CN118151324A - Optical component adjustment device and light adjustment method - Google Patents

Optical component adjustment device and light adjustment method Download PDF

Info

Publication number
CN118151324A
CN118151324A CN202410587458.5A CN202410587458A CN118151324A CN 118151324 A CN118151324 A CN 118151324A CN 202410587458 A CN202410587458 A CN 202410587458A CN 118151324 A CN118151324 A CN 118151324A
Authority
CN
China
Prior art keywords
assembly
plate
sample
lens
base
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202410587458.5A
Other languages
Chinese (zh)
Inventor
廖可梁
宋茂华
李荣刚
韩永志
李东哲
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jinan Hanjiang Photoelectric Technology Co ltd
Original Assignee
Jinan Hanjiang Photoelectric Technology Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jinan Hanjiang Photoelectric Technology Co ltd filed Critical Jinan Hanjiang Photoelectric Technology Co ltd
Priority to CN202410587458.5A priority Critical patent/CN118151324A/en
Publication of CN118151324A publication Critical patent/CN118151324A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/02Mountings, adjusting means, or light-tight connections, for optical elements for lenses
    • G02B7/023Mountings, adjusting means, or light-tight connections, for optical elements for lenses permitting adjustment
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/24Base structure
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/24Base structure
    • G02B21/248Base structure objective (or ocular) turrets
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/24Base structure
    • G02B21/26Stages; Adjusting means therefor
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/18Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors
    • G02B7/182Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors for mirrors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)

Abstract

本发明提供一种光学组件调节装置及调节对光方法,涉及光学元件调整领域。光学组件调节装置包括底座、干涉仪组件、波带片组件、透镜组件、观察组件以及样品组件。所述底架上安装有波带片组件、样品组件与观察组件,所述透镜组件安装在波带片组件中的第一转接板上,所述干涉仪组件安装在波带片组件、样品组件中的转接板上,根据干涉仪组件获取波带片、样品、透镜的相对空间位置,再将三者位置信息发送给计算机或其他控制装置,对波带片组件、样品组件中的各平移台、升降台以及旋转台进行位置调整完成对光。通过本发明的方法和装置,可以实现光学组件的快速、准确、简便的调节,为光学系统的设计和应用提供了新的解决方案。

The present invention provides an optical component adjustment device and an adjustment method for alignment, and relates to the field of optical element adjustment. The optical component adjustment device includes a base, an interferometer assembly, a zone plate assembly, a lens assembly, an observation assembly, and a sample assembly. The base frame is equipped with a zone plate assembly, a sample assembly, and an observation assembly, the lens assembly is mounted on a first adapter plate in the zone plate assembly, and the interferometer assembly is mounted on adapter plates in the zone plate assembly and the sample assembly. The relative spatial positions of the zone plate, the sample, and the lens are obtained according to the interferometer assembly, and the position information of the three is sent to a computer or other control device, and the positions of the translation stages, lifting stages, and rotating stages in the zone plate assembly and the sample assembly are adjusted to complete the alignment. Through the method and device of the present invention, fast, accurate, and simple adjustment of optical components can be achieved, providing a new solution for the design and application of optical systems.

