Paoloni, 1987 - Google Patents
Implementation of microwave diffraction tomography for measurement of dielectric constant distributionPaoloni, 1987
- Document ID
- 2201109672194915374
- Author
- Paoloni F
- Publication year
- Publication venue
- IEE Proceedings H (Microwaves, Antennas and Propagation)
External Links
Snippet
Diffraction tomography is a process that can infer the internal structure of an object from multiple views of its diffraction shadow. The procedure is sensitive to variations in the object's refractive index and there is interest in using the technique to measure permittivity …
- 238000003325 tomography 0 title abstract description 12
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S15/00—Systems using the reflection or reradiation of acoustic waves, e.g. sonar systems
- G01S15/88—Sonar systems specially adapted for specific applications
- G01S15/89—Sonar systems specially adapted for specific applications for mapping or imaging
- G01S15/8906—Short-range imaging systems; Acoustic microscope systems using pulse-echo techniques
- G01S15/895—Short-range imaging systems; Acoustic microscope systems using pulse-echo techniques characterised by the transmitted frequency spectrum
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
- G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
- G01R29/0821—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S13/00—Systems using the reflection or reradiation of radio waves, e.g. radar systems; Analogous systems using reflection or reradiation of waves whose nature or wavelength is irrelevant or unspecified
- G01S13/88—Radar or analogous systems specially adapted for specific applications
- G01S13/89—Radar or analogous systems specially adapted for specific applications for mapping or imaging
- G01S13/90—Radar or analogous systems specially adapted for specific applications for mapping or imaging using synthetic aperture techniques, e.g. correcting range migration errors
- G01S13/9035—Particular SAR processing techniques not provided for elsewhere, e.g. squint mode, doppler beam-sharpening mode, spotlight mode, bistatic SAR, inverse SAR
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00, e.g. X-rays or neutrons by transmitting the radiation through the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/02—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Tabbara et al. | Diffraction tomography: contribution to the analysis of some applications in microwaves and ultrasonics | |
| Johnson et al. | Inverse Scattering Solutions by a Sinc Basis, Multiple Source, Moment Method--Part I: Theory | |
| US6636584B2 (en) | Apparatus and method for imaging objects with wavefields | |
| Mueller et al. | Reconstructive tomography and applications to ultrasonics | |
| Pichot et al. | Active microwave imaging of inhomogeneous bodies | |
| Slaney et al. | Limitations of imaging with first-order diffraction tomography | |
| Marklein et al. | Linear and nonlinear inversion algorithms applied in nondestructive evaluation | |
| Lavarello et al. | Tomographic reconstruction of three-dimensional volumes using the distorted Born iterative method | |
| Rius et al. | Planar and cylindrical active microwave temperature imaging: Numerical simulations | |
| Tajik et al. | Comparative study of the Rytov and Born approximations in quantitative microwave holography | |
| CN114047389B (en) | Frequency diversity and computational imaging method and system | |
| Paoloni | Implementation of microwave diffraction tomography for measurement of dielectric constant distribution | |
| US5144236A (en) | Method and apparatus for r.f. tomography | |
| Caorsi et al. | Numerical solution to three-dimensional inverse scattering for dielectric reconstruction purposes | |
| Solimene et al. | 3D sliced tomographic inverse scattering experimental results | |
| Al-Tayar et al. | Non-Destructive Testing Using Filtered Backprojection Tomography with Focusing Lens Antennas in the W-and D-Band | |
| Kechribaris et al. | Reconstruction of two-dimensional permittivity distribution using an improved Rytov approximation and nonlinear optimization | |
| Barengolts et al. | Radar-based Tomography with Filtered Backprojection Using Attenuation and Time Shift Profiles of a Reference Reflection | |
| Aitmehdi et al. | The determination of dielectric loss tangent by microwave phase tomography | |
| Kim et al. | Inverse scattering image reconstruction based on the multi-frequency reflection and transmission observation data from limited views | |
| Pichot et al. | Gradient and Newton-Kantorovich methods for microwave tomography | |
| Langenberg et al. | Applied inversion in nondestructive testing | |
| Bramanti et al. | Electromagnetic techniques for nondestructive testing of dielectric materials: Diffraction tomography | |
| Slaney et al. | Microwave imaging with first order diffraction tomography | |
| Tam | Two-dimensional inverse Born approximation in ultrasonic flaw characterization |