CN117310465A - Switch matrix test platform and switch matrix test method - Google Patents

Abstract

The invention discloses a switch matrix testing platform and a switch matrix testing method, and belongs to the field of communication technology. The test platform includes the M*N switch matrix to be tested, the control system, single-pole A-throw switch equipment and single-pole B-throw switch equipment; the M output terminals in the single-pole A-throw switch equipment are respectively connected to the M output terminals of the M*N switch matrix under test. The input terminals are connected one by one, and its N output terminals are connected one by one with the N input terminals in the single-pole B-throw switching equipment; the control system is respectively connected with the single-pole A-throw switching equipment, the single-pole B-throw switching equipment, and the M*N switch to be tested. Matrix connection; where A≥M, B≥N. The switch matrix test platform and test method proposed by the present invention can solve the problem that the current switch matrix test method needs to frequently change ports for testing when testing large-scale radio frequency switch matrices. The test time is long, the labor cost is high, and the reliability of the connector is affected. Sexual issues.

Description

A switch matrix test platform and switch matrix test method

Technical field

The invention relates to the field of communication technology, in particular to a switch matrix testing platform and a switch matrix testing method.

Background technique

The RF switch matrix plays an important role in the communication system and is mainly used for signal switching. Its working methods can be divided into point-to-point, point-to-multipoint and multi-point-to-point. Its main indicators include channel gain, in-band flatness, noise coefficient, Output P-1 etc. The current test method is mainly as follows: when testing the gain and output P-1 of the M*N switch matrix, refer to Figure 1. The signal source and spectrum analyzer are connected to the first input terminal and the first output terminal of the switch matrix respectively, and the measured data, then fix the input, change the output terminal to the second channel to measure the data, measure the Nth output data in this way, then switch the signal source input to the second input terminal, and then output from the 1st channel to the Nth channel Receive the data measured by the spectrum analyzer respectively. By analogy, the data from the M-th input to the N-th output is finally completed.

If you need to test the standing wave ratio parameters of the switch matrix, see Figure 2, you need to use a vector network analyzer and cycle M*N times in the above manner to measure the standing wave ratio of each channel. When the matrix scale is small, such as M≤6, N≤6, the above test method can be completed at a faster speed. However, with the development of the radio frequency industry, the scale of the radio frequency switch matrix gradually becomes larger, and the number of channels also increases significantly. When M≥16 and N≥16, to test all indicators of the switch matrix, the above process needs to be repeated thousands of times, which consumes a lot of time and labor costs. In addition, frequent plugging and unplugging will also affect the reliability of the connector. Make an impact.

Therefore, there is an urgent need for a switch matrix test platform and method to solve the problem that the current switch matrix test method needs to frequently change ports for testing when testing large-scale RF switch matrices. The test time is long, the labor cost is high and it will affect the connection. device reliability issues.

Contents of the invention

The present invention aims to propose a switch matrix test platform and a switch matrix test method to solve the problem that the current switch matrix test method needs to frequently change ports for testing when testing large-scale radio frequency switch matrices, which results in long test time and high labor costs. And will affect the reliability of the connector.

In view of the problems existing in the existing technology, the technical solution adopted by the present invention is:

A switch matrix test platform, including an M*N switch matrix to be tested, a control system, single-pole A-throw switching equipment and single-pole B-throw switching equipment;

The M output terminals in the single-pole A-throw switch device are respectively connected to the M input terminals of the M*N switch matrix to be tested, and the N output terminals of the M*N switch matrix to be tested are respectively connected to all the M input terminals. The N input terminals in the single-pole B-throw switching device are connected one by one; the control system is respectively connected to the single-pole A-throw switching device, the single-pole B-throw switching device and the M*N switch matrix to be tested;

Wherein, M is the number of input terminals of the M*N switch matrix to be tested; N is the number of output terminals of the M*N switch matrix to be tested; A is the number of switch shunts of the single-pole A-throw switch device; B is the number of switch shunts of the single-pole B-throw switch equipment; A≥M, B≥N.

Optionally, a vector network analyzer is also included, and two ports of the vector network analyzer are respectively connected to the single-pole A-throw switching device and the single-pole B-throw switching device.

Optionally, it also includes a signal source and a spectrum analyzer; the output end of the signal source is connected to the input end of the single-pole A-throw switching device; the output end of the single-pole B-throw switching device is connected to the input end of the spectrum analyzer. connect.