Description

Optical component adjusting device and method for adjusting light
Technical Field
The present invention relates to the field of optical element adjustment, and in particular, to an optical component adjustment device and an optical component adjustment method.
Background
In the field of optical system design and application, precise control of the position and angle of the optical components is critical to achieving high quality imaging. Optical components such as zone plates, lenses, prisms and mirrors, and sample devices mounted behind the lenses must be precisely aligned to ensure that the light propagates along a predetermined path to achieve better experimental results. The traditional manual adjustment method has the defects of low adjustment speed, low precision, easiness in being influenced by human factors and the like, and is difficult to meet the requirements of a modern optical system on high precision and high efficiency. Some optical systems also need to work in specific atmosphere environments, such as high and low vacuum environments or inert gas environments, manual adjustment can delay the experimental progress and create more expenditure costs; while some automated adjustment devices are gradually introduced into the adjustment of optical components as the automated technology evolves, while the evolution of automated adjustment technology provides new solutions for the precise adjustment of optical components, existing automated adjustment devices still have some limitations. For example, some devices lack sufficient flexibility in facing different types and sizes of optical components; other devices are expensive to use due to their complex construction and operating requirements.
Therefore, developing an optical assembly adjusting device that can precisely control the position and angle of an optical assembly, has high flexibility and adaptability, and is easy to operate and maintain, has great significance in improving the performance of an optical system and reducing the cost.
Disclosure of Invention
In order to solve the problems, the invention provides an optical component adjusting device and an optical component adjusting method. The method and the device realize accurate adjustment of light by accurately controlling the position and the angle of the optical component. The device adopts advanced sensor and control algorithm, can monitor the state of optical subassembly in real time and carry out automatic adjustment. The technical scheme is that the three-dimensional coordinate system is established by taking the incidence direction of X rays as an X axis, and the technical scheme is as follows:
An optical assembly adjustment device includes a base, an interferometer assembly, a zone plate assembly, a lens assembly, an observation assembly, and a sample assembly. The base comprises a fixed plate, a supporting plate, a positioning seat, a positioning base I, a positioning base II, a substrate two-dimensional moving assembly, a substrate supporting plate and a substrate U-shaped block; the interferometer assembly comprises interferometers with the number more than 2, reflecting mirrors and reflecting mirror mounting seats with the corresponding number, and also comprises rib plate bottom plates, rib plates and rib plate vertical plates; the zone plate assembly comprises a first Y-axis translation table, a first lifting table, a first adapter plate, a second lifting table, a second Y-axis translation table, a second X-axis translation table, a zone plate base, a zone plate mounting seat and an adjustable zone plate; the lens assembly comprises a first lens supporting block, a second lens supporting block, a first X-axis translation table, a lens mounting plate and a lens mounting seat; the observation assembly comprises a fourth adapter plate, a microscope three-dimensional moving assembly, a fifth adapter plate, a microscope supporting device and a microscope; the sample assembly comprises a sample supporting block, a sample lifting platform, a third adapter plate, a third lifting platform, a mounting bottom plate, a rotating platform, a sample two-dimensional moving assembly, a sample frame base, a sample frame and a sample light alignment sheet. The optical fiber optical system comprises a chassis, a lens assembly, a zone plate assembly, a sample assembly and an observation assembly, wherein the zone plate assembly, the sample assembly and the observation assembly are arranged on the chassis, the lens assembly is arranged on a first adapter plate in the zone plate assembly, the interferometer assembly is arranged on an adapter plate in the zone plate assembly and the sample assembly, relative spatial position information of the zone plate, the sample and the lens is acquired according to the interferometer assembly, and then the position information of the zone plate, the sample and the lens is sent to a computer or other control devices, and position adjustment is carried out on each translation table, each lifting table and each rotating table in the zone plate assembly and the sample assembly to finish light.
In some preferred embodiments, the base is an assembly for supporting the interferometer assembly, the zone plate assembly, the lens assembly, the observation assembly and the sample assembly, the fixing plate is a rectangular plate, a through hole is formed in the center of the fixing plate, the through hole is rectangular or circular, holes with the number greater than 1 are drilled on the upper surface and the lower surface of the fixing plate, positioning seats are arranged on part of the holes, and other devices such as supporting or dragging hooks can be arranged on the holes; the supporting plate is a rectangular plate, a through hole is formed in the center of the supporting plate, the through hole is rectangular or circular, holes with the number larger than 1 are formed in the upper surface and the lower surface of the supporting plate, positioning bases are installed on part of the holes, the positions of the positioning bases correspond to the positions of the positioning bases, and the supporting plate is smaller than the fixing plate. The U-shaped base block is made of metal, hole sites are formed in the top surfaces of the vertical blocks at two ends of the U-shaped base block and are in threaded connection with the supporting plate, and through holes are formed in the transverse blocks of the U-shaped base block and are in threaded connection with the supporting plate of the base; and hole sites which are in threaded connection with the U-shaped blocks of the substrate are drilled on the substrate supporting plate.
In some preferred embodiments, the base, the interferometer assembly, the zone plate assembly, the lens assembly, the observation assembly and the sample assembly all comprise different translation stages and lifting stages, and the sample assembly further comprises a rotary stage; each translation platform and elevating platform are standard spare part, only translation distance and translation precision's difference between different translation platforms and the elevating platform.
In some preferred embodiments, the base, interferometer assembly, zone plate assembly, lens assembly, viewing assembly, and sample assembly each comprise a different adapter plate; the adapter plate is a metal plate, and comprises a first adapter plate, a second adapter plate, a third adapter plate, a fourth adapter plate and a fifth adapter plate, wherein the adapter plates are in different installation positions and are reasonably designed according to the space sizes of the installation positions of the adapter plates, the adapter plates have the function of connecting upper and lower different movable parts, and holes with the number more than or equal to 2 are drilled in the adapter plates and are used for the threaded connection of the upper and lower different parts with the adapter plate respectively.
In some preferred embodiments, the interferometer assembly includes more than 2 interferometers and a corresponding number of mirrors, mirror mounting seats, rib plates and rib plates, where the interferometers are laser interferometers, the mounting positions of the interferometers and the mirrors corresponding to the interferometers are used to measure and calculate the relative positions of the adjustable zone plate, the sample and the lens, the mirror mounting seats have multiple patterns, in this embodiment, a flat plate pattern and a sloping plate pattern are mostly adopted, different mounting patterns are selected according to different mounting spaces, and the mirror mounting seats are mounted on different adapter plates or mounting plates in the sample assembly and the zone plate assembly; the reflector is arranged on the reflector mounting seat, and the reflector has the function of reflecting laser.
In some preferred embodiments, holes connected with the support plate, the rib plate and the rib plate vertical plate are drilled on the rib plate bottom plate; the rib plate is triangular, hole sites are reserved on the surfaces of the rib plate, the rib plate bottom plate and the rib plate vertical plate in threaded connection, hole sites for installing interferometers are reserved on the rib plate vertical plate, and the number of the hole sites for installing interferometers is more than or equal to 1; hole sites which are in threaded connection with the rib plates and the rib plate bottom plates are reserved on the rib plate vertical plates.
In some preferred embodiments, a zone plate base in the zone plate assembly is provided with a hole site in threaded connection with the second X-axis translation stage, and a hole site in threaded connection with a zone plate mounting seat; the zone plate mounting seat is matched with the adjustable zone plate in size, and a hole site in threaded connection with the zone plate base and the adjustable zone plate is arranged on the zone plate mounting seat; the adjustable zone plate is a part capable of adjusting the size of the zone plate and controlling the luminous flux.
