CN110333015B - Strain distribution measurement circuit based on strain gauge - Google Patents
Strain distribution measurement circuit based on strain gauge Download PDFInfo
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- CN110333015B CN110333015B CN201910698747.1A CN201910698747A CN110333015B CN 110333015 B CN110333015 B CN 110333015B CN 201910698747 A CN201910698747 A CN 201910698747A CN 110333015 B CN110333015 B CN 110333015B
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- 238000005259 measurement Methods 0.000 title claims abstract description 39
- 239000011159 matrix material Substances 0.000 claims abstract description 7
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- 239000004065 semiconductor Substances 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 5
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
- G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
- G01L1/225—Measuring circuits therefor
- G01L1/2256—Measuring circuits therefor involving digital counting
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Abstract
本发明公开了一种基于应变片的应变分布测量电路，包括：应变片阵列，应变片阵列包括N行M列矩阵式排布的N*M个应变片；N个第一电阻、第二电阻、M个第三电阻和多路开关，每一应变片通过多路开关与至少一个第一电阻、第二电阻和至少要一个第三电阻形成电桥电路。本发明实施例的应变分布测量电路，通过设置应变片阵列并配套相应的采集电路，既降低了复杂度及功耗，又减少了布线线缆。
The present invention discloses a strain distribution measurement circuit based on a strain gauge, comprising: a strain gauge array, the strain gauge array comprising N*M strain gauges arranged in a matrix of N rows and M columns; N first resistors, second resistors, M third resistors and a multi-way switch, each strain gauge forms a bridge circuit with at least one first resistor, a second resistor and at least one third resistor through the multi-way switch. The strain distribution measurement circuit of the embodiment of the present invention reduces complexity and power consumption and reduces wiring cables by setting a strain gauge array and matching a corresponding acquisition circuit.
Description
Technical Field
The invention relates to the technical field of strain distribution measurement, in particular to a strain distribution measurement circuit based on a strain gauge.
Background
At present, in structural stress distribution analysis, a common measurement mode is to attach a plurality of strain gauges on a structural surface for distributed measurement, however, the measurement mode needs large-scale multichannel acquisition equipment to acquire signals of the strain gauges respectively, and the main defects are as follows:
1. the number of channels of the acquisition equipment is more, the system is complex, the volume is huge, and the power consumption is high;
2. each strain gage needs a group of cables to be connected, the cables are more, the wiring is complex, and the reliability is low.
Disclosure of Invention
The present invention aims to solve at least to some extent one of the technical problems in the above-described technology.
Therefore, an object of the present invention is to provide a strain distribution measuring circuit based on strain gauge, which reduces complexity and power consumption and reduces wiring cables by providing a strain gauge array and matching with a corresponding acquisition circuit.
In order to achieve the above purpose, an embodiment of the first aspect of the present invention provides a strain distribution measurement circuit based on strain gages, which includes a strain gage array, wherein the strain gage array includes n×m strain gages arranged in N rows and M columns in a matrix, N first resistors, second resistors, M third resistors, and a multi-path switch, and the first strain gages form a bridge circuit with at least one of the first resistors, the second resistors, and at least one of the third resistors through the multi-path switch.
According to the strain distribution measuring circuit based on the strain gauge, the strain gauge array comprises N rows and M columns of N-M strain gauges which are arranged in a matrix mode, wherein each strain gauge forms a bridge circuit with at least one first resistor, at least one second resistor and at least one third resistor through multiple switches. Therefore, the strain distribution measuring circuit based on the strain gauge not only reduces complexity and power consumption, but also reduces wiring cables by arranging the strain gauge array and matching with a corresponding acquisition circuit.