Optionally, a noise analyzer and a noise source are also included; the output end of the noise source is connected to the input end of the single-pole A-throw switching device, and the output end of the single-pole B-throw switching device is connected to the input end of the noise analyzer. The input terminal is connected, and the noise analyzer is connected to the noise source.

In order to achieve the above object, the present invention also provides a switch matrix testing method for the switch matrix test platform as mentioned above, including:

S100. Calibrate the switch matrix test platform and test the insertion loss values of the single-pole A-throw switching equipment and the single-pole B-throw switching equipment;

S200. According to the preset logical relationship, control the states of the M*N switch matrix to be tested, the single-pole A-throw switching device and the single-pole B-throw switching device through the control system;

S210: Control the opening of the M*N switch matrix channel under test to perform standing wave and gain tests on the M*N switch matrix under test;

S220: Control the channel of the M*N switch matrix under test to be turned off to perform isolation testing on the M*N switch matrix under test. After step S100, the method also includes:

S300: Control the M*N switch matrix to be tested and the single-pole A-throw switch matrix according to the insertion loss value of the single-pole A-throw switch device, the insertion loss value of the single-pole B-throw switch device and the preset logical relationship. The status of the switchgear and said single-pole B-throw switchgear;

S310: Determine whether the input signal power of the signal source increases to the first power value, and whether the output power of the spectrum analyzer increases to the second power value;

S320: If yes, read the displayed power value of the spectrum analyzer.

Further, after step S100, the method further includes;

S400: Set the input loss and output loss of the noise analyzer respectively according to the insertion loss value of the single-pole A-throw switching device and the insertion loss value of the single-pole B-throw switching device;

S410: According to the preset logical relationship, control the states of the M*N switch matrix to be tested, the single-pole A-throw switch device, and the single-pole B-throw switch device to test the M*N switch matrix to be tested. noise figure.

The beneficial effects of the technical solution proposed by the present invention are:

The switch matrix test platform and test method proposed by the present invention reduce the steps of frequently switching cables in the existing test method; if a 16*16 switch matrix is tested, the time required to test all indicators according to the existing test method requires at least 3 Hours of use and frequent cable transfers will also have an impact on the reliability of the connector. If all indicators are tested according to the test method proposed by the present invention, the test time can be controlled within 1 hour, which greatly improves the test efficiency. After the cable is connected to the switch matrix, there is no need for frequent switching, which can better ensure the product. reliability.

In addition, the switch matrix test platform and test method proposed by the present invention require only one tester to complete the test. According to the existing test method, at least two people are required to participate in the test, one person is responsible for controlling the matrix and recording test data, and the other person is responsible for connecting the cable. This test method only needs to connect the cables in the preparation stage and does not need to replace the test interface multiple times. One person can complete the test work, which greatly reduces labor costs and solves the problem of the current switch matrix test method on large-scale testing. When testing a large-scale RF switch matrix, it is necessary to frequently change ports for testing. The test time is long, the labor cost is high, and the reliability of the connector is affected.

The switch matrix test platform and test method proposed by the present invention can better adapt to the construction of automated test systems. Through the data collection of test instruments and the synchronous control of the switch matrix and switching equipment to be tested, and then through the control of the host computer software, Completing automated testing can further improve testing efficiency.

Description of the drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments or prior art will be briefly introduced below. Obviously, the drawings in the following description are only illustrative of the present invention. For some embodiments, for those of ordinary skill in the art, other drawings can be obtained based on these drawings without exerting creative efforts.

Figures 1-2 are schematic diagrams of the connection structure of the existing switch matrix test platform provided by the first embodiment of the present invention;

Figure 3 is a schematic diagram of the connection structure of the switch matrix test platform provided by the first embodiment of the present invention when it is used to test the standing wave, gain and isolation of the switch matrix;

Figure 4 is a schematic diagram of the connection structure of the switch matrix test platform provided by the first embodiment of the present invention when it is used to test the output P-1 of the switch matrix;

Figure 5 is a schematic diagram of the connection structure of the switch matrix test platform provided by the first embodiment of the present invention when it is used to test the noise coefficient of the switch matrix;

Figure 6 is a schematic flow chart of a method for testing the standing wave, gain and isolation of a switch matrix provided by the first embodiment of the present invention;

Figure 7 is a schematic flow chart of the method for testing the output P-1 of the switch matrix provided by the first embodiment of the present invention;

FIG. 8 is a schematic flowchart of testing the noise figure of a switch matrix according to the first embodiment of the present invention.