In some preferred embodiments, the sample supporting block is provided with a hole site in threaded connection with the substrate two-dimensional moving assembly and the sample lifting platform, the sample supporting block is arranged on the substrate two-dimensional moving assembly, and the sample supporting block is a rectangular block with a through hole in the center; the sample rack base is provided with a hole site in threaded connection with the sample two-dimensional moving assembly and a hole site in threaded connection with the sample rack; the sample light alignment sheet is a sheet, a rectangular area extends upwards from the center of the sheet, a semicircular area extends upwards from the right end of the sheet corresponding to the central line of the sheet, and the sample light alignment sheet is convenient to insert or extract from the sample frame; the sample frame cover plate is used for fastening a sample pair light sheet, the sample frame cover plate and the sample frame are connected into a whole through threads and are collectively called as a sample frame, and the sample frame can be used for replacing different sample frames according to different sample types, so that the supporting effect on the sample is achieved.
In some preferred embodiments, the lens mounting plate in the lens assembly is L-shaped, one end of the lens mounting plate is mounted on the first X-axis translation stage, one end of the lens mounting plate is used for mounting the lens mounting seat, and a groove adapted to the lens mounting seat is reserved on one end of the lens mounting seat, so that the lens mounting seat can be mounted conveniently, quickly and accurately; and a hole site for installing a lens is reserved on the lens installation seat.
In some preferred embodiments, the first lens supporting block and the second lens supporting block are solid metal or nonmetal blocks, threaded hole sites are formed on the upper surface and the lower surface of the first lens supporting block and the second lens supporting block, and the height of the second lens supporting block is smaller than that of the first lens supporting block.
In some preferred embodiments, the microscope support device is perforated with holes that are connected to a two-dimensional moving component of a microscope, which is an electron microscope or a visible light microscope, where X-ray beam positions can be observed.
Another object of the present invention is to: a method for adjusting light for an optical assembly adjustment device, comprising the steps of:
Step S01, selecting corresponding sample frames according to different samples, and inserting the samples into the sample frames after selecting the sample frames.
In step S02, the radiation source is turned on, and the relative position of the radiation beam as it passes through the sample is observed by a microscope.
Step S03, transmitting position movement signals to different translation stages or lifting stages in the base, the interferometer assembly, the zone plate assembly, the lens assembly, the observation assembly and the sample assembly according to the position of the ray beam by using a computer or other control equipment.
Step S04, according to the movement positions of different translation stages or lifting stages in the interferometer assembly monitoring base, the interferometer assembly, the zone plate assembly, the lens assembly, the observation assembly and the sample assembly, the simultaneous rapid and accurate movement of each translation stage and the lifting stage is ensured.
And S05, observing and judging whether the ray beam accurately passes through the sample light-aligning sheet through a microscope.
And step S06, after the radiation beam passes through the sample light-aligning sheet, turning off the radiation source, pulling out the sample light-aligning sheet, and inserting the sample light-aligning sheet into the experimental sample to complete the light-aligning work of the whole device.
A computer readable storage medium having stored thereon computer instructions which, when executed by a processor, implement any of steps S02-S05 in a method of adjusting light for an optical component adjustment device.
The invention has the advantages that:
an optical assembly adjustment device has high flexibility and adaptability and can adapt to different types and specifications of optical assemblies. By the method and the device, the optical component can be quickly, accurately and simply adjusted, and a new solution is provided for the design and the application of an optical system.
Drawings
Fig. 1 is a schematic view of the left front side of an optical assembly adjustment device.
Fig. 2 is a front view of an optical assembly adjustment device.
Fig. 3 is a schematic view of the right rear side of the optical assembly adjustment device.
Fig. 4 is a schematic view of an optical assembly conditioner chassis.
Fig. 5 is a bottom view of the optical assembly adjustment device chassis.
In the figure: the three-dimensional microscope comprises a 1-fixed plate, a 2-supporting plate, a 201-positioning seat, a 202-positioning seat, a 203-positioning seat, a 3-rib bottom plate, a 4-rib plate, a 5-rib plate vertical plate, a 6-interferometer, a 601-reflector, a 602-reflector mounting seat, a 603-reflector mounting seat, a 7-first connecting plate, a 8-lens supporting block, a 9-lens supporting block, a 10-second adapter plate, a 11-first Y-axis translation table, a 12-first lifting table, a 13-second lifting table, a 14-first X-axis translation table, a 15-second Y-axis translation table, a 16-second X-axis translation table, a 17-zone plate seat, a 18-zone plate mounting seat, a 19-adjustable zone plate, a 20-sample supporting block, a 21-sample lifting table, a 22-third adapter plate, a 23-third lifting table, a 24-mounting bottom plate, a 25-second sample two-dimensional moving component, a 27-sample frame seat, a 28-sample holder, a 29-sample pair optical plate, a 31-fourth microscope, a 32-third microscope supporting block, a 33-second microscope supporting plate, a 35-two-dimensional moving base, a substrate, a 45-U-supporting plate, a 45-three-dimensional microscope supporting base, a 45-dimensional moving base, a 45-U-shaped microscope, a substrate, a 45-moving base, and a base.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
In the description of the invention, the X-ray incidence direction is taken as an X axis and is also taken as the right side of the whole device, and a three-dimensional coordinate system is established to describe the invention; where the terms "upper", "lower", "front", "rear", "left", "right", "vertical", "inner", "outer", etc. indicate an orientation or positional relationship based on that shown in the drawings, it is merely for convenience of description and to simplify the description, and does not indicate or imply that the apparatus or elements referred to must have a specific orientation to be constructed and operated in a specific orientation, and thus should not be construed as limiting the invention.
It should be noted that, unless explicitly stated and limited otherwise, reference to "hole site" in describing the technical scheme should be interpreted broadly, for example, a hole for connection fixation may be a through hole, a threaded hole, etc.; the terms "mounted," "connected," "coupled," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be directly connected or indirectly connected through an intermediate medium. The specific meaning of the above terms in the present invention will be understood in specific cases by those of ordinary skill in the art.
The optical assembly adjustment device shown in fig. 1, 2 and 3 comprises a chassis, an interferometer assembly, a zone plate assembly, a lens assembly, a viewing assembly and a sample assembly; the observation assembly comprises a fourth adapter plate 31, a microscope three-dimensional moving assembly 32, a fifth adapter plate 33, a microscope support device 34 and a microscope 35; the fourth adapter plate 31 is fixedly connected with the supporting plate 2 in a threaded manner, a lifting platform responsible for Z-axis movement in the three-dimensional moving component 32 of the microscope is connected with the fourth adapter plate 31 in a threaded manner, the fifth adapter plate 33 is connected with a translation platform responsible for X-axis movement in the three-dimensional moving component 32 of the microscope, the fifth adapter plate 33 enables lifting responsible for Z-axis movement in the three-dimensional moving component 32 of the microscope to be connected with the translation platform responsible for X-axis movement, the microscope supporting device 34 is arranged on the three-dimensional moving component 32 of the microscope, the microscope 35 is arranged on the microscope supporting device 34, and the observation component is responsible for observing the position of X-ray beams.