In addition, the strain distribution measuring circuit based on the strain gauge according to the embodiment of the present invention may further have the following additional technical features:
In one embodiment of the invention, the strain distribution measuring circuit based on the strain gauge further comprises N amplifying circuits, N first resistors, N amplifying circuits, N static contacts, an amplifying circuit and a power supply, wherein the N first resistors correspond to N rows of the strain gauge, one end of the strain gauge is connected with the positive electrode of the power supply through the first resistor corresponding to the row, the N amplifying circuits correspond to the N rows of the strain gauge, one end of the strain gauge is also connected with the input negative end of the amplifying circuit corresponding to the row, the amplifying circuit is used for amplifying an input measuring voltage signal to obtain an amplified measuring voltage signal, the input positive end of the amplifying circuit is connected with the positive electrode of the power supply through the second resistor, the M third resistors correspond to the M rows of the strain gauge, the first ends of the third resistors are connected with the positive electrode of the power supply through the second resistor, the M static contacts correspond to the M rows of the strain gauge, the amplifying circuit is used for amplifying the input measuring voltage signal, the amplifying circuit is connected with the positive electrode of the power supply, the input measuring voltage signal is connected with the positive electrode of the amplifying circuit, the first resistor is connected with the positive electrode of the power supply through the second resistor, and the first resistor is connected with the positive electrode of the power supply.
In one embodiment of the present invention, the resistance of the first resistor is equal to the resistance of the second resistor.
In one embodiment of the present invention, the resistance of the third resistor is equal to the resistance of the strain gauge in the unstrained state.
In one embodiment of the present invention, the third resistor is a fixed resistor or a strain gauge non-strained sheet.
In one embodiment of the invention, the amplifying circuit comprises an amplifier, a fourth resistor and a third resistor, wherein the positive input end of the amplifier is used as the positive input end of the amplifying circuit, the negative input end of the amplifier is used as the negative input end of the amplifying circuit, the output end of the amplifier is used as the output end of the amplifying circuit, and the amplifier is used for amplifying the input measuring voltage signal to obtain the amplified measuring voltage signal.
In one embodiment of the invention, the voltage of the negative electrode of the power supply is equal to 0.
In one embodiment of the invention, the multiple switch is a mechanical switch or a semiconductor analog switch.
In one embodiment of the invention, the strain distribution measuring circuit based on the strain gauge further comprises N processors, wherein the N processors correspond to N rows of the strain gauge, the input ends of the processors are connected with the output ends of the amplifying circuits corresponding to the row, and the processors are used for receiving the amplified measuring voltage signals and determining the strain quantity of the strain gauge to be measured in the row according to the amplified measuring voltage signals.
Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.
Drawings
The foregoing and/or additional aspects and advantages of the invention will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings, in which:
FIG. 1 is a schematic diagram of a strain gauge-based strain distribution measurement circuit according to one embodiment of the present invention;
FIG. 2 is a schematic diagram of a single channel measurement equivalent circuit of a strain gauge based strain distribution measurement circuit according to one embodiment of the present invention;
FIG. 3 is a schematic diagram of a strain gauge-based strain distribution measurement circuit in accordance with another embodiment of the present invention, and
Fig. 4 is a schematic diagram of a single channel measurement equivalent circuit of a strain gauge-based strain distribution measurement circuit according to another embodiment of the present invention.
Detailed Description
Embodiments of the present invention are described in detail below, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to like or similar elements or elements having like or similar functions throughout. The embodiments described below by referring to the drawings are illustrative and intended to explain the present invention and should not be construed as limiting the invention.
The strain gauge-based strain distribution measurement circuit of the embodiment of the present invention is described below with reference to the accompanying drawings.
Fig. 1 is a schematic diagram of a strain gauge-based strain distribution measurement circuit according to an embodiment of the present invention, as shown in fig. 1, the strain gauge-based strain distribution measurement circuit according to an embodiment of the present invention may include a strain gauge array 100, N first resistors R1, a second resistor R2, M third resistors R3, and a multiplexing switch SW, where N and M may be positive integers.
The strain gauge array 100 may include n×m strain gauges STRAIN arranged in a matrix of N rows and M columns, and each strain gauge STRAIN may form a bridge circuit with at least one first resistor R1, one second resistor R2, and at least one third resistor R3 through a multiple-way switch SW.
