CN103048595B - A kind of thyristor opens stress test method and device - Google Patents
A kind of thyristor opens stress test method and device Download PDFInfo
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Abstract
本发明提供一种晶闸管开通应力测试方法和装置，功能全面，满足换流阀各种工况下晶闸管开通应力试验要求。且电路拓扑结构简单实用，所需设备容量小，装置成本低。该方法直接对单个晶闸管进行测试，能够在换流阀组装之前即对内部各个晶闸管耐受开通电压电流的能力进行校验，从而提高换流阀生产制造的安全性与经济性。此外，该方法调节试验参数可以提高电热应力的测试强度，从而通过不断试验可以获知晶闸管开通应力极限耐受值，为换流阀系统的优化设计提供依据。
The invention provides a thyristor turn-on stress test method and device, which have comprehensive functions and meet the requirements of the thyristor turn-on stress test under various working conditions of a converter valve. Moreover, the circuit topology is simple and practical, the required equipment capacity is small, and the device cost is low. The method directly tests a single thyristor, and can verify the ability of each internal thyristor to withstand the opening voltage and current before the converter valve is assembled, thereby improving the safety and economy of the converter valve manufacturing. In addition, adjusting the test parameters by this method can increase the test intensity of the electrothermal stress, so that the limit tolerance value of the thyristor turn-on stress can be obtained through continuous testing, which provides a basis for the optimal design of the converter valve system.
Description
技术领域 technical field
本发明属于电力电子技术领域，具体涉及一种晶闸管开通应力测试方法和装置。The invention belongs to the technical field of power electronics, and in particular relates to a thyristor turn-on stress test method and device.
背景技术 Background technique
换流阀是直流输电系统的核心装备，自上世纪70年代以来，以晶闸管为核心开关器件的换流阀逐渐得到了广泛应用。换流阀在开通瞬间，其内部晶闸管会涌入很大的浪涌电流，过高的电流与di/dt可能会造成晶闸管损坏。因此，针对已经设计完成的换流阀系统，通过试验手段校验晶闸管能否耐受开通电流应力，对于保障换流阀的长期稳定运行具有重要意义。根据IEC60700标准，晶闸管开通应力是换流阀型式试验和例行试验的一项重要考核指标，但其都是基于阀模块的整体结构进行考虑，缺少对单个晶闸管开通应力的试验考核。且如果某个晶闸管在试验中出现故障或者烧毁，则可能损坏整个被试阀和试验装置，带来较大的经济损失甚至造成安全隐患。The converter valve is the core equipment of the DC transmission system. Since the 1970s, the converter valve with the thyristor as the core switching device has gradually been widely used. When the converter valve is turned on, a large surge current will flow into its internal thyristor, and excessive current and di/dt may cause damage to the thyristor. Therefore, for the converter valve system that has been designed, it is of great significance to ensure the long-term stable operation of the converter valve to verify whether the thyristor can withstand the opening current stress by means of tests. According to the IEC60700 standard, the turn-on stress of the thyristor is an important assessment index for the type test and routine test of the converter valve, but it is based on the overall structure of the valve module, and the test assessment of the turn-on stress of a single thyristor is lacking. And if a certain thyristor breaks down or burns out during the test, it may damage the entire tested valve and test device, resulting in large economic losses and even potential safety hazards.
发明内容 Contents of the invention
为了克服上述现有技术的不足，本发明提供一种晶闸管开通应力测试方法和装置，功能全面，满足换流阀各种工况下晶闸管开通应力试验要求。且电路拓扑结构简单实用，所需设备容量小，装置成本低。该方法直接对单个晶闸管进行测试，能够在换流阀组装之前即对内部各个晶闸管耐受开通电压电流的能力进行校验，从而提高换流阀生产制造的安全性与经济性。此外，该方法调节试验参数可以提高电热应力的测试强度，从而通过不断试验可以获知晶闸管开通应力极限耐受值，为换流阀系统的优化设计提供依据。In order to overcome the shortcomings of the above-mentioned prior art, the present invention provides a thyristor turn-on stress test method and device, which have comprehensive functions and meet the requirements of the thyristor turn-on stress test under various working conditions of the converter valve. Moreover, the circuit topology is simple and practical, the required equipment capacity is small, and the device cost is low. The method directly tests a single thyristor, and can verify the ability of each internal thyristor to withstand the opening voltage and current before the converter valve is assembled, thereby improving the safety and economy of the converter valve manufacturing. In addition, adjusting the test parameters by this method can increase the test intensity of the electrothermal stress, so that the limit tolerance value of the thyristor turn-on stress can be obtained through continuous testing, which provides a basis for the optimal design of the converter valve system.
