CN103809056B - S parameter and passive intermodulation integrated test system - Google Patents
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Abstract
Description
技术领域 technical field
本发明涉及一种测试系统,具体涉及一种S参数和无源互调综合测试系统,属于产品测试设备领域。 The invention relates to a test system, in particular to an S parameter and passive intermodulation comprehensive test system, which belongs to the field of product test equipment.
背景技术 Background technique
当前快速发展的通信市场给与此相匹配的器件的无源互调指标提出了越来越高的要求,其中PIM(Passive Inter Modulation,即无源互调)指标的测试使得产品在测试环节耗费不少的时间, 尤其是测试器件的多个频带的PIM,其耗费的时间非常巨大,测试效率非常低下,耗费的测试成本非常高昂。 The current rapid development of the communication market puts forward higher and higher requirements for the passive intermodulation indicators of the matching devices. Among them, the test of PIM (Passive Inter Modulation, that is, passive intermodulation) indicators makes the products spend a lot of time in the testing process. It takes a lot of time, especially to test the PIM of multiple frequency bands of the device, which consumes a lot of time, the test efficiency is very low, and the test cost is very high.
此外,现有技术中存在用于测试被测设备(即DUT,device under test)的S参数的VNA(Vector network analyzer,即网络分析仪),现有技术中测试被测设备的S参数和无源互调是独立分开测试的们这样也使得测试效率更为低下,耗费的测试成本更为高昂。 In addition, there is a VNA (Vector network analyzer, network analyzer) for testing the S parameters of the device under test (DUT, device under test) in the prior art. Source intermodulation is tested independently and separately, which also makes the test efficiency lower and the test cost more expensive.
发明内容 Contents of the invention
为解决现有技术的不足,本发明的目的在于提供一种S参数和无源互调综合测试系统。 In order to solve the deficiencies of the prior art, the object of the present invention is to provide a comprehensive testing system for S parameters and passive intermodulation.
为了实现上述目标,本发明采用如下的技术方案: In order to achieve the above object, the present invention adopts the following technical solutions:
S参数和无源互调综合测试系统,包括被测设备、网络分析仪、若干PIM机组,其特征在于,还包括PSS信号中枢,所述被测设备连接PSS信号中枢的输入端,所述PSS信号中枢的输出端分别连接网络分析仪和PIM机组。 S-parameter and passive intermodulation comprehensive test system, comprises the equipment under test, network analyzer, some PIM units, is characterized in that, also comprises the PSS signal hub, and the input end of described equipment under test is connected with PSS signal hub, and described PSS The output ends of the signal hub are respectively connected to the network analyzer and the PIM unit.
前述的S参数和无源互调综合测试系统,其特征在于,所述PSS信号中枢包括若干切换开关组,所述切换开关组包括第一开关、第二开关,所述第一开关和第二开关均为单刀多掷开关,所述第一开关包括多个输入端和一个输出端,所述第二开关包括一个输入端和多个输出端,所述被测设备连接第一开关的任一输入端,所述第一开关的输出端连接第二开关的输入端,所述PIM机组和网络分析仪分别与第二开关的一个输出端相连。 The aforementioned S parameter and passive intermodulation comprehensive testing system is characterized in that the PSS signal hub includes several switch groups, and the switch groups include a first switch, a second switch, and the first switch and the second switch. The switches are all single-pole multi-throw switches, the first switch includes a plurality of input terminals and an output terminal, the second switch includes an input terminal and a plurality of output terminals, and the device under test is connected to any one of the first switches. The input end, the output end of the first switch is connected to the input end of the second switch, and the PIM unit and the network analyzer are respectively connected to an output end of the second switch.
前述的S参数和无源互调综合测试系统,其特征在于,还包括第三开关,所述第三开关包括输入端和输出端,所述第三开关的输入端和PIM机组分别与第二开关的一个输出端相连,所述第三开关的输出端连接网络分析仪。 The aforementioned S-parameter and passive intermodulation comprehensive testing system is characterized in that it also includes a third switch, the third switch includes an input end and an output end, and the input end and the PIM unit of the third switch are respectively connected to the second One output end of the switch is connected, and the output end of the third switch is connected to a network analyzer.
前述的S参数和无源互调综合测试系统,其特征在于,还包括第三开关,所述第三开关包括两个输入端和两个输出端,每个第三开关的输出端均连接一个网络分析仪,所述PSS信号中枢包括第一组切换开关组和第二组切换开关组,所述第三开关的一个输出端和第一组切换开关组中第二开关的一个输出端相连,所述第三开关的另一个输出端和第二组切换开关组中第二开关的一个输出端相连。 The aforementioned S-parameter and passive intermodulation comprehensive test system is characterized in that it also includes a third switch, the third switch includes two input terminals and two output terminals, and the output terminals of each third switch are connected to a In a network analyzer, the PSS signal hub includes a first group of switches and a second group of switches, an output end of the third switch is connected to an output end of the second switch in the first group of switches, The other output end of the third switch is connected to an output end of the second switch in the second switch group.
