TWI389409B - Method and apparatus for laser control in a two chamber gas discharge laser - Google Patents

Method and apparatus for laser control in a two chamber gas discharge laser Download PDF

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TWI389409B
TWI389409B TW098135413A TW98135413A TWI389409B TW I389409 B TWI389409 B TW I389409B TW 098135413 A TW098135413 A TW 098135413A TW 98135413 A TW98135413 A TW 98135413A TW I389409 B TWI389409 B TW I389409B
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energy
laser
control system
dose
voltage input
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TW098135413A
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TW201023462A (en
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Robert N Jacques
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Cymer Inc
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Priority claimed from US12/255,385 external-priority patent/US7751453B2/en
Priority claimed from US12/255,347 external-priority patent/US7756171B2/en
Priority claimed from US12/255,367 external-priority patent/US7720120B2/en
Application filed by Cymer Inc filed Critical Cymer Inc
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/10Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
    • H01S3/102Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling the active medium, e.g. by controlling the processes or apparatus for excitation
    • H01S3/104Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling the active medium, e.g. by controlling the processes or apparatus for excitation in gas lasers
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70008Production of exposure light, i.e. light sources
    • G03F7/70025Production of exposure light, i.e. light sources by lasers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/10Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
    • H01S3/13Stabilisation of laser output parameters, e.g. frequency or amplitude
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/23Arrangements of two or more lasers not provided for in groups H01S3/02 - H01S3/22, e.g. tandem arrangements of separate active media
    • H01S3/2308Amplifier arrangements, e.g. MOPA
    • H01S3/2325Multi-pass amplifiers, e.g. regenerative amplifiers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/005Optical devices external to the laser cavity, specially adapted for lasers, e.g. for homogenisation of the beam or for manipulating laser pulses, e.g. pulse shaping
    • H01S3/0057Temporal shaping, e.g. pulse compression, frequency chirping
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/02Constructional details
    • H01S3/03Constructional details of gas laser discharge tubes
    • H01S3/034Optical devices within, or forming part of, the tube, e.g. windows, mirrors

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  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Optics & Photonics (AREA)
  • General Physics & Mathematics (AREA)
  • Lasers (AREA)

Abstract

A laser control system contains an oscillator gas chamber and an amplifier gas chamber. A first voltage input is operatively connected to deliver electrical pulses to a first pair of electrodes within the oscillator gas chamber and a second pair of electrodes within the amplifier gas chamber. An output of the gas chambers is an energy dose calculated by a trapezoidal window. A control circuit connects to the first voltage input for modifying the first voltage input. A feedback control loop communicates an output of the gas chambers to the control circuit for modifying the first voltage input.

Description

用於兩腔室氣體放電雷射之雷射控制方法及裝置Laser control method and device for two-chamber gas discharge laser 發明領域Field of invention

本揭露的主要內容大體關於雷射系統且更特定地關於用於一兩腔室氣體放電雷射之一雷射控制系統。The main disclosure of the present disclosure relates generally to laser systems and more particularly to laser control systems for one or two chamber gas discharge lasers.

發明背景Background of the invention

第1圖是在先前技藝已知的一MOPA(主振盪器/功率放大器)雷射系統10之方塊圖之說明。該MOPA雷射系統10使用於例如積體電路印刷術之領域。在該MOPA雷射系統10之一個實施例中,一193nm紫外雷射束被提供在諸如日本Canon或Nikon設備或者荷蘭ASML設備提供之步進機或掃描儀之一光刻機/掃描儀2之輸入埠。該MOPA雷射系統10包括用於以諸如4,000Hz或更大的脈衝重複率控制該系統之脈衝能量與累積劑量能量輸出之一雷射能量控制系統4。該MOPA雷射系統10透過回授與前饋控制該脈衝與劑量能量提供了彼此相關的該兩個腔室中放電之非常精確的觸發。Figure 1 is a block diagram of a MOPA (Primary Oscillator/Power Amplifier) laser system 10 known in the prior art. The MOPA laser system 10 is used, for example, in the field of integrated circuit printing. In one embodiment of the MOPA laser system 10, a 193 nm ultraviolet laser beam is provided in a lithography machine/scanner 2 such as a stepper or scanner provided by a Japanese Canon or Nikon device or a Dutch ASML device. Enter 埠. The MOPA laser system 10 includes a laser energy control system 4 for controlling the pulse energy and cumulative dose energy output of the system at a pulse repetition rate such as 4,000 Hz or greater. The MOPA laser system 10 provides a very accurate triggering of the discharges in the two chambers that are related to each other by feedback and feedforward control of the pulse and dose energy.

該雷射系統4之主要元件通常安裝於該掃描儀2被安裝於其上之層/板5之下。然而,該MOPA雷射系統10包括一光束傳送單元6,其提供用於把該雷射光束送至掃描儀2之一輸入埠之一封閉式光束路徑。該光源包括將在下面更詳細地予以描述之例如一主振盪器11之一種子雷射產生器與例如一功率放大器12之一放大雷射器部分且該放大雷射器部分還可以是例如一功率環振盪器(“PRA”)之一振盪器,其也將在下面更詳細地予以描述。為了方便起見,整個申請案中該種子雷射器可被稱為一MO及該放大雷射器可被稱為一功率放大器或簡稱一PA,目的是涵蓋種子雷射器安排與放大雷射器安排之其它形式,諸如實際上是一振盪器(即一功率振盪器(“PO”))之功率環放大器(“PRA”),且其等共同形成一MOPO,且除非有明確指出,要不然此等術語意圖被廣泛的定義。該光源還包括一脈衝展寬器22。The main components of the laser system 4 are typically mounted below the layer/board 5 on which the scanner 2 is mounted. However, the MOPA laser system 10 includes a beam delivery unit 6 that provides a closed beam path for delivering the laser beam to one of the input ports of the scanner 2. The light source comprises, for example, a seed laser generator, such as a primary oscillator 11, and an amplified laser portion, such as a power amplifier 12, which will be described in more detail below and which may also be, for example, a An oscillator of the Power Loop Oscillator ("PRA"), which will also be described in more detail below. For convenience, the seed laser may be referred to as a MO and the amplification laser may be referred to as a power amplifier or a PA for the purpose of covering the seed laser arrangement and amplifying the laser throughout the application. Other forms of arrangement, such as a power loop amplifier ("PRA") that is actually an oscillator (ie, a power oscillator ("PO"), and which together form a MOPO, and unless explicitly stated, Otherwise these terms are intended to be broadly defined. The light source also includes a pulse stretcher 22.

該主振盪器11與該功率放大器/功率振盪器12的每一個包括類似於單一腔室印刷術雷射系統之一放電腔室11A、12A。此等腔室11A、12A包含兩個電極、一雷射氣體、用於使空氣在該等電極與水冷式鰭片熱交換器之間循環之一切線。該主振盪器11產生被放大之一第一雷射光束14A,在一PA架構中藉由兩次經過該功率放大器12或者在一PO/PRA架構之情況下藉由在PO/PRA中振盪產生如第1圖中所示的一第二雷射光束14B。該主振盪器11包括藉由一輸出耦合器11C及一譜線減寬方塊11B形成之一諧振腔。該主振盪器11之增益介質產生於包含在該主振盪器放電腔室11A內之兩個細長電極之間。該功率放大器12基本上是一放電腔室12A且在較佳實施例中幾乎完全相同於在兩個電極之間提供一增益介質之該主振盪器放電腔室11A,但該功率放大器12可不具有諧振腔,與一PO/PRA不同。此MOPA雷射系統10架構允許該主振盪器11被設計及操作以最大化諸如波長穩定性與很窄頻寬之光束品質參數;其中該功率放大器12被設計與操作以最大化功率輸出。基於此原因,該MOPA雷射系統10表現出比單一腔室系統具有更高的品質與更高的功率雷射光源。Each of the main oscillator 11 and the power amplifier/power oscillator 12 includes a discharge chamber 11A, 12A similar to a single chamber printing laser system. These chambers 11A, 12A comprise two electrodes, a laser gas, and a line for circulating air between the electrodes and the water-cooled fin heat exchanger. The main oscillator 11 produces a first laser beam 14A that is amplified, produced by oscillating in the PO/PRA in a PA architecture by passing through the power amplifier 12 or in a PO/PRA architecture. A second laser beam 14B as shown in FIG. The main oscillator 11 includes a resonant cavity formed by an output coupler 11C and a spectral line widening block 11B. The gain medium of the main oscillator 11 is generated between two elongated electrodes included in the main oscillator discharge chamber 11A. The power amplifier 12 is substantially a discharge chamber 12A and, in the preferred embodiment, is nearly identical to the main oscillator discharge chamber 11A that provides a gain medium between the two electrodes, but the power amplifier 12 may not have The cavity is different from a PO/PRA. This MOPA laser system 10 architecture allows the main oscillator 11 to be designed and operated to maximize beam quality parameters such as wavelength stability and very narrow bandwidth; wherein the power amplifier 12 is designed and operated to maximize power output. For this reason, the MOPA laser system 10 exhibits a higher quality and higher power laser source than a single chamber system.

