DE202004012665U1 - Light-emitting diode arrangement based on a gallium nitride semiconductor compound - Google Patents
Light-emitting diode arrangement based on a gallium nitride semiconductor compound Download PDFInfo
- Publication number
- DE202004012665U1 DE202004012665U1 DE202004012665U DE202004012665U DE202004012665U1 DE 202004012665 U1 DE202004012665 U1 DE 202004012665U1 DE 202004012665 U DE202004012665 U DE 202004012665U DE 202004012665 U DE202004012665 U DE 202004012665U DE 202004012665 U1 DE202004012665 U1 DE 202004012665U1
- Authority
- DE
- Germany
- Prior art keywords
- layer
- type gan
- light
- emitting diode
- textured
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 229910002601 GaN Inorganic materials 0.000 title claims abstract description 55
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 title claims abstract description 14
- 239000004065 semiconductor Substances 0.000 title claims abstract description 13
- 150000001875 compounds Chemical class 0.000 title claims abstract description 8
- 230000003647 oxidation Effects 0.000 claims abstract description 13
- 238000007254 oxidation reaction Methods 0.000 claims abstract description 13
- 239000000758 substrate Substances 0.000 claims abstract description 11
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims description 6
- 229910052738 indium Inorganic materials 0.000 claims description 3
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims description 3
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 claims description 3
- 239000011787 zinc oxide Substances 0.000 claims description 3
- 229910003437 indium oxide Inorganic materials 0.000 claims description 2
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical group [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 claims description 2
- UAFICZUDNYNDQU-UHFFFAOYSA-N indium;oxomolybdenum Chemical compound [In].[Mo]=O UAFICZUDNYNDQU-UHFFFAOYSA-N 0.000 claims description 2
- 150000004767 nitrides Chemical class 0.000 claims description 2
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 claims description 2
- 229910001887 tin oxide Inorganic materials 0.000 claims description 2
- 239000010410 layer Substances 0.000 claims 18
- 239000002344 surface layer Substances 0.000 claims 1
- 230000000284 resting effect Effects 0.000 abstract 1
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 6
- 239000010931 gold Substances 0.000 description 4
- 239000000463 material Substances 0.000 description 3
- 229910052759 nickel Inorganic materials 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- -1 gallium nitride compound Chemical class 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- AJNVQOSZGJRYEI-UHFFFAOYSA-N digallium;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Ga+3].[Ga+3] AJNVQOSZGJRYEI-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 229910001195 gallium oxide Inorganic materials 0.000 description 1
- 238000003306 harvesting Methods 0.000 description 1
- 229910052744 lithium Inorganic materials 0.000 description 1
- YQNQTEBHHUSESQ-UHFFFAOYSA-N lithium aluminate Chemical compound [Li+].[O-][Al]=O YQNQTEBHHUSESQ-UHFFFAOYSA-N 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 238000006862 quantum yield reaction Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- 229910052596 spinel Inorganic materials 0.000 description 1
- 239000011029 spinel Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/819—Bodies characterised by their shape, e.g. curved or truncated substrates
- H10H20/82—Roughened surfaces, e.g. at the interface between epitaxial layers
Landscapes
- Led Devices (AREA)
Abstract
Leuchtdiodenanordnung
auf Basis einer Galliumnitrid-Halbleiterverbindung, wenigstens aufweisend:
ein
Substrat (31);
eine Epitaxieschicht, die auf dem Substrat (31)
aufliegt und von unten nach oben eine n-Typ-GaN-Schicht (32), eine Emissionsschicht
(33) und eine p-Typ-GaN-Schicht (34) umfasst;
eine texturierte
Schicht (36), die oberhalb der p-Typ-GaN-Schicht (34) vorgesehen
ist;
eine leitende, lichtdurchlässige Oxidationsschicht, die
sich auf der texturierten Schicht (36) befindet und mit der texturierten
Schicht (36) einen ohmschen Kontakt bildet;
eine erste Elektrode
(38), die an die leitende, lichtdurchlässige Oxidationsschicht elektrisch
angekoppelt ist; und
eine zweite Elektrode (39), die an die
n-Typ-GaN-Schicht (32) der Epitaxieschicht elektrisch angekoppelt
ist.Light-emitting diode arrangement based on a gallium nitride semiconductor compound, comprising at least:
a substrate (31);
an epitaxial layer resting on the substrate (31) and comprising, from bottom to top, an n-type GaN layer (32), an emission layer (33), and a p-type GaN layer (34);
a textured layer (36) provided above the p-type GaN layer (34);
a conductive translucent oxidation layer disposed on the textured layer (36) and making an ohmic contact with the textured layer (36);
a first electrode (38) electrically coupled to the conductive, light-transmissive oxidation layer; and
a second electrode (39) electrically coupled to the n-type GaN layer (32) of the epitaxial layer.