本发明的有益之处在于:本发明的S参数和无源互调综合测试系统能够实现一站式完成S参数和多个频带的PIM测试,从而大幅度提高产品的测试效率、降低测试时间和测试成本。 The benefit of the present invention is that: the S-parameter and passive intermodulation comprehensive test system of the present invention can realize the one-stop completion of the PIM test of S-parameter and multiple frequency bands, thereby greatly improving the test efficiency of products, reducing test time and cost of testing.
附图说明 Description of drawings
图1是本发明S参数和无源互调综合测试系统的一个优选实施的结构示意图; Fig. 1 is the structural representation of a preferred implementation of S parameter and passive intermodulation comprehensive test system of the present invention;
图2是本发明的PSS信号中枢的一个优选实施的结构示意图。 Fig. 2 is a schematic structural diagram of a preferred implementation of the PSS signal hub of the present invention.
图中附图标记的含义: Meanings of reference signs in the figure:
1、被测设备,2、第一组切换开关组的第一开关,3、第一组切换开关组的第二开关,4、第二组切换开关组的第一开关,5、第二组切换开关组的第二开关,6、网络分析仪,7、第一个PIM机组的第一个端口,8、第二个PIM机组的第一个端口,9、第二个PIM机组的第二个端口,10、第一个PIM机组的第二个端口,11、第三开关,12、超低互调吸收负载,13、超低互调衰减器。 1. The device under test, 2. The first switch of the first switch group, 3. The second switch of the first switch group, 4. The first switch of the second switch group, 5. The second group Toggle the second switch of the switch group, 6. Network analyzer, 7. The first port of the first PIM unit, 8. The first port of the second PIM unit, 9. The second port of the second PIM unit 10, the second port of the first PIM unit, 11, the third switch, 12, ultra-low intermodulation absorption load, 13, ultra-low intermodulation attenuator.
具体实施方式 detailed description
以下结合附图和具体实施例对本发明作具体的介绍。 The present invention will be specifically introduced below in conjunction with the accompanying drawings and specific embodiments.
参照图1所示,本发明S参数和无源互调综合测试系统,包括被测设备1、网络分析仪6、若干PIM机组,还包括PSS信号中枢,被测设备1连接PSS信号中枢的输入端,PSS信号中枢的输出端分别连接网络分析仪6和PIM机组。本发明中PIM机组的数量可以是一个,也可以是多个,其数量的选择是根据测试要求决定的。比如当需要进行S参数和单频点无源互调测试时,图1中的PSS信号中枢的输出端连接一个PIM互调测试仪和一个网络分析仪6即可满足要求,再比如,当需要进行S参数和2频点PIM测试时,图1中的PSS信号中枢的输出端连接一个PIM互调测试仪和两个网络分析仪6即可满足要求。再比如,当需要进行S参数和3频点PIM测试时,图1中的PSS信号中枢的输出端连接一个PIM互调测试仪和三个网络分析仪6即可满足要求,因此,附图1中标注的PIM机组1至PIM机组n,其中的n为任何的正整数。此外,本发明中,被测设备1的类型和数量并不限制,被测设备1可以是天线、滤波器、功分器、耦合器和电缆组件等无源器件。本发明中的PSS信号中枢(请解释这么名字的含义,以及PSS是什么意思),其用于将被测设备1分别连接VNA和PIM机组,从而通过PSS信号中枢中内部通道的切换来完成不同的测试内容。由此,本发明可以应用于天线、滤波器、功分器、耦合器和电缆组件等无源器件领域的快速测试。 Shown in Fig. 1, S parameter and passive intermodulation comprehensive test system of the present invention, comprise device under test 1, network analyzer 6, some PIM units, also comprise PSS signal center, the input of device under test 1 connection PSS signal center terminal, and the output terminal of the PSS signal hub is respectively connected to the network analyzer 6 and the PIM unit. The number of PIM units in the present invention can be one or more, and the selection of the number is determined according to the test requirements. For example, when it is necessary to perform S-parameter and single-frequency passive intermodulation tests, the output of the PSS signal hub in Figure 1 is connected to a PIM intermodulation tester and a network analyzer 6 to meet the requirements. When performing S-parameter and 2-frequency PIM tests, the output of the PSS signal hub in Figure 1 is connected to a PIM intermodulation tester and two network analyzers 6 to meet the requirements. For another example, when S parameters and 3-frequency point PIM tests need to be carried out, the output of the PSS signal hub in Fig. 1 is connected to a PIM intermodulation tester and three network analyzers 6 to meet the requirements. PIM unit 1 to PIM unit n marked in , where n is any positive integer. In addition, in the present invention, the type and quantity of the equipment under test 1 are not limited, and the equipment under test 1 may be passive components such as antennas, filters, power splitters, couplers, and cable assemblies. The PSS signal hub in the present invention (please explain the meaning of the name and what PSS means) is used to connect the device under test 1 to the VNA and the PIM unit respectively, so as to complete different functions by switching the internal channel in the PSS signal hub. the test content. Therefore, the present invention can be applied to rapid testing in the field of passive devices such as antennas, filters, power splitters, couplers and cable assemblies.