如上所述,該放大器部分可被組配,例如通過該放大器放電腔室之放電區之兩個光束通道或在包含該放大器放電腔室之該腔中的振盪,如第1圖中所示。該光束在包含該MO 11之LNP 11B與輸出耦合器11C(有30%的反射係數)之間的該主振盪器腔室11A之腔內振盪,且在其通過LNP 10C時被嚴重地譜線减寬。發自該輸出耦合器11C之一雷射光束之波長藉由一線中心分析模組7量測。該已譜線减寬的種子光束藉由在該MO波長處理方塊(MO WEB)24中的一鏡子被向下反射且經由該PA波長處理方塊(PA WEB)26以一角度稍有偏斜地(相對於電極方向)被水平反射到該放大器腔室12。該放大器之後端,一光束換向器28把該光束以與該電極方向成水平一致地反射回去以第二次通過該PA腔室12或在該PO/PRA腔室中振盪。發自該放電腔室12A之一雷射之頻寬藉由一光譜分析模組9量測,儘管該雷射之頻寬可替換為用一頻寬分析模組量測。As noted above, the amplifier portion can be assembled, such as by two beam paths of the discharge region of the discharge chamber of the amplifier or oscillations in the chamber containing the discharge chamber of the amplifier, as shown in FIG. The beam oscillates within the cavity of the main oscillator chamber 11A between the LNP 11B containing the MO 11 and the output coupler 11C (having a 30% reflection coefficient), and is severely lined as it passes through the LNP 10C. Reduced. The wavelength of the laser beam from one of the output couplers 11C is measured by a line center analysis module 7. The spectrally broadened seed beam is reflected downward by a mirror in the MO wavelength processing block (MO WEB) 24 and is slightly skewed at an angle via the PA wavelength processing block (PA WEB) 26. (relative to the electrode direction) is reflected horizontally to the amplifier chamber 12. At the rear end of the amplifier, a beam commutator 28 reflects the beam back horizontally in line with the direction of the electrode to oscillate a second time through the PA chamber 12 or in the PO/PRA chamber. The bandwidth of one of the lasers from the discharge chamber 12A is measured by a spectral analysis module 9, although the bandwidth of the laser can be replaced with a bandwidth analysis module.

該雷射系統輸出光束脈衝14B從該PA/PO腔室12A傳到一光束分離器16。該光束分離器16把該功率放大器輸出光束14B之大約60%反射進由四個聚焦鏡20A、20B、20C及20D產生的一延遲路徑。光束14B之每一脈衝之40%已發送的部分成為一輸出光束脈衝14C之一對應的變寬脈衝之一第一峰。該輸出光束14C藉由光束分離器16被指引到把該反射的部分聚集到點22之鏡子20A。該光束接著展開且自鏡子20B反射,該鏡子20B把該展開光束轉換為一平行光且把其指引到再一次在點22處聚焦該光束之鏡子20C。此光束接著藉由像該鏡子20B一樣之鏡子20D把該展開光束改變成一平行光束且把其指引回到光束分離器16,其中該第一反射光之60%較佳地與該輸出光束14C中的此脈衝之該第一發送的部分一致地被反射以成為該雷射系統輸出光束脈衝中的一第二峰之大部分。該反射的光束之40%發送光束分離器16且準確的沿著在該變寬的脈衝中產生額外的小峰之該第一反射的光束之路徑。結果是該完成的輸出光束14C,其在脈衝長度上從20ns延伸到大約70ns。一光束傳送單元(BDU)傳送該輸出光束14C。該BDU可包括兩個波束指向鏡40A、40B,其中一個或兩個可被控制以為變化光束指向提供傾斜與偏移校正。The laser system output beam pulse 14B is passed from the PA/PO chamber 12A to a beam splitter 16. The beam splitter 16 reflects approximately 60% of the power amplifier output beam 14B into a delay path generated by the four focusing mirrors 20A, 20B, 20C, and 20D. The 40% transmitted portion of each pulse of beam 14B becomes the first peak of one of the widened pulses corresponding to one of the output beam pulses 14C. The output beam 14C is directed by beam splitter 16 to focus the reflected portion to mirror 20A of point 22. The beam is then unrolled and reflected from mirror 20B, which converts the unfolded beam into a parallel beam and directs it to mirror 20C which again focuses the beam at point 22. The beam is then redirected into a parallel beam by a mirror 20D like the mirror 20B and directed back to the beam splitter 16, wherein 60% of the first reflected light is preferably associated with the output beam 14C The first transmitted portion of the pulse is uniformly reflected to become a majority of a second peak in the output beam pulse of the laser system. 40% of the reflected beam is transmitted to beam splitter 16 and accurately along the path of the first reflected beam that produces additional small peaks in the widened pulse. The result is the completed output beam 14C, which extends from 20 ns to approximately 70 ns over the pulse length. A beam delivery unit (BDU) transmits the output beam 14C. The BDU can include two beam pointing mirrors 40A, 40B, one or both of which can be controlled to provide tilt and offset correction for varying beam directions.

根據該先前技藝,第2圖是用於第1圖之該MOPA/MOPO雷射系統之一能量控制方塊圖50之一說明。第2圖說明了控制該MOPA雷射系統10之一電壓52之各種控制元件。該能量控制方塊圖50包括一靜態控制54,其提供期望實現一能量目標56之一基本確定的電壓(如果沒有其它需說明的影響)。一前饋方塊58基於一觸發間隔60提供了一電壓調節。觸發間隔60可用以計算影響“電壓輸入-能量輸出”關係之重複率、發射數目及工作週期。該電壓調節被計算為此等值之一函數。一能量伺服機62基於該先前發射之一已計算的電壓誤差調整電壓輸入52。一抖動取消66調整電壓以消除由一時間抖動68造成的能量改變。最後,一能量抖動70提供加到該電壓輸入52之一週期性信號,其用以估計電壓對MO能量、輸出能量及MOPA時間之影響。此五個電壓信號加到一起以產生該電壓輸入52。當該雷射器發射時,能量72被量測。該能量目標被從該量測的能量中減去以產生能量誤差信號74,該能量誤差信號74由dV/dE(電壓關於能量的導數之雷射估計76)縮放。產生的電壓誤差64被用以驅動以最小化能量誤差、劑量誤差、能量西格瑪或其等一些組合之方式調整一些電壓信號之適應演算法78。In accordance with this prior art, FIG. 2 is an illustration of one of the energy control block diagrams 50 for the MOPA/MOPO laser system of FIG. Figure 2 illustrates various control elements that control one of the voltages 52 of the MOPA laser system 10. The energy control block diagram 50 includes a static control 54 that provides a voltage that is desired to achieve a substantially determined one of the energy targets 56 (if there are no other effects to account for). A feed forward block 58 provides a voltage adjustment based on a trigger interval 60. Trigger interval 60 can be used to calculate the repetition rate, number of shots, and duty cycle that affect the "voltage input - energy output" relationship. This voltage adjustment is calculated as a function of this value. An energy servo 62 adjusts the voltage input 52 based on the calculated voltage error of one of the previous emissions. A jitter cancel 66 adjusts the voltage to cancel the energy change caused by a time jitter 68. Finally, an energy jitter 70 provides a periodic signal to the voltage input 52 that is used to estimate the effect of voltage on MO energy, output energy, and MOPA time. These five voltage signals are added together to produce the voltage input 52. When the laser is fired, energy 72 is measured. The energy target is subtracted from the measured energy to produce an energy error signal 74 that is scaled by dV/dE (the laser's estimate of the derivative of the energy with respect to the energy 76). The resulting voltage error 64 is used to drive an adaptive algorithm 78 that adjusts some of the voltage signals in a manner that minimizes energy error, dose error, energy sigma, or some combination thereof.

第1圖中顯示的該MOPA雷射系統10是該單一腔室系統之改進,其提供了比該單一腔室系統之更大的光束控制、光束功率及穩定性。然而,解決該系統之音調干擾及進一步的銳化時間與能量控制可顯著的改進操作。The MOPA laser system 10 shown in Figure 1 is an improvement of the single chamber system that provides greater beam control, beam power and stability than the single chamber system. However, solving the system's pitch disturbances and further sharpening time and energy control can significantly improve the operation.

