Iida et al., 1997 - Google Patents

A 1/4-inch 330 K square pixel progressive scan CMOS active pixel image sensor

Iida et al., 1997

Document ID
9559302273168932907
Author
Iida Y
Oba E
Mabuchi K
Nakamura N
Miura H
Publication year
Publication venue
IEEE Journal of Solid-State Circuits

External Links

Snippet

In this paper, three pixel structures have been studied as candidates to realize high density CMOS active pixel sensors. A novel cell structure, the" I-shaped" cell, in which the active regions are formed along a straight line, has been proposed for high-packing density …
Continue reading at ieeexplore.ieee.org (other versions)

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    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength, or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
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    • H01L27/14601Structural or functional details thereof
    • H01L27/14609Pixel-elements with integrated switching, control, storage or amplification elements
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    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/14601Structural or functional details thereof
    • H01L27/14603Special geometry or disposition of pixel-elements, address-lines or gate-electrodes
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    • H01L27/144Devices controlled by radiation
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    • H01L27/144Devices controlled by radiation
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    • H01L27/14689MOS based technologies
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    • H04N5/00Details of television systems
    • H04N5/30Transforming light or analogous information into electric information
    • H04N5/335Transforming light or analogous information into electric information using solid-state image sensors [SSIS]
    • H04N5/369SSIS architecture; Circuitry associated therewith
    • H04N5/374Addressed sensors, e.g. MOS or CMOS sensors
    • H04N5/3745Addressed sensors, e.g. MOS or CMOS sensors having additional components embedded within a pixel or connected to a group of pixels within a sensor matrix, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N5/37452Addressed sensors, e.g. MOS or CMOS sensors having additional components embedded within a pixel or connected to a group of pixels within a sensor matrix, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising additional storage means
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    • H04N5/369SSIS architecture; Circuitry associated therewith
    • H04N5/374Addressed sensors, e.g. MOS or CMOS sensors
    • H04N5/3745Addressed sensors, e.g. MOS or CMOS sensors having additional components embedded within a pixel or connected to a group of pixels within a sensor matrix, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N5/37457Addressed sensors, e.g. MOS or CMOS sensors having additional components embedded within a pixel or connected to a group of pixels within a sensor matrix, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising amplifiers shared between a plurality of pixels, e.g. at least one part of the amplifier has to be on the sensor array itself
    • HELECTRICITY
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    • H04N3/00Scanning details of television systems
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    • H04N3/14Scanning details of television systems by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
    • H04N3/15Scanning details of television systems by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation
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    • H04N3/14Scanning details of television systems by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
    • H04N3/15Scanning details of television systems by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation
    • H04N3/1506Scanning details of television systems by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation with addressing of the image-sensor elements
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    • H04N5/369SSIS architecture; Circuitry associated therewith
    • H04N5/378Readout circuits, e.g. correlated double sampling [CDS] circuits, output amplifiers or A/D converters
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    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
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    • H04N5/351Control of the SSIS depending on the scene, e.g. brightness or motion in the scene
    • H04N5/355Control of the dynamic range
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    • H04N5/357Noise processing, e.g. detecting, correcting, reducing or removing noise
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