WO2018061817A1 - Gate driving circuit and light emission device having same - Google Patents

Gate driving circuit and light emission device having same Download PDF

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Publication number
WO2018061817A1
WO2018061817A1 PCT/JP2017/033387 JP2017033387W WO2018061817A1 WO 2018061817 A1 WO2018061817 A1 WO 2018061817A1 JP 2017033387 W JP2017033387 W JP 2017033387W WO 2018061817 A1 WO2018061817 A1 WO 2018061817A1
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Prior art keywords
voltage
terminal
gate
semiconductor switching
gate terminal
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French (fr)
Japanese (ja)
Inventor
伊奈 裕彦
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Panasonic Intellectual Property Management Co Ltd
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Panasonic Intellectual Property Management Co Ltd
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    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02MAPPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M1/00Details of apparatus for conversion
    • H02M1/08Circuits specially adapted for the generation of control voltages for semiconductor devices incorporated in static converters
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/04Modifications for accelerating switching
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/687Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors

Definitions

  • the present invention relates to a gate driving circuit for driving a semiconductor switching element by applying a voltage to the gate terminal with respect to the semiconductor switching element having a gate terminal, and a light emitting device including the gate driving circuit.
  • a semiconductor switching device having a gate terminal such as a MOSFET (Metal Oxide Semiconductor Field Effect Transistor) is used.
  • MOSFET Metal Oxide Semiconductor Field Effect Transistor
  • a gate drive circuit has been proposed in which a negative voltage is applied to the gate terminal to shorten the turn-off time when the semiconductor switching element is turned off (see, for example, Patent Documents 1 and 2).
  • the present invention provides a gate driving circuit capable of shortening the turn-on time and the turn-off time of a semiconductor switching element, and a light emitting device including the same.
  • the first terminal, the second terminal connected to the higher potential side than the first terminal, and the voltage higher than the threshold voltage are applied, so that the first terminal and the second terminal are electrically connected.
  • a gate drive circuit for driving an N-channel type semiconductor switching element having a gate terminal includes an on-voltage applying unit that applies an on-voltage that is equal to or higher than a threshold voltage to a gate terminal, an on-voltage variable unit that changes an on-voltage applied by the on-voltage applying unit, and a gate terminal that is lower than the threshold voltage.
  • an off-voltage applying unit that applies an off-voltage that draws charges from the parasitic capacitance between the gate terminal and the first terminal.
  • the on-voltage variable unit applies, as an on-voltage, a first on-voltage that is equal to or higher than a threshold voltage at the start of the on-period of the semiconductor switching element, is lower than the first on-voltage at the end of the on-period, and The ON voltage is changed and applied to the gate terminal of the semiconductor switching element so that the second ON voltage equal to or higher than the threshold voltage is applied.
  • the amount of charge accumulated in the parasitic capacitance (hereinafter referred to as “gate parasitic capacitance”) between the gate terminal and the first terminal of the semiconductor switching element is such that a constant first on-voltage is obtained during the on-period.
  • gate parasitic capacitance hereinafter referred to as “gate parasitic capacitance”
  • the semiconductor switching element transitions from the off state to the on state (hereinafter referred to as “turn on”), a first on voltage higher than the second on voltage is applied to the gate terminal. Thereby, the turn-on time of the semiconductor switching element can be shortened.
  • a first terminal, a second terminal connected to a lower potential side than the first terminal, and a voltage equal to or lower than a threshold voltage are applied between the first terminal and the second terminal.
  • the gate drive circuit includes an on-voltage applying unit that applies an on-voltage less than or equal to a threshold voltage to the gate terminal, an on-voltage variable unit that changes the on-voltage applied by the on-voltage applying unit, and a gate terminal that is higher than the threshold voltage.
  • an off-voltage applying unit that applies an off-voltage that draws charges from the parasitic capacitance between the gate terminal and the first terminal.
  • the on-voltage variable unit applies, as an on-voltage, a first on-voltage that is equal to or lower than a threshold voltage at the start of the on-period of the semiconductor switching element, is higher than the first on-voltage at the end of the on-period, and The on-voltage applied to the gate terminal of the semiconductor switching element is changed so that the second on-voltage below the threshold voltage is applied.
  • the second on-voltage higher than the first on-voltage is applied to the gate terminal at the end of the on-period of the semiconductor switching element. For this reason, the amount of charge accumulated in the gate parasitic capacitance of the switching element is smaller than that in the case where the first on-voltage is continuously applied in the on-period. As a result, charges can be quickly extracted from the gate parasitic capacitance at the time of turn-off. As a result, the turn-off time of the semiconductor switching element can be shortened.
  • the semiconductor switching element when the semiconductor switching element is turned on, a first on-voltage that is lower than the second on-voltage is applied to the gate terminal. Thereby, the turn-on time of the semiconductor switching element can be shortened.
  • the light-emitting device of the present invention includes a light-emitting element, a semiconductor switching element that switches between supply and stop of current to the light-emitting element, and the gate drive circuit that drives the semiconductor switching element.
  • a light-emitting device with a short turn-on time and turn-off time of the light-emitting element can be realized by a gate drive circuit having a simple circuit configuration.
  • a gate potential difference applied to the semiconductor switching element is smaller than the first ON voltage, and a second ON voltage is applied to the gate terminal.
  • the amount of charge accumulated in the gate parasitic capacitance of the switching element is smaller than that in the case where the first on-voltage is continuously applied in the on-period.
  • charges can be quickly extracted from the gate parasitic capacitance at the time of turn-off, and the turn-off time can be shortened. As a result, it is possible to quickly switch between supply and stop of the current flowing through the light emitting element.
  • FIG. 1 is a block diagram showing a configuration of a gate drive circuit according to Embodiment 1 of the present invention.
  • FIG. 2 is a time chart showing the output signal of the on-voltage applying unit in the gate drive circuit according to the embodiment, and a time chart showing the voltage of the gate terminal in the semiconductor switching element driven by the gate drive circuit.
  • FIG. 3 is a block diagram showing the configuration of the gate drive circuit according to Embodiment 2 of the present invention.
  • FIG. 4 is a block diagram showing the configuration of the gate drive circuit according to Embodiment 3 of the present invention.
  • FIG. 1 is a block diagram showing a configuration of a gate drive circuit according to Embodiment 1 of the present invention.
  • FIG. 2 is a time chart showing the output signal of the on-voltage applying unit in the gate drive circuit according to the embodiment, and a time chart showing the voltage of the gate terminal in the semiconductor switching element driven by the gate drive circuit.
  • FIG. 3 is a block diagram showing the configuration of the gate drive circuit according to
  • FIG. 5 is a time chart showing the output signal of the on-voltage applying unit in the gate drive circuit according to the embodiment, and a time chart showing the voltage of the gate terminal in the semiconductor switching element driven by the gate drive circuit.
  • FIG. 6 is a block diagram showing the configuration of the gate drive circuit according to Embodiment 4 of the present invention.
  • FIG. 1 is a block diagram showing a configuration of a light emitting device including a gate drive circuit 2 and a gate drive circuit 2 according to Embodiment 1 of the present invention.
  • the light emitting device 1 of the present embodiment includes a gate drive circuit 2, a light emitting element LD, a semiconductor switching element Q1, and the like.
  • the light emitting device 1 is used as a light source in a distance image camera of a TOF (Time Of Flight) system that creates a three-dimensional distance distribution image, for example.
  • the TOF range image camera first irradiates a subject with laser light. Next, the reflected light is measured with a two-dimensional image sensor. Then, the distance to the subject is calculated based on the flight time of light. Thus, the camera creates a three-dimensional distance distribution image.
  • the light emitting element LD is configured by, for example, a laser diode that emits light when supplied with current.
  • a laser diode having two terminals will be described as an example.
  • the light emitting device 1 of the present embodiment repeats switching between conduction and non-conduction of the semiconductor switching element Q1 in units of nanoseconds, for example, and repeatedly switches light emission and non-light emission of the light emitting element LD at high speed. Operate.
  • Semiconductor switching elements Q1 has a first terminal t 1, the second terminal t 2 is connected to the high potential side of the first terminal t 1, and has a gate terminal t G.
  • Semiconductor switching element Q1, the gate terminal t G, the threshold voltage or higher is applied between the first terminal t 1 and the second terminal t 2 is conductive.
  • the semiconductor switching element Q1 of the present embodiment is composed of an N channel type MOSFET. Therefore, a source terminal corresponding to the first terminal t 1, the drain terminal corresponding to the second terminal t 2, and the gate terminal t G. Note that the above threshold voltage, the potential difference between the gate terminal t G and the first terminal (the source terminal t 1).
  • the threshold voltage in the present embodiment is, for example, + 3V.
  • the gate drive circuit 2 includes an on-voltage application unit 3, an on-voltage variable unit 4, an off-voltage application unit 5, and the like.
  • the on-voltage application unit 3 includes, for example, a driver IC, and is connected to an FPGA (Field Programmable Gate Array) that generates a pulse signal (not shown), a first voltage power supply V1, and a GND.
  • the FPGA outputs a pulse signal having a predetermined pulse width to the on-voltage applying unit 3 in accordance with imaging mode information input from the outside.
  • the first voltage power supply V1 is a constant voltage power supply that applies a predetermined voltage.
  • the first voltage source V1 applies a first ON voltage higher than the threshold voltage to the gate terminal t G of the semiconductor switching element Q1.
  • the first voltage source V1 of the embodiment as the predetermined voltage, the first constant voltage V 1 (e.g., + 17 V) to be applied to the gate terminal t G.
  • the on-voltage variable unit 4 includes a capacitor C1, a first differentiation circuit 7, a second voltage power supply V2, and the like.
  • Capacitor C1 the output terminal 3a of the on-voltage applying unit 3 is connected between the gate terminal t G of the semiconductor switching element Q1.
  • First differentiating circuit 7 includes series circuit 6, one end of which is connected to the connection point J1 of the capacitor C1 and the gate terminal t G.
  • the second voltage power supply V2 is connected to the other end of the first resistor R1 of the series circuit 6.
  • the series circuit 6 of the present embodiment includes a diode D1 whose anode is connected to the connection point J1, and a first resistor R1 whose one end is connected in series with the cathode of the diode D1.
  • the second voltage power supply V2 is a constant voltage power supply that applies a predetermined voltage.
  • the second voltage source V2 to the gate terminal t G of the semiconductor switching elements Q1, lower than the first ON voltage and the threshold voltage or more second on-voltage of the semiconductor switching element Q1 is applied.
  • the second voltage power supply V2 of the present embodiment applies a second constant voltage V 2 (for example, +5 V) as a predetermined voltage to the on-voltage variable unit 4.
  • Off voltage applying unit 5 a capacitor C1, and includes a second resistor R2 connected between the gate terminal t G and the first terminal t 1 of the semiconductor switching elements Q1 (source terminal), the second differentiating circuit Constitute.
  • the second resistor R2 has one end connected to the connection point J1 and the other end connected to GND.
  • the third resistor R3 by passing a small current to the configured light emitting element LD laser diode generates a voltage drop to the laser diode to lower the potential of the second terminal t 2 of the semiconductor switching element Q1.
  • circuit configurations of the first differentiating circuit 7 and the second differentiating circuit are not limited to the above-described configurations, and may be other configurations.
  • the light emitting device 1 including the gate driving circuit 2 and the gate driving circuit 2 of the present embodiment is configured.
  • FIG. 2 is a time chart showing the output signal of the on-voltage applying unit in the gate drive circuit according to the embodiment, and a time chart showing the voltage of the gate terminal in the semiconductor switching element driven by the gate drive circuit.
  • the upper time chart of FIG. 2 shows the output signal of the on-voltage application unit 3 of the gate drive circuit 2.
  • Lower time chart in Figure 2 shows the voltage applied to the gate terminal t G of the semiconductor switching elements Q1 which is driven by the gate drive circuit 2.
  • the on-voltage applying unit 3 uses the voltage of the first on-voltage V ON1 to turn on the HIGH signal based on the pulse signal output from the FPGA, when the pulse signal is HIGH. 4 is output.
  • the on-voltage applying unit 3 outputs a LOW signal to the on-voltage variable unit 4 at a voltage of 0 V when the pulse signal is LOW.
  • the period in which the ON voltage applying unit 3 outputs a HIGH signal corresponds to the ON period T ON of the semiconductor switching element Q1.
  • the period during which the on-voltage applying unit 3 outputs a LOW signal corresponds to the off-period T OFF of the semiconductor switching element Q1.
  • the first constant voltages V 1 is set to a first voltage source V1 (for example, A HIGH signal corresponding to + 17V is output. Accordingly, the ON voltage applied to the gate terminal t G of the semiconductor switching element Q1, the first differentiating circuit 7 first on-voltage V ON1 (e.g., + 17 V) until suddenly increases. At this time, charges are accumulated in the capacitor C1. Further, parasitic capacitance between the gate terminal t G and the first terminal t 1 (source terminal) of the semiconductor switching elements Q1 (hereinafter, referred to as "gate parasitic capacitance") also, the charge is accumulated.
  • gate parasitic capacitance parasitic capacitance between the gate terminal t G and the first terminal t 1 (source terminal) of the semiconductor switching elements Q1
  • the threshold voltage e.g., + 3V
  • the first terminal t 1 from the second terminal t 2 of the semiconductor switching elements Q1 a current flows.
  • current is supplied from the second voltage power supply V2 to the light emitting element LD via the fourth resistor R4, and the light emitting element LD emits light.
  • the ON voltage is a total value of the second constant voltage V 2 (for example, + 5V) set to the second voltage power supply V2 and the voltage V D1 (for example, + 0.6V) generated between both ends of the diode D1. It is maintained at a certain second ON voltage V ON2 (for example, +5.6 V).
  • the gate terminal t G second on-voltage V ON2 (e.g., + 5.6 V) even in a state of being applied, the voltage applied to the gate terminal t G is the threshold voltage (e.g., + 3V) is greater than or equal, therefore, The conduction state of the semiconductor switching element Q1 is maintained, and the light emitting element LD continues to emit light. Even in this state, charges are accumulated in the capacitor C1. Specifically, the capacitor C1 is charged with the first on-voltage V ON1 (e.g., + 17 V) and the voltage difference between the second on-voltage V ON2 (e.g., + 5.6 V) (e.g., + 11.4 V) .
  • the first on-voltage V ON1 e.g., + 17 V
  • the voltage difference between the second on-voltage V ON2 e.g., + 5.6 V
  • + 11.4 V e.g., + 11.4 V
  • the voltage applied to the gate terminal t G is the threshold voltage (e.g., + 3V) when it becomes less than, the semiconductor switching element Q1 is turned off. Thereby, the current to the light emitting element LD is stopped, and the light emitting element LD enters a non-light emitting state.
  • the threshold voltage e.g., + 3V
  • the voltage applied to the gate terminal t G is from less than the threshold voltage, the first off-voltage V OFF1 (e.g., -11.4V) until drops rapidly. Thereafter, the voltage rises with the time constant of the off-voltage applying unit 5 (second differential circuit). Then, the voltage applied to the gate terminal t G is maintained at the second turn-off voltage V OFF2 (e.g., 0V). Note that in the OFF period T OFF, after the first off-voltage V OFF1 is applied, the voltage applied to the gate terminal t G (corresponding to the waveform of the lower ⁇ region of FIG. 2) is convex upward It gradually rises with a slope of.
  • the first off-voltage V OFF1 e.g., -11.4V
  • the second off-voltage V OFF2 to a gate terminal t G (e.g., 0V) even in a state where it is applied, the voltage applied to the gate terminal t G is the threshold voltage (e.g., + 3V) lower than. Therefore, the non-conducting state of the semiconductor switching element Q1 is maintained, and the light emitting element LD is maintained in the non-light emitting state.
  • the semiconductor switching element Q1 repeats a series of operations of an on period T ON and an off period T OFF . As a result, the switching operation of the light emitting element LD between light emission and non-light emission is repeatedly executed.
  • the gate driving circuit 2 and the light emitting device 1 including the gate driving circuit 2 operate.
  • the gate driving circuit 2 at the end of the ON period T ON of the semiconductor switching elements Q1, first ON voltage V ON1 (e.g., + 17 V) lower than the second on-voltage V ON2 (e.g., + 5.6 V) There is applied to the gate terminal t G. Therefore, the amount of charges accumulated in the gate parasitic capacitance of the semiconductor switching element Q1 is in the on-period T ON, constant first ON voltage V ON1 (e.g., + 17 V) smaller than when continues to be applied. As a result, when the semiconductor switching element Q1 is turned off, charges can be quickly extracted from the gate parasitic capacitance. As a result, the turn-off time of the semiconductor switching element Q1 can be shortened.
  • V ON1 e.g., + 17 V
  • V ON2 e.g., + 5.6 V
  • the gate driving circuit 2 has, for example, 2 as compared with the second on-voltage V ON2 (for example, +5.6 V) with respect to the first terminal t 1 (source terminal). More than double of the first on-voltage V ON1 (e.g., + 17 V) is applied to the gate terminal t G a. Therefore, the ON voltage of the gate terminal t G is the time to exceed the threshold voltage becomes short. Thereby, the turn-on time when the semiconductor switching element Q1 is turned on can be further shortened.
  • V ON2 for example, +5.6 V
  • the gate driving circuit 2 has a second off voltage V OFF2 (for example, higher than the first off voltage V OFF1 (for example, ⁇ 11.4 V)) applied to the gate terminal t G immediately before turning on the semiconductor switching element Q1. , 0V) is applied. Therefore, when the semiconductor switching element Q1 is turned on, the difference between the voltage immediately before turning on and the threshold voltage is small compared to the case where the constant first off voltage VOFF1 is continuously applied. Thereby, the turn-on time of the semiconductor switching element Q1 can be further shortened.
  • V OFF2 for example, higher than the first off voltage V OFF1 (for example, ⁇ 11.4 V)
  • FIG. 3 is a block diagram showing a configuration of the light emitting device 11 including the gate drive circuit 12 and the gate drive circuit 12 according to Embodiment 2 of the present invention.
  • the configuration of the on-voltage variable section 14 in the gate drive circuit 12 is different from that in the first embodiment.
  • Other configurations are the same. Therefore, the same reference numerals are given to the same configurations in the second embodiment as those in the first embodiment, and the description thereof is omitted.
  • the light emitting device 11 of the present embodiment includes a gate driving circuit 12, a light emitting element LD, a semiconductor switching element Q1, and the like.
  • the gate drive circuit 12 includes an on-voltage application unit 3, an on-voltage variable unit 14, an off-voltage application unit 5, and the like.
  • the on-voltage variable unit 14 includes a capacitor C1, a first differentiation circuit 7, a Zener diode ZD, and the like. Capacitor C1, the output terminal 3a of the on-voltage applying unit 3 is connected between the gate terminal t G of the semiconductor switching element Q1.
  • First differentiating circuit 7 includes a capacitor C1, a series circuit 6 having one end connected to the connection point J1 and the gate terminal t G of the semiconductor switching element Q1.
  • the series circuit 6 includes a diode D1 whose anode is connected to the connection point J1, and a first resistor R1 whose one end is connected in series with the cathode of the diode D1.
  • the Zener diode ZD has a cathode connected to the other end of the first resistor R1 (an end of the first resistor R1 that is not connected to the diode D1).
  • the anode of the Zener diode ZD is connected to the first terminal t 1 (source terminal) of the semiconductor switching element Q1.
  • the Zener voltage value of the Zener diode ZD is higher than a threshold voltage (for example, + 3V), for example, + 5V. Therefore, in the on-voltage varying unit 14 of this embodiment, the Zener voltage value corresponds to a second constant voltage V 2 which is set by the second voltage source V2 of the first embodiment.
  • the gate driving circuit 12 and the light emitting device 11 including the gate driving circuit 12 according to the present embodiment are configured and operate as follows.
  • the light emitting device 11 of the present embodiment as in the first embodiment, during the turn-on of the semiconductor switching elements Q1, on the voltage applied to the gate terminal t G is the first by a first differentiating circuit 7
  • the voltage rapidly rises to the ON voltage V ON1 (for example, + 17V).
  • the ON voltage decreases with the time constant of the first differentiating circuit 7.
  • the ON voltage is a Zener voltage value (for example, +5 V) of the Zener diode ZD corresponding to the second constant voltage V 2 of the first embodiment, and a voltage V D1 (for example, +0.6 V) generated between both ends of the diode D1.
  • the second on-voltage V ON2 for example, +5.6 V).
  • FIG. 4 is a block diagram showing a configuration of the gate drive circuit 22 according to Embodiment 3 of the present invention.
  • the third embodiment is different from the first embodiment in that the semiconductor switching element Q2 is configured by a P-channel type MOSFET. Therefore, the same reference numerals are given to the same configurations in the third embodiment as those in the first embodiment, and the description thereof is omitted.
  • the light emitting device 21 of the present embodiment includes a gate drive circuit 22, a light emitting element LD, a semiconductor switching element Q2, and the like.
  • the semiconductor switching element Q2 is composed of a P-channel type MOSFET. Therefore, the threshold voltage of the semiconductor switching element Q2 in the present embodiment is, for example, ⁇ 3V.
  • the gate drive circuit 22 includes an on-voltage application unit 3, an on-voltage variable unit 24, an off-voltage application unit 25, and the like.
  • the on-voltage applying unit 3 is connected to the FPGA, the first voltage power supply V1, and GND.
  • the first voltage power supply V1 is a constant voltage power supply that applies a predetermined voltage.
  • the first voltage source V1 is lower than the threshold voltage to the gate terminal t G of the semiconductor switching elements Q2, applying a first turn-on voltage.
  • the first constant voltage V 1 e.g., -17 V to be applied to the gate terminal t G.
  • the on-voltage variable unit 24 includes a capacitor C1, a first differentiation circuit 27, and the like. Capacitor C1, the output terminal 3a of the on-voltage applying unit 3 is connected between the gate terminal t G of the semiconductor switching element Q2.
  • the first differentiating circuit 27 includes a capacitor C1, a series circuit 26 of which one end is connected to the connection point J1 and the gate terminal t G of the semiconductor switching element Q2.