發明概要Summary of invention

本揭露標地之實施例之一些層面提供了用於控制一雷射系統之一系統及方法,簡單來說,在架構上,該系統之一個可能實施例之層面尤其可如下予以實施。該系統包含一振盪器氣體腔室及一放大器氣體腔室。一第一電壓輸入被可操作地連接以傳送電脈衝到該振盪器氣體腔室內的一第一對電極與該放大器氣體腔室內的一第二對電極。該等氣體腔室之一輸出是由一梯形視窗計算的一能量劑量。一控制電路連接到該第一電壓輸入用於修改該第一電壓輸入。一回授控制迴路把該等氣體腔室之一輸出傳到用於修改該第一電壓輸入的控制電路。Some aspects of embodiments of the present disclosure provide a system and method for controlling a laser system. Briefly, in terms of architecture, one level of a possible embodiment of the system can be implemented as follows. The system includes an oscillator gas chamber and an amplifier gas chamber. A first voltage input is operatively coupled to deliver an electrical pulse to a first pair of electrodes within the oscillator gas chamber and a second pair of electrodes within the amplifier gas chamber. One of the gas chamber outputs is an energy dose calculated from a trapezoidal window. A control circuit is coupled to the first voltage input for modifying the first voltage input. A feedback control loop passes the output of one of the gas chambers to a control circuit for modifying the first voltage input.

該揭露標地之一些層面還可被看作提供用於控制一雷射系統之方法。在這點上,其中這樣的一方法之一個實施例尤其可被總結為以下步驟:把一第一電壓輸入可操作地以電脈衝之形式傳送到一振盪器氣體腔室內的一第一對電極與一放大器氣體腔室內的一第二對電極;透過一梯形視窗計算該等氣體腔室之一輸出之一能量劑量;透過一控制電路修改該第一電壓輸入;及透過一回授控制迴路把該等氣體腔室之一輸出傳到該控制電路以修改該第一電壓輸入。Some aspects of the disclosed landmarks can also be viewed as providing a method for controlling a laser system. In this regard, an embodiment of such a method can be summarized in particular as the step of operatively transmitting a first voltage input as an electrical pulse to a first pair of electrodes within an oscillator gas chamber. And a second pair of electrodes in an amplifier gas chamber; calculating an energy dose of one of the gas chambers through a trapezoidal window; modifying the first voltage input through a control circuit; and transmitting through a feedback control loop One of the gas chamber outputs is passed to the control circuit to modify the first voltage input.

本揭露標地之其它系統、方法、特徵及優點對於一個熟於此技藝者一經察看下面的圖式與詳細描述後將是或將變得明顯。目的是所有這樣的其它系統、方法、特徵及優點被包括在此描述內、在該揭露標地之範圍內且受所附的申請專利範圍保護。Other systems, methods, features and advantages of the present invention will be or become apparent to those skilled in the art. It is intended that all such other systems, methods, features and advantages are included within the scope of the disclosure, and are covered by the appended claims.

圖式簡單說明Simple illustration

本發明之很多層面結合下面的圖式可被更好的理解。該等圖式中的元件不一定按比例繪製,而重點放在清楚地說明該揭露標地之原理。而且,在該等圖式中,相同的參考數字指示全部幾個視圖中相同部分。Many aspects of the invention can be better understood in conjunction with the following figures. The elements in the figures are not necessarily drawn to scale, and the emphasis is on the principles of the disclosure. Moreover, in the drawings, like reference numerals refer to the

第1圖是一MOPA/MOPRA雷射系統之一方塊圖之說明。Figure 1 is a block diagram of a MOPA/MOPRA laser system.

第2圖是用於第1圖之該MOPA/MOPRA雷射系統之一能量控制方塊圖之說明。Figure 2 is an illustration of an energy control block diagram for one of the MOPA/MOPRA laser systems of Figure 1.

第3圖根據本揭露標地之一第一示範性實施例,是表示不同的重複率之梯形視窗之曲線圖之說明。Figure 3 is a diagram showing a graph of a trapezoidal window of different repetition rates in accordance with a first exemplary embodiment of the present disclosure.

第4圖根據本揭露標地之一第一示範性實施例,是用於第3圖中說明的該等視窗之劑量運算器之頻率響應之曲線圖之說明。Figure 4 is a diagram showing a plot of the frequency response of the dose operators of the windows illustrated in Figure 3, in accordance with a first exemplary embodiment of the present disclosure.

第5圖根據本揭露標地之一第一示範性實施例,是用於第1圖之MOPA/MOPRA雷射系統之一能量控制方塊圖之說明。Figure 5 is an illustration of one of the energy control block diagrams of the MOPA/MOPRA laser system of Figure 1 in accordance with a first exemplary embodiment of the present disclosure.

第6圖根據本揭露標地之該第一示範性實施例,是說明提供第5圖之雷射控制系統之一方法之流程圖。Figure 6 is a flow chart illustrating one method of providing a laser control system of Figure 5 in accordance with the first exemplary embodiment of the present disclosure.

較佳實施例之詳細說明Detailed description of the preferred embodiment

本揭露標地之元件基於以下認知:儘管方形視窗已在以前使用以用於能量劑量計算,但一些優點可藉由採用變化形狀之視窗而被實現。根據本揭露標地的一第一示範性實施例,第3圖是表示變化的重複率之梯形窗之曲線圖之說明。根據本揭露標地的第一示範性實施例之層面,第4圖是用於第3圖中說明的視窗之劑量運算器之頻率響應曲線圖之說明。要注意儘管有隨著變化的視窗寬度而變化的一組零,對於所有視窗在20%及40%的取樣率下有清楚的零存在。此等零對應5個脈衝移動平均之零。可顯示一梯形視窗是一具有等於該視窗大小、小於後緣的矩形視窗與一5個脈衝矩形視窗的卷積。The elements of the present disclosure are based on the recognition that although square windows have been previously used for energy dose calculations, some advantages can be realized by employing windows of varying shapes. In accordance with a first exemplary embodiment of the present disclosure, FIG. 3 is an illustration of a graph of a trapezoidal window showing varying repetition rates. In accordance with the level of the first exemplary embodiment of the present disclosure, FIG. 4 is an illustration of a frequency response graph for the dose operator of the window illustrated in FIG. Note that although there is a set of zeros that vary with varying window widths, there is a clear zero presence for all windows at 20% and 40% sampling rates. These zeros correspond to zeros of the five pulse moving averages. A trapezoidal window can be displayed as a convolution of a rectangular window having a size equal to the window size and less than the trailing edge and a five-pulse rectangular window.

根據本揭露標地的一第一示範性實施例,第5圖是用於第1圖之該MOPA/MOPRA雷射系統10之一能量控制方塊圖150之說明。第5圖說明了控制該MOPA/MOPARA雷射系統10之一電壓輸入152之各種控制元件。該能量控制方塊圖150包括一靜態控制154,其提供期望實現一能量目標156之一基本確定的電壓(如果沒有其它需說明的影響)。該靜態控制154之一目標之一部分是使該能量控制器回應該能量目標156中的變化。如果一使用者調整一能量目標,用於該第一發射之該第一電壓輸入152應當被估計以滿足該新的能量設定點。該靜態控制154可提供下面的電壓信號:In accordance with a first exemplary embodiment of the present disclosure, FIG. 5 is an illustration of an energy control block diagram 150 for the MOPA/MOPRA laser system 10 of FIG. Figure 5 illustrates various control elements that control one of the voltage inputs 152 of the MOPA/MOPARA laser system 10. The energy control block diagram 150 includes a static control 154 that provides a voltage that is desired to achieve a substantially determined one of the energy targets 156 (if there are no other effects to account for). One of the goals of one of the static controls 154 is to cause the energy controller to respond to changes in the energy target 156. If a user adjusts an energy target, the first voltage input 152 for the first shot should be estimated to satisfy the new energy set point. The static control 154 can provide the following voltage signals:

其中Eref 被大致設定成該雷射系統10之一標稱能量及Vref 是以Eref 發射該雷射大約所需的電壓。Where E ref is approximately set to a nominal energy of the laser system 10 and V ref is the voltage required to emit the laser at E ref .