为了实现上述发明目的，本发明采取如下技术方案：In order to realize the above-mentioned purpose of the invention, the present invention takes the following technical solutions:
提供一种晶闸管开通应力测试方法，所述方法包括以下步骤：A thyristor turn-on stress testing method is provided, the method comprising the following steps:
步骤1：将试品晶闸管进行加热到换流阀运行状况下的等效结温；Step 1: Heat the test thyristor to the equivalent junction temperature under the operating condition of the converter valve;
步骤2：对可调电容器C进行充电；Step 2: Charge the adjustable capacitor C;
步骤3：触发试品晶闸管，使可调电容器C释放能量，完成试品晶闸管一次开通应力测试；Step 3: Trigger the thyristor of the test product, so that the adjustable capacitor C releases energy, and complete the one-time turn-on stress test of the thyristor of the test product;
步骤4：重复步骤2和步骤3，进行下一测试周期，循环直至测试结束。Step 4: Repeat Step 2 and Step 3 for the next test cycle until the end of the test.
所述步骤1中，闭合开关Kr，控制直流电压源E，通过电阻r对试品晶闸管进行加热到换流阀运行状况下的等效结温。In the step 1, the switch Kr is closed, the DC voltage source E is controlled, and the thyristor of the test sample is heated to the equivalent junction temperature under the operating condition of the converter valve through the resistance r.
所述步骤2中，闭合开关KG，控制可变频高压恒流源G输出幅值固定频率可调的直流电流对电容器C进行充电，充电至试验电压后可变频高压恒流源G自动闭锁。In the step 2, the switch K G is closed to control the variable frequency high voltage constant current source G to output a DC current with a fixed amplitude and adjustable frequency to charge the capacitor C, and the variable frequency high voltage constant current source G is automatically blocked after charging to the test voltage.
所述步骤3中，发出试品晶闸管触发脉冲，使试品晶闸管触发导通后可调电容器C释放能量，其放电与可调电抗器L谐振产生试验电流，完成试品晶闸管一次开通应力测试。In the step 3, a trigger pulse of the thyristor under test is issued, and the adjustable capacitor C releases energy after the thyristor under test is triggered and turned on, and its discharge resonates with the adjustable reactor L to generate a test current to complete the primary turn-on stress test of the thyristor under test.
所述步骤4中，测试完成后，关闭可变频高压恒流源G，断开开关KG；闭合开关KC将可调电容器C残存能量释放完毕；关闭直流电压源E，闭合开关Kr，停止加热。In the step 4, after the test is completed, close the variable frequency high voltage constant current source G, disconnect the switch K G ; close the switch K C to release the residual energy of the adjustable capacitor C; close the DC voltage source E, close the switch Kr, and stop heating.
本发明同时提供一种晶闸管开通应力测试装置，所述装置包括可变频高压恒流源G、试验主电路单元、加热回路单元和保护回路单元；所述可变频高压恒流源G输出直流电流对试验主电路单元的可调电容器C进行充电；可变频高压恒流源G闭锁并发出试品晶闸管触发脉冲，在试品晶闸管触发导通后可调电容器C放电产生试验电流，完成试品晶闸管在不同工作条件下的开通应力测试；所述加热回路单元对试品晶闸管加热到试验结温；所述保护回路单元防止测试对试品晶闸管损坏。The present invention also provides a thyristor turn-on stress test device, the device includes a variable frequency high voltage constant current source G, a test main circuit unit, a heating circuit unit and a protection circuit unit; the output DC current of the variable frequency high voltage constant current source G is The adjustable capacitor C of the main circuit unit of the test is charged; the variable frequency high-voltage constant current source G is blocked and sends out the trigger pulse of the thyristor of the test product. Turn-on stress test under different working conditions; the heating circuit unit heats the thyristor of the test product to the test junction temperature; the protection circuit unit prevents damage to the thyristor of the test product.
所述不同工作条件包括不同电压、不同频率、不同触发信号、不同结温、不同电流峰值及di/dt。The different working conditions include different voltages, different frequencies, different trigger signals, different junction temperatures, different current peak values and di/dt.
