CN214895456U - A switch matrix structure and test system for multi-channel device testing - Google Patents
A switch matrix structure and test system for multi-channel device testing Download PDFInfo
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Abstract
The utility model provides a switch matrix structure for multichannel device test, including the downstream port group that is used for connecting the ascending port group of test equipment and is used for connecting the multichannel device that awaits measuring, the ascending port group sets up four at least first ports, first port comprises first single-pole multiple-throw switch; the downlink port group is provided with at least four second ports, and the second ports are formed by second single-pole multi-throw switches; each switch arm of the same first single-pole multi-throw switch is respectively connected with one switch arm of each second single-pole multi-throw switch; the input end of the first single-pole multi-throw switch is the external connection end of the first port, and the input end of the second single-pole multi-throw switch is the external connection end of the second port. After the structure is accessed, the test system can form a plurality of different test channels, and the corresponding test channels enter a working state through the switching of the switch to complete a plurality of tests.
Description
Technical Field
The utility model belongs to the technical field of the radio frequency test technique and specifically relates to indicate a switch matrix structure and test system for multichannel device test.
Background
The traditional test of radio frequency transmission and reflection indexes is usually suitable for a two-port or four-port vector network analyzer. The current latest radio frequency communication technologies, such as 5G massive MIMO technology, WIFI 6 MU-MIMO technology, and multi-channel phased array radar in the field of national defense, have multi-channel requirements for modules and components, that is, have high requirements for reflection and transmission of channels and consistency and isolation between channels. In the product development verification stage, if verification tests are performed only on the basis of a traditional two-port or four-port network analyzer, verification of dozens of channels, even hundreds or even thousands of channels, becomes almost a bottleneck of verification; in the stage of mass production, it is also a great limitation to the productivity of the product.
In contrast, network analyzer manufacturers have also introduced test equipment with more ports, but the high selling price thereof causes the test cost to rise too much, and the multi-port test equipment is not smoothly upgraded from the traditional two-port or four-port test equipment, but is a brand-new test solution. If a multi-port network analyzer is selected for device verification or production testing, a large number of two-port or four-port network analyzers for early product testing will be discarded and left unused, which is an unacceptable cost waste for device manufacturers;
meanwhile, a test scheme for realizing multi-port equipment by using an existing two-port or four-port network analyzer and adding a switch matrix to expand ports is also provided in the market, and the test scheme is realized by adopting a method of calibrating two ports and storing a plurality of calibration states. However, since the number of the currently mainstream device ports is as large as tens of device ports or even hundreds of device ports, the test items are very large, and the calibration time becomes a very large bottleneck for the aforementioned scheme.
SUMMERY OF THE UTILITY MODEL
The utility model discloses the technical problem that will solve is: a switching structure which does not affect the test result and can comprehensively utilize the existing two-port network analyzer and other equipment of an enterprise to simultaneously measure the performance of the multi-port equipment is designed.
In order to solve the technical problem, the utility model discloses a technical scheme be:
a switch matrix structure for testing a multi-channel device comprises an uplink port group used for connecting test equipment and a downlink port group used for connecting the multi-channel device to be tested, wherein the uplink port group is provided with at least four first ports, and each first port is composed of a first single-pole multi-throw switch; the downlink port group is provided with at least four second ports, and the second ports are formed by second single-pole multi-throw switches; each switch arm of the same first single-pole multi-throw switch is respectively connected with one switch arm of each second single-pole multi-throw switch; the input end of the first single-pole multi-throw switch is the external connection end of the first port, and the input end of the second single-pole multi-throw switch is the external connection end of the second port.
Further, the switch matrix structure for testing the multi-channel device also comprises a switch switching controller; the input end of the first single-pole multi-throw switch is controlled to be connected or disconnected with a switch arm of the first single-pole multi-throw switch through the switch switching controller; the input end of the second single-pole multi-throw switch is controlled to be connected or disconnected with the switch arm of the second single-pole multi-throw switch through the switch switching controller.
Further, the first single-pole multi-throw switch is internally provided with a load circuit; the second single-pole multi-throw switch is internally provided with a load circuit.
Further, the number of the first single-pole multi-throw switches, the number of the switch arms of the first single-pole multi-throw switches, the number of the second single-pole multi-throw switches, and the number of the switch arms of the second single-pole multi-throw switches are all equal.
Furthermore, the uplink port group is composed of four first ports, and the downlink port group is composed of four second ports; the first single pole, multiple throw switch is SP4T and the second single pole, multiple throw switch is SP 4T.
Or further, the uplink port group is composed of eight first ports, and the downlink port group is composed of eight second ports; the first single pole, multiple throw switch is SP8T and the second single pole, multiple throw switch is SP 8T.