In an embodiment of the present invention, referring to fig. 1, the strain distribution measuring circuit based on strain gauge may further include N amplifying circuits 200, where N first resistors R1 correspond to N rows of strain gauges STRAIN, N amplifying circuits 200 correspond to N rows of strain gauges STRAIN, one end of the strain gauge STRAIN is connected to the positive electrode of the power supply V through the first resistor R1 corresponding to the row, one end of the strain gauge STRAIN is also connected to the negative input terminal of the amplifying circuit 200 corresponding to the row, and the amplifying circuit 200 is configured to amplify the input measurement voltage signal to obtain an amplified measurement voltage signal. The input positive terminal of the amplifying circuit 200 is connected to the positive terminal of the power supply V through the second resistor R2. The M third resistors R3 correspond to the M rows of strain gauges STRAIN, and the first end of the third resistor R3 is connected with the positive electrode of the power supply V through the second resistor R2. The multi-way switch SW comprises a movable contact and M fixed contacts, the M fixed contacts correspond to M rows of strain gauges STRAIN, the other end of each strain gauge STRAIN is connected with the corresponding fixed contact of the corresponding row, the second end of the third resistor R3 is connected with the corresponding fixed contact of the corresponding row, and the movable contact is connected with the negative electrode of the power supply V.
Note that, in the above embodiment, the rows (N rows) and the columns (M columns) of the n×m strain gages STRAIN may be expanded according to actual needs.
Alternatively, the resistance of the first resistor R1 and the resistance of the second resistor R2 may be equal, the resistance of the third resistor R3 and the resistance of the strain gauge STRAIN in the unstrained state may be equal, the third resistor R3 may be a fixed resistor or a strain gauge non-strained sheet identical to the strain gauge STRAIN, the voltage of the negative electrode of the power supply V may be equal to 0, and the multiple switch SW may be a mechanical switch or a semiconductor analog switch.
Specifically, referring to fig. 1 and 2, the amplifying circuit 200 may include an amplifier AMP and a fourth resistor R4, wherein an input positive terminal of the amplifier AMP is used as an input positive terminal of the amplifying circuit 200, an input negative terminal of the amplifier AMP is used as an input negative terminal of the amplifying circuit 200, an output terminal of the amplifier AMP is used as an output terminal of the amplifying circuit 200, and the amplifier AMP is used for amplifying an input measurement voltage signal to obtain an amplified measurement voltage signal, and an input negative terminal of the amplifier AMP is connected with the output terminal of the amplifier AMP through the fourth resistor R4.
Further, referring to fig. 3, the strain distribution measuring circuit based on strain gauge may further include N processors 300, where N processors 300 correspond to N rows of strain gauges STRAIN, an input end of the processor 300 is connected to an output end of the amplifying circuit 200 corresponding to the row, and the processor 300 is configured to receive the amplified measurement voltage signal, and determine the strain amount of the strain gauge STRAIN to be measured in the row according to the amplified measurement voltage signal. The processor 300 may include comparators, ADCs (Analog to Digital Converter, analog to digital converters), and the like, among others.
The following describes in detail how the strain distribution measuring circuit of the strain gauge according to the embodiment of the present invention performs strain distribution measurement (i.e., measurement principle):
In the embodiment of the present invention, as shown in fig. 3 and 4, the strain gauge STRAIN is a to-be-measured strain gauge, the strain gauge STRAINx and the fifth resistor R5 are bypass resistors formed by other strain gauges and matching resistors in the matrix, the first resistor R1, the second resistor R2, the third resistor R3 and the strain gauge STRAIN form a bridge circuit, r1=r2, R3 is matched with the nominal resistance of the strain gauge STRAIN, and the fourth resistor R4 is set with a magnification factor. The strain gauge signal may be amplified and supplied to a back end (i.e., processor 300) for processing, such as a comparator, ADC, etc.
For example, referring to fig. 4, let the current flowing through the first resistor R1 be I1, the current flowing through the strain gauge STRAIN be IS, the current flowing through the second resistor R2 be I2, the resistance of the strain gauge STRAIN be RS, the resistance change caused by strain be Δr, the bridge supply voltage (v+) - (V-) =u, the input voltage at the input positive terminal of the amplifying circuit 200 be U1, the input voltage at the input negative terminal be U2, the internal resistance of the multi-way switch SW be RSW, and the voltage be U3.