前饋方塊158基於一觸發間隔160提供了一電壓調整。觸發間隔160被用以估計影響“電壓輸入-能量輸出”關係之重複率、發射數目及工作週期。用於該觸發間隔160之該電壓調節被計算為此等值之一函數。更特定地,由該前饋方塊158提供之電壓信號可由V=f 0 (D)+f 1 (R,n)給定,其中D是工作週期,R是該重複率及n是該發射數目。要注意該前饋電壓具有兩項。一項f 0 依賴於工作週期及/或叢發間隔,及另一項f 1 依賴於發射數目與重複率。按照設計,f 1 在每一叢發之第一發射時恆為零。因此,f 0 獨自確定用於該叢發之第一發射之前饋電壓。此項的目的是調整雷射在效能上的改變,其一般在整個叢發中持續。該f 1 項描述任何暫態形狀。此定律假定工作週期或叢間間隔效應對於在一叢發中的所有發射,只移動能量對發射數目向上地或向下地改變等量。該能量暫態之形狀被假定只取決於重複率。該f 1 (R,n)函數補償該能量暫態之形狀。Feed forward block 158 provides a voltage adjustment based on a trigger interval 160. The trigger interval 160 is used to estimate the repetition rate, number of shots, and duty cycle that affect the "voltage input - energy output" relationship. This voltage adjustment for the trigger interval 160 is calculated as a function of this value. More specifically, the voltage signal provided by the feedforward block 158 can be given by V = f 0 (D) + f 1 (R, n), where D is the duty cycle, R is the repetition rate and n is the number of shots . It should be noted that the feedforward voltage has two items. One f 0 depends on the duty cycle and/or the burst interval, and the other f 1 depends on the number of shots and the repetition rate. By design, f 1 is always zero at the first shot of each burst. Therefore, f 0 alone determines the feed voltage for the first transmission of the burst. The purpose of this item is to adjust the change in performance of the laser, which generally lasts throughout the burst. Description of the f 1 Transient any shape. This law assumes that the duty cycle or inter-cluster spacing effect for all emissions in a burst, only shifts the energy to the number of shots up or down by the same amount. The shape of this energy transient is assumed to depend only on the repetition rate. The f 1 (R, n) function compensates for the shape of the energy transient.

f 1 (R,n)函數與重複率和發射數目的關係以一表被保持。一簡單積分器被用以適應區(bins)。以前,該等區被初始化為零,在該雷射控制正確地以該重複率反轉該暫態前需要好幾個叢發。替代用零初始化此等區,前饋區可利用在頻率上最接近的被訓練區之值被初始化。利用接近於該能量暫態之形狀之正確值之一值初始化該等區,允許該雷射控制更快且具有更大準確性以該重複率反轉該暫態。The relationship of the f 1 (R, n) function with the repetition rate and the number of shots is maintained in a table. A simple integrator is used to accommodate the bins. Previously, the zones were initialized to zero, requiring several bursts before the laser control correctly reverses the transient at the repetition rate. Instead of initializing these regions with zeros, the feedforward region can be initialized with the value of the trained region that is closest in frequency. Initializing the regions with one of the correct values close to the shape of the energy transient allows the laser control to be faster and with greater accuracy to reverse the transient at the repetition rate.

一能量伺服機162基於該相同叢發內的先前的發射之一已計算的電壓誤差164調整該電壓輸入152。來自該能量伺服機162之該調整可在至少一對不同模組中被計算。首先,IISquared回授是熟於此技藝者已知的一回授定律。此回授定律回授一正比於該電壓誤差之積分(積分增益)的電壓和另一正比於該電壓誤差積分二次(I平方增益)之電壓。好幾組增益被提供:軟;硬;及MO。當目的是最小化發射的能量誤差時,軟增益被用在可操作模式中。軟增益被選擇以最小化能量誤差。硬增益用在劑量與西格瑪模式中。硬增益目的是最小化劑量(能量誤差之積分)且往往比軟增益大。該MO增益被用在MO能量控制模式中且目的也是最小化能量誤差。An energy servo 162 adjusts the voltage input 152 based on a calculated voltage error 164 of one of the previous transmissions within the same burst. This adjustment from the energy servo 162 can be calculated in at least one pair of different modules. First, IISquared feedback is a reciprocal law known to those skilled in the art. This feedback law returns a voltage proportional to the integral of the voltage error (integral gain) and another voltage proportional to the voltage error integral quadratic (I square gain). Several sets of gains are provided: soft; hard; and MO. When the goal is to minimize the energy error of the emission, the soft gain is used in the operational mode. Soft gain is selected to minimize energy error. Hard gain is used in dose and sigma mode. The purpose of hard gain is to minimize the dose (integration of the energy error) and tend to be larger than the soft gain. This MO gain is used in the MO energy control mode and is also intended to minimize energy errors.

IISquared回授的另一可選擇方式是劑量回授。和具有硬增益之IISquared控制器一樣,劑量回授控制器目的是最小化劑量。然而,其利用透過非矩形劑量視窗(例如梯形劑量視窗)提供較好性能之一控制定律。劑量回授受一尺寸參數與一增益向量控制。該劑量回授控制器只可用在劑量與西格瑪模式中且可應用一線形二次調節器最小化能量劑量與該能量誤差172之平方和。利用該線性二次調節器代替100%積分回授已經在測試中顯示可降低能量劑量誤差大約25%。Another alternative to IISquared feedback is dose feedback. As with the IISquared controller with hard gain, the dose feedback controller is designed to minimize the dose. However, it utilizes a control law that provides better performance through a non-rectangular dose window (eg, a trapezoidal dose window). The dose feedback is controlled by a size parameter and a gain vector. The dose feedback controller can only be used in dose and sigma mode and a linear quadratic regulator can be applied to minimize the sum of the sum of the energy dose and the energy error 172. Using this linear quadratic regulator instead of 100% integral feedback has been shown in the test to reduce the energy dose error by approximately 25%.

如第5圖中所示,該雷射系統4之結果是經由一靜態增益把該電壓輸入152轉變為能量(由能量量測172估計)。此外,有一組干擾加到該能量信號。因此該系統之狀態可等同於干擾動態與劑量運算器。該能量伺服機162可被導向去提供響應於該劑量運算器之行為之電壓調節。該能量劑量回授可以一狀態回授向量K與一表徵該劑量運算器之狀態之向量xd的內積而被計算。As shown in FIG. 5, the result of the laser system 4 is that the voltage input 152 is converted to energy (estimated by the energy measurement 172) via a static gain. In addition, a set of interference is added to the energy signal. Thus the state of the system can be equated with the interference dynamics and dose operator. The energy servo 162 can be directed to provide voltage regulation in response to the behavior of the doser. The energy dose feedback can be calculated from a state feedback vector K and an inner product of a vector xd characterizing the state of the dose operator.

Vdose=-K xdVdose=-K xd

其中K作為最小化該能量誤差之平方與該能量劑量誤差之平方之一加權和之一線性二次調節器之一解被計算。Where K is calculated as one of the linear quadratic regulators that minimizes the sum of the square of the energy error and the square of the energy dose error.

一抖動取消166調節電壓以消除由一時間抖動168造成的能量改變。此消除之一副產物是估計在一固定能量下電壓關於MOPA/MOPRA時間之導數,用以計算MopaOPpoint180(該MOPA雷射系統之操作點u,其在一不變能量下被定義為:u=1/E*dV/dt,其中E是一雷射能量,V是電壓及t是MOPA時間,在該MO與PA腔室之間的發射時間之差。)之一值。對於時間控制之某些層面,時間對能量曲線之局部斜率是需要的。此資訊藉由把一抖動信號施加到該MO與PA整流器觸發器要求的不同時間而獲得。因為時間耦合到能量,此抖動信號產生在能量上的一匹配抖動。抖動取消演算法適應性地找到一電壓信號,其當用在該雷射器中時,準確地消除了由該時間抖動信號產生的在能量上的抖動。因此,該時間抖動不再出現在該能量信號中,且因此對能量西格瑪或能量劑量沒有影響。A jitter cancellation 166 adjusts the voltage to cancel the energy change caused by a time jitter 168. One of the eliminations of this by-product is to estimate the derivative of the voltage with respect to MOPA/MOPRA time at a fixed energy to calculate MopaOPpoint 180 (the operating point u of the MOPA laser system, which is defined as a u= at a constant energy) 1/E*dV/dt, where E is a laser energy, V is the voltage and t is the MOPA time, one of the difference between the emission time between the MO and the PA chamber. For some aspects of time control, the local slope of the time vs. energy curve is needed. This information is obtained by applying a jitter signal to the different times required by the MO and PA rectifier triggers. Because time is coupled to energy, this jitter signal produces a matched jitter in energy. The jitter cancellation algorithm adaptively finds a voltage signal that, when used in the laser, accurately eliminates the energy jitter produced by the time jitter signal. Therefore, this time jitter no longer occurs in the energy signal and therefore has no effect on the energy sigma or energy dose.

該取消演算法之一副產物是在一固定能量下電壓關於時間的導數。此副產物是時間抖動被用來確認在第一位置之斜率資訊。在用於氣體控制之該雷射控制系統中使用的一參數dMpopdMopa(MopaOpPoint關於MO與PA腔室發射時間之間的差之導數)可被用以使該抖動取消幾乎馬上回應MOPA時間之變化(MO與PA腔室發射時間之差)。如果該參數被取消(off),在MOPA/MOPRA時間上的一“大”變化,MopaOpPoint 180(“Mpop”)將跳到一新值且那麽接著下一個幾千次發射,將移到一不同的值。在當該MopaOpPoint 180估計正收斂的期間,該等時間抖動信號之一些將滲濾為能量。如果上述的氣體控制參數被正確地設定,在MOPA/MOPRA時間上的一“大”(1-2ns)變化,一MopaOpPoint 180應當跳到一新值且接著以很少飄移地保持在該新值。One of the by-products of the cancellation algorithm is the derivative of the voltage with respect to time at a fixed energy. This by-product is the time jitter used to confirm the slope information at the first location. A parameter dMpopdMopa (the derivative of the difference between the MO and PA chamber emission time of the MopaOpPoint) used in the laser control system for gas control can be used to cancel the jitter almost immediately in response to changes in the MOPA time ( The difference between the MO and PA chamber emission time). If the parameter is canceled (off), a "large" change in MOPA/MOPRA time, MopaOpPoint 180 ("Mpop") will jump to a new value and then the next thousands of shots will move to a different Value. Some of these time jitter signals will percolate into energy during the time when the MopaOpPoint 180 estimates positive convergence. If the above gas control parameters are correctly set, a "large" (1-2 ns) change in MOPA/MOPRA time, a MopaOpPoint 180 should jump to a new value and then remain at the new value with little drift. .

