CN121558180B - Polarization and wavelength joint detection method and device based on light beam spin separation - Google Patents
Polarization and wavelength joint detection method and device based on light beam spin separationInfo
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- CN121558180B CN121558180B CN202610091734.8A CN202610091734A CN121558180B CN 121558180 B CN121558180 B CN 121558180B CN 202610091734 A CN202610091734 A CN 202610091734A CN 121558180 B CN121558180 B CN 121558180B
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J4/00—Measuring polarisation of light
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- G—PHYSICS
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
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Abstract
本申请属于光学测量领域，公开了一种基于光束自旋分离的偏振与波长联合检测方法及装置，该方法包括：在第一操作模式下，将待测光束入射至几何相位偏振光栅，使其分离为包含原始偏振态的零级衍射光斑和两侧分别是左、右旋圆偏振的衍射光斑；通过测量两侧光斑的光强，确定待测光束的椭偏度和旋向；在光栅后设置一可旋转检偏器，通过旋转检偏器并测量零级衍射光斑光强的变化，确定待测光束的偏振方位角。在第二操作模式下，在光栅前设置一偏振器使待测光束变为线偏振光，测量分离后零级衍射光斑与任一侧衍射光斑的光强，根据光强比值与波长的关系，确定待测光束的波长。本方法实现了对光束偏振全参量和波长的集成化、高效检测，适用于宽波段分析。
This application belongs to the field of optical measurement and discloses a method and apparatus for joint detection of polarization and wavelength based on beam spin separation. The method includes: in a first operating mode, the beam to be tested is incident on a geometric phase polarization grating, separating it into a zero-order diffraction spot containing the original polarization state and diffraction spots with left- and right-hand circular polarizations on either side; the ellipticity and direction of rotation of the beam to be tested are determined by measuring the light intensity of the two spots; a rotatable analyzer is placed behind the grating, and the polarization azimuth angle of the beam to be tested is determined by rotating the analyzer and measuring the change in the light intensity of the zero-order diffraction spot. In a second operating mode, a polarizer is placed in front of the grating to convert the beam to be tested into linearly polarized light; the light intensity of the separated zero-order diffraction spot and the diffraction spot on either side are measured; and the wavelength of the beam to be tested is determined based on the relationship between the intensity ratio and the wavelength. This method achieves integrated and efficient detection of all polarization parameters and wavelength of the beam, and is suitable for wide-band analysis.
Description
Technical Field
The invention relates to the field of optical measurement, in particular to a polarization and wavelength joint detection method and device based on light beam spin separation.
Background
The polarization state and wavelength of light are two key attributes describing the physical properties of a light beam. The polarization state is represented by ellipsometry, handedness, azimuth angle and other parameters, the vibration form of the light field electric vector in space is reflected, and the wavelength is directly related to the energy of light. The method can accurately detect the polarization and wavelength information of the light beam, and has wide and important application in the fields of remote sensing detection, biomedicine, industrial detection, material analysis and the like.
Photon spin separation effect refers to the physical phenomenon of photons with different spin angular momentums undergoing lateral spatial separation when propagating through a particular medium. With this effect, an optical measurement system can be constructed that is closely related to the polarization state and wavelength of the incident light.
However, conventional polarization and wavelength measurement techniques typically rely on a variety of discrete optical elements. For example, a rotating wave plate method or stokes method is often used for polarization state measurement, multiple elements such as a wave plate and an analyzer are required, and wavelength measurement mainly depends on dispersive elements such as a spectrometer. This multi-element combination approach results in a bulky measurement system, complex structure, and cumbersome calibration and setup procedures. At the same time, these conventional elements are often designed to modulate or analyze only a single attribute of light, resulting in a single measurable optical parameter and limited information dimensions. These problems significantly reduce the performance and feasibility of detecting light field multidimensional information in a miniaturized and integrated system, and are difficult to meet the core requirements of modern optical information measurement technologies for broadband applicability, high integration, dynamic response and multi-parameter collaborative analysis.
Therefore, there is a need in the art for a solution that overcomes the above-mentioned drawbacks to achieve an efficient, integrated, compact measurement of multiple optical properties, including polarization and wavelength, of a light beam.
Disclosure of Invention
Based on the problems, the invention aims to solve the defects of huge volume, single function and low integration level of an optical parameter measurement system in the prior art, and provides a polarization and wavelength combined detection method and device based on light beam spin separation.
