CN104378167A - Testing method and system - Google Patents

Abstract

The invention discloses a testing method and system. M test devices are connected to the input ends of the test path selection device, and N devices to be tested are connected to the output ends of the test path selection device. M is greater than or equal to 1, and N is greater than or equal to 1. Equal to 1; then the test path selection device can select the corresponding test device from the M test devices according to the test path control command to test the N devices to be tested, that is, the test path selection device in the present invention can be in the test path control command Under the control, one or more test devices are automatically selected to test the N devices to be tested. Therefore, in the test process, there is no need to manually switch the devices under test connected to the test device, but the test channel selection device automatically switches according to the control command, and the N devices under test connected to it can be completed once. or multiple tests, so the test efficiency of the test device can be improved, and the test cost can be reduced at the same time.

Description

A testing method and system

technical field

The invention relates to the communication field, in particular to a test method and a test system.

Background technique

In the field of communication, various tests are involved, and in the current test field, it is often necessary to use various test equipment to test the equipment to be tested, and the most commonly used is the test instrument. However, the current test instrument can only be connected to one device under test at a time, and the device under test needs to be replaced after the test is completed, and the replacement of the device under test is generally done manually by the tester. In this way, the test instrument must be operated only when someone is present. During non-working hours, the expensive test instrument is completely idle, resulting in a huge waste of resources; at the same time, it also reduces the efficiency of the test. In order to solve this problem, the most common solution is to arrange more testers and implement a two-shift or three-shift work system to improve the efficiency of instrument use, but this solution will greatly increase labor costs.

Contents of the invention

The main technical problem to be solved by the present invention is to provide a test method and a test system to solve the problems of low test efficiency and high test cost in the current test process.

In order to solve the above technical problems, the present invention provides a test system, comprising: a test control device, a test path selection device, M test devices and N test devices, wherein M is greater than or equal to 1, and N is greater than or equal to 1; The M test devices are connected to the input ends of the test path selection device, the N DUTs are connected to the output ends of the test path selection device, and the test path selection device is used to control the The test path control instruction sent by the device selects a corresponding test device from the M test devices to test the N DUTs.

In one embodiment of the present invention, the test system further includes a power path selection device, the input end of the power path selection device is connected to a power supply, and the output end is connected to the N devices to be tested; the power path selection device The selecting device is used for connecting the device under test in the current test path to the power supply according to the power path control instruction sent by the test control device.

In an embodiment of the present invention, the test system further includes a communication channel selection device, one end of the communication selection device is connected to the test control device, and the other end is connected to the N devices to be tested; the The communication path selection device is used for connecting the device under test in the current test path to the test control device according to the communication path control command sent by the test control device.

In one embodiment of the present invention, the test path selection device selects a corresponding test device from the M test devices according to the test path control instruction sent by the test control device to perform the test on the N devices to be tested. The test is: the test path selection device sequentially selects a test device from the M test devices according to the test path control instruction to test the N devices to be tested one by one.

In an embodiment of the present invention, the test path control instruction includes a first test path control instruction and a second test path control instruction; the test path selection device sequentially selects from the M Selecting a test device in the test device to test the N devices to be tested one by one includes:

The test path selection device selects a test device from the test devices according to the first test path control instruction to test the N devices to be tested; After testing the device, the test path selection device selects one of the remaining devices to be tested according to the second test path control instruction sent by the test control device to connect to the test device; After the testing of the N devices to be tested is completed, the test path selection device reselects a test device from the remaining test devices according to the first test path control instruction sent by the test control device to test the N devices to be tested , until all the M testing devices have tested the N testing devices.

In an embodiment of the present invention, the test device is further configured to send the test result to the test control device after each device under test is tested.

In one embodiment of the present invention, the test control device is also used to store test strategies; the test device is also used to obtain the test strategy from the test control device before testing the device under test connected to it. Strategy, and then test the device under test currently connected to it according to the test strategy.

In order to solve the above problems, the present invention also discloses a test method, comprising:

Connecting M test devices to the input terminals of the test path selection device, and connecting N devices to be tested to the output ends of the test path selection device, the M is greater than or equal to 1, and the N is greater than or equal to 1;

The test path selection device selects a corresponding test device from the M test devices to test the N DUTs according to the test path control instruction.

In an embodiment of the present invention, the test path selection device selects a corresponding test device from the M test devices according to the test path control instruction to test the N devices to be tested as follows: The test path selection device sequentially selects a test device from the M test devices according to the test path control instruction to test the N devices to be tested one by one.