  • the series circuit 26 includes a diode D1 whose cathode is connected to the connection point J1, and a first resistor R1 whose one end is connected in series with the anode of the diode D1. The other end of the first resistor R1 is connected to GND.
  • Off voltage applying unit 25 includes a capacitor C1 and includes a second resistor R2 connected between the semiconductor switching element Q2 gate terminal t G and the first terminal t 1 (source terminal), the second differentiating circuit Constitute. At this time, one end of the second resistor R2 is connected to the connection point J1, and the other end is connected to the third voltage power source V3.
  • a third voltage power supply V3 that outputs a third constant voltage is connected to a first terminal t 1 (source terminal).
  • a fourth resistor R4 is connected in series between GND and the light emitting element LD.
  • the fourth resistor R4 is provided to adjust the magnitude of the current supplied to the light emitting element LD.
  • circuit configurations of the first differentiating circuit 27 and the second differentiating circuit are not limited to the above-described configurations, and may be other configurations.
  • the light emitting device 21 including the gate driving circuit 22 and the gate driving circuit 22 according to the present embodiment is configured.
  • Figure 5 is a time chart showing the output signal of the on-voltage applying unit 3 in the gate drive circuit 22 according to the embodiment, and the voltage of the gate terminal t G of the semiconductor switching element Q2 which is driven by the gate drive circuit 22 It is a time chart which shows.
  • the upper time chart of FIG. 5 shows the output signal of the on-voltage application unit 3 of the gate drive circuit 22.
  • Lower time chart in FIG. 5 shows a voltage applied to the gate terminal t G of the semiconductor switching element Q2 which is driven by the gate drive circuit 22.
  • the on-voltage applying unit 3 outputs a HIGH signal and a LOW signal to the on-voltage variable unit 24 based on the pulse signal output from the FPGA, as in the first embodiment.
  • Pulse signal via a capacitor C1 is applied to the gate terminal t G of the semiconductor switching element Q2.
  • the output terminal 3a of the on-voltage applying unit 3 to the capacitor C1 the first constant voltage V 1 (e.g., -17 V) corresponding LOW signal is output. Accordingly, the ON voltage applied to the gate terminal t G of the semiconductor switching element Q2, the first differentiating circuit 7 first on-voltage V ON1 (e.g., -17 V) to decrease rapidly. At this time, charges are accumulated in the capacitor C1. In addition, charges are also accumulated in the gate parasitic capacitance of the semiconductor switching element Q2.
  • the threshold voltage e.g., -3 V
  • the first terminal t 1 current flows from the second terminal t 2 of the semiconductor switching element Q2.
  • the drain current flows.
  • a current is supplied from the third voltage power supply V3 to the light emitting element LD via the fourth resistor R4, and the light emitting element LD emits light.
  • the first on-voltage V ON1 (e.g., -17 V) to decrease rapidly. Thereafter, the ON voltage increases with the time constant of the first differentiating circuit 7.
  • the ON voltage is a total value of a third constant voltage (for example, ⁇ 5V) set in the third voltage power supply V3 and a voltage V D1 (for example, ⁇ 0.6V) generated across the diode D1.
  • V D1 for example, ⁇ 0.6V
  • V ON2 e.g., -5.6V
  • Second on-voltage V ON2 to the gate terminal t G (e.g., -5.6V) even in a state where it is applied, the voltage applied to the gate terminal t G is the threshold voltage (e.g., -3 V) is lower than. Therefore, the conduction state of the semiconductor switching element Q2 is maintained, and the light emitting element LD continues to emit light. Even in this state, charges are accumulated in the capacitor C1. Specifically, the capacitor C1 is charged with a first turn-on voltage V ON1 (e.g., -17 V) voltage difference between the second on-voltage V ON2 (e.g., -5.6V) (e.g., -11.4V) Is done.
  • V ON1 e.g., -17 V
  • the voltage applied to the gate terminal t G is the threshold voltage (e.g., -3 V) at the time exceeds the semiconductor switching element Q2 is turned off. Thereby, the current to the light emitting element LD is stopped, and the light emitting element LD enters a non-light emitting state.
  • the threshold voltage e.g., -3 V
  • the voltage applied to the gate terminal t G may exceed the threshold voltage, the first off-voltage V OFF1 (e.g., + 11.4 V) until suddenly increases. Thereafter, the voltage decreases with the time constant of the off-voltage applying unit 5 (second differential circuit). Then, the voltage applied to the gate terminal t G is maintained at the second turn-off voltage V OFF2 (e.g., 0V). Note that the voltage applied to the gate terminal t G after the first off voltage V OFF1 is applied in the off period T OFF (corresponding to the waveform in the lower ⁇ region in FIG. 5) is convex downward. It gradually decreases with the slope of.
  • the gate terminal t G second off voltage V OFF2 (e.g., 0V) even in a state where it is applied, the voltage applied to the gate terminal t G is the threshold voltage (e.g., -3 V) is higher than. Therefore, the non-conducting state of the semiconductor switching element Q2 is maintained, and the light emitting element LD is maintained in the non-light emitting state.
  • the semiconductor switching element Q2 repeats a series of operations of an on period T ON and an off period T OFF . As a result, the switching operation of the light emitting element LD between light emission and non-light emission is repeatedly executed.
  • the gate drive circuit 22 and the light emitting device 21 including the gate drive circuit 22 operate.
  • the turn-on time and turn-off time of the semiconductor switching element Q2 can be shortened by the above operation.
  • FIG. 6 is a block diagram showing a configuration of the light emitting device 31 including the gate drive circuit 32 and the gate drive circuit 32 according to Embodiment 4 of the present invention.
  • the configuration of the on-voltage variable section 34 in the gate drive circuit 32 is different from that in the third embodiment.
  • Other configurations are the same. Therefore, the same reference numerals are given to the same configurations in the fourth embodiment as those in the third embodiment, and the description thereof is omitted.
  • the light emitting device 31 of the present embodiment includes a gate drive circuit 32, a light emitting element LD, a semiconductor switching element Q2, and the like.
  • the semiconductor switching element Q2 is formed of a P-channel MOSFET as in the third embodiment. Therefore, the threshold voltage of the semiconductor switching element Q2 in the present embodiment is, for example, ⁇ 3V.
  • the gate drive circuit 32 includes an on-voltage application unit 3, an on-voltage variable unit 34, an off-voltage application unit 35, and the like.
  • the first voltage power supply V1 of the gate drive circuit 32 is a constant voltage power supply that applies a predetermined voltage.
  • the first voltage source V1 is the gate terminal t G of the semiconductor switching elements Q2, applied lower than the threshold voltage, the first on-voltage.
  • the first voltage source V1 of the embodiment as the predetermined voltage, the first constant voltage V 1 (e.g., -17 V) to be applied to the gate terminal t G.
  • the on-voltage variable unit 34 includes a capacitor C1, a first differentiation circuit 37, a Zener diode ZD, and the like. Capacitor C1, the output terminal 3a of the on-voltage applying unit 3 is connected between the gate terminal t G of the semiconductor switching element Q2.
  • the first differentiating circuit 37 includes a capacitor C1, a series circuit 36 having one end connected to a connection point J1 and the gate terminal t G of the semiconductor switching element Q2.
  • the series circuit 36 includes a diode D1 whose cathode is connected to the connection point J1, and a first resistor R1 whose one end is connected in series with the anode of the diode D1.
  • the Zener diode ZD has an anode connected to the other end of the first resistor R1, and a cathode connected to the first terminal t 1 (source terminal) of the semiconductor switching element Q2. Note that the Zener voltage value of the Zener diode ZD corresponds to the third constant voltage output from the third voltage power supply V3 of the third embodiment.
  • Off voltage applying unit 35 includes a capacitor C1, and includes a second resistor R2 connected between the semiconductor switching element Q2 gate terminal t G and the first terminal t 1 (source terminal), the second differentiating circuit Constitute. At this time, one end of the second resistor R2 is connected to the connection point J1, and the other end is connected to the third voltage power source V3 and the cathode of the Zener diode ZD.
  • the semiconductor switching element Q2 has a first terminal t 1 (source terminal) connected to the third voltage power supply V3. Thereby, the voltage of the first terminal t 1 (source terminal) of the semiconductor switching element Q2 is fixed to the third voltage power supply V3.
  • the circuit configurations of the first differentiating circuit 37 and the second differentiating circuit are not limited to the above-described configurations, and may be other configurations.
  • the gate drive circuit 32 and the light emitting device 31 including the gate drive circuit 32 according to the present embodiment are configured.
  • the same effect as in the third embodiment can be obtained.
  • the turn-on time and turn-off time of the semiconductor switching element Q2 can be shortened by the above operation.
  • gate drive circuit of the present invention is not limited to the above-described embodiment, and it is needless to say that various changes can be made without departing from the gist of the present invention.
  • the on-period T ON after the first on-voltage V ON1 is applied, the voltage applied to the gate terminal t G is a shape that gradually decreases convex slope downward Although described as an example, it is not limited to this. It may be a shape that gradually increases with a convex slope upward, or another shape.
  • the on-period T ON has been described in example of switching the voltage applied to the gate terminal t G in the first on-voltage V ON1 and second on-voltage V ON2, not limited to this.
  • the voltage may be continuously and gradually reduces the applied to the gate terminal t G.
  • the turn-off just before, the second on-voltage V ON2 applied to the gate terminal t G is lower than the first ON voltage V ON1.
  • the amount of charge accumulated in the gate parasitic capacitance is smaller than when the constant first on-voltage V ON1 is continuously applied. Thereby, the turn-off time of the semiconductor switching element can be shortened.
  • the voltage applied to the gate terminal t G gradually decreases with a convex slope upward.
  • it is not limited to this.
  • it may be a shape that gradually increases downward with a convex inclination or another shape.
  • the voltage applied to the gate terminal t G described switching example in the first OFF voltage V OFF1 and second off-voltage V OFF2, not limited to this.
  • the voltage may be continuously gradually increased to be applied to the gate terminal t G.
  • the turn-on immediately before the voltage applied to the gate terminal t G is higher than the first OFF voltage V OFF1. Therefore, if than continue to apply a constant first OFF voltage V OFF1, the time until the voltage of the gate terminal t G exceeds the threshold voltage is shortened. Thereby, the turn-on time of the semiconductor switching element can be further shortened.
  • the ratio between the first ON voltage V ON1 with a first reference terminal t 1 and the second on-voltage V ON2 is described more than two times as an example, not limited thereto.
  • the first on-voltage V ON1 ratio between the second on-voltage V ON2 is higher than the threshold voltage, and is higher than the second on-voltage V ON2, may be less than 2 times.
  • the turn-off just before the voltage applied to the gate terminal t G is lower than the first ON voltage V ON1. Therefore, the amount of charge accumulated in the gate parasitic capacitance is smaller than when the constant first on-voltage V ON1 is continuously applied. Thereby, the turn-off time of the semiconductor switching element can be shortened.
  • the semiconductor switching elements Q1 and Q2 have been described as being configured using MOSFETs.
  • semiconductor switching elements such as IGBTs (Insulated Gate Bipolar Transistors) may be used.
  • a laser diode having two terminals has been described as an example of the light emitting element LD, but is not limited thereto.
  • a laser diode having three terminals, an LED (Light Emitting Diode), an incandescent lamp, a fluorescent lamp, or the like may be used as the light emitting element LD.
  • the configuration in which the light-emitting device 1 is used as a flash for a TOF type distance image camera is described as an example.
  • the present invention is not limited to this, and the light-emitting device 1 may be used as a lighting device, for example. Good.
  • the light-emitting device 1 can be used for a lighting device having a light control function for changing the brightness of emitted light.
  • the first terminal, the second terminal connected to the higher potential side than the first terminal, and the voltage higher than the threshold voltage are applied.
  • This is a gate driving circuit for driving an N-channel type semiconductor switching element having a gate terminal conducting between two terminals.
  • the gate drive circuit includes an on-voltage applying unit that applies an on-voltage that is equal to or higher than a threshold voltage to a gate terminal, an on-voltage variable unit that changes an on-voltage applied by the on-voltage applying unit, and a gate terminal that is lower than the threshold voltage.
  • an off-voltage applying unit that applies to the gate terminal an off-voltage that draws charges from the parasitic capacitance between the gate terminal and the first terminal.
  • the on-voltage variable unit applies, as an on-voltage, a first on-voltage that is equal to or higher than a threshold voltage at the start of the on-period of the semiconductor switching element, and at the end of the on-period, The ON voltage is changed and applied to the gate terminal of the semiconductor switching element so as to apply a second ON voltage that is lower than the ON voltage and equal to or higher than the threshold voltage.
  • the second ON voltage lower than the first ON voltage is applied to the gate terminal. Therefore, the amount of charge accumulated in the parasitic capacitance (hereinafter referred to as “gate parasitic capacitance”) between the gate terminal and the first terminal of the semiconductor switching element is such that a constant first on-voltage is obtained during the on-period. Compared to the case where the voltage is continuously applied. As a result, charges can be quickly extracted from the gate parasitic capacitance at the time of turn-off. As a result, the turn-off time of the semiconductor switching element can be shortened.
  • the semiconductor switching element when the semiconductor switching element is turned on, a first on-voltage higher than the second on-voltage is applied to the gate terminal. Thereby, the turn-on time of the semiconductor switching element can be shortened.
  • the ratio of the first on-voltage and the second on-voltage with reference to the first terminal is twice or more.
  • the semiconductor switching element when the semiconductor switching element is turned on, the first on-voltage more than twice the second on-voltage is applied to the gate terminal. Therefore, the time until the voltage at the gate terminal exceeds the threshold voltage is shortened. Thereby, the turn-on time when turning on the semiconductor switching element can be further shortened.
  • the ON voltage variable unit has one end connected to the capacitor connected between the output terminal and the gate terminal of the ON voltage application unit, and the connection point between the capacitor and the gate terminal. And a first differentiating circuit that lowers the applied voltage from the first on voltage after applying the first on voltage to the gate terminal.
  • the on-voltage variable unit includes a voltage power source that is connected to the other end of the series circuit and applies a predetermined voltage so that the second on-voltage is continuously applied to the gate terminal.
  • the series circuit preferably includes a diode and a first resistor connected in series with the diode.
  • the turn-on time and the turn-off time of the semiconductor switching element can be shortened while realizing the gate drive circuit with a simple circuit configuration.
  • the ON voltage variable unit has one end connected to the capacitor connected between the output terminal and the gate terminal of the ON voltage application unit, and the connection point between the capacitor and the gate terminal. And a first differentiating circuit that lowers the applied voltage from the first on voltage after applying the first on voltage to the gate terminal. Further, the ON voltage variable unit has a predetermined voltage so that the anode is connected to the other end of the series circuit, the cathode is connected to the first terminal of the semiconductor switching element, and the second ON voltage is continuously applied to the gate terminal. A Zener diode is applied.
  • the series circuit preferably includes a diode and a first resistor connected in series with the diode.
  • the turn-on time and the turn-off time of the semiconductor switching element can be shortened while realizing the gate drive circuit with a simple circuit configuration.
  • the off-voltage applying unit applies the first off-voltage lower than the threshold voltage at the start of the off-period of the semiconductor switching element as the off-voltage, and at the end of the off-period.
  • the off-voltage is applied to the gate terminal of the semiconductor switching element while applying a second off-voltage that is higher than the first off-voltage and lower than the threshold voltage.
  • the second off voltage applied to the gate terminal is higher than the first off voltage. Therefore, when the semiconductor switching element is turned on, the time until the voltage of the gate terminal exceeds the threshold voltage is shortened. Thereby, the turn-on time of the semiconductor switching element can be further shortened.
  • the off-voltage applying unit includes a capacitor and a second resistor connected between the gate terminal and the first terminal, and applies the first off-voltage to the gate terminal. Thereafter, it is preferable to include a second differentiating circuit that raises the applied voltage from the first off voltage and then applies a predetermined voltage so that the second off voltage is continuously applied to the gate terminal.
  • the turn-on time and the turn-off time of the semiconductor switching element can be shortened while realizing the gate drive circuit with a simple circuit configuration.
  • the present invention also provides a first terminal, a second terminal connected to a lower potential side than the first terminal, and a gate that conducts between the first terminal and the second terminal by application of a voltage equal to or lower than a threshold voltage.
  • This is a gate drive circuit for driving a P-channel type semiconductor switching element having a terminal.
  • the gate driving circuit includes: an on-voltage applying unit that applies an on-voltage that is equal to or lower than a threshold voltage to a gate terminal; an on-voltage variable unit that changes an on-voltage applied by the on-voltage applying unit; An off-voltage applying unit that applies an off-voltage that draws charges from the parasitic capacitance between the terminal and the first terminal to the gate terminal is provided.
  • the on-voltage variable unit applies, as an on-voltage, a first on-voltage that is equal to or lower than a threshold voltage at the start of the on-period of the semiconductor switching element, is higher than the first on-voltage at the end of the on-period, and The ON voltage is changed and applied to the gate terminal of the semiconductor switching element so as to apply the second ON voltage equal to or lower than the threshold voltage.
  • the second on-voltage higher than the first on-voltage is applied to the gate terminal at the end of the on-period of the semiconductor switching element. For this reason, the amount of charge accumulated in the gate parasitic capacitance of the semiconductor switching element is smaller than that in the case where the constant first on-voltage is continuously applied in the on-period. As a result, charges can be quickly extracted from the gate parasitic capacitance at the time of turn-off. As a result, the turn-off time of the semiconductor switching element can be shortened.
  • the semiconductor switching element when the semiconductor switching element is turned on, a first on-voltage higher than the second on-voltage is applied to the gate terminal. Thereby, the turn-on time of the semiconductor switching element can be shortened.
  • the ratio between the first on-voltage and the second on-voltage with reference to the first terminal is twice or more.
  • the semiconductor switching element when the semiconductor switching element is turned on, the first on-voltage more than twice the second on-voltage is applied to the gate terminal. Therefore, the time until the voltage at the gate terminal exceeds the threshold voltage is shortened. Thereby, the turn-on time when turning on the semiconductor switching element can be further shortened.
  • the ON voltage variable unit has one end connected to the capacitor connected between the output terminal and the gate terminal of the ON voltage application unit, and the connection point between the capacitor and the gate terminal. And a first differentiating circuit that raises the applied voltage from the first on-voltage after applying the first on-voltage to the gate terminal.
  • the on-voltage variable unit includes a voltage power source that is connected to the other end of the series circuit and applies a predetermined voltage so that the second on-voltage is continuously applied to the gate terminal.
  • the series circuit preferably includes a diode and a first resistor connected in series with the diode.
  • the turn-on time and the turn-off time of the semiconductor switching element can be shortened while realizing the gate drive circuit with a simple circuit configuration.
  • the ON voltage variable unit has one end connected to the capacitor connected between the output terminal and the gate terminal of the ON voltage application unit, and the connection point between the capacitor and the gate terminal. And a first differentiating circuit that raises the applied voltage from the first on-voltage after applying the first on-voltage to the gate terminal. Further, the ON voltage variable unit has a predetermined voltage so that the anode is connected to the other end of the series circuit, the cathode is connected to the first terminal of the semiconductor switching element, and the second ON voltage is continuously applied to the gate terminal. A Zener diode is applied.
  • the series circuit preferably includes a diode and a first resistor connected in series with the diode.
  • the turn-on time and the turn-off time of the semiconductor switching element can be shortened while realizing the gate drive circuit with a simple circuit configuration.
  • the off-voltage applying unit applies a first off-voltage higher than the threshold voltage at the start of the off-period of the semiconductor switching element as the off-voltage, and at the end of the off-period. It is preferable that the off-voltage is changed and applied to the gate terminal of the semiconductor switching element so that the second off-voltage lower than the first off-voltage and higher than the threshold voltage is applied.
  • the second off voltage applied to the gate terminal is lower than the first off voltage. Therefore, when the semiconductor switching element is turned on, the time until the voltage of the gate terminal exceeds the threshold voltage is shortened. Thereby, the turn-on time of the semiconductor switching element can be further shortened.
  • the off-voltage applying unit includes a capacitor and a second resistor connected between the gate terminal and the first terminal, and applies the first off-voltage to the gate terminal. Thereafter, it is preferable to include a second differentiating circuit that raises the applied voltage from the first off voltage and then applies a predetermined voltage so that the second off voltage is continuously applied to the gate terminal.
  • “to increase the applied voltage from the first off voltage” means, for example, to increase the applied voltage from the first off voltage with reference to the GND voltage.
  • the turn-on time and the turn-off time of the semiconductor switching element can be shortened while realizing the gate drive circuit with a simple circuit configuration.
  • the light-emitting device of the present invention includes a light-emitting element, a semiconductor switching element that switches between supply and stop of a current to the light-emitting element, and the gate drive circuit that drives the semiconductor switching element.
  • a light emitting device with a short turn-on time and a short turn-off time can be realized by a gate drive circuit having a simple circuit configuration.
  • the turn-off time can be shortened by quickly extracting charges from the gate parasitic capacitance at the time of turn-off. As a result, it is possible to quickly switch between supply and stop of the current flowing through the light emitting element.
  • the gate drive circuit of the present invention can be adapted to drive a semiconductor switching element connected in series to a light emitting element for, for example, a TOF range image camera.