In a first aspect, the present invention provides a polarization and wavelength joint detection method based on beam spin separation, including the steps of:
polarization detection is performed in a first mode of operation:
acquiring the respective light intensities of a first left light spot, a first middle light spot and a first right light spot which are formed by the light beam to be detected after being diffracted by a geometric phase polarization grating;
Acquiring the light intensity of the first intermediate light spot under different rotation angles of the analyzer after the light beam to be measured passes through the geometric phase polarization grating and the rotatable analyzer;
Wavelength detection is performed in a second mode of operation:
A polarizer is arranged in front of the optical path of the geometric phase polarization grating to enable the light beam to be detected to be changed into linear polarized light, and the light intensity of each of a second left light spot, a second middle light spot and a second right light spot which are formed by separating the linear polarized light after being diffracted by the geometric phase polarization grating is obtained;
And determining the wavelength of the light beam to be detected based on the light intensity of the second middle light spot and the light intensity of the light spot at any side and according to the relation between the phase delay and the wavelength.
As an optional implementation manner of the first aspect of the present application, in the step of performing polarization detection in the first operation mode, a spot electric field of the light beam to be measured after being diffracted by a geometric phase polarization grating is expressed as: Wherein The position of the light beam to be measured in the three-dimensional rectangular coordinate system is represented,The middle represents the electric field of optical spin separation after the light beam to be measured passes through the geometric phase polarization grating,Representing the complex amplitude distribution of the electric field of the light intermediate facula after the light beam to be measured passes through the geometric phase polarization grating,Respectively represents the complex amplitude distribution of the left-handed and right-handed circular polarization electric fields after the light beam to be measured is completely separated by the light spin after passing through the geometric phase polarization grating,Representing the geometric phase factor obtained by the light beam to be measured through the geometric phase polarization grating,Representing the spatial optical axis distribution of the geometric phase polarization grating,The number of the virtual-parts is represented,Indicating that the intermediate light spot obtained after the light beam to be measured passes through the geometric phase polarization grating maintains the original polarization state,Indicating the phase difference of the fast and slow axes.
As an optional implementation manner of the first aspect of the present application, the step of determining the ellipsometry and the rotation direction of the light beam to be measured specifically includes substituting the light intensity of the first left-hand light spot and the light intensity of the first right-hand light spot into an ellipsometry calculation formula to calculate the ellipsometry, where the ellipsometry is obtained by the calculation methodThe calculation formula is as follows: Wherein, the method comprises the steps of, ,Indicating that the intensity of the first left spot is higher than the intensity of the first right spot,Representing the electric field amplitude of the first left spot compared to the electric field amplitude of the first right spot; representing the intensity of the first left spot, Representing the intensity of the first right spot,Representing the electric field amplitude of the first left spot,Representing the electric field amplitude of the first right spot, based on the ellipsometryAnd (3) determining the rotation direction of the light beam to be detected, wherein a positive value is left rotation, and a negative value is right rotation.
As an optional implementation manner of the first aspect of the present application, in the step of performing polarization detection in the first operation mode, an electric field of a light spot of the light beam to be measured after passing through the geometric phase polarization grating and a rotatable analyzer is expressed as: Wherein The position of the light beam to be measured in the three-dimensional rectangular coordinate system is represented,Indicating that the light beam to be measured sequentially penetrates through the geometric phase polarization grating and the polarization direction isSpin separation electric field of the degree analyzer; Representing the complex amplitude distribution of the electric field of the light intermediate facula after the light beam to be measured passes through the geometric phase polarization grating, Respectively representing the complex amplitude distribution of the left-handed and right-handed circular polarization electric fields passing through the analyzer after the light beam to be measured is completely separated by the light spin after passing through the geometric phase polarization grating; Indicating the direction of the transmission deflection as Jones matrix of analyzer of degree, wherein the light intensity of the first intermediate light spot follows the rotation angle of analyzerA change by change; representing the phase factor obtained by the light beam to be measured through the geometric phase polarization grating and the analyzer, Representing the spatial optical axis distribution of the geometric phase polarization grating,The number of the virtual-parts is represented,Representing an intermediate light spot obtained after a light beam to be measured passes through the geometric phase polarization grating, maintaining the original polarization state,Indicating the phase difference of the fast and slow axes.