Description
Die Erfindung betrifft eine Leuchtdiodenanordnung auf Basis einer Galliumnitrid-Halbleiterverbindung nach dem Oberbegriff des Anspruchs 1.The The invention relates to a light emitting diode array based on a gallium nitride semiconductor compound according to the preamble of claim 1.
Eine
herkömmliche
Leuchtdiodenanordnung
Es
ist längst
bekannt, dass die p-Typ-GaN-Kontaktschicht
Das bekannte Indiumzinnoxid (ITO) ist ein Material mit großer Energielücke zwischen 2,9 und 3,8 Volt. Im Bereich des sichtbaren Lichtes weist ITO einen Durchdringungsgrad über 95% auf. Außerdem ist ITO ein hoch leitfähiges n-Typ-Material, und der Brechungskoeffizienz von ITO liegt im Bereich von 1,7 bis 2,2. Aufgrund des Brechungskoeffizienten (n=2,4) der Epitaxieschicht und des Brechungskoeffizienten (n=1,5) des Verpackungsharzmaterials wird gemäß Snell-Gesetz und Anti-Reflexionsgrundsatz eine Verringerung der Lichtreflexion und somit eine Erhöhung der Lichtgewinnung gewährleistet, wenn ein Mittel mit einer Brechungskoeffizienz von n=1,9 hinzugefügt werden kann. Daher kann dieses Mittel (ITO) als Fensterschicht der Leuchtdiode dienen.The known indium tin oxide (ITO) is a material with a large energy gap between 2.9 and 3.8 volts. In the field of visible light, ITO has one Penetration degree over 95% up. Besides that is ITO a highly conductive n-type material, and the refractive index of ITO is in the range from 1.7 to 2.2. Due to the refractive index (n = 2,4) of the Epitaxial layer and the refractive index (n = 1.5) of the packaging resin material becomes in accordance with Snell law and anti-reflection principle a reduction of light reflection and thus an increase ensures the light, if an agent with a refractive index of n = 1.9 is added can. Therefore, this means (ITO) as a window layer of the light emitting diode serve.
Bei
einer taiwanesischen Patentanmeldung (TW 461126) ist ein Gedanke
vorgeschlagen worden, dass ITO als transparente leitende Schicht
verwendet wird. Wie in
Aus diesem Grund hat der Erfinder in Anbetracht der Nachteile herkömmlicher Lösungen, basierend auf langjähriger Erfahrung in diesem Bereich, nach langem Studium, zahlreichen Versuchen und unentwegten Verbesserungen die vorliegende Erfindung entwickelt.Out For this reason, in view of the disadvantages of the present inventor Solutions, based on longtime Experience in this area, after a long study, numerous experiments and unceasing improvements to the present invention.
Durch die Erfindung wird eine Leuchtdiodenanordnung auf Basis einer Galliumnitrid-Halbleiterverbindung geschaffen, bei der eine leitende, lichtdurchlässige Oxidationsschicht an einer oben mit einer texturierten Schicht versehenen Galliumnitrid-Schicht angebracht ist und als Fensterschicht dient, wobei die texturierte Schicht als ohmsche Kontaktschicht zur leitenden, lichtdurchlässigen Oxidationsschicht verwendbar ist, was eine effektive Herabsetzung des Kontaktwiderstands und der Betriebsspannung bewirkt, wobei die texturierte Schicht für die Unterbrechung der Lichtleitwirkung sorgt, um den Wirkungsgrad der Lichtgewinnung zu erhöhen und somit die Quantenausbeute zu verbessern.By The invention will be a light emitting diode array based on a gallium nitride semiconductor compound created in the case of a conductive, transparent oxidation layer a gallium nitride layer provided with a textured layer above is attached and serves as a window layer, wherein the textured Layer as ohmic contact layer to the conductive, transparent oxidation layer usable, resulting in effective reduction of contact resistance and the operating voltage causes the textured layer for the Interruption of the light guiding ensures the efficiency of the Increase light production and thus to improve the quantum yield.