The realization of the purpose, functional features and advantages of the present invention will be further described with reference to the embodiments and the accompanying drawings.

Detailed ways

The present invention will be further described in detail below in conjunction with the accompanying drawings and examples. It can be understood that the specific embodiments described here are only used to explain the relevant invention, but not to limit the invention. In addition, it should be noted that, for convenience of description, only the parts related to the invention are shown in the drawings.

In addition, the terms "mounted," "set," "provided," "connected," and "connected" are to be construed broadly. For example, it can be a fixed connection, a detachable connection, or an integral structure; it can be a mechanical connection or an electrical connection; it can be directly connected, or indirectly connected through an intermediate medium, or between two devices, components or components. internal connectivity. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

Therefore, there is an urgent need for a switch matrix test platform and method to solve the problem that the current switch matrix test method needs to frequently change ports for testing when testing large-scale RF switch matrices. The test time is long, the labor cost is high and it will affect the connection. device reliability issues

In the following embodiments of the present application, the frequency hopping signal angle tracking platform used in the implementation of the technology of the present application will be described:

Referring to Figure 3, Figure 3 is a schematic structural diagram of the frequency hopping signal angle tracking platform involved in the embodiment of the present application.

The switch matrix test platform includes M*N switch matrix to be tested, control system, single-pole A-throw switch equipment and single-pole B-throw switch equipment;

The M output terminals in the single-pole A-throw switch device are respectively connected to the M input terminals of the M*N switch matrix to be tested, and the N output terminals of the M*N switch matrix to be tested are respectively connected to all the M input terminals. The N input terminals in the single-pole B-throw switching device are connected one by one; the control system is respectively connected to the single-pole A-throw switching device, the single-pole B-throw switching device and the M*N switch matrix to be tested;

Wherein, M is the number of input terminals of the M*N switch matrix to be tested; N is the number of output terminals of the M*N switch matrix to be tested; A is the number of switch shunts of the single-pole A-throw switch device; B is the number of switch shunts of the single-pole B-throw switch equipment; A≥M, B≥N.

That is to say, the switch matrix test platform proposed by the present invention adds two single-pole multi-throw switching devices on the basis of the original test platform. The frequency range of this device needs to cover the frequency range of the M*N switch matrix to be tested, and the number of its switch shunts needs to be greater than It is equal to the number of input ports and the number of output ports of the switch matrix under test M*N.

In a specific embodiment, referring to Figure 3, the switch matrix test platform proposed by the present invention also includes a vector network analyzer, two ports of the vector network analyzer are respectively connected to the single-pole A-throw switching device and the single-pole B Throw switchgear connections.

In a specific embodiment, referring to Figure 4, the switch matrix test platform proposed by the present invention also includes a signal source and a spectrum analyzer; the output end of the signal source is connected to the input end of the single-pole A-throw switching device; the single-pole The output terminal of the B-throw switching device is connected to the input terminal of the spectrum analyzer.

In a specific embodiment, referring to Figure 5, the switch matrix test platform proposed by the present invention also includes a noise analyzer and a noise source; the output end of the noise source is connected to the input end of the single-pole A-throw switching device, and the The output of the single-pole B-throw switching device is connected to the input of the noise analyzer, and the noise analyzer is connected to the noise source.

Embodiments of the present application In the following, the switch matrix testing method applied in the implementation of the technology of the present application will be described.

During specific implementation, it is assumed that the test requirements are as follows: (1) Matrix size: M*N; (2) Matrix frequency range: fL~fH; (3) Matrix index requirements: ① Gain: g±1d; ② Input and output isolation : ≥I dB; ③Output P-1: ≥p dB; ④Noise coefficient: ≤n dB; ⑤Input-output standing wave ratio: ≤m:1.

Then the index requirements of single-pole multi-throw equipment are: (1) Number of switch channels: greater than or equal to M (N), (M and N are respectively the number of M*N switch matrix input and output ports to be tested) (2) Amplitude consistency between switch channels : <±0.1dB; (3) Switch isolation: greater than I dB, I is the isolation index requirement of the matrix to be tested; (4) Input and output standing wave: <1.1.

Referring to Figure 6, based on the test platform shown in Figure 3, the methods for testing the standing wave, gain and isolation of the switch matrix include:

S100. Calibrate the switch matrix test platform and test the insertion loss values of the single-pole A-throw switching equipment and the single-pole B-throw switching equipment;

Specifically, the vector network analyzer frequency is set to fL~fH for calibration, and the insertion loss values of two single-pole multi-throw switching devices are tested respectively, recorded as ILSW1 and ILSW2. Connect the input ports of the single-pole M-throw and single-pole B-throw switch equipment to the S11 and S22 ports of the vector network respectively, open the first channel of the switch equipment, use the switch equipment as part of the vector network, set the frequency from fL to fH, and perform dual-port calibration and pass-through calibration.