In an optional implementation manner of the first aspect of the present application, the step of determining the polarization azimuth angle of the light beam to be measured specifically includes rotating the analyzer in a preset step size within a range of 0 to 180 degrees, collecting the light intensity values of the first intermediate light spot under a plurality of rotation angles, determining the rotation angle corresponding to the maximum light intensity value, and taking the rotation angle as the polarization azimuth angle of the light beam to be measured.
In an optional implementation manner of the first aspect of the present application, the method further includes determining whether the light beam to be measured forms only two separated light spots after being diffracted by the geometric phase polarization grating when performing polarization detection, and if so, removing the geometric phase polarization grating in the optical path and performing the step of determining the polarization azimuth angle of the light beam to be measured.
As an optional implementation manner of the first aspect of the present application, in the step of performing wavelength detection in the second operation mode, a spot electric field of the linearly polarized light after being diffracted by the geometric phase polarization grating is expressed as: Wherein Representing the completely separated electric field of linearly polarized light through a horizontal analyzer and then through a geometric phase polarization grating by fresnel diffraction,Represents the light field amplitude of linearly polarized light passing through a horizontal analyzer and then passing through a geometric phase polarization grating to be completely separated,Representing the phase delay obtained by passing linearly polarized light through a geometric phase polarization grating, whereinFor the linearly polarized electric field of the second intermediate spot,The number of the virtual-parts is represented,Is the right-hand circular polarized electric field of the second light spot,Representing the phase factor obtained by passing linearly polarized light through a horizontal analyzer and then through a geometric phase polarization grating,Is the left-hand circularly polarized electric field of the second light spot.
As an optional implementation manner of the first aspect of the present application, the step of determining the wavelength of the light beam to be measured specifically includes calculating a ratio of the light intensity of the second intermediate light spot to a measured total light intensity, where the measured total light intensity is a sum of the light intensity of the second intermediate light spot and the light intensity of the light spot measured on either side, and based on the ratio, determining a phase delay relation of the light beam to be measuredGeometric phase polarization grating phase retardationFor a nominal resulting phase delay,And finally, measuring the total light intensity according to the light intensity ratio of the middle light spotAnd phase delay relationshipCalculating the wavelength of the light beam to be measured。
In a second aspect, an embodiment of the present application provides a polarization and wavelength joint detection device based on beam spin separation, including:
the geometric phase polarization grating is used for carrying out diffraction separation on the light beam to be detected;
an insertable or removable polarizer disposed in front of the optical path of the geometric phase polarization grating;
The rotatable analyzer is arranged behind the optical path of the geometric phase polarization grating;
The light intensity detector is used for collecting the light intensity of the light spot passing through the optical element;
A processor electrically connected to the light intensity detector, the processor configured to:
In a first operation mode, controlling the light intensity detector to acquire the light intensity of a first left light spot, a first middle light spot and a first right light spot which are formed by separating the light beam to be detected after being diffracted by the geometric phase polarization grating, determining the ellipsometry and the rotation direction of the light beam to be detected based on the light intensity, and acquiring the light intensity of the first middle light spot under different rotation angles of the polarization analyzer after the light beam to be detected passes through the geometric phase polarization grating and the rotatable polarization analyzer;
In a second operation mode, after the polarizer is inserted into the light path, controlling the light intensity detector to acquire the light intensity of each of a second left light spot, a second middle light spot and a second right light spot which are formed by separating linearly polarized light after being diffracted by the geometric phase polarization grating, and determining the wavelength of the light beam to be detected based on the relation among the light intensity, the phase delay and the wavelength.
In a third aspect, an embodiment of the present application provides an electronic device comprising a processor, a memory and a program or instruction stored on the memory and executable on the processor, the program or instruction implementing the steps of the method according to the first aspect when executed by the processor.
In a fourth aspect, embodiments of the present application provide a readable storage medium having stored thereon a program or instructions which when executed by a processor perform the steps of the method according to the first aspect.
Compared with the prior art, the invention has the beneficial effects that:
1. the invention uses single geometric phase polarization grating as core element, and can realize the measurement of two key parameters of polarization and wavelength by simple operation mode switching (inserting/removing polarizer), thereby greatly simplifying the system structure and reducing the volume.
2. The method can measure the polarization full parameter (ellipsometry, handedness and azimuth angle) and wavelength of the light beam to be measured at the same time, and provides multi-dimensional analysis capability of the light beam attribute.