如所示,關於第4圖,採用梯形視窗,對於所有視窗在取樣率的20%到40%有出現清楚的零(其中該梯形視窗之前緣與後緣是5個脈衝)。一抖動之振幅通常被設定得低以降低該能量抖動,但該低振幅延遲了該能量劑量對電壓估計之導數之計算。如果該抖動移動到該等梯形視窗之一個之零之下,該振幅可增大而具有減小的負面影響。As shown, with respect to Figure 4, a trapezoidal window is used, with clear zeros appearing for 20% to 40% of the sampling rate for all windows (where the leading and trailing edges of the trapezoidal window are 5 pulses). The amplitude of a jitter is typically set low to reduce the energy jitter, but the low amplitude delays the calculation of the derivative of the energy dose to the voltage estimate. If the jitter moves below zero of one of the trapezoidal windows, the amplitude can be increased with a reduced negative impact.

Mpop補償182調整該電壓輸入152以補償MOPA時間變化。此調節主要是穩定能量於一DtMopaTarget超過大約1納秒之變化。如果一雷射器與頻寬控制致能(ASC)一起運作且當前遠離諧振運作以保持頻寬不變,該控制系統降低MO與PA觸發器之間的延遲。這時MopaOpPoint將是一低、負值,因為DtMopaTarget是若干納秒低於最高效率之值。接著,該掃描儀2把重複率轉換為依賴於一頻寬諧振之一個重複率。頻寬上升且該頻寬控制器提升DtMopaTarget若干納秒以補償。這使該雷射好幾奈秒更靠近最高效率及能量以一步階方式提高。能量改變之步驟將影響能量劑量直到該能量伺服器有一補償機會。Mpop compensation 182 adjusts this voltage input 152 to compensate for MOPA time variations. This adjustment is primarily a change in the stabilizing energy over a DtMopaTarget of more than about 1 nanosecond. If a laser operates with Bandwidth Control Enable (ASC) and is currently operating away from resonance to keep the bandwidth constant, the control system reduces the delay between the MO and PA flip-flops. At this time, MopaOpPoint will be a low and negative value because DtMopaTarget is a value of several nanoseconds below the highest efficiency. Next, the scanner 2 converts the repetition rate into a repetition rate that depends on a bandwidth resonance. The bandwidth rises and the bandwidth controller boosts DtMopaTarget by a few nanoseconds to compensate. This brings the laser closer to the highest efficiency and energy in a step-by-step manner. The step of energy change will affect the energy dose until the energy server has a chance to compensate.

與此同時,MopaOpPoint補償182減輕此影響。利用被用以調整用於Mopa時間變化之抖動取消之相同值dMpopDMopa,計算將需要的隨一給定Mopa時間變化而變化之電壓量是可能的。當Mopa時間變化得很快時,該MopaOpPoint補償182可預測還需要什麽電壓變化且提供一適當的電壓信號到該電壓輸入152而無需任何等待一能量誤差174出現。該MopaOpPoint補償182可被描述為:At the same time, the MopaOpPoint Compensation 182 mitigates this effect. With the same value dMpopDMopa used to adjust the jitter cancellation for the Mopa time variation, it is possible to calculate the amount of voltage that would be required to vary with a given Mopa time variation. When the Mopa time changes rapidly, the MopaOpPoint compensation 182 can predict what voltage change is needed and provide an appropriate voltage signal to the voltage input 152 without any waiting for an energy error 174 to occur. The MopaOpPoint Compensation 182 can be described as:

V=Eu2 /2kV=Eu 2 /2k

其中E是該雷射能量,u是MopaOpPoint,及k是dMpopDMopa或MopaOpPoint關於Mopa時間(在該MO與PA腔室之間的發射時間之差)之導數。Where E is the laser energy, u is MopaOpPoint, and k is the derivative of dMpopDMopa or MopaOpPoint with respect to the Mopa time (the difference in emission time between the MO and the PA chamber).

一干擾預測184基於電壓誤差之一預測調整該電壓輸入152,假定影響能量之干擾是一DC偏移加上一些音調。該等音調在該MO及PA/PO風機轉速之倍數之頻率。此預測的電壓誤差被從該電壓輸入152中減去,從而消除由於DC偏移或風機葉片通過造成的影響。An interference prediction 184 predicts the voltage input 152 based on one of the voltage errors, assuming that the interference affecting the energy is a DC offset plus some tones. The tones are at a frequency that is a multiple of the MO and PA/PO fan speeds. This predicted voltage error is subtracted from the voltage input 152, thereby eliminating the effects due to DC offset or fan blade passage.

最後,一能量抖動170提供加到到該電壓輸入152之一週期信號,用以計算電壓對MO能量、輸出能量及MOPA時間上之影響。來自該能量抖動170之該週期信號是n個發射長且可由此方程式描述:Finally, an energy jitter 170 provides a periodic signal applied to the voltage input 152 for calculating the effect of voltage on MO energy, output energy, and MOPA time. The periodic signal from the energy jitter 170 is n long and can be described by this equation:

V[k]=Acos(2πnd k/n) k=0,...,n-1V[k]=Acos(2πn d k/n) k=0,...,n-1

其中A是抖動振幅及nd 是該抖動之一完整週期內的餘弦週期之數目。Where A is the jitter amplitude and n d is the number of cosine periods in one complete period of the jitter.

該抖動信號在每一叢發中開始時被延遲一固定個數之發射。該延遲被提供使得該抖動未能與叢發影響之開始結合而把該雷射器4推出規格之外。為了防止在或接近該抖動頻率之其它信號干擾導數估計,該抖動信號之相位可被隨機化,隨機化藉由隨機以上方程式中的值k以開始該抖動而被執行。對於第3圖中顯示的該等視窗,該抖動頻率是該重複率之五分之一(每一梯形視窗提前與落後5個發射)。此是利用梯形視窗以計算劑量之雷射器之關鍵頻率。對於具有四個脈衝前緣和後緣之視窗來說,該重複率之20%位於該劑量運算器之一零內。因此,以此頻率之抖動將對劑量沒有影響。The jitter signal is delayed by a fixed number of transmissions at the beginning of each burst. This delay is provided such that the jitter fails to combine with the beginning of the burst effect to push the laser 4 out of specification. In order to prevent other signals at or near the jitter frequency from interfering with the derivative estimate, the phase of the jitter signal can be randomized, and randomization is performed by randomly starting the jitter by the value k in the above equation. For the windows shown in Figure 3, the jitter frequency is one-fifth of the repetition rate (each trapezoidal window advances 5 times behind). This is the critical frequency of a laser using a trapezoidal window to calculate the dose. For a window with four pulse leading and trailing edges, 20% of the repetition rate is within one of the zeros of the dose operator. Therefore, jitter at this frequency will have no effect on the dose.

此等電壓信號被加在一起以產生該電壓輸入152。當該雷射器發射時,該能量被量測172。該能量目標被從該量測的能量中減去以產生一能量誤差信號174,能量誤差信號174由dV/dE(電壓關於能量之導數的雷射估計176)縮放。產生的電壓誤差164被用以驅動以最小化能量誤差、劑量誤差或能量西格瑪或其等組合之一方式調整一些電壓信號之適應演算法178。These voltage signals are added together to produce the voltage input 152. This energy is measured 172 when the laser is fired. The energy target is subtracted from the measured energy to produce an energy error signal 174 that is scaled by dV/dE (the voltage estimate 176 of the voltage derivative of the energy). The resulting voltage error 164 is used to drive an adaptation algorithm 178 that adjusts some of the voltage signals in a manner that minimizes energy error, dose error, or energy sigma or a combination thereof.