The interferometer component comprises a rib plate bottom plate 3, a rib plate 4, a rib plate vertical plate 5, an interferometer 6, a reflector 601, a first reflector mounting seat 602 and a second reflector mounting seat 603, wherein the rib plate bottom plate 3 is in threaded connection with a supporting plate 2, the rib plate vertical plate 5 is in threaded connection with the rib plate bottom plate 3, the rib plate 4 is in threaded connection with the rib plate bottom plate 3 and the rib plate vertical plate 5 respectively, so that the perpendicularity and stability of the rib plate vertical plate 5 are guaranteed, holes with the number being greater than 1 are punched on the rib plate vertical plate 5 for mounting the interferometer 6, the reflector mounting seat is provided with a plurality of patterns, for example, the first reflector mounting seat 602 and the second reflector mounting seat 603, the reflector mounting seat is mounted on adapter plates of different components, for example, the second adapter plate 10 and the third adapter plate 22 are mounted according to the space size of the adapter plates, the reflector 601 is mounted on the reflector mounting seat, the reflector 601 corresponds to the interferometer 6 one by one, and the interferometer 6 is matched with the reflector 601 to measure the relative position relationship among the components.
The lens assembly comprises a first lens supporting block 8, a second lens supporting block 9, a first X-axis translation stage 14, a lens mounting plate 40 and a lens mounting seat 41; the first lens supporting block 8 and the second lens supporting block 9 are arranged on the first adapter plate, three parts are fixedly connected through threads, the first lens supporting block 8 and the second lens supporting block 9 enable the position height of the lens mounting seat 41 to be consistent with the position height of the adjustable zone plate 19, the first X-axis translation table 14 is arranged on the second lens supporting block 9, the L-shaped lens mounting plate 40 is arranged above the first X-axis translation table 14, the lens mounting seat 41 is arranged at one end of the lens mounting plate 40, the mounting groove is formed in one end of the lens mounting seat 41, and the lens mounting seat 41 is convenient to mount, accurate in position and convenient to mount. The lens is mounted in the lens mount 41, and different sized lenses, and lens mount 41 adapted to different sized lenses, may be selected according to the needs of different experiments.
The zone plate assembly comprises a first Y-axis translation stage 11, a first lifting stage 12, a first adapter plate 7, a second lifting stage 13, a second Y-axis translation stage 15, a second X-axis translation stage 16, a zone plate base 17, a zone plate mounting seat 18 and an adjustable zone plate 19; the first Y-axis translation stage 11 is mounted on the support plate 2, the first lifting stage 12 is mounted on the first Y-axis translation stage 11, the upper and lower sides of the first adapter plate 7 are respectively in threaded connection with the first lifting stage 12 and the second lifting stage 13, so that the second lifting stage 13, the first lifting stage 12 and the first Y-axis translation stage 11 are integrated, the second Y-axis translation stage 15 is in threaded connection with the second lifting stage 13, the second X-axis translation stage 16 is in threaded connection with the second Y-axis translation stage 15, the zone plate base 17 is mounted on the second X-axis translation stage 16, the zone plate base 17 and the lens mounting plate 40 have the same horizontal height at the moment, the zone plate mounting seat 18 is mounted on the zone plate base 17, and the adjustable zone plate 19 is mounted on the zone plate mounting seat 18; after the installation is completed, the adjustable zone plate 19 can be adjusted in three-dimensional directions through the first Y-axis translation stage 11, the first lifting stage 12, the second lifting stage 13, the second Y-axis translation stage 15 and the second X-axis translation stage 16, and the center position of the adjustable zone plate 19 and the center position of the lens mounting seat 41 are on the same horizontal line. Since the first lens supporting block 8 is mounted on the first adapter plate 7, the center position of the adjustable zone plate 19 and the center position of the lens mount 41 can be ensured to be always at the same height.
The sample assembly comprises a sample supporting block 20, a sample lifting table 21, a third adapter plate 22, a third lifting table 23, a mounting bottom plate 24, a rotary table 25, a sample two-dimensional moving assembly 26, a sample frame base 27, a sample frame 28 and a sample light alignment sheet 29; the sample supporting block 20 is mounted on the substrate two-dimensional moving assembly 45, the sample lifting platform 21 is in threaded connection with the sample supporting block 20, the third lifting platform 23 is connected with the sample lifting platform 21 into a whole through the third adapter plate 22, the sample lifting platform 21 is responsible for rough adjustment in the Z-axis direction, the third lifting platform 23 is responsible for fine adjustment in the Z-axis direction, the mounting base plate 24 is mounted on the third lifting platform 23, the second reflector mounting base 603 is further mounted in front of the mounting base plate 24, the rotating platform 25 is mounted on the mounting base plate 24, the sample two-dimensional moving assembly 26 is further mounted above the rotating platform 25 and is responsible for adjusting the two-dimensional position of the sample rack 28, the sample rack base 27 is mounted on the sample rack base 27, the sample light-aligning piece 29 is inserted in a corresponding groove of the sample rack 28, and during light, the sample lifting platform 21, the third lifting platform 23 and the sample two-dimensional moving assembly 26 receive signals from a computer or a control device, and the moving position distance of the sample rack 28 is determined according to an interferometer assembly, and the sample light-aligning piece 29 is located on an X-ray path.
The chassis of the optical assembly adjusting device shown in fig. 4 and 5 comprises a fixed plate 1, a supporting plate 2, a substrate two-dimensional moving assembly 45, a substrate supporting plate 46 and a substrate U-shaped block 47; the fixing plate 1 is provided with a through hole in the center, holes with the number more than or equal to 1 are drilled on the upper surface and the lower surface, the fixing plate 1 is arranged at a corresponding space position where a laboratory or an optical component adjusting device needs to be arranged and fixed, the fixing plate 1 is provided with a positioning base, and the positioning bases are different in pattern, for example, a first positioning base 202 and a second positioning base 203; the central point of the supporting plate 2 is reserved with a through hole, the size of the through hole is smaller than that of the through hole on the fixed plate 1, the upper surface and the lower surface of the supporting plate 2 are both provided with holes with the number larger than or equal to 1, wherein the lower side of the supporting plate 2 is provided with positioning seats 201, the positioning seats 201 are distributed in a triangular mode, the positions of the positioning seats 201 correspond to the positions of positioning bases arranged on the fixed plate 1, two base U-shaped blocks 47 are symmetrically arranged on the lower side of the supporting plate 2, the base bearing plate 46 is fixedly connected with the two base U-shaped blocks 47 through threads to form a supporting platform, and the base two-dimensional moving assembly 45 is arranged on the supporting platform. The sample assembly is mounted on the base two-dimensional movement assembly 45.
A method for adjusting light for an optical assembly adjustment device, comprising:
Step S01, selecting corresponding sample frames according to different samples, and inserting the samples into the sample frames after selecting the sample frames.
In step S02, the radiation source is turned on, and the relative position of the radiation beam as it passes through the sample is observed by a microscope.
Step S03, transmitting position movement signals to different translation stages or lifting stages in the base, the interferometer assembly, the zone plate assembly, the lens assembly, the observation assembly and the sample assembly according to the position of the ray beam by using a computer or other control equipment.
Step S04, according to the movement positions of different translation stages or lifting stages in the interferometer assembly monitoring base, the interferometer assembly, the zone plate assembly, the lens assembly, the observation assembly and the sample assembly, the simultaneous rapid and accurate movement of each translation stage and the lifting stage is ensured.
And S05, observing and judging whether the ray beam accurately passes through the sample light-aligning sheet through a microscope.
And step S06, after the radiation beam passes through the sample light-aligning sheet, turning off the radiation source, pulling out the sample light-aligning sheet, and inserting the sample light-aligning sheet into the experimental sample to complete the light-aligning work of the whole device.
A computer readable storage medium having stored thereon computer instructions which, when executed by a processor, implement any of steps S02-S05 in a method of adjusting light for an optical component adjustment device.
After the optical component adjusting device finishes focusing, the adjustable zone plate 19, the lens and the sample are positioned on one light path at the moment, experiments can be carried out, in the experimental process, the first X-axis translation stage 14 can be controlled to adjust the position of the lens so as to finish the adjustment of the size and definition of the sample, and the position of the sample can be finely adjusted through the control rotary stage 25 and the third lifting stage 23, so that the state of the sample can be observed more conveniently and accurately.
Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the spirit and scope of the invention as defined by the appended claims and their equivalents.