In an embodiment of the present invention, the test control device is further configured to analyze all the test results received after the M test devices have tested the N DUTs one by one, according to The analysis result determines the device under test that needs to be retested, and sends a retest control instruction to the test path selection device;

The test path selection device is also used to sequentially select a test device from the M test devices according to the retest control instruction to test the devices under test that need to be retested one by one.

In an embodiment of the present invention, the test path control instruction includes a first test path control instruction and a second test path control instruction; the test path selection device sequentially Selecting a test device from the M test devices to test the N devices to be tested one by one includes:

The test path selection device selects a test device from the test devices according to the first test path control instruction to test the N devices to be tested; After testing the device, the test path selection device selects one of the remaining devices to be tested according to the second test path control instruction sent by the test control device to connect to the test device; After the testing of the N devices to be tested is completed, the test path selection device reselects a test device from the remaining test devices according to the first test path control instruction sent by the test control device to test the N devices to be tested , until all the M testing devices have tested the N testing devices.

In one embodiment of the present invention, the test device sends the test result to the test control device after testing each device to be tested;

The test control device analyzes all the test results received after the M testing devices have finished testing the N DUTs one by one, determines the DUTs that need to be retested according to the analysis results, and sends A retest control instruction is given to the test path selection device;

The test path selection device sequentially selects a test device from the M test devices according to the retest control instruction to test the devices under test that need to be retested one by one.

The beneficial effects of the present invention are:

In the test method and system provided by the present invention, M test devices are connected to the input ends of the test path selection device, and N devices to be tested are connected to the output ends of the test path selection device, M is greater than or equal to 1, and N is greater than or equal to 1 Then the test path selection device can select the corresponding test device from the M test devices according to the test path control instruction to test the N devices to be tested, that is, the test path selection device in the present invention can be under the control of the test path control command , to automatically select one or more test devices to test N DUTs. Therefore, in the test process, there is no need to manually switch the devices under test connected to the test device, but the test channel selection device automatically switches according to the control command, and can complete the N devices under test connected to it once. or multiple tests, so the test efficiency of the test device can be improved, and the test cost can be reduced at the same time.

Description of drawings

FIG. 1 is a schematic structural diagram of a test system provided by an embodiment of the present invention;

Fig. 2 is a schematic diagram 2 of the test system structure provided by an embodiment of the present invention;

Fig. 3 is a schematic structural diagram of a test system provided by an embodiment of the present invention III;

Fig. 4 is a schematic diagram 4 of the test system structure provided by an embodiment of the present invention;

Fig. 5 is a structural schematic diagram of the integrated arrangement of each channel selection device in Fig. 4;

Fig. 6 is a schematic flowchart of a testing method provided by an embodiment of the present invention.

Detailed ways

The present invention will be further described in detail below through specific embodiments in conjunction with the accompanying drawings.

Please refer to Figure 1, which shows a test system provided by this embodiment, a test control device, a test path selection device, M test devices and N devices to be tested, and M in this embodiment is greater than or equal to 1, N is greater than or equal to 1; In this embodiment, the test control device can also be used as a test control center, mainly used to control the selection of each channel, the test device to test the device to be tested, and to collect various parameter information of the device to be tested, collect Various test results fed back by the test device and various processing and analysis based on the test results. The test path selection device in this embodiment can be realized by pure hardware, or by software combined with hardware, and it can include a control unit, which is used to receive control instructions sent by the test control device to perform corresponding operations. The testing devices in this embodiment can be various testing instruments, and the devices to be tested can be various testing equipment corresponding to each testing instrument. The present invention will be further described below in conjunction with the specific connection relationship and control process of each device in the system.

In this embodiment, M test devices are connected to the input terminals of the test path selection device, and N devices to be tested are connected to the output terminals of the test path selection device. In this embodiment, the input terminals and output terminals of the test path selection device The number of channels at the terminal can be set specifically according to factors such as specific application scenarios; The number of channels at the input end of the device and the value of N can be no greater than the number of channels at the output end of the test channel selection device; the test channel selection device is also connected with the test control device for receiving the test channel control instruction sent by the test control device, and according to The test path control instruction selects a corresponding test device from the M test devices to test the N DUTs. Specifically, it can select corresponding one or more (less than M) test devices from M test commands according to the control instruction to test N test devices, or select test devices one by one from M test devices, and the selected The test device tests all the N test devices. In this embodiment, when one test device tests N devices to be tested, according to the actual situation, it can choose to test the N devices to be tested one by one, or it can choose to test multiple of the N devices to be tested at the same time. . It is worth noting that in this embodiment, the identification of each test device and the device to be tested can be specifically identified by numbering each device, or by identifying the identification information (such as identification information) of each device itself; and obtaining each The identification information of the device may be manually input by the tester, or automatically reported by each device through a corresponding communication link.

