Lai et al., 2018 - Google Patents
GPGPU-based ATPG system: Myth or reality?Lai et al., 2018
- Document ID
- 5871924485545952108
- Author
- Lai L
- Tsai K
- Li H
- Publication year
- Publication venue
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
External Links
Snippet
General-purpose computing on graphics processing units (GPGPUs) is a programming model that uses graphics cards to perform computations traditionally done by CPU. It began to become practical with the advent of programmable shaders and floating-point support on …
- 101710003518 ATPAF2 0 title abstract description 46
Classifications
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- G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
- G06F17/50—Computer-aided design
- G06F17/5009—Computer-aided design using simulation
- G06F17/5022—Logic simulation, e.g. for logic circuit operation
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- G—PHYSICS
- G06—COMPUTING; CALCULATING; COUNTING
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- G06F9/00—Arrangements for programme control, e.g. control unit
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- G06F9/38—Concurrent instruction execution, e.g. pipeline, look ahead
- G06F9/3885—Concurrent instruction execution, e.g. pipeline, look ahead using a plurality of independent parallel functional units
- G06F9/3889—Concurrent instruction execution, e.g. pipeline, look ahead using a plurality of independent parallel functional units controlled by multiple instructions, e.g. MIMD, decoupled access or execute
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- G06F9/30—Arrangements for executing machine-instructions, e.g. instruction decode
- G06F9/30003—Arrangements for executing specific machine instructions
- G06F9/30076—Arrangements for executing specific machine instructions to perform miscellaneous control operations, e.g. NOP
- G06F9/30087—Synchronisation or serialisation instructions
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequence
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- G—PHYSICS
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- G06F9/00—Arrangements for programme control, e.g. control unit
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- G06F9/46—Multiprogramming arrangements
- G06F9/50—Allocation of resources, e.g. of the central processing unit [CPU]
- G06F9/5061—Partitioning or combining of resources
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
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- G—PHYSICS
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- G06F9/00—Arrangements for programme control, e.g. control unit
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- G06F9/44—Arrangements for executing specific programmes
- G06F9/455—Emulation; Software simulation, i.e. virtualisation or emulation of application or operating system execution engines
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- G—PHYSICS
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