Claims (10)

1.一种光学组件调节装置,其特征在于:光学组件调节装置包括底座、干涉仪组件、波带片组件、透镜组件、观察组件以及样品组件;所述底座包括固定板(1)、支撑板(2)、定位座(201)、定位底座一(202)、定位底座二(203)、基底二维移动组件(45),基底承托板(46),基底U型块(47);所述干涉仪组件包括数量大于2的干涉仪(6)以及对应数量的反射镜(601)、反射镜安装座,还包括肋板底板(3)、肋板(4)、肋板立板(5);所述波带片组件包括第一Y轴平移台(11)、第一升降台(12)、第一转接板(7)、第二升降台(13)、第二Y轴平移台(15),第二X轴平移台(16),波带片底座(17)、波带片安装座(18)以及可调波带片(19);透镜组件包括透镜承托块一(8)、透镜承托块二(9)、第一X轴平移台(14)、透镜安装板(40)与透镜安装座(41);观察组件包括第四转接板(31)、显微镜三维移动组件(32)、第五转接板(33)、显微镜支撑装置(34)、显微镜(35);样品组件包括样品承托块(20)、样品升降台(21),第三转接板(22),第三升降台(23),安装底板(24),旋转台(25),样品二维移动组件(26),样品架底座(27),样品架(28),样品对光片(29);所述底架上安装有波带片组件、样品组件与观察组件,所述透镜组件安装在波带片组件中的第一转接板(7)上,所述干涉仪组件安装在波带片组件、样品组件中的转接板上,根据干涉仪组件获取波带片、样品、透镜的相对空间位置信息,再将三者位置信息发送给计算机或其他控制装置,对波带片组件、样品组件中的各平移台、升降台以及旋转台(25)进行位置调整完成对光。1. An optical component adjustment device, characterized in that: the optical component adjustment device comprises a base, an interferometer component, a zone plate component, a lens component, an observation component and a sample component; the base comprises a fixing plate (1), a support plate (2), a positioning seat (201), a positioning base 1 (202), a positioning base 2 (203), a base two-dimensional moving component (45), a base supporting plate (46), and a base U-shaped block (47); the interferometer component comprises a number greater than 2 interferometers (6) and a corresponding number of reflectors (6 01), a reflector mounting seat, further comprising a rib bottom plate (3), a rib (4), and a rib vertical plate (5); the wave zone plate assembly comprises a first Y-axis translation stage (11), a first lifting stage (12), a first adapter plate (7), a second lifting stage (13), a second Y-axis translation stage (15), a second X-axis translation stage (16), a wave zone plate base (17), a wave zone plate mounting seat (18), and an adjustable wave zone plate (19); the lens assembly comprises a lens support block 1 (8), a lens support block 2 (9), a first X-axis translation stage (1 4), a lens mounting plate (40) and a lens mounting seat (41); an observation assembly including a fourth adapter plate (31), a microscope three-dimensional moving assembly (32), a fifth adapter plate (33), a microscope supporting device (34), and a microscope (35); a sample assembly including a sample support block (20), a sample lifting platform (21), a third adapter plate (22), a third lifting platform (23), a mounting base plate (24), a rotating platform (25), a sample two-dimensional moving assembly (26), a sample rack base (27), and a sample rack (28). The sample alignment plate (29); the base frame is provided with a zone plate assembly, a sample assembly and an observation assembly; the lens assembly is mounted on a first adapter plate (7) in the zone plate assembly; the interferometer assembly is mounted on adapter plates in the zone plate assembly and the sample assembly; the relative spatial position information of the zone plate, the sample and the lens is obtained according to the interferometer assembly, and the position information of the three is then sent to a computer or other control device, and the position of each translation stage, lifting stage and rotating stage (25) in the zone plate assembly and the sample assembly is adjusted to complete the alignment. 2.根据权利要求1所述的一种光学组件调节装置,其特征在于:所述固定板(1)为矩形板件,中心位置开有通孔,通孔为矩形或为圆形,固定板(1)上下两面打有数量大于1的孔位,部分孔位上安装有定位座(201),孔位还可以安装其他支撑或者拖拽挂钩装置;所述支撑板(2)为矩形板件,中心位置开有通孔,通孔为矩形或为圆形,支撑板(2)上下两面打有数量大于1的孔位,部分孔位上安装有定位底座,定位底座位置与定位座(201)位置相对应,所述支撑板(2)小于固定板(1);所述基底U型块(47)为金属材质,基底U型块(47)两端竖向块顶面开有孔位与支撑板(2)螺纹连接,基底U型块(47)中横向块上打有通孔与基底承托板(46)螺纹连接;所述基底承托板(46)上打有与基底U型块(47)螺纹连接的孔位。2. An optical component adjustment device according to claim 1, characterized in that: the fixing plate (1) is a rectangular plate with a through hole at the center, the through hole is rectangular or circular, the fixing plate (1) has a number of holes greater than 1 on the upper and lower surfaces, some of the holes are installed with positioning seats (201), and other support or drag hook devices can also be installed on the holes; the support plate (2) is a rectangular plate with a through hole at the center, the through hole is rectangular or circular, the support plate (2) has a number of holes greater than 1 on the upper and lower surfaces 1, some of the holes are provided with positioning bases, the position of the positioning bases corresponds to the position of the positioning seat (201), the support plate (2) is smaller than the fixed plate (1); the base U-shaped block (47) is made of metal, the top surfaces of the vertical blocks at both ends of the base U-shaped block (47) are provided with holes for threaded connection with the support plate (2), the horizontal blocks in the base U-shaped block (47) are provided with through holes for threaded connection with the base supporting plate (46); the base supporting plate (46) is provided with holes for threaded connection with the base U-shaped block (47). 3.