3. The method has good detection effect in a wider wavelength range based on the deterministic relation between the phase delay and the wavelength, and has strong applicability.
4. The operation is simple and convenient, the efficiency is high, the measuring process only needs to carry out light intensity acquisition for several times and simple rotation operation, the data processing algorithm is direct and clear, the detection efficiency is high, and the method is suitable for dynamically or real-time monitoring scenes.
Drawings
FIG. 1 is a flow chart of a method for polarization and wavelength joint detection based on beam spin separation according to an embodiment of the invention;
FIG. 2 is a schematic diagram of an experimental apparatus for a polarization detection mode based on a combined polarization and wavelength detection method for spin separation of light beams in an embodiment of the present invention;
FIG. 3 is a schematic diagram showing the distribution of liquid crystal molecules of a geometric phase polarization grating based on a method for detecting polarization and wavelength combination by beam spin separation in an embodiment of the present invention;
FIG. 4 is a schematic diagram of polarization states of each light spot after spin separation after passing through a geometric phase liquid crystal polarization grating when a light beam to be measured is left-handed elliptical polarized light in an embodiment of the present invention;
FIG. 5 is a schematic diagram of polarization states of each light spot after spin separation after passing through a geometric phase liquid crystal polarization grating when a light beam to be measured is left circularly polarized light in an embodiment of the present invention;
FIG. 6 is a schematic diagram of polarization states of each light spot after spin separation after passing through a geometric phase liquid crystal polarization grating when a light beam to be measured is right circularly polarized light in an embodiment of the present invention;
FIG. 7 is a schematic diagram of an experimental apparatus for a wavelength detection mode of a polarization and wavelength joint detection method based on beam spin separation in an embodiment of the present invention;
Fig. 8 is a schematic diagram of spatial position distribution of light spots of diffraction orders of a light beam to be measured after passing through a polarization and wavelength detection device according to an embodiment of the present invention.
Detailed Description
The following description of the embodiments of the present application will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are some, but not all embodiments of the application. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.
The terms first, second and the like in the description and in the claims, are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged where appropriate such that embodiments of the application may be practiced otherwise than as specifically illustrated or described herein. Furthermore, in the description and claims, "and/or" means at least one of the connected objects, and the character "/", generally means that the associated object is an "or" relationship. In the description of the present application, the meaning of "a plurality" is two or more, unless explicitly defined otherwise.
Example 1
Referring to fig. 1, a flowchart of a polarization and wavelength combination detection method based on beam spin separation is provided in an embodiment of the present invention. The method may comprise the steps of:
s1, acquiring the light intensity of a first left light spot, a first middle light spot and a first right light spot which are formed by separating a light beam to be detected after being diffracted by a geometric phase polarization grating, and determining the ellipsometry and the rotation direction of the light beam to be detected based on the light intensity of the first left light spot and the light intensity of the first right light spot.
Fig. 2 is a schematic diagram of a polarization detection experimental device based on an embodiment of a method for detecting polarization and wavelength combination by spin separation of a light beam, wherein the light beam to be detected is modulated into light with any polarization in step S1.
It should be noted that, the first wavelength of the light beam to be measured isThe electric field expression is:
;
Wherein the method comprises the steps of Represents the electric field of linearly polarized light,Respectively represents a horizontal axis, a vertical axis and a vertical axis in a three-dimensional rectangular coordinate system,Representing the complex amplitude distribution of the electric field of the linearly polarized light beam to be measured,Respectively represent left-hand circular polarization componentsAnd right-hand circular polarization component;
Then, the quarter wave plate is rotated to modulate the polarized light to be tested with any polarization state (azimuth angle and ellipsometry are not independent of each other), and the Jones matrix of the quarter wave plate is formed:
;
Wherein, the Is the included angle between the fast and slow axes of the quarter wave plate and the right-angle coordinate axis,AndRespectively representing sine operation and cosine operation of the quarter wave plate optical axis distribution.
The Jones matrix of the light beam to be measured with any polarization state is obtained after the modulation of the quarter wave plate:
;
the above formula can also be expressed simply as:
;
Wherein, the Indicating the transmission angle of the linearly polarized light beamThe electric field of the quarter wave plate,Indicating the transmission angle of the linearly polarized light beamComplex amplitude distribution of electric field of quarter wave plate of degree, whereinExpressed in natural constantAn exponential function of the base is used,The number of the virtual-parts is represented,Representing the rotation angle of the quarter wave plate, whereinIndicating the phase difference of the fast and slow axes.