Further, the switch matrix structure for testing the multi-channel device also comprises a self-calibration controller which stores a self-calibration file; the signal of the second port calibrated by the self-calibration controller is output from the first port.
A test system comprises test equipment, a multi-channel device to be tested and the switch matrix structure; the test equipment is connected with the multi-channel device to be tested through the switch matrix structure.
Further, the external connection end of the first port is connected with or idled on the test equipment; and the external connection end of the second port is connected with or idled on the multi-channel device to be tested.
Furthermore, the test equipment is one or more of a two-port network analyzer, a four-port network analyzer, a signal analyzer and a signal generator; the multi-channel device to be tested is one or more of a multi-port radio frequency circuit, a multi-port filter and a multi-port antenna.
The beneficial effects of the utility model reside in that: because each switch arm of the same first single-pole multi-throw switch is respectively connected with one switch arm of each second single-pole multi-throw switch, a plurality of different test channels can be formed, and the corresponding test channels enter a working state through the switching of the switches. Correspondingly, each switch arm of the same second single-pole multi-throw switch is also connected with one switch arm of each first single-pole multi-throw switch, namely only one test channel needs to be formed between the same first port and the same second port.
Because the load circuit is arranged in the single-pole multi-throw switch, the load insertion position does not need to be changed after the single-pole multi-throw switch is switched to another test channel in the test process.
Because the switch matrix is provided with a plurality of first ports, can connect a plurality of test equipment simultaneously, each test equipment can work simultaneously and mutual noninterference.
After each test device is inserted into the switch array and calibrated, the self-calibration controller is triggered to call the self-calibration file of the corresponding channel to perform automatic calibration respectively, namely in the test process, although the switch switching controller controls the switching to different test channels, as long as the position of the test device inserted into the switch array is unchanged, no matter how the multi-channel device to be tested is replaced, the calibration is not required to be performed again.
Drawings
The following detailed description of the specific structure of the present invention with reference to the accompanying drawings
Fig. 1 is a schematic structural diagram of a switch matrix structure for testing a multi-channel device according to the present invention;
fig. 2 is a schematic structural connection diagram of a test system according to the present invention;
fig. 3 is a schematic structural connection diagram of a test system according to the present invention;
fig. 4 is a graph showing the transmission coefficient results obtained by testing the coaxial line to be tested before and after the switch matrix structure for testing the multi-channel device according to the present invention;
fig. 5 is a graph showing the reflection coefficient results obtained from testing the coaxial line to be tested before and after the switch matrix structure for testing the multi-channel device according to the present invention;
the device comprises a network analyzer 1, a signal analyzer 2, a signal generator 3, a first port 4, a first single-pole multi-throw switch 41, a first single-pole multi-throw switch 5, a switch matrix structure 6, a second port 61, a second single-pole multi-throw switch 61 and a multi-channel device to be tested 7.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, not all, of the embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Example 1
Referring to fig. 1 and fig. 2, a switch matrix structure 5 for testing a multi-channel device includes an uplink port group for connecting a test apparatus and a downlink port group for connecting a multi-channel device 7 to be tested, where the uplink port group is provided with at least four first ports 4, and the first ports 4 are formed by first single-pole multi-throw switches; the downlink port group is provided with at least four second ports 6, and the second ports 6 are formed by second single-pole multi-throw switches; each switch arm of the same first single-pole multi-throw switch 41 is connected with one switch arm of each second single-pole multi-throw switch 61; the input end of the first single-pole multi-throw switch 41 is the external connection end of the first port 4, and the input end of the second single-pole multi-throw switch 61 is the external connection end of the second port 6. That is, the test channel path is the port of the test equipment-the input terminal of the first single-pole multi-throw switch 41-the switch arm of the second single-pole multi-throw switch 61-the input terminal of the second single-pole multi-throw switch 61-the port of the multi-channel device under test.
Since each switch arm of the same first single-pole multi-throw switch 41 is connected to one switch arm of each second single-pole multi-throw switch 61, a plurality of different test channels can be formed, and the corresponding test channels enter a working state by switching the switches. Correspondingly, each switch arm of the same second single-pole multi-throw switch 61 is also connected with one switch arm of each first single-pole multi-throw switch 41, i.e. only one test channel needs to be formed between the same first port 4 and the same second port 6.
Because the switch matrix is provided with a plurality of first ports 4, can connect a plurality of test equipment simultaneously, each test equipment can work simultaneously and mutual noninterference.