In this embodiment, the test strategy adopted by the test device to test each device to be tested can be preset on each test device or one or more test devices according to the actual situation, and then the unpresetted test device It can be obtained from a preset test device; various test strategies can also be preset directly on the test control device, and then the test control device will use the corresponding The test strategy can be sent to the test device, or the current test device can actively request the test strategy from the test control device; when it is preset on the test control device, the test device will It is necessary to obtain the corresponding test strategy from the test control device. Only when the test device detects that the currently stored test strategy matches the currently detected device under test, it does not need to re-acquire the test strategy from the test control device, and can directly test the device under test. Afterwards, the test results are uploaded to the data acquisition center corresponding to the value; in this embodiment, it can be uploaded to the test control device, and it can be set that after it has not finished testing a device to be tested, the test results will be uploaded to the test control device, and the test control After the device receives the test result, it can know that the current test is completed, and it needs to send a control command to the test path selection device to switch the test path. After all the test devices have tested all the devices under test, the test control device performs subsequent processing and analysis according to the collected test results. Of course, the test results can also be centrally sent to the corresponding processing device for processing and analysis.

In order to better understand the present invention, the test path selection device sequentially selects the test device from the M test devices according to the test path control instruction sent by the test control device as an example to test the N devices to be tested. The test path control instruction sent by the test control device in the example includes a first test path control instruction and a second test path control instruction; the first test path control instruction is mainly used for selecting a test device, and the second test path control instruction is mainly used for Select the device to be tested, the specific selection and testing process are as follows:

The test path selection device first selects a test device from the test devices according to the first test path control instruction to test N devices to be tested; After the device is installed, the test path selection device selects one of the remaining devices to be tested to be connected to the test device for testing according to the second test path control instruction sent by the test control device; After the test is completed, the test path selection device reselects a test device from the remaining test devices according to the first test path control instruction sent by the test control device to test the N devices to be tested, until all the M test devices are on the N test devices. The test device was tested. Since each of the M test devices has tested the N devices to be tested, each device to be tested has M test results, and the test results obtained by statistical analysis based on the M test results are more accurate.

In order to better control the test process, the test results obtained are more accurate. In this embodiment, the power supply of each device under test can also be controlled by the test control device. See also shown in Fig. 2, the test system among the present embodiment can also comprise power path selecting device, the input end of this power path selecting device is connected with power supply, and output end is connected with above-mentioned N devices to be tested; After receiving the power path control instruction sent by the test control device, and after receiving the instruction, connect the device under test in the current test path to the power supply, and the output voltage and current of the power supply can be controlled by the test control device or The control unit of the power path selection device itself can be adjusted within a certain range for different devices under test.

See also shown in Fig. 3, the test system among the present embodiment can further comprise communication channel selection device, and one end of communication selection device is connected with test control device, and the other end is connected with above-mentioned N DUTs; According to the communication path control command sent by the test control device, the device under test in the current test path is connected to the test control device; the test control device can obtain information such as various parameters of the device under test communicated with it based on the communication path, And sending corresponding instructions to the device under test through the communication path to set, modify, etc. the parameters of the device under test.

Please refer to FIG. 4 , the test system in this embodiment can further include a display device, which can be used to set the content to be displayed according to the application scenario for viewing by testers or monitors, which is more convenient for monitoring tests.

In this embodiment, the various devices included in the test system may be connected via a bus or the like. And the test path selection device, the power supply path selection device and the communication path selection device in this embodiment can be integrated together and set up as an intelligent multi-way switch, and each switch module is controlled by a control module, as shown in Figure 5; Separately set up, each device is correspondingly set up with a control unit to receive the instructions sent by the test control device and then execute the corresponding function by running the corresponding program. It is worth noting that in this embodiment, the input and output terminals of each device can be set as common connection ports, and different types of test cables can be connected according to needs, which has good versatility, and the test control device sends test path control commands, power supply The timing of the path control command and the communication path control command is not strictly limited, and the setting can be selected according to the specific application scenario; for example, when switching a device under test for the test device according to the second test path control command sent by the test control device, the test The control device can respectively send a power path control command and a communication path control command to the power path selection device and the communication path selection device to switch the power path and the communication path accordingly.