所述试验主电路单元包括可调电容器C、阻尼电阻R与二极管D串联而成的R-D支路、开关KC、电阻r2和饱和电抗器L；所述开关KC和电阻r2串联后并联在所述可调电容器C两端，所述R-D支路与所述可调电容器C并联后与所述饱和电抗器L串联。The test main circuit unit includes an adjustable capacitor C, a damping resistor R connected in series with a diode D RD branch, a switch K C , a resistor r2 and a saturated reactor L; the switch K C and resistor r2 are connected in parallel after being connected in series Both ends of the adjustable capacitor C, the RD branch is connected in parallel with the adjustable capacitor C and then connected in series with the saturated reactor L.
所述R-D支路为可调电容器C振荡出现的反压提供反向电流通路，并通过阻尼电阻R消耗可调电容器C上的能量，使得试品晶闸管在开通应力测试周期内自然关断。The R-D branch provides a reverse current path for the back pressure generated by the oscillation of the adjustable capacitor C, and consumes the energy on the adjustable capacitor C through the damping resistor R, so that the thyristor of the test object is naturally turned off during the turn-on stress test period.
所述加热回路单元包括绝缘导热板A、开关Kr、电阻r、直流电压源E和绝缘导热板B，所述绝缘导热板A、开关Kr、电阻r、直流电压源E和绝缘导热板B依次串联后，并联在试品晶闸管两端，实现试验主电路单元和加热回路单元的电气隔离。The heating circuit unit includes an insulating heat conducting plate A, a switch Kr, a resistor r, a DC voltage source E, and an insulating heat conducting plate B, and the insulating heat conducting plate A, a switch Kr, a resistor r, a DC voltage source E, and an insulating heat conducting plate B are sequentially After being connected in series, it is connected in parallel at both ends of the thyristor of the test object to realize electrical isolation between the test main circuit unit and the heating circuit unit.
所述保护回路单元包括阻尼电阻Rd、阻尼电容Cd和均压电阻Rw；其中阻尼电阻Rd与阻尼电容Cd串联构成Rd-Cd串联支路，所述Rd-Cd串联支路与所述均压电阻Rw并联后，并联在试品晶闸管两端。The protection circuit unit includes a damping resistor Rd, a damping capacitor Cd, and a voltage equalizing resistor Rw ; wherein the damping resistor Rd and the damping capacitor Cd are connected in series to form an Rd-Cd series branch, and the Rd-Cd series branch is connected to the voltage equalizing After the resistance Rw is connected in parallel, it is connected in parallel at both ends of the thyristor of the test object.
与现有技术相比，本发明的有益效果在于：Compared with prior art, the beneficial effect of the present invention is:
1、该方法功能全面，可提供同换流阀实际工况相当的暂态电压、暂态电流、暂态的热与损耗强度，满足换流阀各种工况下晶闸管开通应力试验要求；1. This method has comprehensive functions, and can provide transient voltage, transient current, transient heat and loss intensity equivalent to the actual working conditions of the converter valve, and can meet the requirements of the thyristor turn-on stress test under various working conditions of the converter valve;
2、拓扑结构简单易实现，所需设备容量小，装置成本低；2. The topology is simple and easy to realize, the required equipment capacity is small, and the device cost is low;
3、阻尼电阻R与二极管D串联而成的R-D支路为可调电容器C振荡出现的反压提供反向电流通路，并通过阻尼电阻R消耗可调电容器C上的能量，使得试品晶闸管在开通应力测试周期内自然关断，不仅去掉了其关断信号电路，简化了试验装置，并且排除了强制关断对晶闸管开通性能可能带来的影响因素，提高了试验精度；3. The R-D branch formed by the damping resistor R and the diode D in series provides a reverse current path for the back pressure of the adjustable capacitor C oscillation, and consumes the energy on the adjustable capacitor C through the damping resistor R, so that the test thyristor is in The natural shutdown during the turn-on stress test cycle not only removes its turn-off signal circuit, simplifies the test device, but also eliminates the factors that may affect the turn-on performance of the thyristor due to forced turn-off, and improves the test accuracy;
4、直接对单个试品晶闸管进行开通应力测试，能够在换流阀组装之前即对内部各个晶闸管耐受换流阀开通电压电流的能力进行校验，从而提高换流阀生产制造的安全性与经济性；4. Directly conduct a turn-on stress test on a single test thyristor, which can verify the ability of each internal thyristor to withstand the turn-on voltage and current of the converter valve before the converter valve is assembled, thereby improving the safety and reliability of the converter valve manufacturing. economy;
5、可以提高电热应力的测试强度，从而通过不断试验可以获知被试晶闸管开通应力极限耐受值，为换流阀系统的优化设计提供依据。5. The test intensity of electrothermal stress can be improved, so that the limit tolerance value of the thyristor turn-on stress can be known through continuous testing, which provides a basis for the optimal design of the converter valve system.