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Abstract

A gate driving circuit comprises: an on-voltage application unit that applies, to a gate terminal, an on-voltage equal to or greater than a threshold voltage; an on-voltage variation unit that varies the on-voltage; and an off-voltage application unit that applies, to the gate terminal, an off-voltage lower than the threshold voltage that removes charges from a parasitic capacitance between the gate terminal and a first terminal. The on-voltage variation unit varies the on-voltage in such a manner that a first on-voltage equal to or greater than the threshold voltage is applied at the beginning of an on-interval of the semiconductor switching element and a second on-voltage lower than the first on-voltage and equal to or greater than the threshold voltage is applied at the end of the on-interval. In this way, a gate driving circuit capable of further shortening the turn-off time of a semiconductor switching element is provided.

Description

ゲート駆動回路およびそれを備える発光装置Gate drive circuit and light emitting device including the same

 本発明は、ゲート端子を有する半導体スイッチング素子に対して、ゲート端子に電圧を印加することで半導体スイッチング素子を駆動するゲート駆動回路およびそれを備える発光装置に関する。 The present invention relates to a gate driving circuit for driving a semiconductor switching element by applying a voltage to the gate terminal with respect to the semiconductor switching element having a gate terminal, and a light emitting device including the gate driving circuit.

 従来、レーザーダイオードなどの半導体発光素子をパルス発光させる場合、MOSFET(Metal Oxicide Semiconductor Field Effect Transistor)などのゲート端子を有する半導体スイッチング素子が用いられる。このとき、半導体スイッチング素子のスイッチングの高速化のために、半導体スイッチング素子に対して、オン状態からオフ状態への遷移(以下、「ターンオフ」と言う)にかかる時間を短くすることが求められている。 Conventionally, when a semiconductor light emitting device such as a laser diode is caused to emit light in a pulsed manner, a semiconductor switching device having a gate terminal such as a MOSFET (Metal Oxide Semiconductor Field Effect Transistor) is used. At this time, in order to increase the switching speed of the semiconductor switching element, it is required to shorten the time required for the transition from the ON state to the OFF state (hereinafter referred to as “turn-off”) for the semiconductor switching element. Yes.

 そこで、例えば半導体スイッチング素子をターンオフさせる際に、ゲート端子に負の電圧を印加して、ターンオフ時間を短くするゲート駆動回路が提案されている(例えば、特許文献1、2参照)。 Therefore, for example, a gate drive circuit has been proposed in which a negative voltage is applied to the gate terminal to shorten the turn-off time when the semiconductor switching element is turned off (see, for example, Patent Documents 1 and 2).

 しかしながら、近年、半導体スイッチング素子に対して、さらなるスイッチング動作の高速化が求められている。つまり、半導体スイッチング素子の、より短いターンオン時間およびターンオフ時間のスイッチング動作が要望されている。 However, in recent years, further switching operation speed has been demanded for semiconductor switching elements. That is, there is a demand for a switching operation with shorter turn-on time and turn-off time of the semiconductor switching element.

特開平8-149796号公報Japanese Patent Laid-Open No. 8-14997 特開2000-216671号公報JP 2000-216671 A

 本発明は、半導体スイッチング素子のターンオン時間およびターンオフ時間を短くできるゲート駆動回路およびそれを備える発光装置を提供する。 The present invention provides a gate driving circuit capable of shortening the turn-on time and the turn-off time of a semiconductor switching element, and a light emitting device including the same.

 本発明は、第1端子、第1端子よりも高電位側に接続される第2端子、および、閾値電圧以上の電圧が印加されることで、第1端子と第2端子との間が導通するゲート端子を有する、Nチャネル型の半導体スイッチング素子を駆動するゲート駆動回路である。ゲート駆動回路は、ゲート端子に閾値電圧以上のオン電圧を印加するオン電圧印加部と、オン電圧印加部が印加するオン電圧を変化させるオン電圧可変部と、ゲート端子に、閾値電圧よりも低く、かつ、ゲート端子と第1端子との間の寄生容量から電荷を引き抜くオフ電圧を印加するオフ電圧印加部を備える。そして、オン電圧可変部は、オン電圧として、半導体スイッチング素子のオン期間の開始時において閾値電圧以上の第1オン電圧を印加し、オン期間の終了時において第1オン電圧よりも低く、かつ、閾値電圧以上の第2オン電圧を印加するように、半導体スイッチング素子のゲート端子にオン電圧を変化させて印加する。 In the present invention, the first terminal, the second terminal connected to the higher potential side than the first terminal, and the voltage higher than the threshold voltage are applied, so that the first terminal and the second terminal are electrically connected. And a gate drive circuit for driving an N-channel type semiconductor switching element having a gate terminal. The gate drive circuit includes an on-voltage applying unit that applies an on-voltage that is equal to or higher than a threshold voltage to a gate terminal, an on-voltage variable unit that changes an on-voltage applied by the on-voltage applying unit, and a gate terminal that is lower than the threshold voltage. And an off-voltage applying unit that applies an off-voltage that draws charges from the parasitic capacitance between the gate terminal and the first terminal. The on-voltage variable unit applies, as an on-voltage, a first on-voltage that is equal to or higher than a threshold voltage at the start of the on-period of the semiconductor switching element, is lower than the first on-voltage at the end of the on-period, and The ON voltage is changed and applied to the gate terminal of the semiconductor switching element so that the second ON voltage equal to or higher than the threshold voltage is applied.

 この構成によれば、半導体スイッチング素子のオン期間の終了時に、第1オン電圧よりも低い、第2オン電圧がゲート端子に印加される。そのため、半導体スイッチング素子のゲート端子と第1端子との間の寄生容量(以下、「ゲート寄生容量」と記す)に蓄積されている電荷の量は、オン期間において、一定の第1オン電圧が印加され続ける場合と比べて少ない。これにより、ターンオフの際にゲート寄生容量から素早く電荷を引き抜くことができる。その結果、半導体スイッチング素子のターンオフ時間を短くできる。 According to this configuration, at the end of the ON period of the semiconductor switching element, a second ON voltage that is lower than the first ON voltage is applied to the gate terminal. Therefore, the amount of charge accumulated in the parasitic capacitance (hereinafter referred to as “gate parasitic capacitance”) between the gate terminal and the first terminal of the semiconductor switching element is such that a constant first on-voltage is obtained during the on-period. Compared to the case where the voltage is continuously applied. As a result, charges can be quickly extracted from the gate parasitic capacitance at the time of turn-off. As a result, the turn-off time of the semiconductor switching element can be shortened.

 さらに、半導体スイッチング素子をオフ状態からオン状態へ遷移(以下、「ターンオン」と言う)させる際に、第2オン電圧よりも高い、第1オン電圧がゲート端子に印加される。これにより、半導体スイッチング素子のターンオン時間を短くできる。 Furthermore, when the semiconductor switching element transitions from the off state to the on state (hereinafter referred to as “turn on”), a first on voltage higher than the second on voltage is applied to the gate terminal. Thereby, the turn-on time of the semiconductor switching element can be shortened.

 また、本発明は、第1端子、第1端子よりも低電位側に接続される第2端子、および、閾値電圧以下の電圧が印加されることで、第1端子と第2端子との間が導通するゲート端子を有する、Pチャネル型の半導体スイッチング素子を駆動するゲート駆動回路である。ゲート駆動回路は、ゲート端子に閾値電圧以下のオン電圧を印加するオン電圧印加部と、オン電圧印加部が印加するオン電圧を変化させるオン電圧可変部と、ゲート端子に、閾値電圧よりも高く、かつ、ゲート端子と第1端子との間の寄生容量から電荷を引き抜くオフ電圧を印加するオフ電圧印加部を備える。そして、オン電圧可変部は、オン電圧として、半導体スイッチング素子のオン期間の開始時において閾値電圧以下の第1オン電圧を印加し、オン期間の終了時において、第1オン電圧よりも高く、かつ、閾値電圧以下の第2オン電圧を印加するように、半導体スイッチング素子のゲート端子に印加するオン電圧を変化させる。 Further, according to the present invention, a first terminal, a second terminal connected to a lower potential side than the first terminal, and a voltage equal to or lower than a threshold voltage are applied between the first terminal and the second terminal. Is a gate drive circuit for driving a P-channel type semiconductor switching element having a gate terminal for conducting. The gate drive circuit includes an on-voltage applying unit that applies an on-voltage less than or equal to a threshold voltage to the gate terminal, an on-voltage variable unit that changes the on-voltage applied by the on-voltage applying unit, and a gate terminal that is higher than the threshold voltage. And an off-voltage applying unit that applies an off-voltage that draws charges from the parasitic capacitance between the gate terminal and the first terminal. The on-voltage variable unit applies, as an on-voltage, a first on-voltage that is equal to or lower than a threshold voltage at the start of the on-period of the semiconductor switching element, is higher than the first on-voltage at the end of the on-period, and The on-voltage applied to the gate terminal of the semiconductor switching element is changed so that the second on-voltage below the threshold voltage is applied.

 この構成によれば、半導体スイッチング素子のオン期間の終了時に、第1オン電圧よりも高い、第2オン電圧がゲート端子に印加される。そのため、スイッチング素子のゲート寄生容量に蓄積されている電荷の量は、オン期間において第1オン電圧が印加され続ける場合と比べて少ない。これにより、ターンオフの際にゲート寄生容量から素早く電荷を引き抜くことができる。その結果、半導体スイッチング素子のターンオフ時間を短くできる。 According to this configuration, the second on-voltage higher than the first on-voltage is applied to the gate terminal at the end of the on-period of the semiconductor switching element. For this reason, the amount of charge accumulated in the gate parasitic capacitance of the switching element is smaller than that in the case where the first on-voltage is continuously applied in the on-period. As a result, charges can be quickly extracted from the gate parasitic capacitance at the time of turn-off. As a result, the turn-off time of the semiconductor switching element can be shortened.

 さらに、半導体スイッチング素子をターンオンさせる際に、第2オン電圧よりも低い高い、第1オン電圧がゲート端子に印加される。これにより、半導体スイッチング素子のターンオン時間を短くできる。 Furthermore, when the semiconductor switching element is turned on, a first on-voltage that is lower than the second on-voltage is applied to the gate terminal. Thereby, the turn-on time of the semiconductor switching element can be shortened.

 また、本発明の発光装置は、発光素子と、発光素子への電流の供給と停止とを切り替える半導体スイッチング素子と、半導体スイッチング素子を駆動する、上記ゲート駆動回路を備える。 The light-emitting device of the present invention includes a light-emitting element, a semiconductor switching element that switches between supply and stop of current to the light-emitting element, and the gate drive circuit that drives the semiconductor switching element.

 この構成によれば、簡易な回路構成のゲート駆動回路により、発光素子のターンオン時間およびターンオフ時間の短い発光装置を実現できる。 According to this configuration, a light-emitting device with a short turn-on time and turn-off time of the light-emitting element can be realized by a gate drive circuit having a simple circuit configuration.

 さらに、半導体スイッチング素子のオン期間の終了時に、半導体スイッチング素子に印加されるゲート電位差は、第1オン電圧よりも小さい、第2オン電圧がゲート端子に印加される。そのため、スイッチング素子のゲート寄生容量に蓄積されている電荷の量は、オン期間において第1オン電圧が印加され続ける場合と比べて少ない。これにより、ターンオフの際にゲート寄生容量から素早く電荷を引き抜いて、ターンオフ時間を短くできる。その結果、発光素子に流れる電流の供給と停止とを素早く切り替えることができる。 Furthermore, at the end of the ON period of the semiconductor switching element, a gate potential difference applied to the semiconductor switching element is smaller than the first ON voltage, and a second ON voltage is applied to the gate terminal. For this reason, the amount of charge accumulated in the gate parasitic capacitance of the switching element is smaller than that in the case where the first on-voltage is continuously applied in the on-period. As a result, charges can be quickly extracted from the gate parasitic capacitance at the time of turn-off, and the turn-off time can be shortened. As a result, it is possible to quickly switch between supply and stop of the current flowing through the light emitting element.

図1は、本発明の実施の形態1に係るゲート駆動回路の構成を示すブロック図である。FIG. 1 is a block diagram showing a configuration of a gate drive circuit according to Embodiment 1 of the present invention. 図2は、同実施の形態に係るゲート駆動回路におけるオン電圧印加部の出力信号を示すタイムチャート、および、ゲート駆動回路により駆動される半導体スイッチング素子におけるゲート端子の電圧を示すタイムチャートである。FIG. 2 is a time chart showing the output signal of the on-voltage applying unit in the gate drive circuit according to the embodiment, and a time chart showing the voltage of the gate terminal in the semiconductor switching element driven by the gate drive circuit. 図3は、本発明の実施の形態2に係るゲート駆動回路の構成を示すブロック図である。FIG. 3 is a block diagram showing the configuration of the gate drive circuit according to Embodiment 2 of the present invention. 図4は、本発明の実施の形態3に係るゲート駆動回路の構成を示すブロック図である。FIG. 4 is a block diagram showing the configuration of the gate drive circuit according to Embodiment 3 of the present invention. 図5は、同実施の形態に係るゲート駆動回路におけるオン電圧印加部の出力信号を示すタイムチャート、および、ゲート駆動回路により駆動される半導体スイッチング素子におけるゲート端子の電圧を示すタイムチャートである。FIG. 5 is a time chart showing the output signal of the on-voltage applying unit in the gate drive circuit according to the embodiment, and a time chart showing the voltage of the gate terminal in the semiconductor switching element driven by the gate drive circuit. 図6は、本発明の実施の形態4に係るゲート駆動回路の構成を示すブロック図である。FIG. 6 is a block diagram showing the configuration of the gate drive circuit according to Embodiment 4 of the present invention.

 以下、本発明の実施の形態に係るゲート駆動回路およびゲート駆動回路を備える発光装置について、図面を参酌しながら説明する。 Hereinafter, a gate drive circuit and a light-emitting device including the gate drive circuit according to embodiments of the present invention will be described with reference to the drawings.

 (実施の形態1)
 以下、本実施の形態1に係るゲート駆動回路およびゲート駆動回路を備える発光装置の回路構成について、図1を用いて説明する。
(Embodiment 1)
Hereinafter, the circuit configuration of the light emitting device including the gate driving circuit and the gate driving circuit according to the first embodiment will be described with reference to FIG.

 図1は、本発明の実施の形態1に係るゲート駆動回路2およびゲート駆動回路2を備える発光装置の構成を示すブロック図である。 FIG. 1 is a block diagram showing a configuration of a light emitting device including a gate drive circuit 2 and a gate drive circuit 2 according to Embodiment 1 of the present invention.

 図1に示すように、本実施の形態の発光装置1は、ゲート駆動回路2、発光素子LD、および、半導体スイッチング素子Q1などを備える。 As shown in FIG. 1, the light emitting device 1 of the present embodiment includes a gate drive circuit 2, a light emitting element LD, a semiconductor switching element Q1, and the like.

 なお、本実施の形態の発光装置1は、例えば三次元の距離分布画像を作成するTOF(Time Of Flight)方式の距離画像カメラにおける光源として用いられる。TOF方式の距離画像カメラは、まず、被写体にレーザー光を拡散照射する。つぎに、反射光を二次元の画像センサで測定する。そして、光の飛行時間により被写体までの距離を計算する。これにより、三次元の距離分布画像を作成するカメラである。 The light emitting device 1 according to the present embodiment is used as a light source in a distance image camera of a TOF (Time Of Flight) system that creates a three-dimensional distance distribution image, for example. The TOF range image camera first irradiates a subject with laser light. Next, the reflected light is measured with a two-dimensional image sensor. Then, the distance to the subject is calculated based on the flight time of light. Thus, the camera creates a three-dimensional distance distribution image.

 発光素子LDは、電流が供給されることにより発光する、例えばレーザーダイオードなどで構成される。なお、本実施の形態では、例えば2端子を有するレーザーダイオードを例に説明する。 The light emitting element LD is configured by, for example, a laser diode that emits light when supplied with current. In this embodiment, a laser diode having two terminals will be described as an example.

 また、本実施の形態の発光装置1は、半導体スイッチング素子Q1の導通と非導通との切り替えを、例えばナノ秒単位で繰り返し、発光素子LDの発光と非発光との切り替えを高速で繰り返すように動作する。 In addition, the light emitting device 1 of the present embodiment repeats switching between conduction and non-conduction of the semiconductor switching element Q1 in units of nanoseconds, for example, and repeatedly switches light emission and non-light emission of the light emitting element LD at high speed. Operate.