下面详细所述本发明的PSS信号中枢的一个优选实施的结构。如图2所示, PSS信号中枢包括若干切换开关组,切换开关组包括第一开关2、第二开关3,第一开关2和第二开关3均为单刀多掷开关,第一开关4包括多个输入端和一个输出端,第二开关包括一个输入端和多个输出端,被测设备1连接第一开关4的任一输入端,第一开关的输出端连接第二开关5的输入端,PIM机组和网络分析仪6分别与第二开关5的一个输出端相连。 A preferred implementation structure of the PSS signal hub of the present invention will be described in detail below. As shown in Figure 2, the PSS signal hub includes several switch groups, the switch group includes a first switch 2, a second switch 3, the first switch 2 and the second switch 3 are single-pole multi-throw switches, the first switch 4 includes Multiple input terminals and one output terminal, the second switch includes one input terminal and multiple output terminals, the device under test 1 is connected to any input terminal of the first switch 4, and the output terminal of the first switch is connected to the input of the second switch 5 terminal, the PIM unit and the network analyzer 6 are respectively connected to an output terminal of the second switch 5 .
在每一个切换开关组中,实际使用时,可以切第一开关和第二开关5,从而实现被测设备1与网络分析仪6和不同的PIM机组的不同端口的切换连接,从而实现不同的测试内容。 In each switching switch group, in actual use, the first switch and the second switch 5 can be cut, so as to realize the switch connection between the device under test 1 and the different ports of the network analyzer 6 and different PIM sets, thereby realizing different Test content.
实际中,为了更好地实现对被测设备1和网络分析仪6之间的切换和通断,本发明还可以包括第三开关11,第三开关11包括输入端和输出端,第三开关11的输入端和PIM机组分别与第二开关的一个输出端相连,第三开关11的输出端连接网络分析仪6。从而可以通过第三开关11的通断开实现对被测设备1和网络分析仪6之间的切换。本发明不限制第三开关11的输入端和输出端的数量,第三开关11的输出端也可以连接一个或者多个网络分析仪6,在第三开关11的输出端连接多个网络分析仪6时,可以实现对于一个被测设备1,可以通过切换第三开关11实现通过不同的网络分析仪6来测试被测设备1的S参数,从而使得S参数的测量更加准确。 In practice, in order to better realize switching and on-off between the device under test 1 and the network analyzer 6, the present invention may also include a third switch 11, the third switch 11 includes an input end and an output end, and the third switch The input end of 11 and the PIM unit are respectively connected to an output end of the second switch, and the output end of the third switch 11 is connected to the network analyzer 6 . Therefore, switching between the device under test 1 and the network analyzer 6 can be realized by turning on and off the third switch 11 . The present invention does not limit the number of input terminals and output terminals of the third switch 11, the output terminal of the third switch 11 may also be connected to one or more network analyzers 6, and multiple network analyzers 6 may be connected to the output terminal of the third switch 11 At this time, it can be realized that for a device under test 1, the S parameter of the device under test 1 can be tested by switching the third switch 11 through different network analyzers 6, so that the measurement of the S parameter is more accurate.
下面介绍当本发明的PSS信号中枢中采用多个切换开关组时的优选实施例。以PSS信号中枢中采用两个切换开关组来进行说明,存在更多的切换开关组时可以类推。如图2所示,此时还包括第三开关11,第三开关11包括两个输入端和两个输出端,每个第三开关11的输出端均连接一个网络分析仪6,PSS信号中枢包括第一组切换开关组和第二组切换开关组,第三开关11的一个输出端和第一组切换开关组中第二开关的一个输出端相连,第三开关11的另一个输出端和第二组切换开关组中第二开关的一个输出端相连。 The following describes the preferred embodiment when multiple switch groups are used in the PSS signal hub of the present invention. The PSS signal hub adopts two switch groups for illustration, and it can be analogized when there are more switch groups. As shown in Figure 2, at this time also include the 3rd switch 11, the 3rd switch 11 comprises two input terminals and two output terminals, the output terminal of each 3rd switch 11 all connects a network analyzer 6, PSS signal central Including the first group of switch groups and the second group of switch groups, one output end of the third switch 11 is connected to an output end of the second switch in the first group of switch groups, and the other output end of the third switch 11 is connected to the One output end of the second switch in the second switch group is connected.