In the strain distribution measuring circuit based on the strain gauge according to the embodiment of the present invention, the operational principle (i.e., the operation principle of the amplifying circuit 200) is that the operation principle of the operational amplifier circuit 200 is that u1=u2, so that no current flows through the strain gauge STRAINx and the fifth resistor R5, i.e., the bypass strain gauge and the resistor will not affect the measurement result.
Assuming that the voltage of the negative electrode V-of the power supply V is equal to 0 (i.e., the potential is 0), the following equation can be obtained:
I1*R1+IS*(RS+ΔR)+(IS+I2)*RSW=U;
U-U1=I1*R1;
U2=I2*R3+(IS+I2)*RSW;
I1-IS=(U2-OUT)/R4;
U1=U2;
simultaneous solutions can yield out=u2- (IS Δr/R3) R4, where U2, IS can be considered approximately constant, and r3=rs, since Δr of the strain gauge STRAIN IS a very small amount relative to nominal.
Then, the approximate conduction formula of the circuit output and the strain IS obtained by the strain gauge characteristic formula dR/R=Ks epsilon, wherein OUT=U2- (IS_Ks epsilon) R4.
Finally, the circuit output and the strain are linear relation once according to the conduction formula, and in practical application, direct calibration or calibration can be performed by other standard equipment.
Therefore, the strain distribution measuring circuit based on the strain gauge can greatly reduce the wire harness scale, has simpler hardware system and is easier to realize miniaturization because fewer signal processing channels are used, and the signal processing units can be arranged nearby, long wires are reduced, and the like.
In summary, according to the strain gauge-based strain distribution measurement circuit of the embodiment of the present invention, the strain gauge array includes n×m strain gauges arranged in a matrix of N rows and M columns, where each strain gauge forms a bridge circuit with at least one first resistor, one second resistor, and at least one third resistor through multiple switches. Therefore, the strain distribution measuring circuit based on the strain gauge not only reduces complexity and power consumption, but also reduces wiring cables by arranging the strain gauge array and matching with a corresponding acquisition circuit.
In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings are merely for convenience in describing the present invention and simplifying the description, and do not indicate or imply that the device or element being referred to must have a specific orientation, be configured and operated in a specific orientation, and therefore should not be construed as limiting the present invention.
Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more such feature. In the description of the present invention, the meaning of "a plurality" is two or more, unless explicitly defined otherwise.
In the present invention, unless explicitly specified and limited otherwise, the terms "mounted," "connected," "secured," and the like are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally formed, mechanically connected, electrically connected, directly connected, indirectly connected via an intervening medium, or in communication between two elements or in an interaction relationship between two elements. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art according to the specific circumstances.
In the present invention, unless expressly stated or limited otherwise, a first feature "up" or "down" a second feature may be the first and second features in direct contact, or the first and second features in indirect contact via an intervening medium. Moreover, a first feature being "above," "over" and "on" a second feature may be a first feature being directly above or obliquely above the second feature, or simply indicating that the first feature is level higher than the second feature. The first feature being "under", "below" and "beneath" the second feature may be the first feature being directly under or obliquely below the second feature, or simply indicating that the first feature is less level than the second feature.
In the description of the present specification, a description referring to terms "one embodiment," "some embodiments," "examples," "specific examples," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present invention. In this specification, schematic representations of the above terms are not necessarily directed to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, the different embodiments or examples described in this specification and the features of the different embodiments or examples may be combined and combined by those skilled in the art without contradiction.
While embodiments of the present invention have been shown and described above, it will be understood that the above embodiments are illustrative and not to be construed as limiting the invention, and that variations, modifications, alternatives and variations may be made to the above embodiments by one of ordinary skill in the art within the scope of the invention.