S200. According to the preset logical relationship, control the states of the M*N switch matrix to be tested, the single-pole A-throw switching device and the single-pole B-throw switching device through the control system;

The above preset logical relationships are shown in Table 1 below:

Matrix input terminal to be tested Single pole M throwing equipment Matrix output to be tested Single pole N throw equipment Enter 1 Channel 1 Output 1 Channel 1 Enter 1 Channel 1 Output 2 Channel 2 … … … … Enter 1 Channel 1 OutputN Channel N Enter 2 Channel 2 Output 1 Channel 1 Enter 2 Channel 2 Output 2 Channel 2 … … … … Enter 2 Channel 2 Output N Channel N Enter 3 Channel 3 Output 1 Channel 1 … … … … Enter M Channel M Output 1 Channel 1 Enter M Channel M Output 2 Channel 2 … … … … Enter M Channel M Output N Channel N

Table 1: Single-pole multi-throw switch equipment and switch matrix control logic relationship under test

S210: Control the opening of the M*N switch matrix channel under test to perform standing wave and gain tests on the M*N switch matrix under test;

S220: Control the channel of the M*N switch matrix under test to be turned off to perform an isolation test on the M*N switch matrix under test.

Further, referring to Figure 7, based on the test platform shown in Figure 4, the test method for the output P-1 of the switch matrix includes:

S100. Calibrate the switch matrix test platform and test the insertion loss values of the single-pole A-throw switching equipment and the single-pole B-throw switching equipment;

S300: Control the M*N switch matrix to be tested and the single-pole A-throw switch matrix according to the insertion loss value of the single-pole A-throw switch device, the insertion loss value of the single-pole B-throw switch device and the preset logical relationship. The status of the switchgear and said single-pole B-throw switchgear;

S310: Determine whether the input signal power of the signal source increases to the first power value, and whether the output power of the spectrum analyzer increases to the second power value;

S320: If yes, read the displayed power value of the spectrum analyzer.

Specifically, turn on the power, control the switching device and the switch matrix to be tested through the preset logical relationship in Table 1, and test the output P-1 index of the switch matrix to be tested respectively. When the input power increases by 10dB and the output power increases by exactly 9dB, read the power value displayed by the spectrum analyzer. Since a single-pole B-throw switch device is introduced at the output end of the switch matrix under test, the insertion loss value of the switch device will affect the output P-1 of the matrix under test. Therefore, you can add the insertion loss value of the switch device by setting the spectrum analyzer reading offset function. , the reading at this time is the reading of the switch matrix output P-1 under test.

Further, referring to Figure 8, based on the test platform shown in Figure 5, the noise figure test method for the switch matrix includes:

S100: Calibrate the switch matrix test platform and test the insertion loss value of the single-pole A-throw switching device and the single-pole B-throw switching device;

Based on the above calibration, set the frequency of the noise analyzer from fL to fH, and connect the output end of the noise source probe to the input end of the noise analyzer to calibrate it.

S400: Set the input loss and output loss of the noise analyzer respectively according to the insertion loss value of the single-pole A-throw switching device and the insertion loss value of the single-pole B-throw switching device;

S410: According to the preset logical relationship, control the states of the M*N switch matrix to be tested, the single-pole A-throw switch device, and the single-pole B-throw switch device to test the M*N switch matrix to be tested. noise figure. .

Specifically, turn on the power, control the switching device and the switch matrix to be tested through the preset logical relationship in Table 1, and test the noise coefficient index of the switch matrix to be tested respectively. Since a single-pole A-throw switching device is introduced at the input end of the switch matrix under test and a single-pole B-throw switch device is introduced at the output end, the insertion loss value of the switching device will affect the noise coefficient of the switch matrix under test, so the inputs of the noise analyzer are set separately. The loss and output loss are ILSW1 and ILSW2, and the test reading is the noise figure of the matrix under test.

The switch matrix test platform and test method proposed by the present invention reduce the steps of frequently switching cables in the existing test method; if a 16*16 switch matrix is tested, the time required to test all indicators according to the existing test method requires at least 3 Hours of use and frequent cable transfers will also have an impact on the reliability of the connector. If all indicators are tested according to the test method proposed by the present invention, the test time can be controlled within 1 hour, which greatly improves the test efficiency. After the cable is connected to the switch matrix, there is no need for frequent switching, which can better ensure the product. reliability.