Example 2
On the basis of the structure, the switch matrix structure for testing the multi-channel device also comprises a switch switching controller; the input end of the first single-pole multi-throw switch 41 is controlled by the switch switching controller to be connected with or disconnected from the switch arm of the first single-pole multi-throw switch 41; the input end of the second single-pole multi-throw switch 61 is controlled by the switch switching controller to be connected with or disconnected from the switch arm of the second single-pole multi-throw switch 61. The switch switching controller is used for controlling the automatic switching to different testing channels, so that the testing process is accelerated.
Example 3
In addition to the above structure, the first single-pole-multi-throw switch 41 has a load circuit built therein; the second single-pole multi-throw switch 61 has a built-in load circuit, so that the load insertion position does not need to be changed after the switch is switched to another test channel in the test process.
Example 4
In addition to the above configuration, the number of the first single-pole multi-throw switches 41, the number of the switch arms of the first single-pole multi-throw switches 41, the number of the second single-pole multi-throw switches 61, and the number of the switch arms of the second single-pole multi-throw switches 61 are all equal.
Example 5
On the basis of the above structure, the upstream port group is composed of four first ports 4, and the downstream port group is composed of four second ports 6; the first single-pole multi-throw switch 41 is SP4T, and the second single-pole multi-throw switch 61 is SP 4T. At this time, a 4 × 4 switch matrix is formed, for a total of 16 test channels. The SP4T can be a commercially available product with a keysight 87104D or R594843417 model, a built-in load circuit is arranged in the SP, the working range reaches 40GHz, and the SP can be used for testing high-frequency radio frequency such as a millimeter wave antenna.
Example 6
In addition to the structure of embodiment 4, the upstream port group includes eight first ports 4, and the downstream port group includes eight second ports 6; the first single-pole multi-throw switch 41 is SP8T, and the second single-pole multi-throw switch 61 is SP 8T. At this time, an 8 × 8 switch matrix is formed, for 64 test channels. The SP8T can be selected from a commercially available product of MC88T-S18L24-0D model, and a built-in load circuit can be used for testing low-frequency radio frequency.
Example 7
On the basis of the structure, the switch matrix structure 5 for testing the multi-channel device further comprises a self-calibration controller storing a self-calibration file; the signal of the second port 6 calibrated by the self-calibration controller is output from the first port 4.
The self-calibration file is formed by the following method:
referring to fig. 3, assuming that the switch matrix structure 5 is not connected and the two ports of the network analyzer 1 are well calibrated, the test data of the ith and jth ports of the multi-channel dut is CiAnd Cj. Self-calibration file B with switch matrix structure 1 for ith and jth channelsiAnd Bj. When the two first ports 4 corresponding to the ith and jth channels are connected with the network analyzer 1, the two second ports 6 corresponding to the ith and jth channels are connected with the multi-channel device 7 to be tested. The result obtained in this test is AiAnd Aj。
In summary, the cascade principle of the multi-stage microwave network can be known as follows: a. thei＝BiCi
Then: b isi＝AiCi -1
The following can be obtained by the same method: b isj＝AjCj -1
By the method, the self-calibration file B of the ith and jth channels in the switch matrix can be obtainediAnd Bj。
Before use, the device to be tested 7 and the two-port network analyzer 1 which have known results and are used for calibration are accessed for calibration, the result displayed by the two-port network analyzer 1 is calibrated to be the result of the device to be tested 7 and used for calibration, and the self-calibration device is triggered to call the self-calibration file of the corresponding channel. Then change after the device 7 that awaits measuring, the result that two port network analyzer 1 shows is the actual result of the device that awaits measuring promptly, and two port network analyzer is in promptly the utility model discloses an only need calibrate once among the test system.
In summary, after calibration, each test device is inserted into any first port 4 of the switch array structure 5, that is, the self-calibration controller is triggered to call the self-calibration file of the corresponding channel for automatic calibration, and during the test process, although the switch switching controller controls switching to a different test channel, calibration is not required again.
Example 8
Referring to fig. 2, a test system includes a test apparatus, a multi-channel device to be tested 7, and the switch matrix structure 5; the test equipment is connected with the multi-channel device to be tested through the switch matrix structure 5.
Example 9
On the basis of the structure, the external connection end of the first port 4 is connected with the test equipment or is idle; and the external connection end of the second port 6 is connected with or idled on the multi-channel device to be tested 7.
Example 10
On the basis of the structure, the test equipment is one or more of a two-port network analyzer 1, a four-port network analyzer, a signal analyzer 2 and a signal generator 3; the multi-channel device to be tested 7 is one or more of a multi-port radio frequency circuit, a multi-port filter and a multi-port antenna.
Switch switching controller can pass through remote control, so adopt the utility model discloses a switch matrix structure 5 can enough make full use of the current test equipment of enterprise, can avoid frequent calibration work again, reduce the input of manpower and materials, promote the productivity.