根据权利要求1所述的一种光学组件调节装置,其特征在于:所述底座、干涉仪组件、波带片组件、透镜组件、观察组件以及样品组件中均包含不同的平移台、升降台,样品组件中还包括旋转台(25);所述各平移台以及升降台均为标准零部件,不同的平移台与升降台之间只有平移距离以及平移精度的差距;所述底座、干涉仪组件、波带片组件、透镜组件、观察组件以及样品组件中均包含不同的转接板;所述转接板为金属板件,包括第一转接板(7),第二转接板(10),第三转接板(22),第四转接板(31),第五转接板(33),所述转接板有不同安装位置的转接板,其形状大小各不相同,所述转接板具有连接上下两种不同移动零部件的功能,转接板上打有数量大于等于 2 的孔位,用于上下两种不同零部件分别与转接板螺纹连接。3. An optical component adjustment device according to claim 1, characterized in that: the base, interferometer assembly, wave zone plate assembly, lens assembly, observation assembly and sample assembly all include different translation stages and lifting platforms, and the sample assembly also includes a rotating table (25); the translation stages and lifting platforms are all standard components, and the only difference between different translation stages and lifting platforms is the translation distance and translation accuracy; the base, interferometer assembly, wave zone plate assembly, lens assembly, observation assembly and sample assembly all include different adapter plates; the adapter plates are metal plates, including a first adapter plate (7), a second adapter plate (10), a third adapter plate (22), a fourth adapter plate (31), and a fifth adapter plate (33), the adapter plates have adapter plates with different installation positions, and their shapes and sizes are different, the adapter plates have the function of connecting two different upper and lower moving parts, and the adapter plates are provided with holes greater than or equal to 2 for threaded connection of the two different upper and lower parts with the adapter plates respectively. 4.根据权利要求1所述的一种光学组件调节装置,其特征在于:所述干涉仪组件包括多个干涉仪(6)以及对应数量的反射镜(601)、反射镜安装座以及肋板底板(3)、肋板(4)、肋板立板(5),所述干涉仪(6)为激光干涉仪,安装位置与干涉仪(6)对应的反射镜(601)配合使用测算可调波带片(19)、样品以及透镜的相对位置,反射镜安装座有多种样式,反射镜安装座安装在样品组件与波带片组件中的不同转接板或安装板上;所述反射镜(601)安装在反射镜安装座上,反射镜(601)具有反射激光的作用。4. An optical component adjustment device according to claim 1, characterized in that: the interferometer assembly includes a plurality of interferometers (6) and a corresponding number of reflectors (601), a reflector mounting seat, and a rib bottom plate (3), a rib (4), and a rib vertical plate (5); the interferometer (6) is a laser interferometer; the reflector (601) whose mounting position corresponds to the interferometer (6) is used in conjunction with the measurement of the relative positions of the adjustable zone plate (19), the sample, and the lens; the reflector mounting seat has a variety of styles, and the reflector mounting seat is mounted on different adapter plates or mounting plates in the sample assembly and the zone plate assembly; the reflector (601) is mounted on the reflector mounting seat, and the reflector (601) has the function of reflecting laser. 5.根据权利要求1所述的一种光学组件调节装置,其特征在于:所述肋板底板(3)上打有与支撑板(2),肋板(4),肋板立板(5)连接的孔位;所述肋板(4)为三角形,肋板(4)与肋板底板(3)以及肋板立板(5)螺纹连接的面上预留有孔位,肋板立板(5)上预留有安装干涉仪(6)的孔位,所述安装干涉仪(6)的孔位数量大于等于 1 ;所述肋板立板(5)上还预留有与肋板(4),肋板底板(3)螺纹连接的孔位。5. An optical component adjustment device according to claim 1, characterized in that: the rib bottom plate (3) is punched with holes for connecting with the support plate (2), the rib (4), and the rib vertical plate (5); the rib (4) is triangular, and holes are reserved on the surface of the rib (4) for threaded connection with the rib bottom plate (3) and the rib vertical plate (5); holes are reserved on the rib vertical plate (5) for installing the interferometer (6), and the number of holes for installing the interferometer (6) is greater than or equal to 1; the rib vertical plate (5) is also reserved with holes for threaded connection with the rib (4) and the rib bottom plate (3). 6.根据权利要求1所述的一种光学组件调节装置,其特征在于:所述波带片组件中的波带片底座(17)上打有与第二X轴平移台(16)螺纹连接的孔位,打有与波带片安装座(18)螺纹连接的孔位;所述波带片安装座(18)与可调波带片(19)大小相匹配,波带片安装座(18)上打有与波带片底座(17)、可调波带片(19)螺纹连接的孔位;所述可调波带片(19)为可以调节波带片大小以及控制光通量的零部件。6. An optical component adjustment device according to claim 1, characterized in that: the zone plate base (17) in the zone plate assembly is punched with holes threadedly connected to the second X-axis translation stage (16), and is punched with holes threadedly connected to the zone plate mounting seat (18); the zone plate mounting seat (18) matches the size of the adjustable zone plate (19), and the zone plate mounting seat (18) is punched with holes threadedly connected to the zone plate base (17) and the adjustable zone plate (19); the adjustable zone plate (19) is a component that can adjust the size of the zone plate and control the luminous flux. 7.根据权利要求1所述的一种光学组件调节装置,其特征在于:所述样品承托块(20)上打有与基底二维移动组件(45)、样品升降台(21)螺纹连接的孔位,所述样品承托块(20)安装在基底二维移动组件(45)上,样品承托块(20)为中心有通孔的矩形块;所述样品架底座(27)上打有与样品二维移动组件(26)螺纹连接的孔位,与样品架(28)螺纹连接的孔位;所述样品对光片(29)为一薄片,在薄片中心位置向上伸出一矩形区域,对应着薄片的中心线,在薄片的右端向上延伸出一半圆形区域,方便将样品对光片(29)从样品架(28)上插入或拔出;所述样品组件中样品架(28)上有用来紧固样品对光片(29)的样品架盖板,样品架盖板与样品架(28)通过螺纹连接为一个整体,统称为样品架(28),所述样品架(28)可根据不同样品类型更换不同样品架(28),达到对样品的支撑作用。