CN102721886A - Aging test device of motormeter - Google Patents
Aging test device of motormeter Download PDFInfo
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- CN102721886A CN102721886A CN2012102179623A CN201210217962A CN102721886A CN 102721886 A CN102721886 A CN 102721886A CN 2012102179623 A CN2012102179623 A CN 2012102179623A CN 201210217962 A CN201210217962 A CN 201210217962A CN 102721886 A CN102721886 A CN 102721886A
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- automobile instrument
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- 230000032683 aging Effects 0.000 title claims abstract description 31
- 238000012360 testing method Methods 0.000 title abstract description 28
- 238000004891 communication Methods 0.000 claims description 9
- 230000009466 transformation Effects 0.000 claims description 9
- 238000010998 test method Methods 0.000 claims description 6
- 238000002474 experimental method Methods 0.000 abstract description 5
- 238000004088 simulation Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
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Abstract
The invention relates to an aging test device of a motormeter. The aging test device comprises a main control board, a digital output circuit board and a plurality of resistance boards, wherein the digital output circuit board is used for outputting pulse-width modulation (PWM) signals and input-output (IO) signals, and the plurality of circuit boards are used for outputting resistance signals. The main control board communicates with the digital output circuit board, the plurality of resistance boards and the motormeter to be tested through a controller area network (CAN) bus according to a prestored testing program and simulates automobile running to control signals output to the tested motormeter by the digital output circuit board and the plurality of resistance boards. The aging test device of the motormeter can automatically simulate the actual environment of automobile running to perform a series of durability aging working testing experiments on the motormeter, achieves the aim of performing an aging test on motormeter products and is high in testing efficiency.
Description
Technical field
The present invention relates to aging of product proving installation, relate in particular to a kind of automobile instrument ageing tester.
Background technology
To be what product all will do the life-span after exploitation is accomplished tests the demand that whether satisfies the client of testing, and the automobile instrument product belongs to the safety member of automobile, more need do the experiment of durability of products burn-in test scrupulously.Existing automobile instrument burn-in test generally is to utilize waveform generator, accomplishes test through manual mode to the automobile instrument input test signal, and efficient is low, also can't simulate the real running environment of automobile instrument.
Summary of the invention
Based on this, but be necessary to provide a kind of simulated automotive instrument running environment and the high automobile instrument ageing tester of efficient.
A kind of automobile instrument ageing tester, it comprises master control borad, digital output circuit plate and polylith resistance board.Said digital output circuit plate is used for output pwm signal and IO signal, and said polylith circuit board is used for the output resistance signal.Said master control borad carries out communication according to the test procedure that prestores through CAN bus and digital output circuit plate, polylith resistance board and tested automobile instrument, and the signal exported to tested automobile instrument of simulated automotive operation control figure output circuit plate and polylith resistance board.
In a preferred embodiment, said master control borad comprises first single chip microcontroller, RS-232 line drive and CAN protocol controller and physical bus interface; RS-232 line drive, CAN protocol controller and physical bus interface link to each other with first single chip microcontroller.
In a preferred embodiment, the digital output circuit plate comprises CAN protocol controller and physical bus interface, second single chip microcontroller, PWM generator, a plurality of shift register and a plurality of switchgear.Said second single chip microcontroller is through CAN protocol controller and physical bus interface and CAN bus and master control borad communication; Control PWM generator output pwm signal under the control of master control borad, said pwm signal is sent to tested automobile instrument through a switchgear.A plurality of shift registers are formed a transformation from serial to parallel converter with remaining switchgear; Said second single chip microcontroller also sends the default control data to said transformation from serial to parallel converter under the control of master control borad, make said transformation from serial to parallel converter to the corresponding IO signal of tested automobile instrument output.
In a preferred embodiment, when said switchgear is switched on its level signal that receives directly being exported, is high-impedance state when it is turned off.
In a preferred embodiment, each resistance board comprises CAN protocol controller and physical bus interface, the 3rd single chip microcontroller, shift register and a plurality of resistance.Said the 3rd single chip microcontroller is through CAN protocol controller and physical bus interface and CAN bus and master control borad communication, and the corresponding resistance of the said shift register connection of control comes to the corresponding resistance signal of tested automobile instrument output under the control of master control borad.
In a preferred embodiment, said master control borad also simulated automotive ruuning situation directly to tested automobile instrument output CAN signal.
The actual environment that automobile instrument ageing tester of the present invention can be simulated automobilism automatically carries out the aging work test experiments of a series of permanance to automobile instrument, has reached the purpose to automobile instrument aging of product test, and testing efficiency is high.
Description of drawings
Fig. 1 is the functional structure chart of the automobile instrument ageing tester of an embodiment.
Fig. 2 is the structure principle chart of master control borad of the automobile instrument ageing tester of Fig. 1.