附图说明 Description of drawings
图1是本发明实施例中晶闸管开通应力测试装置拓扑结构图；Fig. 1 is a topological structure diagram of a thyristor turn-on stress test device in an embodiment of the present invention;
图2是晶闸管开通应力测试装置对试品晶闸管进行开通测试时的试验电压波形图；Fig. 2 is a test voltage waveform diagram when the thyristor turn-on stress test device performs a turn-on test on the test thyristor;
图3是晶闸管开通应力测试装置对试品晶闸管进行开通测试时的试验电流波形图。Fig. 3 is a test current waveform diagram when the thyristor turn-on stress test device performs a turn-on test on the test thyristor.
具体实施方式 detailed description
下面结合附图对本发明作进一步详细说明。The present invention will be described in further detail below in conjunction with the accompanying drawings.
如图1-图3，提供一种晶闸管开通应力测试方法，所述方法包括以下步骤：As shown in Fig. 1-Fig. 3, a kind of thyristor turn-on stress test method is provided, the method comprises the following steps:
步骤1：将试品晶闸管进行加热到换流阀运行状况下的等效结温；Step 1: Heat the test thyristor to the equivalent junction temperature under the operating condition of the converter valve;
步骤2：对可调电容器C进行充电；Step 2: Charge the adjustable capacitor C;
步骤3：触发试品晶闸管，使可调电容器C释放能量，完成试品晶闸管一次开通应力测试；Step 3: Trigger the thyristor of the test product, so that the adjustable capacitor C releases energy, and complete the one-time turn-on stress test of the thyristor of the test product;
步骤4：重复步骤2和步骤3，进行下一测试周期，循环直至测试结束。Step 4: Repeat Step 2 and Step 3 for the next test cycle until the end of the test.
所述步骤1中，闭合开关Kr，控制直流电压源E，通过电阻r对试品晶闸管进行加热到换流阀运行状况下的等效结温。In the step 1, the switch Kr is closed, the DC voltage source E is controlled, and the thyristor of the test sample is heated to the equivalent junction temperature under the operating condition of the converter valve through the resistor r.
所述步骤2中，闭合开关KG，控制可变频高压恒流源G输出幅值固定频率可调的直流电流对电容器C进行充电，充电至试验电压后可变频高压恒流源G自动闭锁。In the step 2, the switch K G is closed to control the variable frequency high voltage constant current source G to output a DC current with a fixed amplitude and adjustable frequency to charge the capacitor C, and the variable frequency high voltage constant current source G is automatically blocked after charging to the test voltage.
所述步骤3中，发出试品晶闸管触发脉冲，使试品晶闸管触发导通后可调电容器C释放能量，其放电与可调电抗器L谐振产生试验电流，完成试品晶闸管一次开通应力测试。In the step 3, a trigger pulse of the thyristor under test is issued, and the adjustable capacitor C releases energy after the thyristor under test is triggered and turned on, and its discharge resonates with the adjustable reactor L to generate a test current to complete the primary turn-on stress test of the thyristor under test.
所述步骤4中，测试完成后，关闭可变频高压恒流源G，断开开关KG；闭合开关KC将可调电容器C残存能量释放完毕；关闭直流电压源E，闭合开关Kr，停止加热。In the step 4, after the test is completed, close the variable frequency high voltage constant current source G, disconnect the switch K G ; close the switch K C to release the residual energy of the adjustable capacitor C; close the DC voltage source E, close the switch Kr, and stop heating.
