Kane et al., 1995 - Google Patents
A CMOS compatible traction stress sensing element for use in high resolution tactile imagingKane et al., 1995
- Document ID
- 11662551554886007474
- Author
- Kane B
- Kovacs G
- Publication year
- Publication venue
- Proceedings of the International Solid-State Sensors and Actuators Conference-TRANSDUCERS'95
External Links
Snippet
A microstructure capable of resolving the three independent components of a point traction stress has been developed. The sensor exhibits an independent, linear response to each of the three components of an applied traction stress with measurement sensitivities of 130 …
- 238000003384 imaging method 0 title description 2
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/125—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by capacitive pick-up
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress in general
- G01L1/20—Measuring force or stress in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electro-kinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
- G01L1/22—Measuring force or stress in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electro-kinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
- G01L1/2206—Special supports with preselected places to mount the resistance strain gauges; Mounting of supports
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L5/00—Apparatus for, or methods of, measuring force, e.g. due to impact, work, mechanical power, or torque, adapted for special purposes
- G01L5/16—Apparatus for, or methods of, measuring force, e.g. due to impact, work, mechanical power, or torque, adapted for special purposes for measuring several components of force
- G01L5/161—Apparatus for, or methods of, measuring force, e.g. due to impact, work, mechanical power, or torque, adapted for special purposes for measuring several components of force using variations in ohmic resistance
- G01L5/162—Apparatus for, or methods of, measuring force, e.g. due to impact, work, mechanical power, or torque, adapted for special purposes for measuring several components of force using variations in ohmic resistance of piezoresistors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress in general
- G01L1/14—Measuring force or stress in general by measuring variations in capacitance or inductance of electrical elements, e.g. by measuring variations of frequency of electrical oscillators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/18—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration in two or more dimensions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L9/00—Measuring steady or quasi-steady pressure of a fluid or a fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material by electric or magnetic means
- G01L9/0041—Transmitting or indicating the displacement of flexible diaphragms
- G01L9/0051—Transmitting or indicating the displacement of flexible diaphragms using variations in ohmic resistance
- G01L9/0052—Transmitting or indicating the displacement of flexible diaphragms using variations in ohmic resistance of piezoresistive elements
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Kane et al. | A traction stress sensor array for use in high-resolution robotic tactile imaging | |
| Chu et al. | Silicon three-axial tactile sensor | |
| Wei et al. | An overview of micro-force sensing techniques | |
| Beebe et al. | A silicon force sensor for robotics and medicine | |
| Kane et al. | CMOS-compatible traction stress sensor for use in high-resolution tactile imaging | |
| Schmidt et al. | Design and calibration of a microfabricated floating-element shear-stress sensor | |
| Leineweber et al. | New tactile sensor chip with silicone rubber cover | |
| US8646335B2 (en) | Contact stress sensor | |
| US7516671B2 (en) | Sensor chip and apparatus for tactile and/or flow sensing | |
| US8601885B2 (en) | Contact force sensor with an elastomer material secured to a deformable membrane | |
| Hoffman et al. | 3D structures with piezoresistive sensors in standard CMOS | |
| Kane et al. | A CMOS compatible traction stress sensing element for use in high resolution tactile imaging | |
| Wang et al. | Characterization of a silicon-based shear-force sensor on human subjects | |
| CN117109796A (en) | A six-axis force sensor and its preparation method | |
| Shan et al. | The design and fabrication of a flexible three-dimensional force sensor skin | |
| Guo et al. | Stand-alone stretchable absolute pressure sensing system for industrial applications | |
| Kim et al. | Design of flexible tactile sensor based on three-component force and its fabrication | |
| Zhe et al. | A MEMS device for measurement of skin friction with capacitive sensing | |
| US7536919B2 (en) | Strain gauge | |
| Li et al. | Design and characterization of a miniature three-axial MEMS force sensor | |
| Jedari Ghourichaei et al. | Multiscale fabrication and characterization of a NEMS force sensor | |
| CN117629492A (en) | Silicon piezoresistive six-dimensional force sensor based on MEMS technology and preparation method thereof | |
| Alcheikh et al. | Characterization and modeling of a piezoresistive three-axial force micro sensor | |
| Huang et al. | Design and characterization of a CMOS capacitive sensor array for fast normal stress analysis | |
| Liu et al. | Progress towards a smart skin: fabrication and preliminary testing |