Die Erfindung weist insbesondere die in Anspruch 1 angegebenen Merkmale auf. In den Unteransprüchen sind Ausgestaltungen der Erfindung angegeben.The Invention has in particular the features specified in claim 1 on. In the dependent claims embodiments of the invention are given.
Im Folgenden werden Aufgaben, Merkmale und Funktionsweise der Erfindung anhand eines bevorzugten Ausführungsbeispiels und der beigefügten Zeichnungen näher erläutert werden. Es zeigen:in the Following are objects, features and operation of the invention based on a preferred embodiment and the accompanying drawings be explained in more detail. Show it:
Bezugnehmend
auf
Die
n-Typ-GaN-Schicht
Das
Substrat
Das
Vorsehen der texturierten Schicht
Darüber hinaus
kann die Betriebsspannung der Dioden herabgesetzt werden (siehe
- 1010
- LeuchtdiodenanordnungLED array
- 1111
- Substratsubstratum
- 1212
- GaN-PufferschichtGaN buffer layer
- 1313
- n-Typ-GaN-Schichtn-type GaN layer
- 1414
- InGaN-SchichtInGaN layer
- 1515
- p-Typ-GaN-Schichtp-type GaN layer
- 1616
- p-Typ-GaN-Kontaktschichtp-type GaN contact layer
- 1717
- transparente leitende Schichttransparent conductive layer
- 1818
- metallische p-Typ-Elektrodemetallic p-type electrode
- 1919
- metallische n-Typ-Elektrodemetallic n-type electrode
- 2020
- Diodenanordnungdiode array
- 2121
- Substratsubstratum
- 2222
- GaN-PufferschichtGaN buffer layer
- 2323
- n-Typ-GaN-Schichtn-type GaN layer
- 2424
- InGaN-AktivschichtInGaN active layer
- 2525
- p-Typ-GaN-Schichtp-type GaN layer
- 2626
- p-Typ-GaN-Kontaktschichtp-type GaN contact layer
- 2727
- transparente leitende Oxidationsschichttransparent conductive oxidation layer
- 2828
- p-Typ-Elektrodep-type electrode
- 2929
- n-Typ-Elektroden-type electrode
- 3030
- Leuchtdiodeled
- 3131
- Substratsubstratum
- 31'31 '
- Pufferschichtbuffer layer
- 3232
- n-Typ-GaN-Schichtn-type GaN layer
- 3333
- Emissionsschichtemission layer
- 3434
- p-Typ-GaN-Schichtp-type GaN layer
- 3535
- p-Typ-Kontaktschichtp-type contact layer
- 3636
- texturierte Schichttextured layer
- 3737
- Fensterschichtwindow layer
- 3838
- erste Elektrodefirst electrode
- 3939
- zweite Elektrodesecond electrode
Claims (5)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2004200364438U CN2760762Y (en) | 2004-04-08 | 2004-04-08 | Gallium nitride-based light-emitting diode structure |
| CN200420036443.8 | 2004-04-08 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE202004012665U1 true DE202004012665U1 (en) | 2005-02-03 |
Family
ID=34171197
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE202004012665U Expired - Lifetime DE202004012665U1 (en) | 2004-04-08 | 2004-08-12 | Light-emitting diode arrangement based on a gallium nitride semiconductor compound |
Country Status (4)
| Country | Link |
|---|---|
| CN (1) | CN2760762Y (en) |
| DE (1) | DE202004012665U1 (en) |
| FR (1) | FR2868878B3 (en) |
| GB (1) | GB2413008B8 (en) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI318013B (en) | 2006-09-05 | 2009-12-01 | Epistar Corp | A light emitting device and the manufacture method thereof |
| CN101150156B (en) * | 2006-09-22 | 2012-05-30 | 晶元光电股份有限公司 | Light emitting element and manufacturing method thereof |
| JP2008182069A (en) * | 2007-01-25 | 2008-08-07 | Toshiba Corp | Semiconductor light emitting device |
| CN101685842B (en) * | 2008-09-25 | 2012-12-05 | 晶元光电股份有限公司 | Optoelectronic semiconductor device |