Fig. 3 is the structure principle chart of digital output circuit plate of the automobile instrument ageing tester of Fig. 1.
Fig. 4 is the structure principle chart of resistance board of the automobile instrument ageing tester of Fig. 1.
Embodiment
To combine specific embodiment and accompanying drawing that automobile instrument ageing tester of the present invention is described in further detail below.
As shown in Figure 1; Among one embodiment, automobile instrument ageing tester of the present invention mainly comprises master control borad, digital output circuit plate and polylith resistance board, can be to tested automobile instrument output CAN bus signals; Pwm signal; Resistance signal, IO signal and self-defining pulse signal, but the actual environment of simulated automotive operation carries out the aging work test experiments of a series of permanance to automobile instrument.
The digital output circuit plate is used for to tested automobile instrument output pwm signal, IO signal and self-defined pulse signal.The polylith circuit board is used for to tested automobile instrument output resistance signal.
Master control borad links to each other with digital output circuit plate, polylith resistance board and tested automobile instrument through the CAN bus; It can carry out communication according to prestore test procedure and digital output circuit plate, polylith resistance board and tested automobile instrument; The parameter and the output logic of the output signal of control figure output circuit plate and polylith resistance board, or directly export the CAN bus signals to tested automobile instrument according to the test procedure that prestores and test accordingly.
Master control borad also can link to each other with host computer through RS-232 interface, upgrades the test data of the test procedure that prestores in the master control borad through host computer.
Master control borad also can directly link to each other with display, to display output test process parameter (for example test period number) and test result.
In the present embodiment, as shown in Figure 2, master control borad mainly comprises first single chip microcontroller, RS-232 line drive and CAN protocol controller and physical bus interface.RS-232 line drive, CAN protocol controller and physical bus interface link to each other with first single chip microcontroller.Master control borad also can carry display, the convenient test parameter that shows in real time.Prestore test procedure in first single chip microcontroller, it can link to each other with host computer through the RS-232 line drive, links to each other with the CAN bus with physical bus interface through the CAN protocol controller, also can directly link to each other with display.
As shown in Figure 3, among the embodiment, the digital output circuit plate mainly comprises CAN protocol controller and physical bus interface, second single chip microcontroller, PWM generator, a plurality of shift register and a plurality of switchgear.Second single chip microcontroller receives the data from master control borad through CAN protocol controller and physical bus interface and CAN bus and master control borad communication, control PWM generator output pwm signal under the control of master control borad.This pwm signal is sent to tested automobile instrument through a switchgear.When switchgear is switched on its level signal that receives directly being exported, is high-impedance state when it is turned off, and can satisfy the high resistant requirement of automobile instrument.Second single chip microcontroller also can be exported self-defined pulse signal to tested automobile instrument through its IO mouth.
A plurality of shift registers are formed a transformation from serial to parallel converter with remaining switchgear, are used for the IO signal that the simulated automotive instrument requires.Second single chip microcontroller sends the default control data to the transformation from serial to parallel converter under the control of master control borad, make the transformation from serial to parallel converter to the corresponding IO signal of tested automobile instrument output.The IO signal of general automobile instrument has three state at most: high level, low level and high resistant.The output of shift register mainly comes the high level and the low level of Simulation with I O signal.Switchgear is used to satisfy the high resistant requirement of automobile instrument.
As shown in Figure 4, among the embodiment, each resistance board includes CAN protocol controller and physical bus interface, the 3rd single chip microcontroller, shift register and a plurality of resistance.The 3rd single chip microcontroller is through CAN protocol controller and physical bus interface and CAN bus and master control borad communication; Reception is from the data of master control borad; The control shift register connects corresponding resistance under the control of master control borad, for example selects certain the several resistance phases Calais in a plurality of resistance to produce final resistance signal.
The exportable signal type of automobile instrument ageing tester of the present invention comprises CAN signal, PWM ripple signal, IO signal and resistance signal, therefore can satisfy the test request of all model automobile instrument products.The CAN signal can be expanded enough a plurality of to satisfy product demand according to theory, therefore can guarantee to test the quantity demand of output data.Automobile instrument ageing tester of the present invention carries out the aging work test experiments of a series of permanance through the actual environment of automatic simulation automobilism to automobile instrument, has reached the purpose to automobile instrument aging of product test, and testing efficiency is high.
The above embodiment has only expressed several kinds of embodiments of the present invention, and it describes comparatively concrete and detailed, but can not therefore be interpreted as the restriction to claim of the present invention.Should be pointed out that for the person of ordinary skill of the art under the prerequisite that does not break away from the present invention's design, can also make some distortion and improvement, these all belong to protection scope of the present invention.Therefore, the protection domain of patent of the present invention should be as the criterion with accompanying claims.