Wherein the spot size of the light beam is controlled, a telescope system is added to adjust the spot, a lens 1 and a lens 2 are respectively used, and the focal length of the lens 1 is thatThe focal length of the lens 2 isCoaxially placing two lenses with a spacing ofLens 1 is in front of lens 2. The angle amplification ratio:
;
The light beam to be measured passes through the telescope post-system electric field representation:
;
Wherein the method comprises the steps of Representing the electric field of the beam passing through the telescope system,Representing the amplitude distribution of the electric field of the beam passing through the telescope system.
In this embodiment, please refer to fig. 3, which is a schematic diagram illustrating a liquid crystal molecular distribution of a geometric phase polarization grating based on a method for detecting polarization and wavelength combination of beam spin separation, in an embodiment of the present invention, wherein the jones matrix of the geometric phase polarization grating is as follows:
;
Wherein, the Representing the spatial optical axis distribution of the geometric phase polarization grating,Representing the grating period, whereinRepresenting the phase delay of the light beam to be measured through the geometric phase polarization grating (wherein),AndRespectively represent the optical axis distribution trigonometric function operation.
In the first operation mode, the modulated polarized light beam is incident to a geometric phase polarization grating, and the light spots which are completely separated from the spin through Fresnel far field diffraction are:
;
Wherein, the The random polarized light beam to be measured is used for adjusting the size of a light spot through a telescope system and transmitting an electric field of optical spin separation after geometrical phase polarization grating,The complex amplitude distribution of the electric field after the light spin is completely separated after the random polarized light beam to be measured passes through the geometrical phase polarization grating after the size of the light spot is regulated by the telescope system,The method shows that the size of the light spot of any polarized light beam to be measured is regulated by a telescope system, and the complex amplitude distribution of the light intermediate light spot electric field of light spin separation after passing through a geometric phase polarization grating,The method respectively represents the complex amplitude distribution of the left-handed and right-handed circular polarization electric fields after the light spins of any polarized light beam to be measured are completely separated after the light beam passes through the geometric phase polarization grating and the light spot is adjusted by a telescope system. According to the geometric phase factor, the observation formula obtains the Jones matrix of the optical field of the spin separated left-handed circularly polarized light, right-handed circularly polarized light and the middle light spot:
;
Wherein, the The size of the light spot of the light beam with any polarization to be measured is adjusted through a telescope system, and the light spin-separated left-handed circularly polarized light after passing through a polarization grating with delayed geometric phase,The size of the light spot of the light beam with any polarization to be measured is adjusted through a telescope system, and the right-handed circularly polarized light with the optical spin separated after passing through the polarization grating with the geometrical phase delay,The size of the light spot of the to-be-measured light beam with any polarization is adjusted through the telescope system, and the light spin-separated intermediate light spot (the polarization state of the intermediate light spot is not modulated by the geometric phase polarization grating) after passing through the geometric phase delayed polarization grating.
For example, when the light beam to be measured is left-handed elliptical polarized light, please refer to fig. 4, which is a schematic diagram of the polarization states of the light spots after spin separation after passing through the geometric phase liquid crystal polarization grating.
Calculating left-handed circularly polarized light through a light intensity formula, the intensity of right circularly polarized light indicates:
;
Is the intensity of the spin-separated left-circularly polarized light, Is the intensity of the spin-separated right circularly polarized light. Wherein the method comprises the steps ofIs the rotation angle of the quarter wave plate,For the wavelength of the light beam to be measured to bePhase retardation under a geometric phase polarization grating.
Any polarization state can be synthesized by a left-handed component and a right-handed component, so that the left-handed component and the right-handed component of the light beam to be measured are separated by geometric phase delay, and the light intensity of light spots on the left side and the right side of the light beam to be measured is measured (the left-handed polarized light is converted into right-handed polarized light through a geometric phase polarization grating and is in the same way on the left side and the right side, and therefore, the left-handed component and the right-handed component of the original light beam can be expressed as a left light spot and a right light spot). In actual measurement, the light beam to be measured is left-handed or right-handed circularly polarized light, so that the light beam to be measured is judged according to the light intensity phenomenon, wherein the left-handed circularly polarized light has two light spots on the left side, and the right-handed circularly polarized light has two light spots on the right side.