根據該揭露標地之該第一個示範性實施例,第6圖是說明提供第5圖之該雷射控制系統150之一方法之流程圖200。應當注意流程圖中的任何流程描述或方塊應當被理解為表示包括用於實施在該流程中之特定邏輯功能之一個或多個指令之模組、程式片段、部分碼或步驟,且替代的實施態樣是包括在本揭露標地的範圍內,其中功能可違反所顯示的或討論的順序執行,依據相關功能其包括實質上現在所顯示的順序或相反的順序,其將為適度熟於該揭露標地之技藝者了解。In accordance with this first exemplary embodiment of the disclosed subject matter, FIG. 6 is a flow chart diagram 200 illustrating one method of providing the laser control system 150 of FIG. It should be noted that any flow descriptions or blocks in the flowcharts should be understood to represent modules, program fragments, partial codes or steps including one or more instructions for implementing particular logical functions in the flow, and alternative implementations The aspects are included within the scope of the disclosure, wherein the functions may be performed in an order that is not in the order shown or discussed. The artisans who expose the landmarks understand.

現在該第一示範性實施例之三個可選擇例將關於第6圖予以各自地描述。Three alternative examples of the first exemplary embodiment will now be described separately with respect to Figure 6.

在一第一可選擇例中,如方塊202所示,一第一電壓輸入被可操作地以電脈衝形式傳送到一振盪器氣體腔室內的一第一對電極與一放大器氣體腔室內的一第二對電極。該等氣體腔室之輸出之一能量劑量透過一梯形視窗被計算(方塊204)。該第一電壓輸入透過一控制電路調整,其中一劑量運算器之頻率響應具有至少一個零(方塊206)。一能量抖動與一時間抖動之至少一個在該等零之一個之下初始化(方塊208)。該等氣體腔室之一輸出透過一回授控制迴路被傳遞到該控制電路以調整該第一電壓輸入(方塊210)。In a first alternative, as indicated by block 202, a first voltage input is operatively transmitted as an electrical pulse to a first pair of electrodes within an oscillator gas chamber and a chamber within an amplifier gas chamber The second pair of electrodes. One of the energy doses of the outputs of the gas chambers is calculated through a trapezoidal window (block 204). The first voltage input is adjusted by a control circuit wherein the frequency response of a dose operator has at least one zero (block 206). At least one of an energy dither and a time dither is initialized below one of the zeros (block 208). An output of one of the gas chambers is passed to the control circuit via a feedback control loop to adjust the first voltage input (block 210).

在第二可選擇例中,如方塊202所示,一第一電壓輸入被可操作地以電脈衝之形式傳送到一氣體腔室內的一第一對電極與一放大器氣體腔室內的一第二對電極。該等氣體腔室之一輸出之一能量劑量透過一梯形視窗被計算(方塊204)。該第一電壓輸入透過一控制電路調整,其中該控制電路根據V=Eu2 /2k調整該第一電壓輸入,其中E是一雷射能量、u是一MopaOpPoint及k是MopaOpPoint關於該等氣體腔室之間的發射時間之差之導數。此可選擇例未使用方塊208。該等氣體腔室之一輸出透過一回授控制迴路被傳遞到該控制電路以調整該第一電壓輸入(方塊210)。In a second alternative, as indicated by block 202, a first voltage input is operatively delivered in the form of an electrical pulse to a first pair of electrodes within a gas chamber and a second chamber within an amplifier gas chamber Electrode. One of the energy doses of one of the gas chambers is calculated through a trapezoidal window (block 204). The first voltage input is adjusted by a control circuit, wherein the control circuit adjusts the first voltage input according to V=Eu 2 /2k, where E is a laser energy, u is a MopaOpPoint, and k is a MopaOpPoint with respect to the gas chambers The derivative of the difference in emission time between chambers. Block 208 is not used in this alternative. An output of one of the gas chambers is passed to the control circuit via a feedback control loop to adjust the first voltage input (block 210).

在第三可選例中,如方塊202所示,一第一電壓輸入被可操作地以電脈衝形式傳送到一振盪器氣體腔室內的一第一對電極與一放大器氣體腔室內的一第二對電極。該等氣體腔室之一輸出之一能量劑量透過一梯形視窗被計算(方塊204)。該第一電壓輸入透過一控制電路按照Vdose =-K xd計算之一能量劑量回授加到該第一電壓輸入而被調整,其中K是一狀態回授向量,其被估計為最小化一能量誤差之平方與一能量劑量誤差之平方之加權和之一線性二次調解器之一解,且xd是表徵一劑量運算器之一狀態之一向量(方塊206)。此可選擇例未使用方塊208。該等氣體腔室之一輸出透過一回授控制迴路被輸出被傳遞到該控制電路以調整該第一電壓輸入(方塊210)。In a third alternative, as indicated by block 202, a first voltage input is operatively transmitted as an electrical pulse to a first pair of electrodes within an oscillator gas chamber and a first portion of an amplifier gas chamber Two pairs of electrodes. One of the energy doses of one of the gas chambers is calculated through a trapezoidal window (block 204). The first voltage input is adjusted by a control circuit applying a dose of energy dose to V dose = -K xd to be added to the first voltage input, wherein K is a state feedback vector, which is estimated to be minimized One of the linear quadratic mediators is a weighted sum of the square of the energy error and the square of an energy dose error, and xd is a vector characterizing one of the states of a dose operator (block 206). Block 208 is not used in this alternative. An output of one of the gas chambers is output through a feedback control loop to the control circuit to adjust the first voltage input (block 210).

應當強調的是,該揭露標地之以上描述的實施例,尤其是任何“較佳”實施例,只是實施態樣之可能範例且只是為了對本發明之原理之清楚了解而提出。可對本發明之以上描述的實施例做很多改變與修改而實質上不脫離本發明之精神與原理。所有這樣的改變與修改意圖被包括在該揭露與該揭露標地之範圍內且受下面的專利申請範圍保護。It should be emphasized that the above described embodiments of the present invention, and particularly, the "preferred" embodiments are merely possible examples of implementations and are merely intended to provide a clear understanding of the principles of the invention. Many changes and modifications may be made to the above described embodiments of the invention without departing from the spirit and scope of the invention. All such changes and modifications are intended to be included within the scope of the disclosure and the scope of the disclosure.

2...光刻機/掃描儀2. . . Lithography machine/scanner

4...雷射能量控制系統、雷射系統4. . . Laser energy control system, laser system

5...層/板5. . . Layer/board

6...光束傳送單元6. . . Beam transfer unit

7...線中心分析模組7. . . Line center analysis module

9...光譜分析模組9. . . Spectral analysis module

10...MOPA雷射系統、MOPA/MOPRA雷射系統、雷射系統10. . . MOPA laser system, MOPA/MOPRA laser system, laser system

11...主振盪器、MO11. . . Main oscillator, MO

11A...放電腔室、主振盪器腔室11A. . . Discharge chamber, main oscillator chamber

11B...譜線減寬方塊11B. . . Line width reduction block

11C...輸出耦合器11C. . . Output coupler

12...功率放大器/功率振盪器12. . . Power amplifier / power oscillator

12A...放電腔室、放大器腔室、PA腔室、PA/PO腔室12A. . . Discharge chamber, amplifier chamber, PA chamber, PA/PO chamber

14A...第一雷射光束14A. . . First laser beam

14B...第二雷射光束、雷射系統輸出光束脈衝、功率放大器輸出光束14B. . . Second laser beam, laser system output beam pulse, power amplifier output beam

14C...輸出光束脈衝、輸出光束14C. . . Output beam pulse, output beam

16...光束分離器16. . . Beam splitter

20A、20B、20C、20D...聚焦鏡20A, 20B, 20C, 20D. . . Focusing mirror

22...脈衝展寬器、點twenty two. . . Pulse stretcher, point

24...MO波長處理方塊(MO WEB)twenty four. . . MO wavelength processing block (MO WEB)

26...PA波長處理方塊(PA WEB)26. . . PA wavelength processing block (PA WEB)

28...光束換向器28. . . Beam commutator

40A、40B...波束指向鏡40A, 40B. . . Beam pointing mirror

50...能量控制方塊圖50. . . Energy control block diagram

52...電壓、電壓輸入52. . . Voltage and voltage input

72...能量72. . . energy

74...能量誤差信號74. . . Energy error signal

150...能量控制方塊圖、雷射控制系統150. . . Energy control block diagram, laser control system

152...電壓輸入152. . . Voltage input

54、154...靜態控制54,154. . . Static control

56、156...能量目標56, 156. . . Energy target

58、158...前饋方塊58,158. . . Feed forward block

60、160...觸發間隔60,160. . . Trigger interval

62、162...能量伺服機62, 162. . . Energy servo

64、164...電壓誤差64,164. . . Voltage error

66、166...抖動取消66, 166. . . Jitter cancellation

68、168...時間抖動68,168. . . Time jitter

70、170...能量抖動70, 170. . . Energy jitter

172...能量量測、能量誤差172. . . Energy measurement, energy error

174...能量誤差信號174. . . Energy error signal

76、176...雷射估計76, 176. . . Laser estimation

78、178...適應演算法78, 178. . . Adaptive algorithm

180...MopaOpPoint(MOPA操作點)180. . . MopaOpPoint (MOPA operating point)

182...MopaOpPoint補償、Mpop補償182. . . MopaOpPoint compensation, Mpop compensation

184...干擾預測184. . . Interference prediction

200...流程圖200. . . flow chart

202、204、206、208、210...方塊202, 204, 206, 208, 210. . . Square

第1圖是一MOPA/MOPRA雷射系統之一方塊圖之說明。Figure 1 is a block diagram of a MOPA/MOPRA laser system.

