Key research themes
1. How can Z-scan techniques be optimized and applied for accurate nonlinear optical property characterization of advanced materials?
This research theme focuses on the development, modeling, and application of the Z-scan technique to investigate nonlinear optical (NLO) properties of various materials including thin films, nanomaterials, and organic molecules. It explores theoretical modeling improvements, experimental implementations such as continuous motion scanning, and the interpretation of nonlinear refractive and absorptive behaviors. Optimizing Z-scan methods is critical for understanding ultrafast optical phenomena, enabling photonic applications such as optical limiting, optical switching, and high-speed data processing.
2. How can high-speed scanning systems be designed to improve data acquisition efficiency in mapping and monitoring applications?
This theme covers the design, evaluation, and performance optimization of scanning systems that achieve rapid and accurate capture of spatial data, including internet-wide network scanning and 3D surface monitoring. Key considerations include scanner architecture, motion techniques, data throughput, and accuracy management. High-speed scanning is significant for large-scale surveys, security scanning, surface deformation monitoring, and industrial inspection, where balancing speed and precision is essential.
3. What are the advancements and challenges in facial and surface scanning technologies for precise 3D modeling and medical applications?
This research trajectory investigates the evolution, capabilities, and limitations of facial and 3D surface scanning systems in medical, dental, and industrial contexts. It spans comparative accuracy studies of different scanners, integration methods such as multi-device bundling, and software-based solutions for data processing and calibration. Understanding scanner performance and calibration is critical for applications in prosthodontics, surgical planning, forensic analysis, and reverse engineering.