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An expandable system has been developed to operate multiple probes for the atomic force microscope in parallel at high speeds. The combined improvements from parallelism and enhanced tip speed in this system represent an increase in... more
An expandable system has been developed to operate multiple probes for the atomic force microscope in parallel at high speeds. The combined improvements from parallelism and enhanced tip speed in this system represent an increase in... more
The radial core size of tracks in CR-39 plastics has been determined for several heavy ions, O(8.6 MeV), Ne(18.8 MeV), Si(27 MeV) Ar(35 MeV) and Fe(80 MeV), by AFM and UV methods. In the AFM method, the core radii were assessed from the... more
Improved imaging rates in Atomic Force Microscopes (AFM) are of high interest for disciplines such as life sciences and failure analysis of semiconductor wafers, where the sample topology shows high aspect ratios. Also, fast imaging is... more
A nanoscale manipulation system has been designed and built through the integration of a force–feedback haptic device and a commercial atomic force microscope. The force–feedback interaction provides a very intuitive, efficient and... more
This paper presents some insights on teaching practical improvements to control methods to engineers already practicing in the field. Virtually all of these engineers have taken an introductory controls class (perhaps many years ago) and... more
This paper presents some insights on teaching practical improvements to control methods to engineers already practicing in the field. Virtually all of these engineers have taken an introductory controls class (perhaps many years ago) and... more
The Atomic Force Microscope (AFM) is a powerful imaging and nanofabrication tool that allows the user to observe and manipulate samples at the atomic level. However, one limitation of current AFMs is the long time required to obtain a... more
It is a significant challenge to reduce the scanning time in atomic force microscopy while retaining imaging quality. In this paper, a novel non-raster scanning method for high-speed imaging is presented. The method proposed here is... more
A nanoscale manipulation system has been designed and built through the integration of a force–feedback haptic device and a commercial atomic force microscope. The force–feedback interaction provides a very intuitive, efficient and... more
It is a significant challenge to reduce the scanning time in atomic force microscopy while retaining imaging quality. In this paper, a novel non-raster scanning method for high-speed imaging is presented. The method proposed here is... more
22 We present Sensor Inpainting, a new operation mode for scanning probe microscopy that 23 uses advanced image processing techniques to render images based on position sensor 24 data. Sensor Inpainting frees scanning probe microscopy... more
Improved imaging rates in Atomic Force Microscopes (AFM) are of high interest for disciplines such as life sciences and failure analysis of semiconductor wafers, where the sample topology shows high aspect ratios. Also, fast imaging is... more
The mechanical properties of nanoconfined water layers are still poorly understood and continue to create considerable controversy, despite their importance for biology and nanotechnology. Here, we report on dynamic nanomechanical... more
Effects of thermal annealing on the morphology of the Al x Ga (1 À x) N films with two different high Al-contents (x =0.43 and 0.52) have been investigated by atomic force microscopy (AFM). The annealing treatments were performed in a... more
The mechanical properties of nanoconfined water layers are still poorly understood and continue to create considerable controversy, despite their importance for biology and nanotechnology. Here, we report on dynamic nanomechanical... more
The mechanical properties of nanoconfined water layers are still poorly understood and continue to create considerable controversy, despite their importance for biology and nanotechnology. Here, we report on dynamic nanomechanical... more
The mechanical properties of nanoconfined water layers are still poorly understood and continue to create considerable controversy, despite their importance for biology and nanotechnology. Here, we report on dynamic nanomechanical... more
The mechanical properties of nanoconfined water layers are still poorly understood and continue to create considerable controversy, despite their importance for biology and nanotechnology. Here, we report on dynamic nanomechanical... more
Improved imaging rates in Atomic Force Microscopes (AFM) are of high interest for disciplines such as life sciences and failure analysis of semiconductor wafers, where the sample topology shows high aspect ratios. Also, fast imaging is... more
Monoatomic layers of graphite can be electrically contacted and used as building blocks for new promising devices. These experiment are today possible thanks to the fact that very thin graphite can be identified on a dielectric substrate... more
This paper is designed as a primer for college level STEM students about to take their first formal class in feedback control systems. This means that the explanations assume the reader has had some necessary math, science, and... more
