WO2009041241A1 - センサ閾値回路 - Google Patents

センサ閾値回路 Download PDF

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Publication number
WO2009041241A1
WO2009041241A1 PCT/JP2008/065979 JP2008065979W WO2009041241A1 WO 2009041241 A1 WO2009041241 A1 WO 2009041241A1 JP 2008065979 W JP2008065979 W JP 2008065979W WO 2009041241 A1 WO2009041241 A1 WO 2009041241A1
Authority
WO
WIPO (PCT)
Prior art keywords
threshold value
coefficient
decided
hysteresis width
change
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2008/065979
Other languages
English (en)
French (fr)
Inventor
Sayaka Yoshioka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Asahi Kasei Microdevices Corp
Original Assignee
Asahi Kasei Microdevices Corp
Asahi Kasei EMD Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Kasei Microdevices Corp, Asahi Kasei EMD Corp filed Critical Asahi Kasei Microdevices Corp
Priority to EP08833034.5A priority Critical patent/EP2075548A4/en
Priority to US12/446,880 priority patent/US8054093B2/en
Priority to CN2008800010059A priority patent/CN101548158B/zh
Priority to JP2009508639A priority patent/JP4809472B2/ja
Publication of WO2009041241A1 publication Critical patent/WO2009041241A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/02—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation
    • G01D3/021—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation using purely analogue techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K3/00—Thermometers giving results other than momentary value of temperature
    • G01K3/005—Circuits arrangements for indicating a predetermined temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09—Magnetoresistive devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Technology Law (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Manipulation Of Pulses (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)

Abstract

　閾値点の変化に依存しないヒステリシス幅を与えることができるセンサ閾値回路を提供すること。バイアス電流ＩBを、閾値電流ＩTと閾値調整電流ＩCONTで発生することにより、閾値点は係数Ｋ、係数Ａによって与えられ、ヒステリシス幅｜ＢＨ｜は係数Ｋによって与えられるので、係数Ｋが決定されればヒステリシス幅｜ＢＨ｜は係数Ａによらず、一定に保たれる。また、係数Ａは抵抗比によって決まるため、１つの抵抗器を変えることにより閾値点を変化させることができる。また、係数Ｋが決定されれば、ヒステリシス幅｜ＢＨ｜はひとつの値にきまり、ばらつきや温度変動、経時変化がない。
PCT/JP2008/065979 2007-09-28 2008-09-04 センサ閾値回路 Ceased WO2009041241A1 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
EP08833034.5A EP2075548A4 (en) 2007-09-28 2008-09-04 SENSOR THRESHOLD CIRCUIT
US12/446,880 US8054093B2 (en) 2007-09-28 2008-09-04 Sensor threshold circuit
CN2008800010059A CN101548158B (zh) 2007-09-28 2008-09-04 传感器阈值电路
JP2009508639A JP4809472B2 (ja) 2007-09-28 2008-09-04 センサ閾値回路

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007255983 2007-09-28
JP2007-255983 2007-09-28

Publications (1)

Publication Number Publication Date
WO2009041241A1 true WO2009041241A1 (ja) 2009-04-02

Family

ID=40511130

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/065979 Ceased WO2009041241A1 (ja) 2007-09-28 2008-09-04 センサ閾値回路

Country Status (5)

Country Link
US (1) US8054093B2 (ja)
EP (1) EP2075548A4 (ja)
JP (1) JP4809472B2 (ja)
CN (1) CN101548158B (ja)
WO (1) WO2009041241A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102545842A (zh) * 2010-10-19 2012-07-04 雅马哈株式会社 滞后装置
JP2014102095A (ja) * 2012-11-16 2014-06-05 Asahi Kasei Electronics Co Ltd センサ閾値決定回路