Fig. 5 is a schematic diagram of the polarization states of the light spots after spin separation after passing through the geometric phase liquid crystal polarization grating in the case where the light beam to be measured is left circularly polarized light in the embodiment of the present invention, and fig. 6 is a schematic diagram of the polarization states of the light spots after spin separation after passing through the geometric phase liquid crystal polarization grating in the case where the light beam to be measured is right circularly polarized light in the embodiment of the present invention.
In actual ellipsometry, the ellipsometry measurement of a polarization grating is expressed as:
;
Wherein, the ,Indicating that the intensity of the first left spot is higher than the intensity of the first right spot,Representing the electric field amplitude of the first left spot compared to the electric field amplitude of the first right spot; representing the intensity of the first left spot, Representing the intensity of the first right spot,Representing the electric field amplitude of the first left spot,Representing the electric field amplitude of the first right spot;
It was found by the above formula that the rotation direction and ellipsometry of light of arbitrary polarization modulated by the quarter wave plate depend on the rotation angle of the quarter wave plate. When (when) A positive value indicates a left-hand rotation,Negative values indicate right-hand rotation.
S2, acquiring light intensity of the first intermediate light spot under different rotation angles of the analyzer after the light beam to be detected passes through the geometric phase polarization grating and the rotatable analyzer, and determining the polarization azimuth angle of the light beam to be detected based on the light intensity of the first intermediate light spot under different rotation angles.
In this embodiment, the geometrical phase polarization grating is followed by an analyzer whose jones matrix is expressed as:
;
Wherein the method comprises the steps of Indicating the direction of the transmission deflection asJones matrix of the analyzer of degrees.Representing the transmission axis of the analyzerThe included angle of the axes.
In the first operation mode, the spin-separated light spot passes through the polarization direction as followsThe light field expression obtained by the analyzer of the degree:
;
;
Wherein, the Indicating that the light beam to be measured sequentially passes through the quarter wave plate, the geometric phase polarization grating and the polarization direction isSpin-separating electric field of analyzer of degree, wherein the left-right circular polarization,The light intensity of (2) becomes half of the original; intermediate light spotIs dependent on the rotation angle of the analyzerChanges occur. (similarly, in this embodiment, the spin-separated left and right spots refer to the first left spot and the first right spot, and the spin-separated middle spot refers to the first middle spot)
The polarization azimuth angle is related to the polarization major axis among elliptical polarizations. Because the polarization state of the intermediate light spot is not modulated by the geometric phase polarization grating to maintain the original polarization state, the rotation angle of the intermediate light spot along with the analyzerAnd the light intensity value is measured by rotating the analyzer within the range of 0 to 180 degrees under the same step length, and the maximum value and the corresponding angle are determined, wherein the maximum value and the corresponding angle are the azimuth angle of the light beam to be measured.
In which the phase is delayedWhen the light beam to be measured passes through the geometric phase polarization grating, only two light spots appear. The geometric phase polarization grating needs to be removed from the optical path when the azimuth angle is measured, and then the rotation analyzer is continued to measure the azimuth angle of the light beam to be measured.
S3, arranging a polarizer in front of an optical path of the geometric phase polarization grating to enable a light beam to be detected to be changed into linear polarized light, obtaining respective light intensities of a second left light spot, a second middle light spot and a second right light spot which are formed by separating the linear polarized light after being diffracted by the geometric phase polarization grating, and determining the wavelength of the light beam to be detected based on the light intensity of the second middle light spot and the light intensity of any side light spot and according to the relation between phase delay and wavelength.
Fig. 7 is a schematic diagram of an experimental apparatus for a wavelength detection mode based on a polarization and wavelength combined detection method for spin separation of light beams according to an embodiment of the present invention. It should be noted that the wavelength of the light beam to be measured isCalibration wavelength of polarization grating with geometric phase delayThe dynamic phase delay of the polarization grating with geometric phase delay at the calibrated wavelength isAccording to the kinetic phase formula:
;
Wherein the method comprises the steps of Indicating the retardation of the phase difference caused by the molecular anisotropy of the material,Wavelengths designed for known geometric phase polarization gratings,At the designed wavelengthIs used for the phase delay of (a).For the thickness of the molecules of the material,Representing the difference in refractive index of the fast and slow axes of the polarization grating.