 半導体スイッチング素子Q1は、第1端子t、第1端子tよりも高電位側に接続される第2端子t、および、ゲート端子tを有する。半導体スイッチング素子Q1は、ゲート端子tに、閾値電圧以上の電圧が印加されると、第1端子tと第2端子tとの間が導通する。本実施の形態の半導体スイッチング素子Q1は、Nチャネル型のMOSFETで構成される。そのため、第1端子tに相当するソース端子、第2端子tに相当するドレイン端子、および、ゲート端子tを有する。なお、上記閾値電圧とは、ゲート端子tと第1端子(ソース端子t)との間の電位差である。本実施の形態の閾値電圧は、例えば+3Vである。 Semiconductor switching elements Q1 has a first terminal t 1, the second terminal t 2 is connected to the high potential side of the first terminal t 1, and has a gate terminal t G. Semiconductor switching element Q1, the gate terminal t G, the threshold voltage or higher is applied between the first terminal t 1 and the second terminal t 2 is conductive. The semiconductor switching element Q1 of the present embodiment is composed of an N channel type MOSFET. Therefore, a source terminal corresponding to the first terminal t 1, the drain terminal corresponding to the second terminal t 2, and the gate terminal t G. Note that the above threshold voltage, the potential difference between the gate terminal t G and the first terminal (the source terminal t 1). The threshold voltage in the present embodiment is, for example, + 3V.

 ゲート駆動回路2は、オン電圧印加部3と、オン電圧可変部4と、オフ電圧印加部5などを備える。 The gate drive circuit 2 includes an on-voltage application unit 3, an on-voltage variable unit 4, an off-voltage application unit 5, and the like.

 オン電圧印加部3は、例えばドライバICで構成され、図示しないパルス信号を生成するFPGA(Field Programmable Gate Array)、第1電圧電源V1、GNDに、それぞれ接続されている。FPGAは、外部から入力された撮影モード情報に応じて、所定のパルス幅のパルス信号をオン電圧印加部3に出力する。第1電圧電源V1は、所定の電圧を印加する定電圧電源である。第1電圧電源V1は、半導体スイッチング素子Q1のゲート端子tに閾値電圧以上の高い第1オン電圧を印加する。本実施の形態の第1電圧電源V1は、所定の電圧として、第1定電圧V(例えば、+17V)を、ゲート端子tに印加する。 The on-voltage application unit 3 includes, for example, a driver IC, and is connected to an FPGA (Field Programmable Gate Array) that generates a pulse signal (not shown), a first voltage power supply V1, and a GND. The FPGA outputs a pulse signal having a predetermined pulse width to the on-voltage applying unit 3 in accordance with imaging mode information input from the outside. The first voltage power supply V1 is a constant voltage power supply that applies a predetermined voltage. The first voltage source V1 applies a first ON voltage higher than the threshold voltage to the gate terminal t G of the semiconductor switching element Q1. The first voltage source V1 of the embodiment, as the predetermined voltage, the first constant voltage V 1 (e.g., + 17 V) to be applied to the gate terminal t G.

 オン電圧可変部4は、コンデンサC1と、第1微分回路7と、第2電圧電源V2などで構成される。コンデンサC1は、オン電圧印加部3の出力端子3aと、半導体スイッチング素子Q1のゲート端子tとの間に接続される。第1微分回路7は、コンデンサC1とゲート端子tとの接続点J1に一端が接続される直列回路6を含む。第2電圧電源V2は、直列回路6の第1抵抗R1の他端と接続される。なお、本実施の形態の直列回路6は、上記接続点J1にアノードが接続されるダイオードD1、および、一端がダイオードD1のカソードと直列接続される第1抵抗R1を含む。第2電圧電源V2は、所定の電圧を印加する定電圧電源である。第2電圧電源V2は、半導体スイッチング素子Q1のゲート端子tに、第1オン電圧よりも低く、かつ、半導体スイッチング素子Q1の閾値電圧以上の第2オン電圧が印加する。本実施の形態の第2電圧電源V2は、所定の電圧として、第2定電圧V(例えば、+5V)を、オン電圧可変部4に印加する。 The on-voltage variable unit 4 includes a capacitor C1, a first differentiation circuit 7, a second voltage power supply V2, and the like. Capacitor C1, the output terminal 3a of the on-voltage applying unit 3 is connected between the gate terminal t G of the semiconductor switching element Q1. First differentiating circuit 7 includes series circuit 6, one end of which is connected to the connection point J1 of the capacitor C1 and the gate terminal t G. The second voltage power supply V2 is connected to the other end of the first resistor R1 of the series circuit 6. The series circuit 6 of the present embodiment includes a diode D1 whose anode is connected to the connection point J1, and a first resistor R1 whose one end is connected in series with the cathode of the diode D1. The second voltage power supply V2 is a constant voltage power supply that applies a predetermined voltage. The second voltage source V2, to the gate terminal t G of the semiconductor switching elements Q1, lower than the first ON voltage and the threshold voltage or more second on-voltage of the semiconductor switching element Q1 is applied. The second voltage power supply V2 of the present embodiment applies a second constant voltage V 2 (for example, +5 V) as a predetermined voltage to the on-voltage variable unit 4.

 オフ電圧印加部5は、コンデンサC1、および、半導体スイッチング素子Q1のゲート端子tと第1端子t(ソース端子)との間に接続された第2抵抗R2を含み、第2微分回路を構成する。このとき、第2抵抗R2は、一端が上記接続点J1に、他端がGNDに接続される。 Off voltage applying unit 5, a capacitor C1, and includes a second resistor R2 connected between the gate terminal t G and the first terminal t 1 of the semiconductor switching elements Q1 (source terminal), the second differentiating circuit Constitute. At this time, the second resistor R2 has one end connected to the connection point J1 and the other end connected to GND.

 半導体スイッチング素子Q1は、第1端子tと第2端子tとの間に、第3抵抗R3が、並列に接続される。第3抵抗R3は、レーザーダイオードで構成される発光素子LDに微小電流を流すことにより、レーザーダイオードに電圧降下を発生させ、半導体スイッチング素子Q1の第2端子tの電位を下げる。これにより、スイッチング時の電圧変化を少なくし、半導体スイッチング素子Q1におけるゲート端子t第1端子tと第2端子tとの寄生容量の影響を低減する。 Semiconductor switching elements Q1, during the first terminal t 1 and the second terminal t 2, the third resistor R3, connected in parallel. The third resistor R3, by passing a small current to the configured light emitting element LD laser diode generates a voltage drop to the laser diode to lower the potential of the second terminal t 2 of the semiconductor switching element Q1. Thus, by reducing the voltage change at the time of switching, reducing the effect of parasitic capacitance between the gate terminal t G first terminal t 1 and the second terminal t 2 of the semiconductor switching elements Q1.

 なお、第1微分回路7および第2微分回路(オフ電圧印加部5)の回路構成は、上述の構成に限定されず、他の構成であってもよい。 Note that the circuit configurations of the first differentiating circuit 7 and the second differentiating circuit (off-voltage applying unit 5) are not limited to the above-described configurations, and may be other configurations.

 以上のように、本実施の形態のゲート駆動回路2およびゲート駆動回路2を備える発光装置1は構成される。 As described above, the light emitting device 1 including the gate driving circuit 2 and the gate driving circuit 2 of the present embodiment is configured.

 以下に、上記ゲート駆動回路2およびゲート駆動回路2を備える発光装置1の動作について、図2を用いて、説明する。 Hereinafter, the operation of the light emitting device 1 including the gate driving circuit 2 and the gate driving circuit 2 will be described with reference to FIG.

 図2は、同実施の形態に係るゲート駆動回路におけるオン電圧印加部の出力信号を示すタイムチャート、および、ゲート駆動回路により駆動される半導体スイッチング素子におけるゲート端子の電圧を示すタイムチャートである。なお、図2の上側のタイムチャートは、ゲート駆動回路2のオン電圧印加部3の出力信号を示す。図2の下側のタイムチャートは、ゲート駆動回路2により駆動される半導体スイッチング素子Q1のゲート端子tに印加される電圧を示す。 FIG. 2 is a time chart showing the output signal of the on-voltage applying unit in the gate drive circuit according to the embodiment, and a time chart showing the voltage of the gate terminal in the semiconductor switching element driven by the gate drive circuit. The upper time chart of FIG. 2 shows the output signal of the on-voltage application unit 3 of the gate drive circuit 2. Lower time chart in Figure 2 shows the voltage applied to the gate terminal t G of the semiconductor switching elements Q1 which is driven by the gate drive circuit 2.

 図2に示すように、オン電圧印加部3は、FPGAにより出力されるパルス信号に基づいて、パルス信号がHIGHのときに、第1オン電圧VON1の電圧で、HIGH信号をオン電圧可変部4に出力する。一方、オン電圧印加部3は、パルス信号がLOWのときに、0Vの電圧で、LOW信号をオン電圧可変部4に出力する。なお、オン電圧印加部3がHIGH信号を出力する期間は、半導体スイッチング素子Q1のオン期間TONに相当する。オン電圧印加部3がLOW信号を出力する期間は、半導体スイッチング素子Q1のオフ期間TOFFに相当する。 As shown in FIG. 2, the on-voltage applying unit 3 uses the voltage of the first on-voltage V ON1 to turn on the HIGH signal based on the pulse signal output from the FPGA, when the pulse signal is HIGH. 4 is output. On the other hand, the on-voltage applying unit 3 outputs a LOW signal to the on-voltage variable unit 4 at a voltage of 0 V when the pulse signal is LOW. The period in which the ON voltage applying unit 3 outputs a HIGH signal corresponds to the ON period T ON of the semiconductor switching element Q1. The period during which the on-voltage applying unit 3 outputs a LOW signal corresponds to the off-period T OFF of the semiconductor switching element Q1.

 半導体スイッチング素子Q1のターンオンの際、オン期間TONの開始時において、オン電圧印加部3の出力端子3aからコンデンサC1に、第1電圧電源V1に設定される第1定電圧V(例えば、+17V)相当のHIGH信号が出力される。これにより、半導体スイッチング素子Q1のゲート端子tに印加されるオン電圧は、第1微分回路7により第1オン電圧VON1(例えば、+17V)まで急激に上昇する。このとき、コンデンサC1に、電荷が蓄積される。また、半導体スイッチング素子Q1のゲート端子tと第1端子t(ソース端子)との間の寄生容量(以下、「ゲート寄生容量」と言う)にも、電荷が蓄積される。 Upon turn-on of the semiconductor switching elements Q1, at the beginning of the ON period T ON, the output terminal 3a of the on-voltage applying unit 3 to the capacitor C1, the first constant voltages V 1 is set to a first voltage source V1 (for example, A HIGH signal corresponding to + 17V is output. Accordingly, the ON voltage applied to the gate terminal t G of the semiconductor switching element Q1, the first differentiating circuit 7 first on-voltage V ON1 (e.g., + 17 V) until suddenly increases. At this time, charges are accumulated in the capacitor C1. Further, parasitic capacitance between the gate terminal t G and the first terminal t 1 (source terminal) of the semiconductor switching elements Q1 (hereinafter, referred to as "gate parasitic capacitance") also, the charge is accumulated.

 そして、オン電圧の上昇に伴い、半導体スイッチング素子Q1のゲート端子tに印加される電圧が、閾値電圧(例えば、+3V)以上となった時点で、第1端子tおよび第2端子tは、導通状態となる。これにより、半導体スイッチング素子Q1の第2端子tから第1端子t電流が流れる。本実施の形態の場合、半導体スイッチング素子Q1のソース端子tおよびドレイン端子tが導通状態となり、ドレイン電流が流れる。これにより、第2電圧電源V2から第4抵抗R4を介して、発光素子LDに電流が供給され、発光素子LDが発光する。 Then, with the rise of the ON voltage, the voltage applied to the gate terminal t G of the semiconductor switching element Q1, the threshold voltage (e.g., + 3V) when it becomes more, the first terminal t 1 and the second terminal t 2 Is in a conductive state. Thus, the first terminal t 1 from the second terminal t 2 of the semiconductor switching elements Q1, a current flows. In this embodiment, it becomes conductive state source terminal t 1 and the drain terminal t 2 of the semiconductor switching elements Q1, the drain current flows. As a result, current is supplied from the second voltage power supply V2 to the light emitting element LD via the fourth resistor R4, and the light emitting element LD emits light.

 つぎに、ゲート端子tに印加されるオン電圧は、閾値電圧を超え、第1オン電圧VON1(例えば、+17V)まで急激に上昇する。その後、オン電圧は、第1微分回路7の時定数で低下する。そして、オン電圧は、第2電圧電源V2に設定される第2定電圧V(例えば、+5V)と、ダイオードD1の両端間に生じる電圧VD1(例えば、+0.6V)との合計値である第2オン電圧VON2(例えば、+5.6V)で維持される。なお、オン期間TONにおいて、第1オン電圧VON1が印加された後、ゲート端子tに印加される電圧は(図2の下側のα領域の波形に相当)は、下方に凸状の傾きで徐々に減少する。 Then, on the voltage applied to the gate terminal t G is greater than the threshold voltage, the first on-voltage V ON1 (e.g., + 17 V) until suddenly increases. Thereafter, the ON voltage decreases with the time constant of the first differentiating circuit 7. The ON voltage is a total value of the second constant voltage V 2 (for example, + 5V) set to the second voltage power supply V2 and the voltage V D1 (for example, + 0.6V) generated between both ends of the diode D1. It is maintained at a certain second ON voltage V ON2 (for example, +5.6 V). Note that in the on-period T ON, after the first on-voltage V ON1 is applied, the voltage applied to the gate terminal t G (corresponding to the waveform of the lower α region in FIG. 2) is convex downward It gradually decreases with the slope of.

 ゲート端子tに第2オン電圧VON2(例えば、+5.6V)が印加された状態においても、ゲート端子tに印加される電圧は、閾値電圧(例えば、+3V)以上である、そのため、半導体スイッチング素子Q1の導通状態は維持され、発光素子LDは発光し続ける。この状態においても、コンデンサC1には、電荷が蓄積される。具体的には、コンデンサC1は、第1オン電圧VON1(例えば、+17V)と、第2オン電圧VON2(例えば、+5.6V)との電圧差(例えば、+11.4V)で充電される。 The gate terminal t G second on-voltage V ON2 (e.g., + 5.6 V) even in a state of being applied, the voltage applied to the gate terminal t G is the threshold voltage (e.g., + 3V) is greater than or equal, therefore, The conduction state of the semiconductor switching element Q1 is maintained, and the light emitting element LD continues to emit light. Even in this state, charges are accumulated in the capacitor C1. Specifically, the capacitor C1 is charged with the first on-voltage V ON1 (e.g., + 17 V) and the voltage difference between the second on-voltage V ON2 (e.g., + 5.6 V) (e.g., + 11.4 V) .

 一方、半導体スイッチング素子Q1のターンオフの際、オフ期間TOFFの開始時において、オン電圧印加部3の出力端子3aからコンデンサC1に、LOW信号が出力される。これにより、コンデンサC1に充電されていた電圧差(例えば、+11.4V)に相当する電荷が放電され、半導体スイッチング素子Q1のゲート端子tに逆バイアスが印加される。逆バイアスにより、ゲート端子tと第1端子t(ソース端子)との間の寄生容量から電荷が引き抜かれる。そして、半導体スイッチング素子Q1のゲート端子tに印加される電圧は、第1オフ電圧VOFF1(例えば、-11.4V)まで急激に低下する。 On the other hand, when the semiconductor switching element Q1 is turned off, a LOW signal is output from the output terminal 3a of the on-voltage applying unit 3 to the capacitor C1 at the start of the off period TOFF . Accordingly, the voltage difference which has been charged in the capacitor C1 (for example, + 11.4 V) corresponding to the charge is discharged in a reverse bias is applied to the gate terminal t G of the semiconductor switching element Q1. The reverse bias charge is withdrawn from the parasitic capacitance between the gate terminal t G and the first terminal t 1 (source terminal). Then, the voltage applied to the gate terminal t G of the semiconductor switching element Q1, a first OFF voltage V OFF1 (e.g., -11.4V) until drops rapidly.

 このとき、ゲート端子tに印加される電圧が、閾値電圧(例えば、+3V)未満となった時点で、半導体スイッチング素子Q1は非導通状態となる。これにより、発光素子LDへの電流が停止され、発光素子LDは非発光状態となる。 At this time, the voltage applied to the gate terminal t G is the threshold voltage (e.g., + 3V) when it becomes less than, the semiconductor switching element Q1 is turned off. Thereby, the current to the light emitting element LD is stopped, and the light emitting element LD enters a non-light emitting state.

 つぎに、ゲート端子tに印加される電圧は、閾値電圧未満から、第1オフ電圧VOFF1(例えば、-11.4V)まで急激に低下する。その後、電圧は、オフ電圧印加部5(第2微分回路)の時定数で上昇する。そして、ゲート端子tに印加される電圧は、第2オフ電圧VOFF2(例えば、0V)で維持される。なお、オフ期間TOFFにおいて、第1オフ電圧VOFF1が印加された後、ゲート端子tに印加される電圧は(図2の下側のβ領域の波形に相当)は、上方に凸状の傾きで徐々に上昇する。 Then, the voltage applied to the gate terminal t G is from less than the threshold voltage, the first off-voltage V OFF1 (e.g., -11.4V) until drops rapidly. Thereafter, the voltage rises with the time constant of the off-voltage applying unit 5 (second differential circuit). Then, the voltage applied to the gate terminal t G is maintained at the second turn-off voltage V OFF2 (e.g., 0V). Note that in the OFF period T OFF, after the first off-voltage V OFF1 is applied, the voltage applied to the gate terminal t G (corresponding to the waveform of the lower β region of FIG. 2) is convex upward It gradually rises with a slope of.

 ゲート端子tに第2オフ電圧VOFF2(例えば、0V)が印加された状態においても、ゲート端子tに印加される電圧は、閾値電圧(例えば、+3V)よりも低い。そのため、半導体スイッチング素子Q1の非導通状態は維持され、発光素子LDは非発光状態が維持される。 The second off-voltage V OFF2 to a gate terminal t G (e.g., 0V) even in a state where it is applied, the voltage applied to the gate terminal t G is the threshold voltage (e.g., + 3V) lower than. Therefore, the non-conducting state of the semiconductor switching element Q1 is maintained, and the light emitting element LD is maintained in the non-light emitting state.

 そして、上記半導体スイッチング素子Q1は、オン期間TONとオフ期間TOFFの一連の動作を繰り返す。これにより、発光素子LDの発光および非発光の切り替え動作が、繰り返し実行される。 The semiconductor switching element Q1 repeats a series of operations of an on period T ON and an off period T OFF . As a result, the switching operation of the light emitting element LD between light emission and non-light emission is repeatedly executed.

 以上のように、ゲート駆動回路2およびゲート駆動回路2を備える発光装置1は動作する。 As described above, the gate driving circuit 2 and the light emitting device 1 including the gate driving circuit 2 operate.

 以下、上記構成および動作による効果について、説明する。 The effects of the above configuration and operation will be described below.

 まず、ゲート駆動回路2は、半導体スイッチング素子Q1のオン期間TONの終了時において、第1オン電圧VON1(例えば、+17V)よりも低い、第2オン電圧VON2(例えば、+5.6V)がゲート端子tに印加されている。そのため、半導体スイッチング素子Q1のゲート寄生容量に蓄積されている電荷の量は、オン期間TONにおいて、一定の第1オン電圧VON1(例えば、+17V)が印加され続ける場合と比べて少ない。これにより、半導体スイッチング素子Q1のターンオフの際に、ゲート寄生容量から素早く電荷を引き抜くことができる。その結果、半導体スイッチング素子Q1のターンオフ時間を短くできる。 First, the gate driving circuit 2, at the end of the ON period T ON of the semiconductor switching elements Q1, first ON voltage V ON1 (e.g., + 17 V) lower than the second on-voltage V ON2 (e.g., + 5.6 V) There is applied to the gate terminal t G. Therefore, the amount of charges accumulated in the gate parasitic capacitance of the semiconductor switching element Q1 is in the on-period T ON, constant first ON voltage V ON1 (e.g., + 17 V) smaller than when continues to be applied. As a result, when the semiconductor switching element Q1 is turned off, charges can be quickly extracted from the gate parasitic capacitance. As a result, the turn-off time of the semiconductor switching element Q1 can be shortened.