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140049234A1 (en) * 2012-08-14 2014-02-20 Samsung Electro-Mechanics Co., Ltd. Regulator for controlling output voltage
US10180445B2 (en) 2016-06-08 2019-01-15 Honeywell International Inc. Reducing bias in an accelerometer via current adjustment
JP6431136B1 (ja) 2017-06-13 2018-11-28 ファナック株式会社 比較器の閾値を調整する機能を有するエンコーダ及びエンコーダの制御方法
JP6431135B1 (ja) * 2017-06-13 2018-11-28 ファナック株式会社 比較器の閾値を調整する機能を有するエンコーダ及びエンコーダの制御方法
CN107315505B (zh) * 2017-06-30 2020-10-09 上海天马微电子有限公司 显示面板、触控显示装置及触控压力检测方法
CN109687695B (zh) * 2017-10-19 2020-06-26 华硕电脑股份有限公司 电源系统
CN108508383B (zh) * 2018-03-28 2024-08-09 中国科学院西安光学精密机械研究所 具有阈值调整功能的霍尔片、霍尔传感器及阈值调整方法
KR102842058B1 (ko) 2020-08-18 2025-08-04 삼성전기주식회사 홀 센서 오프셋 저감 장치 및 렌즈 모듈 제어 장치
CN115166369B (zh) * 2022-07-06 2025-06-13 厦门乃尔电子有限公司 一种两线制iepe传感器输出阻抗的测试方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0690143A (ja) * 1992-09-09 1994-03-29 Nippondenso Co Ltd 半導体式センサ回路装置
JPH1038931A (ja) * 1996-07-30 1998-02-13 Yazaki Corp センサ信号処理装置
JP2001108480A (ja) * 1999-10-06 2001-04-20 Asahi Kasei Microsystems Kk センサ閾値回路
JP2008203201A (ja) * 2007-02-22 2008-09-04 Asahi Kasei Electronics Co Ltd センサ閾値回路
JP2008203202A (ja) * 2007-02-22 2008-09-04 Asahi Kasei Electronics Co Ltd センサ閾値回路

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5923024A (en) * 1997-10-02 1999-07-13 Angstrom Technologies, Inc. Apparatus and methods for controlling sensor signal hysteresis
WO2001031299A1 (fr) * 1999-10-29 2001-05-03 Mitsui Mining & Smelting Co., Ltd. Debitmetre
CA2376732C (en) * 2002-03-13 2009-11-17 National Research Council Of Canada A current-comparator-based four-terminal resistance bridge for power frequencies
US7332969B2 (en) * 2005-10-31 2008-02-19 Matsushita Electric Industrial Co., Ltd. Output offset protection for power amplifier
JP2007132706A (ja) * 2005-11-08 2007-05-31 Nikon Corp 移動量演算装置、レンズ鏡筒
KR101185145B1 (ko) * 2006-02-13 2012-09-24 삼성전자주식회사 터치 센서 기준 감지 범위의 적응적 설정 장치 및 방법
DE102006017239B4 (de) * 2006-04-12 2011-06-16 Infineon Technologies Austria Ag Differentieller Levelshifter mit automatischem Fehlerabgleich

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0690143A (ja) * 1992-09-09 1994-03-29 Nippondenso Co Ltd 半導体式センサ回路装置
JPH1038931A (ja) * 1996-07-30 1998-02-13 Yazaki Corp センサ信号処理装置
JP2001108480A (ja) * 1999-10-06 2001-04-20 Asahi Kasei Microsystems Kk センサ閾値回路
JP2008203201A (ja) * 2007-02-22 2008-09-04 Asahi Kasei Electronics Co Ltd センサ閾値回路
JP2008203202A (ja) * 2007-02-22 2008-09-04 Asahi Kasei Electronics Co Ltd センサ閾値回路

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP2075548A4 *

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102545842A (zh) * 2010-10-19 2012-07-04 雅马哈株式会社 滞后装置
CN102545842B (zh) * 2010-10-19 2014-11-26 雅马哈株式会社 滞后装置
JP2014102095A (ja) * 2012-11-16 2014-06-05 Asahi Kasei Electronics Co Ltd センサ閾値決定回路

Also Published As

Publication number Publication date
US8054093B2 (en) 2011-11-08
US20090315575A1 (en) 2009-12-24
EP2075548A1 (en) 2009-07-01
JPWO2009041241A1 (ja) 2011-01-20
EP2075548A4 (en) 2016-09-14
CN101548158B (zh) 2011-07-27
JP4809472B2 (ja) 2011-11-09
CN101548158A (zh) 2009-09-30

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