Wherein by observing the formula, when the wavelength changes will result inChanging, where the wavelength is changed toA varying phase delay can be obtainedExpressed as:
;
In this embodiment, when the wavelength of the light beam to be measured is measured in the second operation mode, the light beam to be measured is added to the horizontal analyzer, and is changed into horizontal polarized light and then is input into the geometric phase polarization grating, so that the spin-separated light beam to be measured can be expressed as:
;
Wherein the method comprises the steps of Representing the completely separated electric field of linearly polarized light through a horizontal analyzer and then through a geometric phase polarization grating by fresnel diffraction,Represents the light field amplitude of linearly polarized light passing through a horizontal analyzer and then passing through a geometric phase polarization grating to be completely separated,Representing the phase delay obtained after linearly polarized light passes through the geometric phase polarization grating,Is the electric field of the middle light spot,Is a right-hand circular polarized electric field,Representing the phase factor obtained by passing linearly polarized light through a horizontal analyzer and then through a geometric phase polarization grating,The optical spot is a left-handed circularly polarized electric field (in this embodiment, the spin-separated left and right light spots refer to the second left light spot and the second right light spot, and the spin-separated middle light spot refers to the second middle light spot).
Fig. 8 is a schematic diagram showing spatial position distribution of the light beam to be measured after the light beam is completely separated by each diffraction order spot of the polarization and wavelength detection device in the embodiment of the present invention.
Further, the light intensity calculation formula is expressed as:
;
Wherein the method comprises the steps of Indicating the intensity of the light,Indicating that the electric field is inThe component in the direction of the light is,Indicating that the electric field is inComponents in the direction.
Wherein, the middle light spot electric field is expressed as:
;
Wherein the method comprises the steps of Representing the electric field of the intermediate spot,Is the electric field amplitude of the intermediate spot.
The relation between the light intensity and the phase delay of the intermediate light spot can be obtained through a light intensity formula and is expressed as follows:
;
Wherein the left-hand circularly polarized electric field in both sides is expressed as:
;
Wherein the method comprises the steps of Representing the electric field of the intermediate spot,The electric field amplitude is left-hand circularly polarized;
the relation between the light intensity and the phase delay of the left-hand circular polarized electric field in two sides can be obtained through a light intensity formula, and the relation is expressed as follows:
;
The light intensity of the right-handed circularly polarized electric field in the two sides is calculated as follows:
;
By observation, the light intensity of the left-hand light spot is equal to that of the right-hand light spot, so that one light spot on any two sides and the middle light spot are measured in the light intensity of the actually measured light spot;
Wherein the sum of the measured light spot intensities is expressed as:
;
wherein the measured intensity ratio of the intermediate spot to the measured total intensity is expressed as:
;
In the above-mentioned formula(s), The measured total intensity is compared to the measured intensity of the intermediate spot.
According to the phase delay formula of the wavelength to be measuredThe relationship between wavelength and intensity can be expressed as:
;
in summary, the invention successfully realizes comprehensive and integrated detection of the full parameters (ellipsometry, rotation direction and azimuth angle) and wavelength of the polarization of the light beam by skillfully designing two operation modes and utilizing the same core optical element, namely the geometric phase polarization grating. The method has the advantages of simple system and high measurement efficiency, and has wide application prospect in a plurality of fields such as fine industrial detection, biomedical diagnosis, remote sensing, environmental monitoring, optical teaching and the like.
Example 2
A second embodiment of the present application proposes a polarization and wavelength joint detection device based on spin separation of light beams, the device comprising:
the geometric phase polarization grating is used for carrying out diffraction separation on the light beam to be detected;
an insertable or removable polarizer disposed in front of the optical path of the geometric phase polarization grating;
The rotatable analyzer is arranged behind the optical path of the geometric phase polarization grating;
The light intensity detector is used for collecting the light intensity of the light spot passing through the optical element;
A processor electrically connected to the light intensity detector, the processor configured to:
In a first operation mode, controlling the light intensity detector to acquire the light intensity of a first left light spot, a first middle light spot and a first right light spot which are formed by separating the light beam to be detected after being diffracted by the geometric phase polarization grating, determining the ellipsometry and the rotation direction of the light beam to be detected based on the light intensity, and acquiring the light intensity of the first middle light spot under different rotation angles of the polarization analyzer after the light beam to be detected passes through the geometric phase polarization grating and the rotatable polarization analyzer;
In a second operation mode, after the polarizer is inserted into the light path, controlling the light intensity detector to acquire the light intensity of each of a second left light spot, a second middle light spot and a second right light spot which are formed by separating linearly polarized light after being diffracted by the geometric phase polarization grating, and determining the wavelength of the light beam to be detected based on the relation among the light intensity, the phase delay and the wavelength.