 また、ゲート駆動回路2は、半導体スイッチング素子Q1をターンオンさせる際に、第1端子t(ソース端子)を基準とした第2オン電圧VON2(例えば、+5.6V)と比べて、例えば2倍以上の第1オン電圧VON1(例えば、+17V)をゲート端子tに印加する。そのため、ゲート端子tのオン電圧が、閾値電圧を超えるまでの時間が短くなる。これにより、半導体スイッチング素子Q1をターンオンさせる際の、ターンオン時間をさらに短くできる。 In addition, when the semiconductor switching element Q1 is turned on, the gate driving circuit 2 has, for example, 2 as compared with the second on-voltage V ON2 (for example, +5.6 V) with respect to the first terminal t 1 (source terminal). more than double of the first on-voltage V ON1 (e.g., + 17 V) is applied to the gate terminal t G a. Therefore, the ON voltage of the gate terminal t G is the time to exceed the threshold voltage becomes short. Thereby, the turn-on time when the semiconductor switching element Q1 is turned on can be further shortened.

 また、ゲート駆動回路2は、半導体スイッチング素子Q1をターンオンさせる直前において、ゲート端子tに、第1オフ電圧VOFF1(例えば、-11.4V)よりも高い、第2オフ電圧VOFF2(例えば、0V)を、印加する。そのため、半導体スイッチング素子Q1をターンオンさせる際に、一定の第1オフ電圧VOFF1を印加し続ける場合に比べて、ターンオンさせる直前の電圧と閾値電圧との差が小さい。これにより、半導体スイッチング素子Q1のターンオン時間を、さらに短くできる。 Further, the gate driving circuit 2 has a second off voltage V OFF2 (for example, higher than the first off voltage V OFF1 (for example, −11.4 V)) applied to the gate terminal t G immediately before turning on the semiconductor switching element Q1. , 0V) is applied. Therefore, when the semiconductor switching element Q1 is turned on, the difference between the voltage immediately before turning on and the threshold voltage is small compared to the case where the constant first off voltage VOFF1 is continuously applied. Thereby, the turn-on time of the semiconductor switching element Q1 can be further shortened.

 また、発光装置1は、第2電圧電源V2で、発光素子LDへの電流の供給、および、ゲート端子tへの第2オン電圧VON2の印加の両方を行うように構成している。そのため、別々の電源で印加する構成と比べて、発光装置1を小型化できる。 Further, the light emitting device 1, the second voltage source V2, the current supply to the light emitting element LD, and is configured to perform both the application of the second on-voltage V ON2 to the gate terminal t G. Therefore, the light-emitting device 1 can be reduced in size as compared with a configuration in which application is performed with separate power sources.

 (実施の形態2)
 以下、本実施の形態2に係るゲート駆動回路12およびゲート駆動回路12を備える発光装置11の回路構成について、図3を用いて説明する。
(Embodiment 2)
Hereinafter, the circuit configuration of the light emitting device 11 including the gate driving circuit 12 and the gate driving circuit 12 according to the second embodiment will be described with reference to FIG.

 図3は、本発明の実施の形態2に係るゲート駆動回路12およびゲート駆動回路12を備える発光装置11の構成を示すブロック図である。 FIG. 3 is a block diagram showing a configuration of the light emitting device 11 including the gate drive circuit 12 and the gate drive circuit 12 according to Embodiment 2 of the present invention.

 なお、本実施の形態は、ゲート駆動回路12におけるオン電圧可変部14の構成が、実施の形態1とは異なる。これ以外の構成については同一である。そのため、実施の形態2における実施の形態1と同一の構成については、同一の符号を付して、その説明を省略する。 In this embodiment, the configuration of the on-voltage variable section 14 in the gate drive circuit 12 is different from that in the first embodiment. Other configurations are the same. Therefore, the same reference numerals are given to the same configurations in the second embodiment as those in the first embodiment, and the description thereof is omitted.

 図3に示すように、本実施の形態の発光装置11は、ゲート駆動回路12、発光素子LD、半導体スイッチング素子Q1などを備える。 As shown in FIG. 3, the light emitting device 11 of the present embodiment includes a gate driving circuit 12, a light emitting element LD, a semiconductor switching element Q1, and the like.

 ゲート駆動回路12は、オン電圧印加部3と、オン電圧可変部14と、オフ電圧印加部5などを備える。 The gate drive circuit 12 includes an on-voltage application unit 3, an on-voltage variable unit 14, an off-voltage application unit 5, and the like.

 オン電圧可変部14は、コンデンサC1と、第1微分回路7と、ツェナーダイオードZDなどで構成される。コンデンサC1は、オン電圧印加部3の出力端子3aと、半導体スイッチング素子Q1のゲート端子tとの間に接続される。第1微分回路7は、コンデンサC1と、半導体スイッチング素子Q1のゲート端子tとの接続点J1に一端が接続される直列回路6を含む。直列回路6は、上記接続点J1にアノードが接続されるダイオードD1、および、一端がダイオードD1のカソードと直列接続される第1抵抗R1を含む。ツェナーダイオードZDは、カソードが第1抵抗R1の他端(第1抵抗R1の両端のうちダイオードD1と接続されていない端部)に接続される。そして、ツェナーダイオードZDのアノードは、半導体スイッチング素子Q1の第1端子t(ソース端子)に接続される。 The on-voltage variable unit 14 includes a capacitor C1, a first differentiation circuit 7, a Zener diode ZD, and the like. Capacitor C1, the output terminal 3a of the on-voltage applying unit 3 is connected between the gate terminal t G of the semiconductor switching element Q1. First differentiating circuit 7 includes a capacitor C1, a series circuit 6 having one end connected to the connection point J1 and the gate terminal t G of the semiconductor switching element Q1. The series circuit 6 includes a diode D1 whose anode is connected to the connection point J1, and a first resistor R1 whose one end is connected in series with the cathode of the diode D1. The Zener diode ZD has a cathode connected to the other end of the first resistor R1 (an end of the first resistor R1 that is not connected to the diode D1). The anode of the Zener diode ZD is connected to the first terminal t 1 (source terminal) of the semiconductor switching element Q1.

 なお、ツェナーダイオードZDのツェナー電圧値は、閾値電圧(例えば、+3V)よりも高く、例えば+5Vである。そのため、本実施の形態のオン電圧可変部14においては、ツェナー電圧値が、実施の形態1の第2電圧電源V2で設定される第2定電圧Vに相当する。 Note that the Zener voltage value of the Zener diode ZD is higher than a threshold voltage (for example, + 3V), for example, + 5V. Therefore, in the on-voltage varying unit 14 of this embodiment, the Zener voltage value corresponds to a second constant voltage V 2 which is set by the second voltage source V2 of the first embodiment.

 以上のように、本実施の形態のゲート駆動回路12およびゲート駆動回路12を備える発光装置11は構成され、以下のように動作する。 As described above, the gate driving circuit 12 and the light emitting device 11 including the gate driving circuit 12 according to the present embodiment are configured and operate as follows.

 つまり、本実施の形態の発光装置11は、実施の形態1と同様に、半導体スイッチング素子Q1のターンオンの際に、ゲート端子tに印加されるオン電圧が、第1微分回路7により第1オン電圧VON1(例えば、+17V)まで急激に上昇する。その後、オン電圧は、第1微分回路7の時定数で低下する。そして、オン電圧は、実施の形態1の第2定電圧Vに相当するツェナーダイオードZDのツェナー電圧値(例えば、+5V)と、ダイオードD1の両端間に生じる電圧VD1(例えば、+0.6V)との合計値である第2オン電圧VON2(例えば、+5.6V)で維持される。 That is, the light emitting device 11 of the present embodiment, as in the first embodiment, during the turn-on of the semiconductor switching elements Q1, on the voltage applied to the gate terminal t G is the first by a first differentiating circuit 7 The voltage rapidly rises to the ON voltage V ON1 (for example, + 17V). Thereafter, the ON voltage decreases with the time constant of the first differentiating circuit 7. Then, the ON voltage is a Zener voltage value (for example, +5 V) of the Zener diode ZD corresponding to the second constant voltage V 2 of the first embodiment, and a voltage V D1 (for example, +0.6 V) generated between both ends of the diode D1. ) And the second on-voltage V ON2 (for example, +5.6 V).

 これにより、実施の形態1の発光装置1と同様に、オン期間TONの終了時において、第1オン電圧VON1よりも低い、第2オン電圧VON2がゲート端子tに印加されている。そのため、半導体スイッチング素子Q1のゲート寄生容量に蓄積されている電荷の量は、オン期間TONにおいて、一定の第1オン電圧VON1が印加され続ける場合と比べて少ない。これにより、半導体スイッチング素子Q1のターンオフの際に、ゲート寄生容量から素早く電荷を引き抜いて、半導体スイッチング素子Q1のターンオフ時間を短くできる。その結果、発光素子LDに流れる電流の供給と停止とを素早く切り替えることができる。 Thus, similarly to the light emitting device 1 of the first embodiment, at the end of the ON period T ON, lower than the first ON voltage V ON1, second on-voltage V ON2 is applied to the gate terminal t G . Therefore, the amount of charges accumulated in the gate parasitic capacitance of the semiconductor switching element Q1 is in the on-period T ON, smaller compared with the case where a certain first on-voltage V ON1 is continuously applied. As a result, when the semiconductor switching element Q1 is turned off, charges are quickly extracted from the gate parasitic capacitance, and the turn-off time of the semiconductor switching element Q1 can be shortened. As a result, it is possible to quickly switch between supply and stop of the current flowing through the light emitting element LD.

 (実施の形態3)
 以下、本実施の形態3に係るゲート駆動回路22およびゲート駆動回路22を備える発光装置21の回路構成について、図4を用いて説明する。
(Embodiment 3)
Hereinafter, the circuit configuration of the light emitting device 21 including the gate driving circuit 22 and the gate driving circuit 22 according to the third embodiment will be described with reference to FIG.

 図4は、本発明の実施の形態3に係るゲート駆動回路22の構成を示すブロック図である。 FIG. 4 is a block diagram showing a configuration of the gate drive circuit 22 according to Embodiment 3 of the present invention.

 なお、本実施の形態3は、半導体スイッチング素子Q2を、Pチャネル型のMOSFETで構成した点などが、実施の形態1とは異なる。そこで、実施の形態3における実施の形態1と同一の構成については、同一の符号を付して、その説明を省略する。 The third embodiment is different from the first embodiment in that the semiconductor switching element Q2 is configured by a P-channel type MOSFET. Therefore, the same reference numerals are given to the same configurations in the third embodiment as those in the first embodiment, and the description thereof is omitted.

 図4に示すように、本実施の形態の発光装置21は、ゲート駆動回路22、発光素子LD、および、半導体スイッチング素子Q2などを備える。 As shown in FIG. 4, the light emitting device 21 of the present embodiment includes a gate drive circuit 22, a light emitting element LD, a semiconductor switching element Q2, and the like.

 なお、半導体スイッチング素子Q2は、Pチャネル型MOSFETで構成される。そのため、本実施の形態の半導体スイッチング素子Q2の閾値電圧は、例えば-3Vである。 The semiconductor switching element Q2 is composed of a P-channel type MOSFET. Therefore, the threshold voltage of the semiconductor switching element Q2 in the present embodiment is, for example, −3V.

 ゲート駆動回路22は、オン電圧印加部3と、オン電圧可変部24と、オフ電圧印加部25などを備える。 The gate drive circuit 22 includes an on-voltage application unit 3, an on-voltage variable unit 24, an off-voltage application unit 25, and the like.

 オン電圧印加部3は、実施の形態1と同様に、FPGA、第1電圧電源V1、GNDにそれぞれ接続されている。第1電圧電源V1は、所定の電圧を印加する定電圧電源である。第1電圧電源V1は、半導体スイッチング素子Q2のゲート端子tに閾値電圧よりも低い、第1オン電圧を印加する。本実施の形態の第1電圧電源V1は第3電源電圧V3の電位を基準に、所定の電圧として、第1定電圧V(例えば、-17V)を、ゲート端子tに印加する。 Similarly to the first embodiment, the on-voltage applying unit 3 is connected to the FPGA, the first voltage power supply V1, and GND. The first voltage power supply V1 is a constant voltage power supply that applies a predetermined voltage. The first voltage source V1 is lower than the threshold voltage to the gate terminal t G of the semiconductor switching elements Q2, applying a first turn-on voltage. To the first voltage source V1 of the embodiment relative to the potential of the third power supply voltage V3, as the predetermined voltage, the first constant voltage V 1 (e.g., -17 V) to be applied to the gate terminal t G.

 オン電圧可変部24は、コンデンサC1と、第1微分回路27などで構成される。コンデンサC1は、オン電圧印加部3の出力端子3aと、半導体スイッチング素子Q2のゲート端子tとの間に接続される。第1微分回路27は、コンデンサC1と、半導体スイッチング素子Q2のゲート端子tとの接続点J1に一端が接続される直列回路26を含む。直列回路26は、上記接続点J1にカソードが接続されるダイオードD1、および、一端がダイオードD1のアノードと直列接続される第1抵抗R1を含む。そして、第1抵抗R1の他端は、GNDに接続される。 The on-voltage variable unit 24 includes a capacitor C1, a first differentiation circuit 27, and the like. Capacitor C1, the output terminal 3a of the on-voltage applying unit 3 is connected between the gate terminal t G of the semiconductor switching element Q2. The first differentiating circuit 27 includes a capacitor C1, a series circuit 26 of which one end is connected to the connection point J1 and the gate terminal t G of the semiconductor switching element Q2. The series circuit 26 includes a diode D1 whose cathode is connected to the connection point J1, and a first resistor R1 whose one end is connected in series with the anode of the diode D1. The other end of the first resistor R1 is connected to GND.

 オフ電圧印加部25は、コンデンサC1、および、半導体スイッチング素子Q2のゲート端子tと第1端子t(ソース端子)との間に接続された第2抵抗R2を含み、第2微分回路を構成する。このとき、第2抵抗R2は、一端が上記接続点J1に、他端が第3電圧電源V3に接続される。 Off voltage applying unit 25 includes a capacitor C1 and includes a second resistor R2 connected between the semiconductor switching element Q2 gate terminal t G and the first terminal t 1 (source terminal), the second differentiating circuit Constitute. At this time, one end of the second resistor R2 is connected to the connection point J1, and the other end is connected to the third voltage power source V3.

 半導体スイッチング素子Q2は、第1端子t(ソース端子)に、第3定電圧を出力する第3電圧電源V3が接続される。 In the semiconductor switching element Q2, a third voltage power supply V3 that outputs a third constant voltage is connected to a first terminal t 1 (source terminal).

 また、GNDと発光素子LDとの間には、第4抵抗R4が、直列に接続される。第4抵抗R4は、発光素子LDに供給される電流の大きさを調整するために設けられる。 In addition, a fourth resistor R4 is connected in series between GND and the light emitting element LD. The fourth resistor R4 is provided to adjust the magnitude of the current supplied to the light emitting element LD.

 なお、第1微分回路27および第2微分回路(オフ電圧印加部25に相当)の回路構成は、上述の構成に限定されず、他の構成であってもよい。 Note that the circuit configurations of the first differentiating circuit 27 and the second differentiating circuit (corresponding to the off-voltage applying unit 25) are not limited to the above-described configurations, and may be other configurations.

 以上のように、本実施の形態のゲート駆動回路22およびゲート駆動回路22を備える発光装置21は構成される。 As described above, the light emitting device 21 including the gate driving circuit 22 and the gate driving circuit 22 according to the present embodiment is configured.

 以下に、上記ゲート駆動回路22およびゲート駆動回路22を備える発光装置21の動作について、図5を用いて説明する。 Hereinafter, the operation of the light emitting device 21 including the gate driving circuit 22 and the gate driving circuit 22 will be described with reference to FIG.

 図5は、同実施の形態に係るゲート駆動回路22におけるオン電圧印加部3の出力信号を示すタイムチャート、および、ゲート駆動回路22により駆動される半導体スイッチング素子Q2におけるゲート端子tの電圧を示すタイムチャートである。なお、図5の上側のタイムチャートは、ゲート駆動回路22のオン電圧印加部3の出力信号を示す。図5の下側のタイムチャートは、ゲート駆動回路22により駆動される半導体スイッチング素子Q2のゲート端子tに印加される電圧を示す。 Figure 5 is a time chart showing the output signal of the on-voltage applying unit 3 in the gate drive circuit 22 according to the embodiment, and the voltage of the gate terminal t G of the semiconductor switching element Q2 which is driven by the gate drive circuit 22 It is a time chart which shows. The upper time chart of FIG. 5 shows the output signal of the on-voltage application unit 3 of the gate drive circuit 22. Lower time chart in FIG. 5 shows a voltage applied to the gate terminal t G of the semiconductor switching element Q2 which is driven by the gate drive circuit 22.

 図5に示すように、オン電圧印加部3は、FPGAにより出力されたパルス信号に基づいて、実施の形態1と同様に、HIGH信号およびLOW信号をオン電圧可変部24に出力する。パルス信号は、コンデンサC1を介して、半導体スイッチング素子Q2のゲート端子tに印加される。 As illustrated in FIG. 5, the on-voltage applying unit 3 outputs a HIGH signal and a LOW signal to the on-voltage variable unit 24 based on the pulse signal output from the FPGA, as in the first embodiment. Pulse signal via a capacitor C1, is applied to the gate terminal t G of the semiconductor switching element Q2.

 具体的には、半導体スイッチング素子Q2のターンオンの際、オン期間TONの開始時において、オン電圧印加部3の出力端子3aからコンデンサC1に、第1定電圧V(例えば、-17V)相当のLOW信号が出力される。これにより、半導体スイッチング素子Q2のゲート端子tに印加されるオン電圧は、第1微分回路7により第1オン電圧VON1(例えば、-17V)まで急激に低下する。このとき、コンデンサC1に、電荷が蓄積される。また、半導体スイッチング素子Q2のゲート寄生容量にも、電荷が蓄積される。 Specifically, when the turn-on of the semiconductor switching elements Q2, at the beginning of the ON period T ON, the output terminal 3a of the on-voltage applying unit 3 to the capacitor C1, the first constant voltage V 1 (e.g., -17 V) corresponding LOW signal is output. Accordingly, the ON voltage applied to the gate terminal t G of the semiconductor switching element Q2, the first differentiating circuit 7 first on-voltage V ON1 (e.g., -17 V) to decrease rapidly. At this time, charges are accumulated in the capacitor C1. In addition, charges are also accumulated in the gate parasitic capacitance of the semiconductor switching element Q2.

 そして、オン電圧の低下に伴い、半導体スイッチング素子Q2のゲート端子tに印加される電圧が、閾値電圧(例えば、-3V)以下となった時点で、第1端子tおよび第2端子tは、導通状態となる。これにより、半導体スイッチング素子Q2の第2端子tから第1端子t電流が流れる。本実施の形態の場合、半導体スイッチング素子Q2のソース端子tおよびドレイン端子tが導通状態となり、ドレイン電流が流れる。これにより、第3電圧電源V3から第4抵抗R4を介して、発光素子LDに電流が供給され、発光素子LDが発光する。 Along with the decrease in the ON voltage, the voltage applied to the gate terminal t G of the semiconductor switching element Q2, the threshold voltage (e.g., -3 V) when it becomes equal to or less than, the first terminal t 1 and the second terminal t 2 becomes conductive. Thereby, the first terminal t 1 current flows from the second terminal t 2 of the semiconductor switching element Q2. In this embodiment, as a source terminal t 1 and the drain terminal t 2 is the conductive state of the semiconductor switching element Q2, the drain current flows. Thereby, a current is supplied from the third voltage power supply V3 to the light emitting element LD via the fourth resistor R4, and the light emitting element LD emits light.