Claims (6)
1. an automobile instrument ageing tester is characterized in that, comprises master control borad, digital output circuit plate and polylith resistance board; Said digital output circuit plate is used for output pwm signal and IO signal, and said polylith circuit board is used for the output resistance signal; Said master control borad carries out communication according to the test procedure that prestores through CAN bus and digital output circuit plate, polylith resistance board and tested automobile instrument, and the signal exported to tested automobile instrument of simulated automotive operation control figure output circuit plate and polylith resistance board.
2. automobile instrument ageing tester according to claim 1 is characterized in that, said master control borad comprises first single chip microcontroller, RS-232 line drive and CAN protocol controller and physical bus interface; RS-232 line drive, CAN protocol controller and physical bus interface link to each other with first single chip microcontroller.
3. automobile instrument ageing tester according to claim 1 is characterized in that, the digital output circuit plate comprises CAN protocol controller and physical bus interface, second single chip microcontroller, PWM generator, a plurality of shift register and a plurality of switchgear;
Said second single chip microcontroller is through CAN protocol controller and physical bus interface and CAN bus and master control borad communication; Control PWM generator output pwm signal under the control of master control borad, said pwm signal is sent to tested automobile instrument through a switchgear;
A plurality of shift registers are formed a transformation from serial to parallel converter with remaining switchgear; Said second single chip microcontroller also sends the default control data to said transformation from serial to parallel converter under the control of master control borad, make said transformation from serial to parallel converter to the corresponding IO signal of tested automobile instrument output.
4. automobile instrument ageing tester according to claim 3 is characterized in that, when said switchgear is switched on its level signal that receives directly exported, and when it is turned off high-impedance state.
5. automobile instrument ageing tester according to claim 1 is characterized in that, each resistance board comprises CAN protocol controller and physical bus interface, the 3rd single chip microcontroller, shift register and a plurality of resistance;
Said the 3rd single chip microcontroller is through CAN protocol controller and physical bus interface and CAN bus and master control borad communication, and the corresponding resistance of the said shift register connection of control comes to the corresponding resistance signal of tested automobile instrument output under the control of master control borad.
6. automobile instrument ageing tester according to claim 1 is characterized in that, said master control borad also simulated automotive ruuning situation is directly exported the CAN signal to tested automobile instrument.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012102179623A CN102721886A (en) | 2012-06-28 | 2012-06-28 | Aging test device of motormeter |
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| Application Number | Priority Date | Filing Date | Title |
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| CN2012102179623A CN102721886A (en) | 2012-06-28 | 2012-06-28 | Aging test device of motormeter |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103163406A (en) * | 2013-03-04 | 2013-06-19 | 航天科技控股集团股份有限公司 | Durable testing table of vehicle instrument based on controller area network (CAN) |
| CN103399568A (en) * | 2013-07-12 | 2013-11-20 | 延锋伟世通电子科技（上海）有限公司 | Automobile instrument durability test testing system with CAN (controller area network) bus |
| CN104535849A (en) * | 2014-10-20 | 2015-04-22 | 北汽福田汽车股份有限公司 | Switch module and combined instrument test system with switch module |
| CN110686719A (en) * | 2019-09-06 | 2020-01-14 | 惠州市德赛西威汽车电子股份有限公司 | Labview-based automobile instrument road test system and method thereof |
| CN111208354A (en) * | 2018-11-20 | 2020-05-29 | 通用汽车环球科技运作有限责任公司 | Vehicle electronics high resistance fault detection and isolation |
| CN114839505A (en) * | 2020-12-29 | 2022-08-02 | 珠海极海半导体有限公司 | Aging test device for MCU chip and integrated circuit chip |
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103163406A (en) * | 2013-03-04 | 2013-06-19 | 航天科技控股集团股份有限公司 | Durable testing table of vehicle instrument based on controller area network (CAN) |
| CN103399568A (en) * | 2013-07-12 | 2013-11-20 | 延锋伟世通电子科技（上海）有限公司 | Automobile instrument durability test testing system with CAN (controller area network) bus |
| CN104535849A (en) * | 2014-10-20 | 2015-04-22 | 北汽福田汽车股份有限公司 | Switch module and combined instrument test system with switch module |
| CN111208354A (en) * | 2018-11-20 | 2020-05-29 | 通用汽车环球科技运作有限责任公司 | Vehicle electronics high resistance fault detection and isolation |
| CN110686719A (en) * | 2019-09-06 | 2020-01-14 | 惠州市德赛西威汽车电子股份有限公司 | Labview-based automobile instrument road test system and method thereof |
| CN114839505A (en) * | 2020-12-29 | 2022-08-02 | 珠海极海半导体有限公司 | Aging test device for MCU chip and integrated circuit chip |
| CN114839505B (en) * | 2020-12-29 | 2023-09-19 | 珠海极海半导体有限公司 | Aging test equipment for MCU chips and integrated circuit chips |
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Application publication date: 20121010 |