The polarization and wavelength combined detection device based on the spin separation of the light beam in the embodiment of the application can be a system, and can also be a component, an integrated circuit or a chip in a terminal. The device may be a mobile electronic device or a non-mobile electronic device. By way of example, the mobile electronic device may be a cell phone, tablet computer, notebook computer, palm computer, vehicle mounted electronic device, wearable device, ultra-mobile Personal Computer, UMPC, netbook or Personal digital assistant (Personal DIGITAL ASSISTANT, PDA), etc., and the non-mobile electronic device may be a server, network attached storage (Network Attached Storage, NAS), personal computer (Personal Computer, PC), etc., the embodiments of the present application are not limited in particular.
The polarization and wavelength combined detection device based on the spin separation of the light beam can be a device with an operating system. The operating system may be an Android operating system, an IOS operating system, or other possible operating systems, and the embodiment of the present application is not limited specifically.
The polarization and wavelength combined detection device based on beam spin separation provided by the embodiment of the application can realize each process realized by the polarization and wavelength combined detection method based on beam spin separation in the method embodiment of fig. 1, and in order to avoid repetition, the description is omitted here.
Optionally, the embodiment of the present application further provides an electronic device, including a processor, a memory, and a program or an instruction stored in the memory and capable of running on the processor, where the program or the instruction implements each process of the above embodiment of the method for detecting polarization and wavelength combination based on beam spin separation when executed by the processor, and the process can achieve the same technical effect, so that repetition is avoided, and no further description is given here.
The embodiment of the application also provides a readable storage medium, on which a program or an instruction is stored, which when executed by a processor, implements each process of the above embodiment of the polarization and wavelength combined detection method based on beam spin separation, and can achieve the same technical effect, so that repetition is avoided, and no further description is given here.
Wherein the processor is a processor in the electronic device described in the above embodiment. The readable storage medium includes a computer readable storage medium such as a Read-Only Memory (ROM), a random access Memory (Random Access Memory, RAM), a magnetic disk or an optical disk, and the like.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element. Furthermore, it should be noted that the scope of the methods and apparatus in the embodiments of the present application is not limited to performing the functions in the order shown or discussed, but may also include performing the functions in a substantially simultaneous manner or in an opposite order depending on the functions involved, e.g., the described methods may be performed in an order different from that described, and various steps may be added, omitted, or combined. Additionally, features described with reference to certain examples may be combined in other examples.
From the above description of the embodiments, it will be clear to those skilled in the art that the above-described embodiment method may be implemented by means of software plus a necessary general hardware platform, but of course may also be implemented by means of hardware, but in many cases the former is a preferred embodiment. Based on such understanding, the technical solution of the present application may be embodied essentially or in a part contributing to the prior art in the form of a software product stored in a storage medium (e.g. ROM/RAM, magnetic disk, optical disk) comprising instructions for causing a terminal (which may be a mobile phone, a computer, a server, an air conditioner, or a network device, etc.) to perform the method according to the embodiments of the present application.
The embodiments of the present application have been described above with reference to the accompanying drawings, but the present application is not limited to the above-described embodiments, which are merely illustrative and not restrictive, and many forms may be made by those having ordinary skill in the art without departing from the spirit of the present application and the scope of the claims, which are to be protected by the present application.
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| CN117346905A (en) * | 2023-12-04 | 2024-01-05 | 江西师范大学 | A beam spin synchronized shearing interference method |
| CN118190177A (en) * | 2024-03-19 | 2024-06-14 | 浙江大学 | Amplitude, phase, and polarization characterization method and device based on coherent diffraction imaging |
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| DE4033013C2 (en) * | 1990-10-18 | 1994-11-17 | Heidenhain Gmbh Dr Johannes | Polarization-optical arrangement |
| DE102006029035B4 (en) * | 2006-06-15 | 2009-10-15 | Freie Universität Berlin | Apparatus and method for the production and detection in amplitude, phase and polarization of shaped laser pulses |
| FR3093821B1 (en) * | 2019-03-14 | 2021-04-16 | Horiba France Sas | Polarization splitter device, differential interferometer and differential contrast optical microscope comprising such a device |
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