7. An optical component adjustment device according to claim 1, characterized in that: the sample support block (20) is punched with holes for threaded connection with the base two-dimensional moving component (45) and the sample lifting platform (21), the sample support block (20) is installed on the base two-dimensional moving component (45), and the sample support block (20) is a rectangular block with a through hole in the center; the sample rack base (27) is punched with holes for threaded connection with the sample two-dimensional moving component (26) and holes for threaded connection with the sample rack (28); the sample alignment sheet (29) is a thin The sample assembly comprises a sheet, a rectangular area extending upward from the center of the sheet, corresponding to the center line of the sheet, and a semicircular area extending upward from the right end of the sheet, so as to facilitate the insertion or removal of the sample light-aligning sheet (29) from the sample holder (28); the sample holder (28) in the sample assembly has a sample holder cover plate for fastening the sample light-aligning sheet (29), the sample holder cover plate and the sample holder (28) are connected as a whole by threads, and are collectively referred to as the sample holder (28), and the sample holder (28) can be replaced with different sample holders (28) according to different sample types to achieve the support effect on the sample. 8.根据权利要求1所述的一种光学组件调节装置,其特征在于:所述透镜组件中的透镜安装板(40)为L形,透镜安装板(40)一端安装在第一X轴平移台(14)上,一端用于安装透镜安装座(41),安装透镜安装座(41)的一端上留有适配透镜安装座(41)的凹槽;所述透镜安装座(41)上留有安装透镜的孔位;所述透镜承托块一(8)与透镜承托块二(9)为实心金属或非金属块,透镜承托块一(8)与透镜承托块二(9)上下两面均打有螺纹孔位,透镜承托块二(9)的高度小于透镜承托块一(8)的高度。8. An optical component adjustment device according to claim 1, characterized in that: the lens mounting plate (40) in the lens assembly is L-shaped, one end of the lens mounting plate (40) is mounted on the first X-axis translation stage (14), and the other end is used to mount a lens mounting seat (41), and a groove for adapting to the lens mounting seat (41) is reserved on one end for mounting the lens mounting seat (41); a hole for mounting the lens is reserved on the lens mounting seat (41); the lens supporting block 1 (8) and the lens supporting block 2 (9) are solid metal or non-metal blocks, and the lens supporting block 1 (8) and the lens supporting block 2 (9) are both provided with threaded holes on the upper and lower surfaces, and the height of the lens supporting block 2 (9) is less than the height of the lens supporting block 1 (8). 9.一种用于光学组件调节装置的调节对光方法,其特征在于:9. A method for adjusting light for an optical component adjusting device, characterized in that: 调节对光方法步骤如下:The steps to adjust the light are as follows: 步骤S01,根据不同的样品选择对应样品架(28),选择好样品架(28)后将样品对光片(29)插入样品架(28)上;Step S01, selecting a corresponding sample rack (28) according to different samples, and inserting a sample alignment sheet (29) into the sample rack (28) after selecting the sample rack (28); 步骤S02,打开射线光源,通过显微镜观察射线光束穿过样品时的相对位置;Step S02, turning on the radiation source, and observing the relative position of the radiation beam when it passes through the sample through a microscope; 步骤S03,根据根据射线光束位置,利用计算机或其他控制设备,向底座、干涉仪组件、波带片组件、透镜组件、观察组件以及样品组件中不同的平移台或升降台传递位置移动信号;Step S03, according to the position of the ray beam, using a computer or other control device, transmitting a position movement signal to different translation stages or lifting stages in the base, interferometer assembly, zone plate assembly, lens assembly, observation assembly and sample assembly; 步骤S04,根据干涉仪组件监控底座、干涉仪组件、波带片组件、透镜组件、观察组件以及样品组件中不同的平移台或升降台移动位置,保证各平移台与升降台同时快速精准移动;Step S04, according to the interferometer assembly monitoring base, interferometer assembly, zone plate assembly, lens assembly, observation assembly and sample assembly, different translation stages or lifting stages are moved to ensure that each translation stage and lifting stage moves quickly and accurately at the same time; 步骤S05,通过显微镜观察判断射线光束是否准确穿过样品对光片(29);Step S05, observing through a microscope to determine whether the radiation beam accurately passes through the sample light sheet (29); 步骤S06,当确定射线光束穿过样品对光片(29)后,关闭射线光源,拔下样品对光片(29),插入实验样品,完成整体装置对光工作。Step S06, when it is determined that the radiation beam passes through the sample light alignment sheet (29), the radiation light source is turned off, the sample light alignment sheet (29) is unplugged, and the experimental sample is inserted to complete the light alignment work of the entire device. 10.一种计算机可读存储介质,其上存储有计算机指令,其特征在于:所述计算机指令被处理器执行时,实现权利要求9中步骤S02~步骤S05中的任一项步骤。10. A computer-readable storage medium having computer instructions stored thereon, wherein when the computer instructions are executed by a processor, any one of steps S02 to S05 in claim 9 is implemented.
CN202410587458.5A 2024-05-13 2024-05-13 Optical component adjustment device and light adjustment method Pending CN118151324A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202410587458.5A CN118151324A (en) 2024-05-13 2024-05-13 Optical component adjustment device and light adjustment method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202410587458.5A CN118151324A (en) 2024-05-13 2024-05-13 Optical component adjustment device and light adjustment method