第2圖是用於第1圖之該MOPA/MOPRA雷射系統之一能量控制方塊圖之說明。Figure 2 is an illustration of an energy control block diagram for one of the MOPA/MOPRA laser systems of Figure 1.

第3圖根據本揭露標地之一第一示範性實施例,是表示不同的重複率之梯形視窗之曲線圖之說明。Figure 3 is a diagram showing a graph of a trapezoidal window of different repetition rates in accordance with a first exemplary embodiment of the present disclosure.

第4圖根據本揭露標地之一第一示範性實施例,是用於第3圖中說明的該等視窗之劑量運算器之頻率響應之曲線圖之說明。Figure 4 is a diagram showing a plot of the frequency response of the dose operators of the windows illustrated in Figure 3, in accordance with a first exemplary embodiment of the present disclosure.

第5圖根據本揭露標地之一第一示範性實施例,是用於第1圖之MOPA/MOPRA雷射系統之一能量控制方塊圖之說明。Figure 5 is an illustration of one of the energy control block diagrams of the MOPA/MOPRA laser system of Figure 1 in accordance with a first exemplary embodiment of the present disclosure.

第6圖根據本揭露標地之該第一示範性實施例,是說明提供第5圖之雷射控制系統之一方法之流程圖。Figure 6 is a flow chart illustrating one method of providing a laser control system of Figure 5 in accordance with the first exemplary embodiment of the present disclosure.

2...光刻機/掃描儀2. . . Lithography machine/scanner

4...雷射能量控制系統、雷射系統4. . . Laser energy control system, laser system

5...層/板5. . . Layer/board

6...光束傳送單元6. . . Beam transfer unit

7...線中心分析模組7. . . Line center analysis module

9...光譜分析模組9. . . Spectral analysis module

10...MOPA雷射系統、MOPA/MOPRA雷射系統、雷射系統10. . . MOPA laser system, MOPA/MOPRA laser system, laser system

11...主振盪器、MO11. . . Main oscillator, MO

11A...放電腔室、主振盪器腔室11A. . . Discharge chamber, main oscillator chamber

11B...譜線減寬方塊11B. . . Line width reduction block

11C...輸出耦合器11C. . . Output coupler

12...功率放大器/功率振盪器12. . . Power amplifier / power oscillator

12A...放電腔室、放大器腔室、PA腔室、PA/PO腔室12A. . . Discharge chamber, amplifier chamber, PA chamber, PA/PO chamber

14A...第一雷射光束14A. . . First laser beam

14B...第二雷射光束、雷射系統輸出光束脈衝、功率放大器輸出光束14B. . . Second laser beam, laser system output beam pulse, power amplifier output beam

14C...輸出光束脈衝、輸出光束14C. . . Output beam pulse, output beam

16...光束分離器16. . . Beam splitter

20A、20B、20C、20D...聚焦鏡20A, 20B, 20C, 20D. . . Focusing mirror

22...脈衝展寬器、點twenty two. . . Pulse stretcher, point

24...MO波長處理方塊(MO WEB)twenty four. . . MO wavelength processing block (MO WEB)

26...PA波長處理方塊(PA WEB)26. . . PA wavelength processing block (PA WEB)

28...光束換向器28. . . Beam commutator

40A、40B...波束指向鏡40A, 40B. . . Beam pointing mirror

Claims (27)