本发明同时提供一种晶闸管开通应力测试装置，所述装置包括可变频高压恒流源G、试验主电路单元、加热回路单元和保护回路单元；所述可变频高压恒流源G输出直流电流对试验主电路单元的可调电容器C进行充电；可变频高压恒流源G闭锁并发出试品晶闸管触发脉冲，在试品晶闸管触发导通后可调电容器C放电产生试验电流，完成试品晶闸管在不同工作条件下的开通应力测试；所述加热回路单元对试品晶闸管加热到试验结温；所述保护回路单元防止测试对试品晶闸管损坏。The present invention also provides a thyristor turn-on stress test device, the device includes a variable frequency high voltage constant current source G, a test main circuit unit, a heating circuit unit and a protection circuit unit; the output DC current of the variable frequency high voltage constant current source G is The adjustable capacitor C of the main circuit unit of the test is charged; the variable frequency high-voltage constant current source G is blocked and sends out the trigger pulse of the thyristor of the test product. Turn-on stress test under different working conditions; the heating circuit unit heats the thyristor of the test product to the test junction temperature; the protection circuit unit prevents damage to the thyristor of the test product.
所述不同工作条件包括不同电压、不同频率、不同触发信号、不同结温、不同电流峰值及di/dt。The different working conditions include different voltages, different frequencies, different trigger signals, different junction temperatures, different current peak values and di/dt.
所述试验主电路单元包括可调电容器C、阻尼电阻R与二极管D串联而成的R-D支路、开关KC、电阻r2和饱和电抗器L；所述开关KC和电阻r2串联后并联在所述可调电容器C两端，所述R-D支路与所述可调电容器C并联后与所述饱和电抗器L串联。The test main circuit unit includes an adjustable capacitor C, a damping resistor R connected in series with a diode D RD branch, a switch K C , a resistor r2 and a saturated reactor L; the switch K C and resistor r2 are connected in parallel after being connected in series Both ends of the adjustable capacitor C, the RD branch is connected in parallel with the adjustable capacitor C and then connected in series with the saturated reactor L.
所述R-D支路为可调电容器C振荡出现的反压提供反向电流通路，并通过阻尼电阻R消耗可调电容器C上的能量，使得试品晶闸管在开通应力测试周期内自然关断。The R-D branch provides a reverse current path for the back pressure generated by the oscillation of the adjustable capacitor C, and consumes the energy on the adjustable capacitor C through the damping resistor R, so that the thyristor of the test object is naturally turned off during the turn-on stress test period.
所述加热回路单元包括绝缘导热板A、开关Kr、电阻r、直流电压源E和绝缘导热板B，所述绝缘导热板A、开关Kr、电阻r、直流电压源E和绝缘导热板B依次串联后，并联在试品晶闸管两端，实现试验主电路单元和加热回路单元的电气隔离。The heating circuit unit includes an insulating heat conducting plate A, a switch Kr, a resistor r, a DC voltage source E, and an insulating heat conducting plate B, and the insulating heat conducting plate A, a switch Kr, a resistor r, a DC voltage source E, and an insulating heat conducting plate B are sequentially After being connected in series, it is connected in parallel at both ends of the thyristor of the test object to realize electrical isolation between the test main circuit unit and the heating circuit unit.
所述保护回路单元包括阻尼电阻Rd、阻尼电容Cd和均压电阻Rw；其中阻尼电阻Rd与阻尼电容Cd串联构成Rd-Cd串联支路，所述Rd-Cd串联支路与所述均压电阻Rw并联后，并联在试品晶闸管两端。The protection circuit unit includes a damping resistor Rd, a damping capacitor Cd, and a voltage equalizing resistor Rw ; wherein the damping resistor Rd and the damping capacitor Cd are connected in series to form an Rd-Cd series branch, and the Rd-Cd series branch is connected to the voltage equalizing After the resistance R w is connected in parallel, it is connected in parallel at both ends of the thyristor of the test object.