 つぎに、ゲート端子tに印加されるオン電圧は、閾値電圧から、第1オン電圧VON1(例えば、-17V)まで急激に低下する。その後、オン電圧は、第1微分回路7の時定数で上昇する。そして、オン電圧は、第3電圧電源V3に設定される第3定電圧(例えば、-5V)と、ダイオードD1の両端間に生じる電圧VD1(例えば、-0.6V)との合計値である第2オン電圧VON2(例えば、-5.6V)で維持される。なお、オン期間TONにおいて、第1オン電圧VON1が印加された後、ゲート端子tに印加される電圧は(図5の下側のα領域の波形に相当)は、上方に凸状の傾きで徐々に増加する。 Then, on the voltage applied to the gate terminal t G is the threshold voltage, the first on-voltage V ON1 (e.g., -17 V) to decrease rapidly. Thereafter, the ON voltage increases with the time constant of the first differentiating circuit 7. The ON voltage is a total value of a third constant voltage (for example, −5V) set in the third voltage power supply V3 and a voltage V D1 (for example, −0.6V) generated across the diode D1. there second on-voltage V ON2 (e.g., -5.6V) is maintained at. Note that in the on-period T ON, after the first on-voltage V ON1 is applied, the voltage applied to the gate terminal t G (corresponding to the waveform of the lower α region in FIG. 5) is convex upward It gradually increases with the slope of.

 ゲート端子tに第2オン電圧VON2(例えば、-5.6V)が印加された状態においても、ゲート端子tに印加される電圧は、閾値電圧(例えば、-3V)よりも低い。そのため、半導体スイッチング素子Q2の導通状態は維持され、発光素子LDは発光し続ける。この状態においても、コンデンサC1には、電荷が蓄積される。具体的には、コンデンサC1は、第1オン電圧VON1(例えば、-17V)と第2オン電圧VON2(例えば、-5.6V)との電圧差(例えば、-11.4V)で充電される。 Second on-voltage V ON2 to the gate terminal t G (e.g., -5.6V) even in a state where it is applied, the voltage applied to the gate terminal t G is the threshold voltage (e.g., -3 V) is lower than. Therefore, the conduction state of the semiconductor switching element Q2 is maintained, and the light emitting element LD continues to emit light. Even in this state, charges are accumulated in the capacitor C1. Specifically, the capacitor C1 is charged with a first turn-on voltage V ON1 (e.g., -17 V) voltage difference between the second on-voltage V ON2 (e.g., -5.6V) (e.g., -11.4V) Is done.

 一方、半導体スイッチング素子Q2のターンオフの際、オフ期間TOFFの開始時において、オン電圧印加部3の出力端子3aからコンデンサC1に、LOW信号が出力される。これにより、コンデンサC1に充電されていた電圧差(例えば、-11.4V)に相当する電荷が放電され、半導体スイッチング素子Q2のゲート端子tに逆バイアスが印加される。逆バイアスにより、ゲート端子tと第1端子t(ソース端子)との間の寄生容量から電荷が引き抜かれる。そして、半導体スイッチング素子Q2のゲート端子tに印加される電圧は、第1オフ電圧VOFF1(例えば、+11.4V)まで急激に上昇する。 On the other hand, when the semiconductor switching element Q2 is turned off, a LOW signal is output from the output terminal 3a of the on-voltage applying unit 3 to the capacitor C1 at the start of the off-period TOFF . Accordingly, the voltage difference which has been charged in the capacitor C1 (e.g., -11.4V) corresponding charge is discharged, a reverse bias is applied to the gate terminal t G of the semiconductor switching element Q2. The reverse bias charge is withdrawn from the parasitic capacitance between the gate terminal t G and the first terminal t 1 (source terminal). Then, the voltage applied to the gate terminal t G of the semiconductor switching element Q2, the first off-voltage V OFF1 (e.g., + 11.4 V) until suddenly increases.

 このとき、ゲート端子tに印加される電圧が、閾値電圧(例えば、-3V)を上回った時点で、半導体スイッチング素子Q2は非導通状態となる。これにより、発光素子LDへの電流が停止され、発光素子LDは非発光状態となる。 At this time, the voltage applied to the gate terminal t G is the threshold voltage (e.g., -3 V) at the time exceeds the semiconductor switching element Q2 is turned off. Thereby, the current to the light emitting element LD is stopped, and the light emitting element LD enters a non-light emitting state.

 つぎに、ゲート端子tに印加される電圧は、閾値電圧を超えて、第1オフ電圧VOFF1(例えば、+11.4V)まで急激に上昇する。その後、電圧は、オフ電圧印加部5(第2微分回路)の時定数で低下する。そして、ゲート端子tに印加される電圧は、第2オフ電圧VOFF2(例えば、0V)で維持される。なお、オフ期間TOFFにおいて、第1オフ電圧VOFF1が印加された後、ゲート端子tに印加される電圧は(図5の下側のβ領域の波形に相当)は、下方に凸状の傾きで徐々に減少する。 Then, the voltage applied to the gate terminal t G may exceed the threshold voltage, the first off-voltage V OFF1 (e.g., + 11.4 V) until suddenly increases. Thereafter, the voltage decreases with the time constant of the off-voltage applying unit 5 (second differential circuit). Then, the voltage applied to the gate terminal t G is maintained at the second turn-off voltage V OFF2 (e.g., 0V). Note that the voltage applied to the gate terminal t G after the first off voltage V OFF1 is applied in the off period T OFF (corresponding to the waveform in the lower β region in FIG. 5) is convex downward. It gradually decreases with the slope of.

 ゲート端子tに第2オフ電圧VOFF2(例えば、0V)が印加された状態においても、ゲート端子tに印加される電圧は、閾値電圧(例えば、-3V)よりも高い。そのため、半導体スイッチング素子Q2の非導通状態は維持され、発光素子LDは非発光状態が維持される。 The gate terminal t G second off voltage V OFF2 (e.g., 0V) even in a state where it is applied, the voltage applied to the gate terminal t G is the threshold voltage (e.g., -3 V) is higher than. Therefore, the non-conducting state of the semiconductor switching element Q2 is maintained, and the light emitting element LD is maintained in the non-light emitting state.

 そして、上記半導体スイッチング素子Q2は、オン期間TONとオフ期間TOFFの一連の動作を繰り返す。これにより、発光素子LDの発光および非発光の切り替え動作が、繰り返し実行される。 The semiconductor switching element Q2 repeats a series of operations of an on period T ON and an off period T OFF . As a result, the switching operation of the light emitting element LD between light emission and non-light emission is repeatedly executed.

 以上のように、ゲート駆動回路22およびゲート駆動回路22を備える発光装置21は動作する。 As described above, the gate drive circuit 22 and the light emitting device 21 including the gate drive circuit 22 operate.

 そして、本実施の形態の発光装置21においても、実施の形態1と同様の効果が得られる。 And also in the light-emitting device 21 of this Embodiment, the effect similar to Embodiment 1 is acquired.

 つまり、上記動作により、半導体スイッチング素子Q2のターンオン時間およびターンオフ時間を短くできる。 That is, the turn-on time and turn-off time of the semiconductor switching element Q2 can be shortened by the above operation.

 (実施の形態4)
 以下、本実施の形態に係るゲート駆動回路およびゲート駆動回路を備える発光装置の回路構成について、図6を用いて説明する。
(Embodiment 4)
Hereinafter, a circuit configuration of the light emitting device including the gate driving circuit and the gate driving circuit according to this embodiment will be described with reference to FIG.

 図6は、本発明の実施の形態4に係るゲート駆動回路32およびゲート駆動回路32を備える発光装置31の構成を示すブロック図である。 FIG. 6 is a block diagram showing a configuration of the light emitting device 31 including the gate drive circuit 32 and the gate drive circuit 32 according to Embodiment 4 of the present invention.

 なお、本実施の形態は、ゲート駆動回路32におけるオン電圧可変部34の構成が、実施の形態3とは異なる。これ以外の構成については同一である。そのため、実施の形態4における実施の形態3と同一の構成については、同一の符号を付して、その説明を省略する。 In the present embodiment, the configuration of the on-voltage variable section 34 in the gate drive circuit 32 is different from that in the third embodiment. Other configurations are the same. Therefore, the same reference numerals are given to the same configurations in the fourth embodiment as those in the third embodiment, and the description thereof is omitted.

 図6に示すように、本実施の形態の発光装置31は、ゲート駆動回路32、発光素子LDおよび半導体スイッチング素子Q2などを備える。 As shown in FIG. 6, the light emitting device 31 of the present embodiment includes a gate drive circuit 32, a light emitting element LD, a semiconductor switching element Q2, and the like.

 なお、半導体スイッチング素子Q2は、実施の形態3と同様に、Pチャネル型MOSFETで構成される。そのため、本実施の形態の半導体スイッチング素子Q2の閾値電圧は、例えば-3Vである。 Note that the semiconductor switching element Q2 is formed of a P-channel MOSFET as in the third embodiment. Therefore, the threshold voltage of the semiconductor switching element Q2 in the present embodiment is, for example, −3V.

 ゲート駆動回路32は、オン電圧印加部3と、オン電圧可変部34と、オフ電圧印加部35などを備える。 The gate drive circuit 32 includes an on-voltage application unit 3, an on-voltage variable unit 34, an off-voltage application unit 35, and the like.

 ゲート駆動回路32の第1電圧電源V1は、所定の電圧を印加する定電圧電源である。第1電圧電源V1は、半導体スイッチング素子Q2のゲート端子tに、閾値電圧よりも低い、第1オン電圧を印加する。本実施の形態の第1電圧電源V1は、所定の電圧として、第1定電圧V(例えば、-17V)を、ゲート端子tに印加する。 The first voltage power supply V1 of the gate drive circuit 32 is a constant voltage power supply that applies a predetermined voltage. The first voltage source V1 is the gate terminal t G of the semiconductor switching elements Q2, applied lower than the threshold voltage, the first on-voltage. The first voltage source V1 of the embodiment, as the predetermined voltage, the first constant voltage V 1 (e.g., -17 V) to be applied to the gate terminal t G.

 オン電圧可変部34は、コンデンサC1と、第1微分回路37と、ツェナーダイオードZDなどで構成される。コンデンサC1は、オン電圧印加部3の出力端子3aと、半導体スイッチング素子Q2のゲート端子tとの間に接続される。第1微分回路37は、コンデンサC1と、半導体スイッチング素子Q2のゲート端子tとの接続点J1に一端が接続された直列回路36を含む。直列回路36は、上記接続点J1にカソードが接続されるダイオードD1、および、一端がダイオードD1のアノードと直列接続される第1抵抗R1を含む。ツェナーダイオードZDは、アノードが第1抵抗R1の他端に接続され、カソードが半導体スイッチング素子Q2の第1端子t(ソース端子)に接続される。なお、ツェナーダイオードZDのツェナー電圧値が、実施の形態3の第3電圧電源V3により出力される第3定電圧に相当する。 The on-voltage variable unit 34 includes a capacitor C1, a first differentiation circuit 37, a Zener diode ZD, and the like. Capacitor C1, the output terminal 3a of the on-voltage applying unit 3 is connected between the gate terminal t G of the semiconductor switching element Q2. The first differentiating circuit 37 includes a capacitor C1, a series circuit 36 having one end connected to a connection point J1 and the gate terminal t G of the semiconductor switching element Q2. The series circuit 36 includes a diode D1 whose cathode is connected to the connection point J1, and a first resistor R1 whose one end is connected in series with the anode of the diode D1. The Zener diode ZD has an anode connected to the other end of the first resistor R1, and a cathode connected to the first terminal t 1 (source terminal) of the semiconductor switching element Q2. Note that the Zener voltage value of the Zener diode ZD corresponds to the third constant voltage output from the third voltage power supply V3 of the third embodiment.

 オフ電圧印加部35は、コンデンサC1、および、半導体スイッチング素子Q2のゲート端子tと第1端子t(ソース端子)との間に接続された第2抵抗R2を含み、第2微分回路を構成する。このとき、第2抵抗R2は、一端が上記接続点J1に、他端が第3電圧電源V3およびツェナーダイオードZDのカソードに接続される。 Off voltage applying unit 35 includes a capacitor C1, and includes a second resistor R2 connected between the semiconductor switching element Q2 gate terminal t G and the first terminal t 1 (source terminal), the second differentiating circuit Constitute. At this time, one end of the second resistor R2 is connected to the connection point J1, and the other end is connected to the third voltage power source V3 and the cathode of the Zener diode ZD.

 半導体スイッチング素子Q2は、第1端子t(ソース端子)が第3電圧電源V3に接続される。これにより、半導体スイッチング素子Q2の第1端子t(ソース端子)の電圧が、第3電圧電源V3に固定される。 The semiconductor switching element Q2 has a first terminal t 1 (source terminal) connected to the third voltage power supply V3. Thereby, the voltage of the first terminal t 1 (source terminal) of the semiconductor switching element Q2 is fixed to the third voltage power supply V3.

 なお、第1微分回路37および第2微分回路(オフ電圧印加部35に相当)の回路構成は、上述の構成に限定されず、他の構成であってもよい。 The circuit configurations of the first differentiating circuit 37 and the second differentiating circuit (corresponding to the off-voltage applying unit 35) are not limited to the above-described configurations, and may be other configurations.

 以上のように、本実施の形態のゲート駆動回路32およびゲート駆動回路32を備える発光装置31は構成される。 As described above, the gate drive circuit 32 and the light emitting device 31 including the gate drive circuit 32 according to the present embodiment are configured.

 そして、上記ゲート駆動回路32およびゲート駆動回路32を備える発光装置31は、実施の形態3と同様に、動作する。 And the light-emitting device 31 provided with the said gate drive circuit 32 and the gate drive circuit 32 operate | moves similarly to Embodiment 3. FIG.

 また、本実施の形態の発光装置31においても、実施の形態3と同様の効果が得られる。 Also, in the light emitting device 31 of the present embodiment, the same effect as in the third embodiment can be obtained.

 つまり、上記動作により、半導体スイッチング素子Q2のターンオン時間およびターンオフ時間を短くできる。 That is, the turn-on time and turn-off time of the semiconductor switching element Q2 can be shortened by the above operation.

 なお、本発明のゲート駆動回路は、上記実施の形態に限定されるものではなく、本発明の要旨を逸脱しない範囲内において種々変更を加え得ることは勿論である。 It should be noted that the gate drive circuit of the present invention is not limited to the above-described embodiment, and it is needless to say that various changes can be made without departing from the gist of the present invention.

 例えば、上記実施の形態では、オン期間TONにおいて、第1オン電圧VON1が印加された後、ゲート端子tに印加される電圧が、下方に凸状の傾きで徐々に減少する形状を例に説明したが、これに限られない。上方に凸状の傾きで徐々に増加する形状や、他の形状でもよい。 For example, in the above embodiment, the on-period T ON, after the first on-voltage V ON1 is applied, the voltage applied to the gate terminal t G is a shape that gradually decreases convex slope downward Although described as an example, it is not limited to this. It may be a shape that gradually increases with a convex slope upward, or another shape.

 また、上記実施の形態では、オン期間TONにおいて、ゲート端子tに印加する電圧を第1オン電圧VON1および第2オン電圧VON2に切り替える例で説明したが、これに限られない。例えば、ゲート端子tに第1オン電圧VON1を印加した後、ゲート端子tに印加する電圧を連続的に徐々に低下させてもよい。この場合でも、ターンオフ直前において、ゲート端子tに印加される第2オン電圧VON2は、第1オン電圧VON1よりも低い。そのため、一定の第1オン電圧VON1を印加し続ける場合よりも、ゲート寄生容量に蓄積される電荷の量が少なくなる。これにより、半導体スイッチング素子のターンオフ時間を短くできる。 In the above embodiment, the on-period T ON, has been described in example of switching the voltage applied to the gate terminal t G in the first on-voltage V ON1 and second on-voltage V ON2, not limited to this. For example, after applying the first on-voltage V ON1 to the gate terminal t G, the voltage may be continuously and gradually reduces the applied to the gate terminal t G. In this case, the turn-off just before, the second on-voltage V ON2 applied to the gate terminal t G is lower than the first ON voltage V ON1. For this reason, the amount of charge accumulated in the gate parasitic capacitance is smaller than when the constant first on-voltage V ON1 is continuously applied. Thereby, the turn-off time of the semiconductor switching element can be shortened.

 また、上記実施の形態では、オフ期間TOFFにおいて、第1オフ電圧VOFF1が印加された後、ゲート端子tに印加される電圧が、上方に凸状の傾きで徐々に減少する形状を例に説明したが、これに限られない。例えば、下方に凸状の傾きで徐々に増加する形状や、他の形状でもよい。 Further, in the above embodiment, after the first off voltage V OFF1 is applied in the off period T OFF , the voltage applied to the gate terminal t G gradually decreases with a convex slope upward. Although described as an example, it is not limited to this. For example, it may be a shape that gradually increases downward with a convex inclination or another shape.

 また、上記実施の形態では、オフ期間TOFFにおいて、ゲート端子tに印加する電圧を第1オフ電圧VOFF1および第2オフ電圧VOFF2に切り替え例で説明したが、これに限られない。例えば、ゲート端子tに第1オフ電圧VOFF1を印加した後、ゲート端子tに印加する電圧を連続的に徐々に上昇させてもよい。 In the above embodiment, in the OFF period T OFF, but the voltage applied to the gate terminal t G described switching example in the first OFF voltage V OFF1 and second off-voltage V OFF2, not limited to this. For example, after applying the first off-voltage V OFF1 to the gate terminal t G, the voltage may be continuously gradually increased to be applied to the gate terminal t G.

 この場合でも、ターンオン直前において、ゲート端子tに印加される電圧は、第1オフ電圧VOFF1よりも高い。そのため、一定の第1オフ電圧VOFF1を印加し続ける場合よりも、ゲート端子tの電圧が閾値電圧を越えるまでの時間が短くなる。これにより、半導体スイッチング素子のターンオン時間を、さらに短くできる。 In this case, the turn-on immediately before the voltage applied to the gate terminal t G is higher than the first OFF voltage V OFF1. Therefore, if than continue to apply a constant first OFF voltage V OFF1, the time until the voltage of the gate terminal t G exceeds the threshold voltage is shortened. Thereby, the turn-on time of the semiconductor switching element can be further shortened.

 また、上記実施の形態では、第1端子tを基準とした第1オン電圧VON1と第2オン電圧VON2との比が2倍以上を例に説明したが、これに限られない。例えば、第1オン電圧VON1と第2オン電圧VON2との比は、閾値電圧よりも高く、かつ、第2オン電圧VON2より高ければ、2倍未満でもよい。この場合でも、ターンオフ直前において、ゲート端子tに印加される電圧は、第1オン電圧VON1よりも低い。そのため、一定の第1オン電圧VON1を印加し続ける場合よりも、ゲート寄生容量に蓄積されている電荷の量が少なくなる。これにより、半導体スイッチング素子のターンオフ時間を短くできる。 Further, in the above-described embodiment, the ratio between the first ON voltage V ON1 with a first reference terminal t 1 and the second on-voltage V ON2 is described more than two times as an example, not limited thereto. For example, the first on-voltage V ON1 ratio between the second on-voltage V ON2 is higher than the threshold voltage, and is higher than the second on-voltage V ON2, may be less than 2 times. In this case, the turn-off just before the voltage applied to the gate terminal t G is lower than the first ON voltage V ON1. Therefore, the amount of charge accumulated in the gate parasitic capacitance is smaller than when the constant first on-voltage V ON1 is continuously applied. Thereby, the turn-off time of the semiconductor switching element can be shortened.

 また、上記実施の形態では、半導体スイッチング素子Q1、Q2として、MOSFETを用いた構成で説明したが、例えばIGBT(Insulated Gate Bipolar Transistor)などの半導体スイッチング素子を用いてもよい。 In the above embodiment, the semiconductor switching elements Q1 and Q2 have been described as being configured using MOSFETs. However, semiconductor switching elements such as IGBTs (Insulated Gate Bipolar Transistors) may be used.