Publications (1)

Publication Number Publication Date
CN118151324A true CN118151324A (en) 2024-06-07

Family

ID=91297420

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202410587458.5A Pending CN118151324A (en) 2024-05-13 2024-05-13 Optical component adjustment device and light adjustment method

Country Status (1)

Country Link
CN (1) CN118151324A (en)

Citations (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5912939A (en) * 1997-02-07 1999-06-15 Hirsch; Gregory Soft x-ray microfluoroscope
JP2005083976A (en) * 2003-09-10 2005-03-31 Shimadzu Corp X-ray analyzer and its focusing device
CN202471629U (en) * 2012-02-07 2012-10-03 中国科学院上海应用物理研究所 Sample rack
CN109490335A (en) * 2018-11-13 2019-03-19 中国科学院上海应用物理研究所 A kind of micro- focusing experiment porch of synchrotron radiation applications
CN210163516U (en) * 2019-04-09 2020-03-20 复旦大学 Large-area atomic-scale precision laser molecular beam epitaxial film preparation system
US20210285899A1 (en) * 2017-06-26 2021-09-16 Gerasimos Daniel Danilatos Specimen control means for particle beam microscopy
CN114812808A (en) * 2016-11-29 2022-07-29 光热光谱股份有限公司 Method and apparatus for enhanced photothermographic and spectroscopic imaging
CN115388772A (en) * 2022-08-20 2022-11-25 哈尔滨工业大学 Ultra-precise form and position error measuring instrument with cross motion surface and dynamic state conforming to Abbe principle
CN115751107A (en) * 2022-11-29 2023-03-07 济南汉江光电科技有限公司 Three-dimensional feed-in adjusting device with vacuum suction decoupling function
CN116540394A (en) * 2023-04-12 2023-08-04 浙江大学 Light sheet microscope single-frame self-focusing method based on structured light illumination and deep learning
CN116661136A (en) * 2023-06-05 2023-08-29 上海科技大学 X-ray free electron laser beam positioning system and method based on visible light laser
CN117030769A (en) * 2023-09-06 2023-11-10 中国科学技术大学 A combined imaging device and method for online freezing super-resolution fluorescence microscopy and soft X-ray imaging
CN117368244A (en) * 2023-10-31 2024-01-09 中国科学院上海高等研究院 Sample stage for micro-focusing X-ray scattering
CN117607177A (en) * 2023-11-23 2024-02-27 中国科学院上海高等研究院 A device that combines micro-focused synchrotron radiation small-angle scattering and wide-angle diffraction
CN117871565A (en) * 2024-01-12 2024-04-12 中国科学院上海高等研究院 A sample detection device for X-ray scattering experiments
CN117990729A (en) * 2022-10-27 2024-05-07 上海科技大学 Optical path adjustment device, method, and sample test system

Patent Citations (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5912939A (en) * 1997-02-07 1999-06-15 Hirsch; Gregory Soft x-ray microfluoroscope
JP2005083976A (en) * 2003-09-10 2005-03-31 Shimadzu Corp X-ray analyzer and its focusing device
CN202471629U (en) * 2012-02-07 2012-10-03 中国科学院上海应用物理研究所 Sample rack
CN114812808A (en) * 2016-11-29 2022-07-29 光热光谱股份有限公司 Method and apparatus for enhanced photothermographic and spectroscopic imaging
US20210285899A1 (en) * 2017-06-26 2021-09-16 Gerasimos Daniel Danilatos Specimen control means for particle beam microscopy
CN109490335A (en) * 2018-11-13 2019-03-19 中国科学院上海应用物理研究所 A kind of micro- focusing experiment porch of synchrotron radiation applications
CN210163516U (en) * 2019-04-09 2020-03-20 复旦大学 Large-area atomic-scale precision laser molecular beam epitaxial film preparation system
CN115388772A (en) * 2022-08-20 2022-11-25 哈尔滨工业大学 Ultra-precise form and position error measuring instrument with cross motion surface and dynamic state conforming to Abbe principle
CN117990729A (en) * 2022-10-27 2024-05-07 上海科技大学 Optical path adjustment device, method, and sample test system
CN115751107A (en) * 2022-11-29 2023-03-07 济南汉江光电科技有限公司 Three-dimensional feed-in adjusting device with vacuum suction decoupling function
CN116540394A (en) * 2023-04-12 2023-08-04 浙江大学 Light sheet microscope single-frame self-focusing method based on structured light illumination and deep learning
CN116661136A (en) * 2023-06-05 2023-08-29 上海科技大学 X-ray free electron laser beam positioning system and method based on visible light laser
CN117030769A (en) * 2023-09-06 2023-11-10 中国科学技术大学 A combined imaging device and method for online freezing super-resolution fluorescence microscopy and soft X-ray imaging
CN117368244A (en) * 2023-10-31 2024-01-09 中国科学院上海高等研究院 Sample stage for micro-focusing X-ray scattering
CN117607177A (en) * 2023-11-23 2024-02-27 中国科学院上海高等研究院 A device that combines micro-focused synchrotron radiation small-angle scattering and wide-angle diffraction
CN117871565A (en) * 2024-01-12 2024-04-12 中国科学院上海高等研究院 A sample detection device for X-ray scattering experiments

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
黄添彪: "《数控技术与机械制造常用数控装备的应用研究》", 31 December 2018, 上海交通大学出版社, pages: 115 - 117 *

Similar Documents

Publication Publication Date Title
US7684031B2 (en) Visual inspection apparatus, visual inspection method, and peripheral edge inspection unit that can be mounted on visual inspection apparatus
US10930467B2 (en) Sample holder system and sample observation apparatus
KR20090102661A (en) Electron beam drawing device and electron beam drawing method
US20070180889A1 (en) Probe replacement method for scanning probe microscope
CN112817160B (en) Method for assembling and adjusting optical imaging system
CN109239087B (en) Image detection platform
CN215414976U (en) Detection device
CN118151324A (en) Optical component adjustment device and light adjustment method
JP4791118B2 (en) Image measuring machine offset calculation method
KR100532238B1 (en) Thin film inspection method, apparatus and inspection system used therein
CN110412049A (en) A precision detection device for hole shape of chemical fiber spinneret based on machine vision
JPH1194756A (en) Substrate inspecting apparatus
CN210664329U (en) Auxiliary jig for measuring system
CN101158655B (en) Laser aiming image monitoring arrangement used for single-crystal orientation tester
CN221148517U (en) Supplementary vision detects frock
CN108572059A (en) A self-focusing detection device for a vehicle lamp lens and its application method
CN214539338U (en) Micrometer displacement table for quantum diamond single spin spectrometer
CN220120025U (en) Multi-lens image measuring instrument
CN114577771B (en) Multi-path sheet light full-automatic alignment device and method
CN218728317U (en) Adjustable multi-azimuth observation mirror
CN113118917B (en) Multi-degree-of-freedom positioning device for reflecting mirror
CN113155733A (en) Detection device
CN220525698U (en) Sample positioning device
CN222579576U (en) Lens focus and resolution evaluation device
CN220472936U (en) A test device for projection lenses

Legal Events

Date Code Title Description
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication

Application publication date: 20240607

RJ01 Rejection of invention patent application after publication