试验时加热回路单元预先将试品晶闸管加热到换流阀运行状况下的等效结温，然后通过可变频高压恒流源G对可调电容器C进行充电，当其电压达到预定值时闭锁恒流源并触发晶闸管。合理选择可调电容器C的大小与试验电压值，可以使被试晶闸管耐受同换流阀实际工况相当的暂态电压、暂态电流、暂态的热与损耗强度，从而实现对单个晶闸管各种阀工况下开通应力的试验考核。。增大可调电容器C、增大试验电压、升高结温与降低饱和电抗器参数，则可以提高电热应力的测试强度，从而通过不断试验可以获知试品晶闸管开通应力极限耐受值，为换流阀系统的优化设计提供依据。最后应当说明的是：以上实施例仅用以说明本发明的技术方案而非对其限制，尽管参照上述实施例对本发明进行了详细的说明，所属领域的普通技术人员应当理解：依然可以对本发明的具体实施方式进行修改或者等同替换，而未脱离本发明精神和范围的任何修改或者等同替换，其均应涵盖在本发明的权利要求范围当中。During the test, the heating circuit unit pre-heats the test thyristor to the equivalent junction temperature under the operating condition of the converter valve, and then charges the adjustable capacitor C through the variable frequency high voltage constant current source G, and locks the constant voltage when the voltage reaches a predetermined value. current source and triggers the thyristor. Reasonable selection of the size of the adjustable capacitor C and the test voltage value can make the tested thyristor withstand the transient voltage, transient current, transient heat and loss intensity equivalent to the actual working condition of the converter valve, so as to realize the control of a single thyristor. Test assessment of opening stress under various valve working conditions. . By increasing the adjustable capacitor C, increasing the test voltage, increasing the junction temperature and reducing the parameters of the saturated reactor, the test intensity of the electrothermal stress can be increased, so that the limit tolerance value of the thyristor turn-on stress of the test product can be obtained through continuous testing. It provides a basis for the optimal design of flow valve system. Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present invention and not to limit them. Although the present invention has been described in detail with reference to the above embodiments, those of ordinary skill in the art should understand that: the present invention can still be Any modification or equivalent replacement that does not depart from the spirit and scope of the present invention shall be covered by the scope of the claims of the present invention.
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| CN103278758B (en) * | 2013-04-19 | 2016-01-20 | 国家电网公司 | A kind of high-power thyristor turn-off characteristic test method and proving installation thereof |
| CN105470160B (en) * | 2015-11-19 | 2018-06-08 | 中冶南方工程技术有限公司 | A kind of high-pressure thyristor trigger board test platform |
| CN108712058B (en) * | 2017-04-12 | 2021-10-01 | 全球能源互联网研究院有限公司 | A shielded voltage equalizing circuit |
| CN109782150A (en) * | 2019-03-13 | 2019-05-21 | 南京南瑞继保电气有限公司 | A kind of thyristor electric heating experimental rig and its test method |
| CN110763970B (en) * | 2019-09-19 | 2021-06-22 | 中国南方电网有限责任公司超高压输电公司检修试验中心 | A kind of MMC power module protection thyristor turning voltage test method |
| CN110927551B (en) * | 2019-12-03 | 2023-02-03 | 西安西电电力系统有限公司 | Thyristor converter valve component short-circuit current test circuit |
| CN111337814B (en) * | 2020-04-21 | 2022-02-25 | 吉林华微电子股份有限公司 | Tolerance test device and method for semiconductor device |
| CN111579981B (en) * | 2020-06-05 | 2022-07-19 | 全球能源互联网研究院有限公司 | A circuit and method for simulating the on-off voltage of a converter valve |
| CN112269114A (en) * | 2020-10-15 | 2021-01-26 | 许继集团有限公司 | Converter valve thyristor level high-low voltage function testing device |
| CN113162099B (en) * | 2021-03-22 | 2023-01-13 | 清华大学 | Thyristor online on-state voltage monitoring system and method |
| CN115133878A (en) * | 2022-07-12 | 2022-09-30 | 云南电网有限责任公司电力科学研究院 | Circuit, device and system for realizing current pulse oscillating wave |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101980035A (en) * | 2010-09-10 | 2011-02-23 | 中国电力科学研究院 | An experimental design and analysis method for thyristors used in converter valves to withstand the most severe current stress |
| CN102035188A (en) * | 2010-09-14 | 2011-04-27 | 中国电力科学研究院 | Novel thyristor overvoltage protection method |
-
2012
- 2012-12-13 CN CN201210541033.8A patent/CN103048595B/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101980035A (en) * | 2010-09-10 | 2011-02-23 | 中国电力科学研究院 | An experimental design and analysis method for thyristors used in converter valves to withstand the most severe current stress |
| CN102035188A (en) * | 2010-09-14 | 2011-04-27 | 中国电力科学研究院 | Novel thyristor overvoltage protection method |
Non-Patent Citations (1)
| Title |
|---|
| "VSC－HVDC换流阀过电流关断试验方法";罗湘 等;《中国电机工程学报》;20110225;第31卷(第6期);第1-6页 * |
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