当第三开关11包括两个输入端和两个输出端时,如图2中,两个输出端均分别连接有一个网络分析仪6,因此当对某一台被测设备1进行S参数的测量时,可以切换第三开关11,在每一台网络分析仪6上均进行S参数的测量,从而使得对于S参数的测量更加准确。在另一方面,当如图2中每一组的切换开关组中的第一开关的输入端均连接有被测设备1时,如图2所示,第一组切换开关组中的第二开关的一个输出端连接第三开关11的一个输入端,第二组切换开关组中的第二开关的一个输出端连接第三开关11的另一个输入端,本发明可以通过切换第三开关11,实现第一组切换开关组中第二开关的一个输出端与一个网络分析仪6连接,而同时第二组切换开关组中第二开关的一个输出端与另一个网络分析仪6连接,从而实现对多个被测设备1的并行同时测试S参数。 When the third switch 11 includes two input terminals and two output terminals, as shown in Figure 2, the two output terminals are respectively connected with a network analyzer 6, so when a certain device under test 1 is subjected to S parameter analysis During the measurement, the third switch 11 can be switched to measure the S parameter on each network analyzer 6, so that the measurement of the S parameter is more accurate. On the other hand, when the input terminals of the first switch in each group of switch groups in Fig. 2 are connected with the device under test 1, as shown in Fig. 2, the second switch group in the first group of switch groups An output end of the switch is connected to an input end of the third switch 11, and an output end of the second switch in the second group of switch groups is connected to the other input end of the third switch 11. The present invention can switch the third switch 11 , realizing that an output end of the second switch in the first set of switch groups is connected to a network analyzer 6, while at the same time an output end of the second switch in the second set of switch groups is connected with another network analyzer 6, thereby Realize parallel and simultaneous testing of S parameters for multiple devices under test 1 .
进一步,本发明中,每一个切换开关组的第二开关的输出端都可以设置有多个,因此每一个切换开关组的第二开关可以连接多个PIM机组,也可以连接一个PIM机组的多个端口,从而实现不同的测试内容。例如,如图2中,第一组切换开关组连接有第二个PIM机组的第二个端口9和第一个PIM机组的第二个端口10,第二组切换开关组连接有第一个PIM机组的第一个端口7和第二个PIM机组的第一个端口8。 Further, in the present invention, multiple output ends of the second switch of each diverter switch group can be provided, so the second switch of each diverter switch group can be connected to multiple PIM units, or can be connected to multiple PIM units of one PIM unit. ports to achieve different test content. For example, as shown in Figure 2, the first group of diverter switch groups is connected to the second port 9 of the second PIM unit and the second port 10 of the first PIM unit, and the second group of diverter switch groups is connected to the first The first port 7 of the PIM unit and the first port 8 of the second PIM unit.
此外,本发明中对切换开关组进行第一组切换开关组、第二组切换开关组的区分是仅仅为了描述方便,对PIM机组进行第一个PIM机组和第二个PIM机组的区分也是仅仅为了描述方便。 In addition, in the present invention, the distinction between the first group of diverter switch groups and the second group of diverter switch groups is only for the convenience of description, and the distinction between the first PIM unit and the second PIM unit for the PIM unit is only For the convenience of description.
综上,本发明的S参数和无源互调综合测试系统能够实现一站式完成S参数和多个频带的PIM测试,从而大幅度提高产品的测试效率、降低测试时间和测试成本。 In summary, the S-parameter and passive intermodulation comprehensive test system of the present invention can realize one-stop completion of S-parameter and PIM test of multiple frequency bands, thereby greatly improving product test efficiency, reducing test time and test cost.
以上显示和描述了本发明的基本原理、主要特征和优点。本行业的技术人员应该了解,上述实施例不以任何形式限制本发明,凡采用等同替换或等效变换的方式所获得的技术方案,均落在本发明的保护范围内。 The basic principles, main features and advantages of the present invention have been shown and described above. Those skilled in the industry should understand that the above-mentioned embodiments do not limit the present invention in any form, and all technical solutions obtained by means of equivalent replacement or equivalent transformation fall within the protection scope of the present invention.
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