In addition, the switch matrix test platform and test method proposed by the present invention require only one tester to complete the test. According to the existing test method, at least two people are required to participate in the test, one person is responsible for controlling the matrix and recording test data, and the other person is responsible for connecting the cable. This test method only needs to connect the cables in the preparation stage and does not need to replace the test interface multiple times. One person can complete the test work, which greatly reduces labor costs and solves the problem of the current switch matrix test method on large-scale testing. When testing a large-scale RF switch matrix, it is necessary to frequently change ports for testing. The test time is long, the labor cost is high, and the reliability of the connector is affected.

The switch matrix test platform and test method proposed by the present invention can better adapt to the construction of automated test systems. Through the data collection of test instruments and the synchronous control of the switch matrix and switching equipment to be tested, and then through the control of the host computer software, Completing automated testing can further improve testing efficiency.

The above descriptions are only preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention shall be included in the protection of the present invention. within the range.

Claims (7)

1. A switch matrix test platform, characterized in that it includes an M*N switch matrix to be tested, a control system, a single-pole A-throw switching device and a single-pole B-throw switching device; The M output terminals in the single-pole A-throw switch device are respectively connected to the M input terminals of the M*N switch matrix to be tested, and the N output terminals of the M*N switch matrix to be tested are respectively connected to all the M input terminals. The N input terminals in the single-pole B-throw switching device are connected one by one; the control system is respectively connected to the single-pole A-throw switching device, the single-pole B-throw switching device and the M*N switch matrix to be tested; Wherein, M is the number of input terminals of the M*N switch matrix to be tested; N is the number of output terminals of the M*N switch matrix to be tested; A is the number of switch shunts of the single-pole A-throw switch device; B is the number of switch shunts of the single-pole B-throw switch equipment; A≥M, B≥N. 2. The switch matrix test platform according to claim 1, further comprising a vector network analyzer, two ports of the vector network analyzer are respectively connected to the single-pole A-throw switching device and the single-pole B-throw switch. Switchgear connections. 3. The switch matrix test platform according to claim 1, further comprising a signal source and a spectrum analyzer; the output end of the signal source is connected to the input end of the single-pole A-throw switching device; the single-pole B The output of the throw switch device is connected to the input of the spectrum analyzer. 4. The switch matrix test platform according to claim 1, further comprising a noise analyzer and a noise source; the output end of the noise source is connected to the input end of the single-pole A-throw switch device, and the single-pole A-throw switch device The output terminal of the B-throw switching device is connected to the input terminal of the noise analyzer, and the noise analyzer is connected to the noise source. 5. A switch matrix testing method, used for the switch matrix test platform as claimed in claims 1-4, characterized in that it includes: S100. Calibrate the switch matrix test platform and test the insertion loss values of the single-pole A-throw switching equipment and the single-pole B-throw switching equipment; S200. According to the preset logical relationship, control the states of the M*N switch matrix to be tested, the single-pole A-throw switching device and the single-pole B-throw switching device through the control system; S210: Control the opening of the M*N switch matrix channel under test to perform standing wave and gain tests on the M*N switch matrix under test; S220: Control the channel of the M*N switch matrix under test to be turned off to perform an isolation test on the M*N switch matrix under test. 6. The switch matrix testing method according to claim 5, characterized in that, after step S100, the method further includes: S300: Control the M*N switch matrix to be tested and the single-pole A-throw switch matrix according to the insertion loss value of the single-pole A-throw switch device, the insertion loss value of the single-pole B-throw switch device and the preset logical relationship. The status of the switchgear and said single-pole B-throw switchgear; S310: Determine whether the input signal power of the signal source increases to the first power value, and whether the output power of the spectrum analyzer increases to the second power value; S320: If yes, read the displayed power value of the spectrum analyzer. 7. The switch matrix testing method according to claim 5, characterized in that, after step S100, the method further includes; S400: Set the input loss and output loss of the noise analyzer respectively according to the insertion loss value of the single-pole A-throw switching device and the insertion loss value of the single-pole B-throw switching device; S410: According to the preset logical relationship, control the states of the M*N switch matrix to be tested, the single-pole A-throw switch device, and the single-pole B-throw switch device to test the M*N switch matrix to be tested. noise figure.