 また、上記実施の形態では、発光素子LDとして、2端子を有するレーザーダイオードを例に説明したが、これに限られない。例えば、3端子を有するレーザーダイオード、LED(Light Emitting Diode)、白熱電球、蛍光灯などを、発光素子LDとして、用いてもよい。 In the above embodiment, a laser diode having two terminals has been described as an example of the light emitting element LD, but is not limited thereto. For example, a laser diode having three terminals, an LED (Light Emitting Diode), an incandescent lamp, a fluorescent lamp, or the like may be used as the light emitting element LD.

 また、上記実施の形態では、発光装置1を、TOF方式の距離画像カメラ向けのフラッシュに用いた構成を例に説明したが、これに限られず、発光装置1を、例えば照明装置として用いてもよい。具体的には、出射光の明るさを変化させる調光機能を有する照明装置に、発光装置1を用いることができる。 In the above embodiment, the configuration in which the light-emitting device 1 is used as a flash for a TOF type distance image camera is described as an example. However, the present invention is not limited to this, and the light-emitting device 1 may be used as a lighting device, for example. Good. Specifically, the light-emitting device 1 can be used for a lighting device having a light control function for changing the brightness of emitted light.

 以上で説明したように、本発明は、第1端子、第1端子よりも高電位側に接続される第2端子、および、閾値電圧以上の電圧が印加されることで、第1端子と第2端子との間が導通するゲート端子を有する、Nチャネル型の半導体スイッチング素子を駆動するゲート駆動回路である。ゲート駆動回路は、ゲート端子に閾値電圧以上のオン電圧を印加するオン電圧印加部と、オン電圧印加部が印加するオン電圧を変化させるオン電圧可変部と、ゲート端子に、閾値電圧よりも低く、かつ、ゲート端子と第1端子との間の寄生容量から電荷を引き抜くオフ電圧を、ゲート端子に印加するオフ電圧印加部を備える。そして、オン電圧可変部は、オン電圧として、半導体スイッチング素子のオン期間の開始時において、オン電圧を閾値電圧以上の第1オン電圧を印加し、オン期間の終了時において、オン電圧を第1オン電圧よりも低く、かつ、閾値電圧以上の第2オン電圧を印加するように、半導体スイッチング素子のゲート端子にオン電圧を変化させて印加する。 As described above, according to the present invention, the first terminal, the second terminal connected to the higher potential side than the first terminal, and the voltage higher than the threshold voltage are applied. This is a gate driving circuit for driving an N-channel type semiconductor switching element having a gate terminal conducting between two terminals. The gate drive circuit includes an on-voltage applying unit that applies an on-voltage that is equal to or higher than a threshold voltage to a gate terminal, an on-voltage variable unit that changes an on-voltage applied by the on-voltage applying unit, and a gate terminal that is lower than the threshold voltage. And an off-voltage applying unit that applies to the gate terminal an off-voltage that draws charges from the parasitic capacitance between the gate terminal and the first terminal. The on-voltage variable unit applies, as an on-voltage, a first on-voltage that is equal to or higher than a threshold voltage at the start of the on-period of the semiconductor switching element, and at the end of the on-period, The ON voltage is changed and applied to the gate terminal of the semiconductor switching element so as to apply a second ON voltage that is lower than the ON voltage and equal to or higher than the threshold voltage.

 この構成によれば、半導体スイッチング素子のオン期間の終了時に、第1オン電圧よりも、低い第2オン電圧がゲート端子に印加される。そのため、半導体スイッチング素子のゲート端子と第1端子との間の寄生容量(以下、「ゲート寄生容量」と言う)に蓄積されている電荷の量は、オン期間において、一定の第1オン電圧が印加され続ける場合と比べて少ない。これにより、ターンオフの際にゲート寄生容量から素早く電荷を引き抜くことができる。その結果、半導体スイッチング素子のターンオフ時間を短くできる。 According to this configuration, at the end of the ON period of the semiconductor switching element, the second ON voltage lower than the first ON voltage is applied to the gate terminal. Therefore, the amount of charge accumulated in the parasitic capacitance (hereinafter referred to as “gate parasitic capacitance”) between the gate terminal and the first terminal of the semiconductor switching element is such that a constant first on-voltage is obtained during the on-period. Compared to the case where the voltage is continuously applied. As a result, charges can be quickly extracted from the gate parasitic capacitance at the time of turn-off. As a result, the turn-off time of the semiconductor switching element can be shortened.

 さらに、半導体スイッチング素子をターンオンさせる際に、第2オン電圧よりも、高い第1オン電圧がゲート端子に印加される。これにより、半導体スイッチング素子のターンオン時間を短くできる。 Furthermore, when the semiconductor switching element is turned on, a first on-voltage higher than the second on-voltage is applied to the gate terminal. Thereby, the turn-on time of the semiconductor switching element can be shortened.

 また、本発明のゲート駆動回路は、第1端子を基準とした第1オン電圧と第2オン電圧との比が2倍以上である、ことが好ましい。 In the gate drive circuit of the present invention, it is preferable that the ratio of the first on-voltage and the second on-voltage with reference to the first terminal is twice or more.

 この構成によれば、半導体スイッチング素子をターンオンさせる際に、第2オン電圧と比べて、2倍以上の第1オン電圧がゲート端子に印加される。そのため、ゲート端子の電圧が閾値電圧を超えるまでの時間が短くなる。これにより、半導体スイッチング素子をターンオンさせる際のターンオン時間を、さらに短くできる。 According to this configuration, when the semiconductor switching element is turned on, the first on-voltage more than twice the second on-voltage is applied to the gate terminal. Therefore, the time until the voltage at the gate terminal exceeds the threshold voltage is shortened. Thereby, the turn-on time when turning on the semiconductor switching element can be further shortened.

 また、本発明のゲート駆動回路は、オン電圧可変部が、オン電圧印加部の出力端子とゲート端子との間に接続されたコンデンサ、および、コンデンサとゲート端子との接続点に一端が接続された直列回路を含むと共に、ゲート端子に第1オン電圧を印加した後、印加する電圧を第1オン電圧から低下させる第1微分回路を備える。さらに、オン電圧可変部は、直列回路の他端と接続され、ゲート端子に第2オン電圧が印加され続けるように所定の電圧を印加する電圧電源を備える。そして、直列回路は、ダイオードと、ダイオードと直列接続された第1抵抗とを含む、ことが好ましい。 In the gate drive circuit of the present invention, the ON voltage variable unit has one end connected to the capacitor connected between the output terminal and the gate terminal of the ON voltage application unit, and the connection point between the capacitor and the gate terminal. And a first differentiating circuit that lowers the applied voltage from the first on voltage after applying the first on voltage to the gate terminal. Furthermore, the on-voltage variable unit includes a voltage power source that is connected to the other end of the series circuit and applies a predetermined voltage so that the second on-voltage is continuously applied to the gate terminal. The series circuit preferably includes a diode and a first resistor connected in series with the diode.

 この構成によれば、ゲート駆動回路を簡易な回路構成で実現しながら、半導体スイッチング素子のターンオン時間およびターンオフ時間を短くできる。 According to this configuration, the turn-on time and the turn-off time of the semiconductor switching element can be shortened while realizing the gate drive circuit with a simple circuit configuration.

 また、本発明のゲート駆動回路は、オン電圧可変部が、オン電圧印加部の出力端子とゲート端子との間に接続されたコンデンサ、および、コンデンサとゲート端子との接続点に一端が接続された直列回路を含むと共に、ゲート端子に第1オン電圧を印加した後、印加する電圧を第1オン電圧から低下させる第1微分回路を備える。さらに、オン電圧可変部は、アノードが直列回路の他端に接続され、カソードが半導体スイッチング素子の第1端子に接続されると共に、ゲート端子に第2オン電圧が印加され続けるように所定の電圧を印加するツェナーダイオードを備える。そして、直列回路は、ダイオードと、ダイオードと直列接続された第1抵抗とを含む、ことが好ましい。 In the gate drive circuit of the present invention, the ON voltage variable unit has one end connected to the capacitor connected between the output terminal and the gate terminal of the ON voltage application unit, and the connection point between the capacitor and the gate terminal. And a first differentiating circuit that lowers the applied voltage from the first on voltage after applying the first on voltage to the gate terminal. Further, the ON voltage variable unit has a predetermined voltage so that the anode is connected to the other end of the series circuit, the cathode is connected to the first terminal of the semiconductor switching element, and the second ON voltage is continuously applied to the gate terminal. A Zener diode is applied. The series circuit preferably includes a diode and a first resistor connected in series with the diode.

 この構成によれば、ゲート駆動回路を簡易な回路構成で実現しながら、半導体スイッチング素子のターンオン時間およびターンオフ時間を短くできる。 According to this configuration, the turn-on time and the turn-off time of the semiconductor switching element can be shortened while realizing the gate drive circuit with a simple circuit configuration.

 また、本発明のゲート駆動回路は、オフ電圧印加部が、オフ電圧として、半導体スイッチング素子のオフ期間の開始時において、閾値電圧よりも低い第1オフ電圧を印加し、オフ期間の終了時において、第1オフ電圧よりも高く、かつ、閾値電圧よりも低い第2オフ電圧を印加するように、半導体スイッチング素子のゲート端子にオフ電圧を変化させて印加する、ことが好ましい。 In the gate driving circuit of the present invention, the off-voltage applying unit applies the first off-voltage lower than the threshold voltage at the start of the off-period of the semiconductor switching element as the off-voltage, and at the end of the off-period. Preferably, the off-voltage is applied to the gate terminal of the semiconductor switching element while applying a second off-voltage that is higher than the first off-voltage and lower than the threshold voltage.

 この構成によれば、半導体スイッチング素子をターンオンさせる直前において、ゲート端子に印加されている第2オフ電圧が、第1オフ電圧よりも高い。そのため、半導体スイッチング素子をターンオンさせる際に、ゲート端子の電圧が閾値電圧を超えるまでの時間が短くなる。これにより、半導体スイッチング素子のターンオン時間を、さらに短くできる。 According to this configuration, immediately before the semiconductor switching element is turned on, the second off voltage applied to the gate terminal is higher than the first off voltage. Therefore, when the semiconductor switching element is turned on, the time until the voltage of the gate terminal exceeds the threshold voltage is shortened. Thereby, the turn-on time of the semiconductor switching element can be further shortened.

 また、本発明のゲート駆動回路は、オフ電圧印加部が、コンデンサ、および、ゲート端子と第1端子との間に接続された第2抵抗を含むと共に、ゲート端子に第1オフ電圧を印加した後、印加する電圧を第1オフ電圧から上昇させ、その後、ゲート端子に第2オフ電圧が印加され続けるように所定の電圧を印加する第2微分回路を備える、ことが好ましい。 In the gate drive circuit of the present invention, the off-voltage applying unit includes a capacitor and a second resistor connected between the gate terminal and the first terminal, and applies the first off-voltage to the gate terminal. Thereafter, it is preferable to include a second differentiating circuit that raises the applied voltage from the first off voltage and then applies a predetermined voltage so that the second off voltage is continuously applied to the gate terminal.

 この構成によれば、ゲート駆動回路を簡易な回路構成で実現しながら、半導体スイッチング素子のターンオン時間およびターンオフ時間を短くできる。 According to this configuration, the turn-on time and the turn-off time of the semiconductor switching element can be shortened while realizing the gate drive circuit with a simple circuit configuration.

 また、本発明は、第1端子、第1端子よりも低電位側に接続される第2端子、および、閾値電圧以下の電圧の印加により第1端子と第2端子との間が導通するゲート端子を有する、Pチャネル型の半導体スイッチング素子を駆動するゲート駆動回路である。ゲート駆動回路は、ゲート端子に閾値電圧以下のオン電圧を印加するオン電圧印加部と、オン電圧印加部が印加するオン電圧を変化させるオン電圧可変部と、閾値電圧よりも高く、かつ、ゲート端子と第1端子との間の寄生容量から電荷を引き抜くオフ電圧を、ゲート端子に印加するオフ電圧印加部を備える。オン電圧可変部は、オン電圧として、半導体スイッチング素子のオン期間の開始時において、閾値電圧以下の第1オン電圧を印加し、オン期間の終了時において、第1オン電圧よりも高く、かつ、閾値電圧以下の第2オン電圧を印加するように、半導体スイッチング素子のゲート端子に、オン電圧を変化させて印加する。 The present invention also provides a first terminal, a second terminal connected to a lower potential side than the first terminal, and a gate that conducts between the first terminal and the second terminal by application of a voltage equal to or lower than a threshold voltage. This is a gate drive circuit for driving a P-channel type semiconductor switching element having a terminal. The gate driving circuit includes: an on-voltage applying unit that applies an on-voltage that is equal to or lower than a threshold voltage to a gate terminal; an on-voltage variable unit that changes an on-voltage applied by the on-voltage applying unit; An off-voltage applying unit that applies an off-voltage that draws charges from the parasitic capacitance between the terminal and the first terminal to the gate terminal is provided. The on-voltage variable unit applies, as an on-voltage, a first on-voltage that is equal to or lower than a threshold voltage at the start of the on-period of the semiconductor switching element, is higher than the first on-voltage at the end of the on-period, and The ON voltage is changed and applied to the gate terminal of the semiconductor switching element so as to apply the second ON voltage equal to or lower than the threshold voltage.

 この構成によれば、半導体スイッチング素子のオン期間の終了時に、第1オン電圧よりも高い第2オン電圧がゲート端子に印加される。そのため、半導体スイッチング素子のゲート寄生容量に蓄積されている電荷の量は、オン期間において、一定の第1オン電圧が印加され続ける場合と比べて少ない。これにより、ターンオフの際にゲート寄生容量から素早く電荷を引き抜くことができる。その結果、半導体スイッチング素子のターンオフ時間を短くできる。 According to this configuration, the second on-voltage higher than the first on-voltage is applied to the gate terminal at the end of the on-period of the semiconductor switching element. For this reason, the amount of charge accumulated in the gate parasitic capacitance of the semiconductor switching element is smaller than that in the case where the constant first on-voltage is continuously applied in the on-period. As a result, charges can be quickly extracted from the gate parasitic capacitance at the time of turn-off. As a result, the turn-off time of the semiconductor switching element can be shortened.

 さらに、半導体スイッチング素子をターンオンさせる際に、第2オン電圧よりも高い第1オン電圧がゲート端子に印加される。これにより、半導体スイッチング素子のターンオン時間を短くできる。 Furthermore, when the semiconductor switching element is turned on, a first on-voltage higher than the second on-voltage is applied to the gate terminal. Thereby, the turn-on time of the semiconductor switching element can be shortened.

 また、本発明のゲート駆動回路は、第1端子を基準とした第1オン電圧と第2オン電圧との比が、2倍以上である、ことが好ましい。 In the gate drive circuit of the present invention, it is preferable that the ratio between the first on-voltage and the second on-voltage with reference to the first terminal is twice or more.

 この構成によれば、半導体スイッチング素子をターンオンさせる際に、第2オン電圧と比べて、2倍以上の第1オン電圧がゲート端子に印加される。そのため、ゲート端子の電圧が閾値電圧を超えるまでの時間が短くなる。これにより、半導体スイッチング素子をターンオンさせる際のターンオン時間を、さらに短くできる。 According to this configuration, when the semiconductor switching element is turned on, the first on-voltage more than twice the second on-voltage is applied to the gate terminal. Therefore, the time until the voltage at the gate terminal exceeds the threshold voltage is shortened. Thereby, the turn-on time when turning on the semiconductor switching element can be further shortened.

 また、本発明のゲート駆動回路は、オン電圧可変部が、オン電圧印加部の出力端子とゲート端子との間に接続されたコンデンサ、および、コンデンサとゲート端子との接続点に一端が接続された直列回路を含むと共に、ゲート端子に第1オン電圧を印加した後、印加する電圧を第1オン電圧から上昇させる第1微分回路を備える。さらに、オン電圧可変部は、直列回路の他端と接続され、ゲート端子に第2オン電圧が印加され続けるように所定の電圧を印加する電圧電源を備える。そして、直列回路は、ダイオードと、ダイオードと直列接続された第1抵抗とを含む、ことが好ましい。 In the gate drive circuit of the present invention, the ON voltage variable unit has one end connected to the capacitor connected between the output terminal and the gate terminal of the ON voltage application unit, and the connection point between the capacitor and the gate terminal. And a first differentiating circuit that raises the applied voltage from the first on-voltage after applying the first on-voltage to the gate terminal. Furthermore, the on-voltage variable unit includes a voltage power source that is connected to the other end of the series circuit and applies a predetermined voltage so that the second on-voltage is continuously applied to the gate terminal. The series circuit preferably includes a diode and a first resistor connected in series with the diode.

 この構成によれば、ゲート駆動回路を簡易な回路構成で実現しながら、半導体スイッチング素子のターンオン時間およびターンオフ時間を短くできる。 According to this configuration, the turn-on time and the turn-off time of the semiconductor switching element can be shortened while realizing the gate drive circuit with a simple circuit configuration.

 また、本発明のゲート駆動回路は、オン電圧可変部が、オン電圧印加部の出力端子とゲート端子との間に接続されたコンデンサ、および、コンデンサとゲート端子との接続点に一端が接続された直列回路を含むと共に、ゲート端子に第1オン電圧を印加した後、印加する電圧を第1オン電圧から上昇させる第1微分回路を備える。さらに、オン電圧可変部は、アノードが直列回路の他端に接続され、カソードが半導体スイッチング素子の第1端子に接続されると共に、ゲート端子に第2オン電圧が印加され続けるように所定の電圧を印加するツェナーダイオードを備える。そして、直列回路は、ダイオードと、ダイオードと直列接続された第1抵抗とを含む、ことが好ましい。 In the gate drive circuit of the present invention, the ON voltage variable unit has one end connected to the capacitor connected between the output terminal and the gate terminal of the ON voltage application unit, and the connection point between the capacitor and the gate terminal. And a first differentiating circuit that raises the applied voltage from the first on-voltage after applying the first on-voltage to the gate terminal. Further, the ON voltage variable unit has a predetermined voltage so that the anode is connected to the other end of the series circuit, the cathode is connected to the first terminal of the semiconductor switching element, and the second ON voltage is continuously applied to the gate terminal. A Zener diode is applied. The series circuit preferably includes a diode and a first resistor connected in series with the diode.

 この構成によれば、ゲート駆動回路を簡易な回路構成で実現しながら、半導体スイッチング素子のターンオン時間およびターンオフ時間を短くできる。 According to this configuration, the turn-on time and the turn-off time of the semiconductor switching element can be shortened while realizing the gate drive circuit with a simple circuit configuration.

 また、本発明のゲート駆動回路は、オフ電圧印加部が、オフ電圧として、半導体スイッチング素子のオフ期間の開始時において、閾値電圧よりも高い第1オフ電圧を印加し、オフ期間の終了時において、第1オフ電圧よりも低く、かつ、閾値電圧よりも高い第2オフ電圧を印加するように、半導体スイッチング素子のゲート端子に、オフ電圧を変化させて印加する、ことが好ましい。 In the gate drive circuit of the present invention, the off-voltage applying unit applies a first off-voltage higher than the threshold voltage at the start of the off-period of the semiconductor switching element as the off-voltage, and at the end of the off-period. It is preferable that the off-voltage is changed and applied to the gate terminal of the semiconductor switching element so that the second off-voltage lower than the first off-voltage and higher than the threshold voltage is applied.

 この構成によれば、半導体スイッチング素子をターンオンさせる直前において、ゲート端子に印加されている第2オフ電圧が、第1オフ電圧よりも低い。そのため、半導体スイッチング素子をターンオンさせる際に、ゲート端子の電圧が閾値電圧を超えるまでの時間が短くなる。これにより、半導体スイッチング素子のターンオン時間を、さらに短くできる。 According to this configuration, immediately before the semiconductor switching element is turned on, the second off voltage applied to the gate terminal is lower than the first off voltage. Therefore, when the semiconductor switching element is turned on, the time until the voltage of the gate terminal exceeds the threshold voltage is shortened. Thereby, the turn-on time of the semiconductor switching element can be further shortened.