To further discuss the feasibility of the present invention, the following test examples were used for comparative testing, and the results before and after insertion of the following test examples are shown in fig. 4 and 5:
test example
A test system comprises a two-port network analyzer 1, a coaxial line to be tested and a switch matrix structure 5; the two-port network analyzer 1 is connected with the coaxial line to be tested through the switch matrix structure 5.
The switch matrix structure 5 comprises an uplink port group for connecting test equipment, a downlink port group for connecting a multichannel device to be tested 7, a switch switching controller and a self-calibration controller stored with a self-calibration file, wherein the uplink port group is provided with four first ports 4, and the first ports 4 are formed by first single-pole multi-throw switches 41; the downstream port group is provided with four second ports 6, and the second ports 6 are formed by a second single-pole multi-throw switch 61; each switch arm of the same first single-pole multi-throw switch 41 is connected with one switch arm of each second single-pole multi-throw switch 61; the input end of the first single-pole multi-throw switch 41 is the external connection end of the first port 4, and the input end of the second single-pole multi-throw switch 61 is the external connection end of the second port 6.
The input end of the first single-pole multi-throw switch 41 is controlled by the switch switching controller to be connected with or disconnected from the switch arm of the first single-pole multi-throw switch 41; the input end of the second single-pole multi-throw switch 61 is controlled by the switch switching controller to be connected with or disconnected from the switch arm of the second single-pole multi-throw switch 61. The first single-pole multi-throw switch 41 has a load circuit built therein; the second single-pole-multiple-throw switch 61 has a load circuit built therein.
The first single-pole multi-throw switch 41 is SP4T, and the second single-pole multi-throw switch 61 is SP 4T. The SP4T model is keysight 87104D.
And inserting the two-port network analyzer 1 into any two first ports 4 on the switch matrix structure 5, and leaving the other two first ports 4 idle. And inserting the coaxial line to be tested on any one second port 6 on the switch matrix structure 5, and leaving the other three second ports 6 unused.
The transmission coefficient and the reflection coefficient of the coaxial line were tested according to the test example structure, and the results are shown in detail in the RD8_ THRU curve in fig. 4 and the RD8_ THRU _ R curve in fig. 5.
Comparative example
The coaxial line to be tested in the test example is directly inserted into the port of the two-port network analyzer 1, and the transmission coefficient and the reflection coefficient of the coaxial line are directly tested, and the result is shown in detail in the VNA _ THRU curve in fig. 4 and the VNA _ THRU _ R curve in fig. 5.
As can be seen from fig. 4, the transmission coefficient results tested in the two cases of the test example and the comparative example are very consistent, and at 10.06GHz, the difference between the two cases is only 0.024dB (VNA _ THRU ═ 2.349dB, RD8_ THRU ═ 2.325dB), which illustrates that the testing method of the load switch matrix proposed by the present invention hardly affects the testing results of the multi-channel device to be tested.
As can be seen from fig. 5, the reflection coefficient results tested in the test example and the comparative example are very consistent in the wide frequency band of 0-20GHz, and at 13.77GHz, the difference between the two is only 0.049dB (VNA _ THRU _ R ═ 17.745dB, RD8_ THRU _ R ═ 17.696dB), which illustrates that the testing method of the loading switch matrix proposed by the present invention hardly affects the testing results of the multi-channel device to be tested.
To sum up, the utility model provides a pair of a switch matrix structure for multichannel device test when being applied to test system, calibrates the test equipment of first access and can trigger self-calibration controller, all the other test equipment direct accesses can. The device to be tested of multiple ports can be quickly tested under the condition that the test equipment is calibrated at one time, the test verification efficiency is greatly improved, the development period can be shortened in the product development verification stage, and the product productivity can be improved in the product mass production test stage. In addition, the test of the multi-port device to be tested can be completed by directly adopting the existing test equipment, and the investment of the production equipment cost is reduced.
The first … … and the second … … are only used for name differentiation and do not represent how different the importance and position of the two are.
The above only is the embodiment of the present invention, not limiting the patent scope of the present invention, all the equivalent structures or equivalent processes that are used in the specification and the attached drawings or directly or indirectly applied to other related technical fields are included in the patent protection scope of the present invention.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113138297A (en) * | 2021-05-21 | 2021-07-20 | 深圳大学 | Switch matrix structure for testing multichannel device and testing system |
| EP4451641A1 (en) * | 2023-04-18 | 2024-10-23 | Aginode Group | Communication apparatus |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113138297A (en) * | 2021-05-21 | 2021-07-20 | 深圳大学 | Switch matrix structure for testing multichannel device and testing system |
| EP4451641A1 (en) * | 2023-04-18 | 2024-10-23 | Aginode Group | Communication apparatus |
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