一種雷射控制系統,其包含:一振盪器氣體腔室;一放大器氣體腔室;一第一電壓輸入,其被可操作地連接以傳送電脈衝到該振盪器氣體腔室內的一第一對電極與該放大器氣體腔室內的一第二對電極;該等氣體腔室之一輸出是透過一梯形視窗計算的一能量劑量;連接到該第一電壓輸入之用於調整該第一電壓輸入之一控制電路,其中一劑量運算器的一頻率響應具有至少一個零;被安排以在該等零之一個下初始化之一能量抖動與一時間抖動之至少一個;及把該等氣體腔室之一輸出傳到用於調整該第一電壓輸入之該控制電路之一回授控制迴路。A laser control system comprising: an oscillator gas chamber; an amplifier gas chamber; a first voltage input operatively coupled to deliver an electrical pulse to a first pair of the oscillator gas chamber An electrode and a second pair of electrodes in the gas chamber of the amplifier; one of the gas chamber outputs is an energy dose calculated through a trapezoidal window; and is coupled to the first voltage input for adjusting the first voltage input a control circuit, wherein a frequency response of a dose operator has at least one zero; is arranged to initialize at least one of energy jitter and one time jitter at one of the zeros; and to place one of the gas chambers The output is passed to one of the control circuits for adjusting the first voltage input to feedback the control loop. 如申請專利範圍第1項所述之雷射控制系統,其中該控制電路根據方程式V=Eu2 /2k調整該第一電壓輸入,其中E是一雷射能量、u是一MopaOpPoint及k是MopaOpPoint關於該等氣體腔室之間的發射時間之差之導數。The laser control system of claim 1, wherein the control circuit adjusts the first voltage input according to the equation V=Eu 2 /2k, where E is a laser energy, u is a MopaOpPoint, and k is a MopaOpPoint The derivative of the difference in emission time between the gas chambers. 如申請專利範圍第1項所述之雷射控制系統,其中一能量抖動與一時間抖動之該至少一個進一步包含在該等零之一個下初始化之一能量抖動。The laser control system of claim 1, wherein the at least one of energy jitter and one time jitter further comprises initializing one of the energy jitters at one of the zeros. 如申請專利範圍第3項所述之雷射控制系統,其中來自該能量抖動之一週期性信號是n個發射長、具有一振幅A且滿足V[k]=Acos(2πnd k/n),其中k等於0到n-1且nd 是該抖動之一個完整週期內的餘弦週期之數目。The laser control system of claim 3, wherein the periodic signal from the energy jitter is n transmission lengths, has an amplitude A, and satisfies V[k]=Acos(2πn d k/n) Where k is equal to 0 to n-1 and n d is the number of cosine periods in one complete period of the jitter. 如申請專利範圍第1項所述之雷射控制系統,其中一能量抖動與一時間抖動之該至少一個一時間抖動被安排以在該等零之一個下初始化。The laser control system of claim 1, wherein the at least one time jitter of an energy jitter and a time jitter is arranged to be initialized at one of the zeros. 如申請專利範圍第1項所述之雷射控制系統,其中該控制電路進一步包含按照Vdose =-K xd計算之一能量劑量回授電路,其中K計算為最小化該能量誤差之平方與該能量劑量誤差之平方之一加權和之一線性二次調解器之一解之一狀態回授向量,且xd是表徵一劑量運算器之一狀態之一向量。The laser control system of claim 1, wherein the control circuit further comprises an energy dose feedback circuit calculated according to V dose = -K xd, wherein K is calculated to minimize the square of the energy error and One of the squares of the energy dose error is weighted by one of the linear quadratic mediators to solve the state feedback vector, and xd is a vector characterizing one of the states of a dose operator. 如申請專利範圍第1項所述之雷射控制系統,其中該控制電路進一步包含能量暫態之一函數,其中多個重複率區被初始化為一非零值。The laser control system of claim 1, wherein the control circuit further comprises a function of energy transients, wherein the plurality of repetition rate regions are initialized to a non-zero value. 如申請專利範圍第7項所述之雷射控制系統,其中該等重複率區被初始化為具有一相似重複率之被訓練區之值。The laser control system of claim 7, wherein the repetition rate zone is initialized to a value of the trained zone having a similar repetition rate. 如申請專利範圍第1項所述之雷射系統,其中該控制電路進一步包含回授近似一劑量運算器之一濾波器之狀態之一線性二次調節器。The laser system of claim 1, wherein the control circuit further comprises a linear quadratic regulator that returns a state of a filter that approximates one of the dose operators. 一種雷射控制系統,其包含:一振盪器氣體腔室;一放大器氣體腔室;一第一電壓輸入,其被可操作地連接以傳送電脈衝到該振盪器氣體腔室內的一第一對電極與該放大器氣體腔室內的一第二對電極;該等氣體腔室之一輸出是透過一梯形視窗計算的一能量劑量;連接到該第一電壓輸入之用於調整該第一電壓輸入之一控制電路,其中該控制電路根據方程式V=Eu2 /2k調整該第一電壓輸入,其中E是一雷射能量、u是一MopaOpPoint及k是MopaOpPoint關於該等氣體腔室之間的發射時間之差之導數;及把該等氣體腔室之一輸出傳到用於調整該第一電壓輸入之該控制電路之一回授控制迴路。A laser control system comprising: an oscillator gas chamber; an amplifier gas chamber; a first voltage input operatively coupled to deliver an electrical pulse to a first pair of the oscillator gas chamber An electrode and a second pair of electrodes in the gas chamber of the amplifier; one of the gas chamber outputs is an energy dose calculated through a trapezoidal window; and is coupled to the first voltage input for adjusting the first voltage input a control circuit, wherein the control circuit adjusts the first voltage input according to the equation V=Eu 2 /2k, where E is a laser energy, u is a MopaOpPoint, and k is a launch time of the MopaOpPoint between the gas chambers a derivative of the difference; and passing the output of one of the gas chambers to one of the control circuits for adjusting the first voltage input to feedback the control loop. 如申請專利範圍第10項所述之雷射控制系統,其中該第一電壓輸入進一步包含自一能量目標計算之一輸入,其中Eref 被大致設定成該雷射系統之一標稱能量,且Vref 是以Eref 發射該雷射所需的大概電壓。The laser control system of claim 10, wherein the first voltage input further comprises inputting from one of the energy target calculations Where E ref is approximately set to one of the nominal energies of the laser system, and V ref is the approximate voltage required to emit the laser at E ref . 如申請專利範圍第10項所述之雷射控制系統,其中一劑量運算器之一頻率響應具有至少一個零,且該控制電路進一步包含在該等零之一個下初始化的一能量抖動。The laser control system of claim 10, wherein one of the dose operators has a frequency response having at least one zero, and the control circuit further comprises an energy jitter initialized at one of the zeros. 如申請專利範圍第12項所述之雷射控制系統,其中來自該能量抖動之一週期性信號是n個發射長、具有一振幅A且滿足V[k]=Acos(2πnd k/n),其中k為0到n-1且nd 為該抖動之一個完整週期內的餘弦週期之數目。The laser control system of claim 12, wherein the periodic signal from the energy jitter is n transmission lengths, has an amplitude A and satisfies V[k]=Acos(2πn d k/n) Where k is 0 to n-1 and n d is the number of cosine periods in one complete period of the jitter. 如申請專利範圍第10項所述之雷射控制系統,其中一劑量運算器之一頻率響應具有至少一個零,且一時間抖動被組配以在該等零之一個下初始化。A laser control system according to claim 10, wherein one of the dose operators has a frequency response having at least one zero, and a time jitter is combined to initialize at one of the zeros. 如申請專利範圍第10項所所述之雷射控制系統,其中該控制電路進一步包含按照Vdose =-K xd計算的一能量劑量回授電路,其中K是最小化該能量誤差之平方與該能量劑量誤差之平方之加權和之一線性二次調節器之一解而計算的一狀態回授向量,且xd是表徵一能量算子之一狀態之一向量。The laser control system of claim 10, wherein the control circuit further comprises an energy dose feedback circuit calculated according to V dose = -K xd, wherein K is to minimize the square of the energy error and A weighted sum of the squares of the energy dose error is a state feedback vector calculated by one of the linear quadratic regulators, and xd is a vector characterizing one of the states of an energy operator. 如申請專利範圍第10項所述之雷射控制系統,其中該控制電路進一步包含能量暫態之一函數,其中多個重複率區被初始化為一非零值。The laser control system of claim 10, wherein the control circuit further comprises a function of energy transients, wherein the plurality of repetition rate regions are initialized to a non-zero value. 如申請專利範圍第16項所述之雷射控制系統,其中該等重複率區被初始化為具有一相似重複率之被訓練區之值。The laser control system of claim 16, wherein the repetition rate zone is initialized to a value of the trained zone having a similar repetition rate. 如申請專利範圍第10項所述之雷射控制系統,其中該控制電路進一步包含一線性二次調節器以回授近似一劑量運算器之一濾波器之一狀態。The laser control system of claim 10, wherein the control circuit further comprises a linear quadratic regulator for feeding back a state of one of the filters of one of the dose operators. 一種雷射控制系統,其包含:一振盪器氣體腔室;一放大器氣體腔室;一第一電壓輸入,其被可操作地連接以傳送電脈衝到該振盪器氣體腔室內的一第一對電極與該放大器氣體腔室內的一第二對電極;該等氣體腔室之一輸出是透過一梯形視窗計算的一能量劑量;連接到該第一電壓輸入以用於調整該第一電壓輸入之一控制電路,該控制電路進一步包含按照Vdose=-K xd計算的一能量劑量回授電路,其中K是最小化該能量誤差之平方與該能量劑量誤差之平方之加權和之一線性二次調節器之一解而計算的一狀態回授向量,且xd是表徵一能量算子之一狀態之一向量;及把該等氣體腔室之一輸出傳到用於調整該第一電壓輸入之該控制電路之一回授控制迴路。A laser control system comprising: an oscillator gas chamber; an amplifier gas chamber; a first voltage input operatively coupled to deliver an electrical pulse to a first pair of the oscillator gas chamber An electrode and a second pair of electrodes in the gas chamber of the amplifier; one of the gas chamber outputs is an energy dose calculated through a trapezoidal window; and is coupled to the first voltage input for adjusting the first voltage input a control circuit, the control circuit further comprising an energy dose feedback circuit calculated according to Vdose=-K xd, wherein K is a linear quadratic adjustment that minimizes a weighted sum of a square of the energy error and a square of the energy dose error a state feedback vector calculated by one of the solutions, and xd is a vector characterizing one of the states of an energy operator; and passing one of the gas chamber outputs to adjust the first voltage input One of the control circuits returns the control loop. 如申請專利範圍第19項所述之雷射控制系統,其中該控制電路根據方程式V=Eu2 /2k調整該第一電壓輸入,其中E是一雷射能量、u是一MopaOpPoint及k是MopaOpPoint關於該等氣體腔室之間的發射時間之差之導數。The laser control system of claim 19, wherein the control circuit adjusts the first voltage input according to the equation V=Eu 2 /2k, where E is a laser energy, u is a MopaOpPoint, and k is a MopaOpPoint The derivative of the difference in emission time between the gas chambers. 如申請專利範圍第19項所述之雷射控制系統,其中一劑量運算器之一頻率響應具有至少一個零,且該控制電路進一步包含在該等零之一個下初始化之一能量抖動。The laser control system of claim 19, wherein one of the dose operators has a frequency response having at least one zero, and the control circuit further comprises initializing one of the energy jitters at the one of the zeros. 如申請專利範圍第21項所述之雷射控制系統,其中來自該能量抖動之一週期性信號是n個發射長、具有振幅A且滿足V[k]=Acos(2πnd k/n),其中k為0到n-1,且nd 是該抖動之一完整週期內的餘弦週期之數目。The laser control system according to claim 21, wherein one of the periodic signals from the energy jitter is n transmission lengths, has an amplitude A, and satisfies V[k]=Acos(2πn d k/n), Where k is 0 to n-1, and n d is the number of cosine periods in one complete period of the jitter. 如申請專利範圍第19項所述之雷射控制系統,其中一劑量運算器之一頻率響應具有至少一個零,且一時間抖動被組配以在該等零之一個下初始化。The laser control system of claim 19, wherein one of the dose operators has a frequency response having at least one zero, and a time jitter is combined to initialize at one of the zeros. 如申請專利範圍第19項所述之雷射控制系統,其中該第一電壓輸入進一步包含由一能量目標計算之一輸入V=,其中Eref 被大致設定成該雷射系統之一標稱能量且Vref 是以Eref 發射該雷射所需的大概能量。The laser control system of claim 19, wherein the first voltage input further comprises inputting one of an energy target calculation V= Where E ref is approximately set to one of the nominal energies of the laser system and V ref is the approximate energy required to emit the laser at E ref . 如申請專利範圍第19項所述之雷射控制系統進一步包含能量暫態之一函數,其中多個重複率區被初始化為一非零值。The laser control system of claim 19, further comprising a function of energy transients, wherein the plurality of repetition rate regions are initialized to a non-zero value. 如申請專利範圍第25項所述之雷射控制系統,其中該重複率區被初始化為具有一相似重複率之被訓練區之值。The laser control system of claim 25, wherein the repetition rate zone is initialized to a value of the trained zone having a similar repetition rate. 如申請專利範圍第19項所述之雷射控制系統,其中該控制電路進一步包含該線性二次調節器以回授近似該劑量運算器之一濾波器之一狀態。The laser control system of claim 19, wherein the control circuit further comprises the linear quadratic regulator to feedback a state of one of the filters of the one of the dose operators.
TW098135413A 2008-10-21 2009-10-20 Method and apparatus for laser control in a two chamber gas discharge laser TWI389409B (en)

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