 また、本発明のゲート駆動回路は、オフ電圧印加部が、コンデンサ、および、ゲート端子と第1端子との間に接続された第2抵抗を含むと共に、ゲート端子に第1オフ電圧を印加した後、印加する電圧を第1オフ電圧から上昇させ、その後、ゲート端子に第2オフ電圧が印加され続けるように所定の電圧を印加する第2微分回路を備える、ことが好ましい。なお、ここでいう「印加する電圧を第1オフ電圧から上昇させる」とは、例えば、印加する電圧を、GND電圧を基準として第1オフ電圧から上昇させることを言う。 In the gate drive circuit of the present invention, the off-voltage applying unit includes a capacitor and a second resistor connected between the gate terminal and the first terminal, and applies the first off-voltage to the gate terminal. Thereafter, it is preferable to include a second differentiating circuit that raises the applied voltage from the first off voltage and then applies a predetermined voltage so that the second off voltage is continuously applied to the gate terminal. Here, “to increase the applied voltage from the first off voltage” means, for example, to increase the applied voltage from the first off voltage with reference to the GND voltage.

 この構成によれば、ゲート駆動回路を簡易な回路構成で実現しながら、半導体スイッチング素子のターンオン時間およびターンオフ時間を短くできる。 According to this configuration, the turn-on time and the turn-off time of the semiconductor switching element can be shortened while realizing the gate drive circuit with a simple circuit configuration.

 また、本発明の発光装置は、発光素子と、発光素子への電流の供給と停止とを切り替える半導体スイッチング素子と、半導体スイッチング素子を駆動する、上記ゲート駆動回路と、を備える。 The light-emitting device of the present invention includes a light-emitting element, a semiconductor switching element that switches between supply and stop of a current to the light-emitting element, and the gate drive circuit that drives the semiconductor switching element.

 この構成によれば、簡易な回路構成のゲート駆動回路により、発光素子ターンオン時間およびターンオフ時間の短い発光装置を実現できる。 According to this configuration, a light emitting device with a short turn-on time and a short turn-off time can be realized by a gate drive circuit having a simple circuit configuration.

 さらに、半導体スイッチング素子のオン期間の終了時に、第1オン電圧よりも、低い第2オン電圧がゲート端子に印加される。そのため、半導体スイッチング素子のゲート寄生容量に蓄積されている電荷の量は、オン期間において、一定の第1オン電圧が印加され続ける場合と比べて少ない。これにより、ターンオフの際にゲート寄生容量から素早く電荷を引き抜くことでターンオフ時間を短くできる。その結果、発光素子に流れる電流の供給と停止とを素早く切り替えることができる。 Further, at the end of the ON period of the semiconductor switching element, a second ON voltage lower than the first ON voltage is applied to the gate terminal. For this reason, the amount of charge accumulated in the gate parasitic capacitance of the semiconductor switching element is smaller than that in the case where the constant first on-voltage is continuously applied in the on-period. As a result, the turn-off time can be shortened by quickly extracting charges from the gate parasitic capacitance at the time of turn-off. As a result, it is possible to quickly switch between supply and stop of the current flowing through the light emitting element.

 本発明のゲート駆動回路は、例えばTOF方式の距離画像カメラ向けの発光素子に直列接続された半導体スイッチング素子の駆動に適応できる。 The gate drive circuit of the present invention can be adapted to drive a semiconductor switching element connected in series to a light emitting element for, for example, a TOF range image camera.

 1,11,21,31  発光装置
 2,12,22,32  ゲート駆動回路
 3  オン電圧印加部(ドライバIC)
 3a  出力端子
 4,14,24,34  オン電圧可変部
 5,25,35  オフ電圧印加部
 6,26,36  直列回路
 7,27,37  第1微分回路
 Q1,Q2  半導体スイッチング素子
 t  第1端子(ソース端子)
 t  第2端子(ドレイン端子)
 t  ゲート端子
 C1  コンデンサ
 D1  ダイオード
 R1  第1抵抗
 R2  第2抵抗
 LD  発光素子
 ZD  ツェナーダイオード
 J1  接続点
1,11,21,31 Light-emitting device 2,12,22,32 Gate drive circuit 3 On-voltage application unit (driver IC)
3a output terminal 4, 14, 24, 34 ON voltage variable section 5, 25, 35 OFF voltage application section 6, 26, 36 series circuit 7, 27, 37 first differentiation circuit Q1, Q2 semiconductor switching element t 1 first terminal (Source terminal)
t 2 Second terminal (drain terminal)
t G gate terminal C1 capacitor D1 diode R1 first resistor R2 second resistor LD light emitting element ZD Zener diode J1 connection point

Claims (13)

第1端子、前記第1端子よりも高電位側に接続される第2端子、および、閾値電圧以上の電圧の印加により前記第1端子と前記第2端子との間が導通するゲート端子を有する、Nチャネル型の半導体スイッチング素子を駆動する、ゲート駆動回路であって、
前記ゲート駆動回路は、
前記ゲート端子に前記閾値電圧以上のオン電圧を印加するオン電圧印加部と、
前記オン電圧印加部が印加するオン電圧を変化させるオン電圧可変部と、
前記閾値電圧よりも低く、かつ、前記ゲート端子と第1端子との間の寄生容量から電荷を引き抜くオフ電圧を、前記ゲート端子に印加するオフ電圧印加部と、を備え、
前記オン電圧可変部は、前記オン電圧として、
前記半導体スイッチング素子のオン期間の開始時において、前記閾値電圧以上の第1オン電圧を印加し、
前記オン期間の終了時において、前記第1オン電圧よりも低く、かつ、前記閾値電圧以上の第2オン電圧を印加するように、
前記半導体スイッチング素子の前記ゲート端子に、前記オン電圧を変化させて印加するゲート駆動回路。
A first terminal; a second terminal connected to a higher potential side than the first terminal; and a gate terminal that conducts between the first terminal and the second terminal when a voltage equal to or higher than a threshold voltage is applied. A gate driving circuit for driving an N-channel type semiconductor switching element,
The gate driving circuit includes:
An on-voltage applying unit that applies an on-voltage greater than or equal to the threshold voltage to the gate terminal;
An on-voltage variable unit that changes an on-voltage applied by the on-voltage applying unit;
An off-voltage applying unit that applies to the gate terminal an off-voltage that is lower than the threshold voltage and that extracts a charge from a parasitic capacitance between the gate terminal and the first terminal;
The on-voltage variable unit is configured as the on-voltage.
Applying a first on-voltage that is equal to or higher than the threshold voltage at the start of the on-period of the semiconductor switching element;
At the end of the ON period, a second ON voltage that is lower than the first ON voltage and equal to or higher than the threshold voltage is applied.
A gate drive circuit for applying the on-voltage to the gate terminal of the semiconductor switching element while changing the on-voltage;
前記第1端子を基準とした前記第1オン電圧と前記第2オン電圧との比は、2倍以上である、請求項1に記載のゲート駆動回路。 2. The gate driving circuit according to claim 1, wherein a ratio of the first on-voltage to the second on-voltage with respect to the first terminal is twice or more. 前記オン電圧可変部は、
前記オン電圧印加部の出力端子と前記ゲート端子との間に接続されたコンデンサ、および、前記コンデンサと前記ゲート端子との接続点に一端が接続された直列回路を含むと共に、前記ゲート端子に前記第1オン電圧を印加した後、印加する電圧を前記第1オン電圧から低下させる第1微分回路と、
前記直列回路の他端と接続され、前記ゲート端子に前記第2オン電圧が印加され続けるように所定の電圧を印加する電圧電源と、を備え、
前記直列回路は、ダイオードと前記ダイオードと直列接続された第1抵抗とを含む、請求項1または請求項2のいずれか1項に記載のゲート駆動回路。
The on-voltage variable unit is
A capacitor connected between the output terminal of the on-voltage applying unit and the gate terminal; and a series circuit having one end connected to a connection point between the capacitor and the gate terminal; and A first differentiating circuit for lowering the applied voltage from the first on-voltage after applying the first on-voltage;
A voltage power source that is connected to the other end of the series circuit and applies a predetermined voltage so that the second on-voltage is continuously applied to the gate terminal;
The gate drive circuit according to claim 1, wherein the series circuit includes a diode and a first resistor connected in series with the diode.
前記オン電圧可変部は、
前記オン電圧印加部の出力端子と前記ゲート端子との間に接続されたコンデンサ、および、前記コンデンサと前記ゲート端子との接続点に一端が接続された直列回路を含むと共に、前記ゲート端子に前記第1オン電圧を印加した後、印加する電圧を前記第1オン電圧から低下させる第1微分回路と、
カソードが前記直列回路の他端に接続され、アノードが前記半導体スイッチング素子の第1端子に接続されると共に、前記ゲート端子に前記第2オン電圧が印加され続けるように所定の電圧を印加するツェナーダイオードと、を備え、
前記直列回路は、ダイオードと前記ダイオードと直列接続された第1抵抗とを含む、請求項1または請求項2のいずれか1項に記載のゲート駆動回路。
The on-voltage variable unit is
A capacitor connected between the output terminal of the on-voltage applying unit and the gate terminal; and a series circuit having one end connected to a connection point between the capacitor and the gate terminal; and A first differentiating circuit for lowering the applied voltage from the first on-voltage after applying the first on-voltage;
A Zener having a cathode connected to the other end of the series circuit, an anode connected to the first terminal of the semiconductor switching element, and a predetermined voltage applied to the gate terminal so that the second ON voltage is continuously applied A diode, and
The gate drive circuit according to claim 1, wherein the series circuit includes a diode and a first resistor connected in series with the diode.
前記オフ電圧印加部は、前記オフ電圧として、
前記半導体スイッチング素子のオフ期間の開始時において、前記閾値電圧よりも低い第1オフ電圧を印加し、
前記オフ期間の終了時において、前記第1オフ電圧よりも高く、かつ、前記閾値電圧よりも低い第2オフ電圧を印加するように、
前記半導体スイッチング素子の前記ゲート端子に、前記オフ電圧を変化させて印加する、請求項1から請求項4のいずれか1項に記載のゲート駆動回路。
The off-voltage applying unit is configured as the off-voltage.
Applying a first off voltage lower than the threshold voltage at the start of the off period of the semiconductor switching element;
At the end of the off period, a second off voltage higher than the first off voltage and lower than the threshold voltage is applied.
The gate drive circuit according to claim 1, wherein the off-voltage is changed and applied to the gate terminal of the semiconductor switching element.
前記オフ電圧印加部は、
前記コンデンサ、および、前記ゲート端子と第1端子との間に接続された第2抵抗を含むと共に、前記ゲート端子に前記第1オフ電圧を印加した後、印加する電圧を前記第1オフ電圧から上昇させ、その後、前記ゲート端子に前記第2オフ電圧が印加され続けるように所定の電圧を印加する第2微分回路を備える、請求項5に記載のゲート駆動回路。
The off-voltage applying unit is
The capacitor includes a second resistor connected between the gate terminal and the first terminal, and after applying the first off voltage to the gate terminal, the voltage to be applied is changed from the first off voltage. The gate drive circuit according to claim 5, further comprising: a second differentiation circuit that raises the voltage and then applies a predetermined voltage so that the second off-voltage is continuously applied to the gate terminal.
第1端子、前記第1端子よりも低電位側に接続される第2端子、および、閾値電圧以下の電圧の印加により前記第1端子と前記第2端子との間が導通するゲート端子を有する、Pチャネル型の半導体スイッチング素子を駆動する、ゲート駆動回路であって、
前記ゲート駆動回路は、
前記ゲート端子に前記閾値電圧以下のオン電圧を印加するオン電圧印加部と、
前記オン電圧印加部が印加するオン電圧を変化させるオン電圧可変部と、
前記閾値電圧よりも高く、かつ、前記ゲート端子と第1端子との間の寄生容量から電荷を引き抜くオフ電圧を、前記ゲート端子に印加するオフ電圧印加部と、を備え、
前記オン電圧可変部は、前記オン電圧として、
前記半導体スイッチング素子のオン期間の開始時において、前記閾値電圧以下の第1オン電圧を印加し、
前記オン期間の終了時において、前記第1オン電圧よりも高く、かつ、前記閾値電圧以下の第2オン電圧を印加するように、
前記半導体スイッチング素子の前記ゲート端子に前記オン電圧を変化させて印加する、ゲート駆動回路。
A first terminal; a second terminal connected to a lower potential side than the first terminal; and a gate terminal that conducts between the first terminal and the second terminal when a voltage equal to or lower than a threshold voltage is applied. A gate driving circuit for driving a P-channel type semiconductor switching element,
The gate driving circuit includes:
An on-voltage applying unit that applies an on-voltage less than or equal to the threshold voltage to the gate terminal;
An on-voltage variable unit that changes an on-voltage applied by the on-voltage applying unit;
An off-voltage applying unit that applies an off-voltage that is higher than the threshold voltage and extracts a charge from a parasitic capacitance between the gate terminal and the first terminal to the gate terminal;
The on-voltage variable unit is configured as the on-voltage.
Applying a first on-voltage that is equal to or lower than the threshold voltage at the start of the on-period of the semiconductor switching element;
At the end of the ON period, a second ON voltage that is higher than the first ON voltage and lower than the threshold voltage is applied.
A gate drive circuit for applying the ON voltage while changing the ON voltage to the gate terminal of the semiconductor switching element.
前記第1端子を基準とした前記第1オン電圧と前記第2オン電圧との比は2倍以上である、請求項7に記載のゲート駆動回路。 The gate drive circuit according to claim 7, wherein a ratio between the first on-voltage and the second on-voltage with respect to the first terminal is twice or more. 前記オン電圧可変部は、
前記オン電圧印加部の出力端子と前記ゲート端子との間に接続されたコンデンサ、および、前記コンデンサと前記ゲート端子との接続点に一端が接続された直列回路を含むと共に、前記ゲート端子に前記第1オン電圧を印加した後、印加する電圧を前記第1オン電圧から上昇させる第1微分回路と、
前記直列回路の他端と接続され、前記ゲート端子に前記第2オン電圧が印加され続けるように所定の電圧を印加する電圧電源と、を備え、
前記直列回路は、ダイオードと前記ダイオードと直列接続された第1抵抗とを含む、請求項7または請求項8のいずれか1項に記載のゲート駆動回路。
The on-voltage variable unit is
A capacitor connected between the output terminal of the on-voltage applying unit and the gate terminal; and a series circuit having one end connected to a connection point between the capacitor and the gate terminal; and A first differentiating circuit for raising the applied voltage from the first on-voltage after applying the first on-voltage;
A voltage power source that is connected to the other end of the series circuit and applies a predetermined voltage so that the second on-voltage is continuously applied to the gate terminal;
The gate drive circuit according to claim 7, wherein the series circuit includes a diode and a first resistor connected in series with the diode.
前記オン電圧可変部は、
前記オン電圧印加部の出力端子と前記ゲート端子との間に接続されたコンデンサ、および、前記コンデンサと前記ゲート端子との接続点に一端が接続された直列回路を含むと共に、前記ゲート端子に前記第1オン電圧を印加した後、印加する電圧を前記第1オン電圧から上昇させる第1微分回路と、
アノードが前記直列回路の他端に接続され、カソードが前記半導体スイッチング素子の第1端子に接続されると共に、前記ゲート端子に前記第2オン電圧が印加され続けるように所定の電圧を印加するツェナーダイオードと、を備え、
前記直列回路は、ダイオードと前記ダイオードと直列接続された第1抵抗とを含む、請求項7または請求項8のいずれか1項に記載のゲート駆動回路。
The on-voltage variable unit is
A capacitor connected between the output terminal of the on-voltage applying unit and the gate terminal; and a series circuit having one end connected to a connection point between the capacitor and the gate terminal; and A first differentiating circuit for raising the applied voltage from the first on-voltage after applying the first on-voltage;
A Zener having an anode connected to the other end of the series circuit, a cathode connected to the first terminal of the semiconductor switching element, and applying a predetermined voltage so that the second ON voltage is continuously applied to the gate terminal A diode, and
The gate drive circuit according to claim 7, wherein the series circuit includes a diode and a first resistor connected in series with the diode.
前記オフ電圧印加部は、前記オフ電圧として、
前記半導体スイッチング素子のオフ期間の開始時において、前記閾値電圧よりも高い第1オフ電圧を印加し、
前記オフ期間の終了時において、前記第1オフ電圧よりも低く、かつ、前記閾値電圧よりも高い第2オフ電圧を印加するように、
前記半導体スイッチング素子の前記ゲート端子に、前記オフ電圧を変化させて印加する、請求項7に記載のゲート駆動回路。
The off-voltage applying unit is configured as the off-voltage.
Applying a first off voltage higher than the threshold voltage at the start of an off period of the semiconductor switching element;
At the end of the off period, a second off voltage lower than the first off voltage and higher than the threshold voltage is applied.
The gate drive circuit according to claim 7, wherein the off-voltage is changed and applied to the gate terminal of the semiconductor switching element.
前記オフ電圧印加部は、
前記コンデンサ、および、前記ゲート端子と第1端子との間に接続された第2抵抗を含むと共に、前記ゲート端子に前記第1オフ電圧を印加した後、印加する電圧を前記第1オフ電圧から上昇させ、その後、前記ゲート端子に前記第2オフ電圧が印加され続けるように所定の電圧を印加する第2微分回路を備える、請求項11に記載のゲート駆動回路。
The off-voltage applying unit is
The capacitor includes a second resistor connected between the gate terminal and the first terminal, and after applying the first off voltage to the gate terminal, the voltage to be applied is changed from the first off voltage. The gate driving circuit according to claim 11, further comprising a second differentiating circuit that raises the voltage and then applies a predetermined voltage so that the second off-voltage is continuously applied to the gate terminal.
発光素子と、
前記発光素子への電流の供給と停止とを切り替える半導体スイッチング素子と、
前記半導体スイッチング素子を駆動する請求項1または請求項7のいずれか1項に記載のゲート駆動回路と、
を備える、発光装置。
A light emitting element;
A semiconductor switching element that switches between supply and stop of current to the light emitting element;
The gate driving circuit according to any one of claims 1 and 7, which drives the semiconductor switching element,
A light emitting device comprising:
PCT/JP2017/033387 2016-09-28 2017-09-15 Gate driving circuit and light emission device having same Ceased WO2018061817A1 (en)

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JP2016189092A JP2018056737A (en) 2016-09-28 2016-09-28 Driver circuit for semiconductor switching element

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WO2022096907A1 (en) * 2020-11-06 2022-05-12 日産自動車株式会社 Resonance-type power conversion device

Citations (5)

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JPH02121520A (en) * 1988-10-31 1990-05-09 Ando Electric Co Ltd Pulse amplifier circuit for capacitive load
JP2007336694A (en) * 2006-06-15 2007-12-27 Mitsubishi Electric Corp Insulated gate semiconductor device drive circuit
JP2013013044A (en) * 2011-05-31 2013-01-17 Sanken Electric Co Ltd Gate drive circuit
JP2016040967A (en) * 2014-08-12 2016-03-24 ニチコン株式会社 Gate drive circuit
WO2017081856A1 (en) * 2015-11-09 2017-05-18 パナソニックIpマネジメント株式会社 Switching circuit

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02121520A (en) * 1988-10-31 1990-05-09 Ando Electric Co Ltd Pulse amplifier circuit for capacitive load
JP2007336694A (en) * 2006-06-15 2007-12-27 Mitsubishi Electric Corp Insulated gate semiconductor device drive circuit
JP2013013044A (en) * 2011-05-31 2013-01-17 Sanken Electric Co Ltd Gate drive circuit
JP2016040967A (en) * 2014-08-12 2016-03-24 ニチコン株式会社 Gate drive circuit
WO2017081856A1 (en) * 2015-11-09 2017-05-18 パナソニックIpマネジメント株式会社 Switching circuit

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