In order to better understand the present invention, the entire testing process will be described below in conjunction with the above-mentioned testing system. First, the test system is initialized, all the devices to be tested are connected to the output channels of the test channel selection device, the power supply channel selection device and the communication channel selection device, all the test equipment are connected to the input terminals of the test channel selection device, and the power supply channel is connected to the test channel selection device. The input end of the selection device is connected to the power supply, and the power path selection device is connected to the test control device, and the input end of the communication path selection device is connected to the test control device; the specific connection can be connected through the bus; and then the tester is on the test control device Configure the software, including configuring the corresponding test strategy, and start the test; the test control device sends corresponding control instructions according to the configuration to select a test path, a communication path and a power path, and the corresponding test device and the device to be tested are determined. Then the test device starts to test the currently connected device under test; when a device under test is tested, the test device transmits the test data to the test control device for storage, and the test control device sends corresponding control commands to the test path selection device , the power path selection device and the communication path selection device select the next test path, the communication path and the power path, and start to test the next device under test; when all the devices under test are tested, the test control device controls the test device to switch, Switch to the next test device until all the test devices have been tested; then the test control device analyzes and processes all the test results received, and determines the device under test that needs to be tested again according to the analysis results, for example, for The device under test whose test result is obviously wrong, or the device under test which is preliminarily judged to have a problem or fault according to the test result, etc., can all be judged as needing to be re-measured; at this time, the test control device sends a retest control command to the test channel selection device; the test The path selection device is also used to sequentially select a test device from the M test devices according to the received retest control instruction to test the devices to be tested that need to be retested one by one; The above test process; for example, the test control device can arrange for the test device that has problems with the test results to reschedule the retest according to the control strategy, and save the test results of the retest; the retest process can use the above test process.

Take the test device as the test instrument, the test control device as the control center, the test path selection device, the power supply path selection device and the communication path selection device to be set together as an example of an intelligent multi-way switch. In conjunction with accompanying drawing 6, the present invention will be further described Instructions, as follows:

Step 600: start;

Step 601: Initialize the software and hardware of the test system. In terms of hardware, M test instruments and N devices to be tested should be connected to the intelligent multi-way switch through the bus in the above-mentioned manner, and the control center, the intelligent multi-way switch and the test instruments should be connected through the Bus connections, software aspects, configuration test scripts;

Step 602: According to the instructions of the control center, the intelligent multi-way switch automatically selects the connection with the test instrument j at the input terminal (j is greater than or equal to 1, and is less than or equal to M), and automatically selects the connection with the device under test i at the output terminal (i<N), By default, after initialization, j=1, i=1, and other configurations can also be selected; at the same time, the intelligent multi-way switch will also select the corresponding communication path and power path;

Step 603: The test instrument j tests the device under test i, the test strategy (or content) is controlled by the script in the control center, the power supply of the device under test is provided by the power supply channel, the power supply is adjustable, and the communication is provided by the communication channel;

Step 604: After the test instrument j finishes testing the device i to be tested, the control center saves the test data;

Step 605: The control center sends out a second test path control command to automatically switch the output of the intelligent multi-way switch device to the next device under test, and the program sets i=i+1; simultaneously sends the communication path control command and the power supply path control command to perform Conducting communication paths and power paths;

Step 606: Determine whether i is less than or equal to N, if yes, go to step 603, otherwise go to step 607;

Step 607: set i=1, j=j+1;

Step 608: judge whether j is less than or equal to M, if yes, perform step 609; otherwise, go to step 610;

Step 609: the control center controls the input end of the intelligent multi-way switch device to switch to the test instrument j, and then go to step 603;

Step 610: the test ends.

It can be seen that the test system and test device provided by the present invention can make the test equipment test continuously and automatically for a long time by cooperating with the control software on the existing various test devices without increasing the labor cost, and greatly improve the performance of the test device. usage efficiency. It is especially suitable for R&D testing and debugging, and can also be used for large-scale batch testing.

The above content is a further detailed description of the present invention in conjunction with specific embodiments, and it cannot be assumed that the specific implementation of the present invention is limited to these descriptions. For those of ordinary skill in the technical field of the present invention, without departing from the concept of the present invention, some simple deduction or replacement can be made, which should be regarded as belonging to the protection scope of the present invention.