| US8513688B2 (en) | 2009-12-02 | 2013-08-20 | Walsin Lihwa Corporation | Method for enhancing electrical injection efficiency and light extraction efficiency of light-emitting devices |
| CN102117871A (en) * | 2009-12-31 | 2011-07-06 | 华新丽华股份有限公司 | Method for increasing electric injection efficiency and light extraction efficiency of light-emitting device |
| TW201349569A (en) * | 2012-05-28 | 2013-12-01 | Genesis Photonics Inc | Light-emitting element and manufacturing method thereof |
| CN102956781B (en) * | 2011-08-31 | 2015-03-11 | 新世纪光电股份有限公司 | Light emitting element and manufacturing method thereof |
| DE102012106998A1 (en) * | 2012-07-31 | 2014-02-06 | Osram Opto Semiconductors Gmbh | Reflective contact layer system for an optoelectronic component and method for its production |
| CN103594582B (en) * | 2013-10-26 | 2016-04-27 | 溧阳市东大技术转移中心有限公司 | A kind of vertical type light emitting diode of high light-emitting efficiency |
| CN104851947B (en) * | 2015-04-21 | 2017-11-14 | 北京邮电大学 | A kind of LED chip with surface roughening translucent construction and preparation method thereof |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5869849A (en) * | 1995-10-05 | 1999-02-09 | Industry Technology Research Institute | Light-emitting diodes with high illumination |
| US5789768A (en) * | 1997-06-23 | 1998-08-04 | Epistar Corporation | Light emitting diode having transparent conductive oxide formed on the contact layer |
| US6207972B1 (en) * | 1999-01-12 | 2001-03-27 | Super Epitaxial Products, Inc. | Light emitting diode with transparent window layer |
| DE19926958B4 (en) * | 1999-06-14 | 2008-07-31 | Osram Opto Semiconductors Gmbh | GaAs (In, Al) P-type ZnO window layer light emission semiconductor diode |
-
2004
- 2004-04-08 CN CNU2004200364438U patent/CN2760762Y/en not_active Expired - Lifetime
- 2004-08-12 DE DE202004012665U patent/DE202004012665U1/en not_active Expired - Lifetime
- 2004-09-03 GB GB0419630A patent/GB2413008B8/en not_active Expired - Fee Related
- 2004-09-14 FR FR0452048A patent/FR2868878B3/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| GB2413008A (en) | 2005-10-12 |
| FR2868878B3 (en) | 2006-03-24 |
| FR2868878A3 (en) | 2005-10-14 |
| CN2760762Y (en) | 2006-02-22 |
| GB2413008A8 (en) | 2007-01-15 |
| GB2413008B8 (en) | 2007-01-15 |
| GB2413008B (en) | 2006-06-28 |
| GB0419630D0 (en) | 2004-10-06 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R207 | Utility model specification |
Effective date: 20050310 |
|
| R150 | Utility model maintained after payment of first maintenance fee after three years |
Effective date: 20070919 |
|
| R079 | Amendment of ipc main class |
Free format text: PREVIOUS MAIN CLASS: H01L0033000000 Ipc: H01L0033300000 |
|
| R151 | Utility model maintained after payment of second maintenance fee after six years |
Effective date: 20101018 |
|
| R152 | Utility model maintained after payment of third maintenance fee after eight years |
Effective date: 20120906 |
|
| R081 | Change of applicant/patentee |
Owner name: SEMILED OPTOELECTRONICS CO. LTD., TW Free format text: FORMER OWNER: SUPERNOVA OPTOELECTRONICS CORP., PING CHENG, TAOYUAN, TW Effective date: 20121108 Owner name: SEMILED OPTOELECTRONICS CO. LTD., TW Free format text: FORMER OWNER: SUPERNOVA OPTOELECTRONICS CORP., PING CHENG, TW Effective date: 20121108 |
|
| R082 | Change of representative |
Representative=s name: NEGENDANCK, MATTHIAS, DIPL.-PHYS. UNIV. DR.-IN, DE Effective date: 20121108 |
|
| R071 | Expiry of right | ||
| R071 | Expiry of right |