Improved imaging rates in Atomic Force Microscopes (AFM) are of high interest for disciplines such as life sciences and failure analysis of semiconductor wafers, where the sample topology shows high aspect ratios. Also, fast imaging is... more
In Tip-Enhanced Raman Spectroscopy (TERS) a metal (or metallized) sharp tip is used to enhance the electromagnetic field by a localized surface-plasmon excitation. Two different modes-atomic force mode (AFM) and scanning tunneling mode... more
Despite its proven success in a wide variety of applications, the atomic force microscope (AFM) remains limited by its slow imaging rate. One approach to overcome this challenge is to rely on algorithmic approaches that reduce the imaging... more
We present the implementation of an atomic force microscope ͑AFM͒ based on fiber-top design. Our results demonstrate that the performances of fiber-top AFMs in contact mode are comparable to those of similar commercially available... more
In Tip-Enhanced Raman Spectroscopy (TERS) a metal (or metallized) sharp tip is used to enhance the electromagnetic field by a localized surface-plasmon excitation. Two different modes-atomic force mode (AFM) and scanning tunneling mode... more
Atomic Force Microscopy (AFM) techniques are used with one-or two-dimensional arrays of piezoresistive probes for parallel imaging. We present a newly designed AFM platform to drive these passivated piezoresistive cantilever arrays in air... more
We present a simple method for causing the end of a silicon nitride atomic force microscope ͑AFM͒ tip to emit light, and we use this emitted light to perform scanning near-field optical microscopy. Illumination of a silicon nitride AFM... more
The mechanical properties of nanoconfined water layers are still poorly understood and continue to create considerable controversy, despite their importance for biology and nanotechnology. Here, we report on dynamic nanomechanical... more
Complex as-grown nanodomain patterns are studied with piezoresponse force microscopy in Sr x Ba 1−x Nb 2 O 6 single crystals at variant Sr/ Ba molar ratios, 0.4ഛ x ഛ 0.75. They reflect random-field Ising model ͑RFIM͒ ferroelectricity,... more
The mechanical properties of nanoconfined water layers are still poorly understood and continue to create considerable controversy, despite their importance for biology and nanotechnology. Here, we report on dynamic nanomechanical... more
Hemispherical p/n/p transistor structures ranging from 100 m down to 0.05 m in diameter are fabricated in CuInSe 2 , by application of a high electric field between a conducting diamond tip of an atomic force microscope and a CuInSe 2... more
In the present study we test a compact disk pickup as the cantilever position sensor in an atomic force microscope ͑AFM͒. The pickup is placed on top of the optical microscope used for the visual inspection and alignment of the specimen.... more
A large scan area high-speed scan stage for atomic force microscopy using the resonant oscillation of a quartz bar has been constructed. The sample scanner can be used for high-speed imaging in both air and liquid environments. The... more
Using an Atomic Force Microscope (AFM), we successfully ploughed micron size planar constriction type junctions on YBa 2 Cu 3 O 7 thin films. The 100 nanometer (nm) thin films are deposited on MgO substrates by an Inverted Cylindrical... more
Hemispherical p/n/p transistor structures ranging from 100 m down to 0.05 m in diameter are fabricated in CuInSe 2 , by application of a high electric field between a conducting diamond tip of an atomic force microscope and a CuInSe 2... more
Atomic force microscopes (AFMs) are the primary investigation systems at the nanoscale. In existing dynamic mode AFM methods steady-state response of microcantilever is monitored for imaging tip-surface interaction forces at the... more
The sliding friction as a function of scanning velocity at the nanometer scale was simulated based on a modified one-dimensional Tomlinson model. Monte Carlo theory was exploited to describe the thermally activated hopping of the contact... more
The mechanical properties of nanoconfined water layers are still poorly understood and continue to create considerable controversy, despite their importance for biology and nanotechnology. Here, we report on dynamic nanomechanical... more
In the atomic force microscope, the nanoscale force topography of even complex surface superstructures is extracted by the changing vibration frequency of a scanning tip. An alternative dissipation topography with similar or even better... more
Effects of thermal annealing on the morphology of the Al x Ga (1 À x) N films with two different high Al-contents (x =0.43 and 0.52) have been investigated by atomic force microscopy (AFM). The annealing treatments were performed in a... more
In this article, we describe nanometer scale characterization of piezoelectric thin films of lead-zirconatetitanate. Using the electric field from a biased conducting atomic-force microscope tip, we show that it is possible to form and... more
Complex as-grown nanodomain patterns are studied with piezoresponse force microscopy in Sr x Ba 1−x Nb 2 O 6 single crystals at variant Sr/ Ba molar ratios, 0.4ഛ x ഛ 0.75. They reflect random-field Ising model ͑RFIM͒ ferroelectricity,... more