Claims (12)

1. A test system, characterized in that it comprises: a test control device, a test path selection device, M test devices and N devices to be tested, the M is greater than or equal to 1, and the N is greater than or equal to 1; the M The test device is connected to the input end of the test path selection device, the N devices to be tested are connected to the output end of the test path selection device, and the test path selection device is used for testing according to the test sent by the test control device. The path control instruction selects a corresponding test device from the M test devices to test the N DUTs. 2. The test system according to claim 1, wherein the test system also includes a power path selection device, the input end of the power path selection device is connected to a power supply, and the output end is connected to the N DUTs. Connecting: the power path selection device is used to connect the device under test in the current test path to the power supply according to the power path control instruction sent by the test control device. 3. The test system according to claim 1, wherein the test system also includes a communication path selection device, one end of the communication selection device is connected to the test control device, and the other end is connected to the N waiting connected to the test device; the communication path selection device is used to connect the device under test in the current test path to the test control device according to the communication path control command sent by the test control device. 4. The test system according to any one of claims 1-3, wherein the test path selection device selects the corresponding test path from the M test devices according to the test path control instruction sent by the test control device. The testing device for testing the N devices to be tested is as follows: the test path selection device sequentially selects a test device from the M test devices according to the test path control instruction to test the N devices to be tested one by one . 5. The test system according to claim 4, wherein said test path control instruction comprises a first test path control instruction and a second test path control instruction; said test path selection device is based on said test path control instruction Selecting a test device from the M test devices in turn to test the N devices to be tested one by one includes: The test path selection device selects a test device from the test devices according to the first test path control instruction to test the N devices to be tested; After testing the device, the test path selection device selects one of the remaining devices to be tested according to the second test path control instruction sent by the test control device to connect to the test device; After the testing of the N devices to be tested is completed, the test path selection device reselects a test device from the remaining test devices according to the first test path control instruction sent by the test control device to test the N devices to be tested , until all the M testing devices have tested the N testing devices. 6. The test system according to claim 4, wherein the test device is further configured to send the test result to the test control device after each device under test is tested. 7. The test system according to claim 5, wherein the test control device is also used for storing test strategies; The test control device obtains a test strategy, and then tests the device under test currently connected to it according to the test strategy. 8. The test system according to claim 6, wherein the test control device is further configured to, after the M test devices have finished testing the N DUTs one by one, to all received Analyze the test results, determine the device under test that needs to be retested according to the analysis results, and send a retest control instruction to the test path selection device; The test path selection device is also used to sequentially select a test device from the M test devices according to the retest control instruction to test the devices under test that need to be retested one by one. 9. A test method, characterized in that it comprises: Connecting M test devices to the input terminals of the test path selection device, and connecting N devices to be tested to the output ends of the test path selection device, the M is greater than or equal to 1, and the N is greater than or equal to 1; The test path selection device selects a corresponding test device from the M test devices to test the N DUTs according to the test path control instruction sent by the test control device. 10. The test method according to claim 9, wherein the test path selection device selects a corresponding test device from the M test devices according to the test path control instruction for the N DUTs The test is performed as follows: the test path selection device sequentially selects a test device from the M test devices according to the test path control instruction to test the N devices to be tested one by one. 11. The testing method according to claim 10, wherein the test path control instruction comprises a first test path control instruction and a second test path control instruction; Selecting a test device from the M test devices in turn to test the N devices to be tested one by one includes: The test path selection device selects a test device from the test devices according to the first test path control instruction to test the N devices to be tested; After testing the device, the test path selection device selects one of the remaining devices to be tested according to the second test path control instruction sent by the test control device to connect to the test device; After the testing of the N devices to be tested is completed, the test path selection device reselects a test device from the remaining test devices according to the first test path control instruction sent by the test control device to test the N devices to be tested , until all the M testing devices have tested the N testing devices. 12. testing method as claimed in claim 10, is characterized in that, described method also comprises: After the test device finishes testing each device to be tested, it sends the test result to the test control device; The test control device analyzes all the test results received after the M testing devices have finished testing the N DUTs one by one, determines the DUTs that need to be retested according to the analysis results, and sends A retest control instruction is given to the test path selection device; The test path selection device sequentially selects a test device from the M test devices according to the retest control instruction to test the devices under test that need to be retested one by one.