Claims (9)
1. A strain gauge-based strain distribution measurement circuit, comprising:
The strain gauge array comprises N rows and M columns of N-x-M strain gauges which are arranged in a matrix manner;
The device comprises N first resistors, second resistors, M third resistors and a multi-way switch, wherein the M third resistors are correspondingly connected with M rows of strain gauges, the first ends of the third resistors are correspondingly connected with the positive electrode of a power supply through the second resistors, the N first resistors are correspondingly connected with N rows of strain gauges, and the N first resistors are respectively connected with at least one third resistor through the second resistors so as to form a bridge circuit; one end of the strain gauge is connected with the positive electrode of the power supply through the first resistor corresponding to the row, the multi-way switch comprises a movable contact and M static contacts, the M static contacts correspond to the M rows of the strain gauge, the other end of the strain gauge is connected with the static contacts corresponding to the row, the second end of the third resistor is connected with the static contacts corresponding to the row, and the movable contact is connected with the negative electrode of the power supply.
2. The strain distribution measurement circuit of claim 1, further comprising N amplifying circuits;
The N amplifying circuits are corresponding to N rows of the strain gauges, one end of each strain gauge is also connected with the input negative terminal of the corresponding amplifying circuit of the corresponding row, and each amplifying circuit is used for amplifying the input measuring voltage signals to obtain amplified measuring voltage signals;
and the input positive end of the amplifying circuit is connected with the positive electrode of the power supply through the second resistor.
3. The strain distribution measurement circuit according to claim 1 or 2, wherein the resistance value of the first resistor and the resistance value of the second resistor are equal.
4. The strain distribution measurement circuit according to claim 1 or 2, wherein the resistance value of the third resistor and the resistance value of the strain gauge in the unstrained state are equal.
5. The strain distribution measurement circuit of claim 4, wherein the third resistor is a fixed resistor or a strain gauge non-strained gauge strain gauge.
6. The strain distribution measurement circuit of claim 2, wherein the amplifying circuit comprises:
the input positive end of the amplifier is used as the input positive end of the amplifying circuit, the input negative end of the amplifier is used as the input negative end of the amplifying circuit, the output end of the amplifier is used as the output end of the amplifying circuit, and the amplifier is used for amplifying the input measuring voltage signal to obtain the amplified measuring voltage signal;
and the input negative end of the amplifier is connected with the output end of the amplifier through the fourth resistor.
7. The strain distribution measurement circuit of claim 2, wherein the voltage at the negative pole of the power supply is equal to 0.
8. The strain distribution measurement circuit of claim 2, wherein the multi-way switch is a mechanical switch or a semiconductor analog switch.
9. The strain distribution measurement circuit of claim 2, further comprising:
The N processors are corresponding to N rows of the strain gauges, the input ends of the processors are connected with the output ends of the amplifying circuits corresponding to the row where the processor is located, and the processors are used for receiving the amplified measurement voltage signals and determining the strain quantity of the strain gauges to be measured in the row where the processor is located according to the amplified measurement voltage signals.
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Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102783955A (en) * | 2012-07-27 | 2012-11-21 | 中国科学院电工研究所 | Pressure distribution detection device |
| CN210071190U (en) * | 2019-07-31 | 2020-02-14 | 浙江荷清柔性电子技术有限公司 | Strain distribution measuring circuit based on strain gauge |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005275627A (en) * | 2004-03-23 | 2005-10-06 | Rohm Co Ltd | Signal processor |
| US8707796B2 (en) * | 2010-08-04 | 2014-04-29 | Terrisa Duenas | Semiconductor strain gauge array |
| CN203940941U (en) * | 2014-06-27 | 2014-11-12 | 武汉钢铁(集团)公司 | A kind of stress distribution test foil gauge array |
| CN104964732B (en) * | 2015-06-30 | 2016-08-24 | 杭州钱江称重技术有限公司 | A kind of double vertical force set digital transducer |
| CN105445606B (en) * | 2015-11-12 | 2019-07-12 | 国网重庆市电力公司电力科学研究院 | A kind of high voltage power cable joint fault monitoring method based on distortion measurement |
| CN109059969A (en) * | 2018-08-13 | 2018-12-21 | 中国科学院电子学研究所 | A kind of resistive sensor array reading circuit and measurement method |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102783955A (en) * | 2012-07-27 | 2012-11-21 | 中国科学院电工研究所 | Pressure distribution detection device |
| CN210071190U (en) * | 2019-07-31 | 2020-02-14 | 浙江荷清柔性电子技术有限公司 | Strain distribution measuring circuit based on strain gauge |
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